calibration of an instrument to calibrate accelerometers

55
Scholars' Mine Scholars' Mine Masters Theses Student Theses and Dissertations 1966 Calibration of an instrument to calibrate accelerometers Calibration of an instrument to calibrate accelerometers Nader Khorzad Follow this and additional works at: https://scholarsmine.mst.edu/masters_theses Part of the Mechanical Engineering Commons Department: Department: Recommended Citation Recommended Citation Khorzad, Nader, "Calibration of an instrument to calibrate accelerometers" (1966). Masters Theses. 2962. https://scholarsmine.mst.edu/masters_theses/2962 This thesis is brought to you by Scholars' Mine, a service of the Missouri S&T Library and Learning Resources. This work is protected by U. S. Copyright Law. Unauthorized use including reproduction for redistribution requires the permission of the copyright holder. For more information, please contact [email protected].

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Page 1: Calibration of an instrument to calibrate accelerometers

Scholars' Mine Scholars' Mine

Masters Theses Student Theses and Dissertations

1966

Calibration of an instrument to calibrate accelerometers Calibration of an instrument to calibrate accelerometers

Nader Khorzad

Follow this and additional works at: https://scholarsmine.mst.edu/masters_theses

Part of the Mechanical Engineering Commons

Department: Department:

Recommended Citation Recommended Citation Khorzad, Nader, "Calibration of an instrument to calibrate accelerometers" (1966). Masters Theses. 2962. https://scholarsmine.mst.edu/masters_theses/2962

This thesis is brought to you by Scholars' Mine, a service of the Missouri S&T Library and Learning Resources. This work is protected by U. S. Copyright Law. Unauthorized use including reproduction for redistribution requires the permission of the copyright holder. For more information, please contact [email protected].

Page 2: Calibration of an instrument to calibrate accelerometers

CALIBRATION OF AN INSTRUMENT TO

CALIBRATE ACCELEROMETERS

BY

NADER KHORZAD - I 'j :3 9 ...

A

THESIS

submitted to the faculty of the

UNIVERSITY OF MISSOURI AT ROLLA

in partial fulfillment of the requirements for the

Degree of

MASTER OF SCIENCE IN MECHANICAL ENGINEERING

Rolla, Missouri

1966

Approved by

av~dvisor)

4~~

Page 3: Calibration of an instrument to calibrate accelerometers

ii

ABSTRACT

The purpose of this research was to calibrate an instrument with

which an accelerometer could be calibrated accurately. The instruments

used were a piezoelectric shaker and a modified Michelson interferometer

together with necessary electronic equipment. This equipment was used

to calibrate a Kistler Model 808A accelerometer.

Weight was added to the shaker in the second part of this experiment

in order to determine its effect on the amplitude and frequency of oscil­

lation of the shaker.

Results show that this instrument may be used to calibrate an

accelerometer quite accurately. The weight added to the shaker will

effect only the amplitude of vibration and not the frequency of oscilla­

tion.

Page 4: Calibration of an instrument to calibrate accelerometers

iii

ACKNOWLEDGEMENT

The author wishes to express his sincere appreciation to Professor

Charles L. Edwards for his help in the selection of this thesis subject

and also for his help and guidance in this study.

The author also wishes to express thanks to Mr. John Lavery of the

Materials Research Center of the University of Missouri at Rolla for his

help in selection of some electrical apparatus.

Thanks are also due to Mr. Parviz Ata-abadi, Roger A. Crane and

Miss Katalin Egresits for their time spent taking data. A special thanks

to Mrs. Joyce Inman for an excellent job of typing this thesis.

Page 5: Calibration of an instrument to calibrate accelerometers

TABLE OF CONTENTS

ABSTRACT .

ACKNOWLEDGEHENT . . .

LIST OF FIGURES

LIST OF TABLES .

LIST OF SYMBOLS . . . . .

I. INTRODUCTION ....

II. REVIEW OF LITERATURE .

III. APPARATUS

A. Electrical System

B. Shaker and Cage

1. Shaker

2. Construction of Cage .

c. Interferometer .

1. Theory of Operation

IV. DISCUSSION . . .

A. Operating Procedure

1. Calibration

2. Effect of Added Weight .

B. Discussion of Results

V. RECOMMENDATIONS

BIBLIOGRAPHY

VITA ....

APPENDIX A .

APPENDIX B .

. .

. . .

.

iv

Page

ii

iii

v

vi

vii

l

3

6

6

10

10

14

17

19

24

24

24

25

29

41

42

44

46

47

Page 6: Calibration of an instrument to calibrate accelerometers

LIST OF FIGURES

Figure

1. Electrical Schematic ...

2. Electrical Control System

3. Electrical System . . . . . .

4. Shaker and Interferometer

5. Typical Barium Titanate Crystal

6. Cage and Accelerometer . . . .

7. Cage Assembly

8. Optical Components of the Interferometer ..

9. Output Waveforms at f = 1037 cps. . . 10. Output Waveforms at f 2348 cps.

11. Output Waveforms at f 3667 cps. . .

12. Acceleration Versus Frequency (First Zeros)

13. Acceleration Versus Frequency (Second Zeros)

14. Acceleration Versus Frequency (Third Zeros)

15. Acceleration Versus Frequency (Fourth Zeros)

16. Acceleration Versus Frequency (Fifth Zeros)

17. Calibration Curve

18. Effect of Added Weight . . .

. .

. .

.

.

.

. . .

.

.

.

.

v

Page

7

8

9

11

12

15

16

18

26

27

28

33

34

35

36

37

39

40

Page 7: Calibration of an instrument to calibrate accelerometers

vi

LIST OF TABLES

Table Page

I. AMPLITUDE OF OSCILLATION . . . . . . . . . . . . . . . . . . 22

II. ACCELERATION CALCULATED AND PERCENT DEVIATION 31

Page 8: Calibration of an instrument to calibrate accelerometers

Symbol

d

r

R

mv

I

K

h

X

T

Bo

A

g

s

v

a

f

G

LIST OF SYMBOLS

Name

Thickness of air film

Radius of Fringe

Radius of curvature of convex lens

Charge

Voltage

Brightness

Constant

Fringe width

Distance

Period

Bessel Function

Wavelength

Amplitude

Acceleration of gravity

Displacement

Velocity

Acceleration

Frequency

"g-level"

vii

Units

em

em

em

micro-microcoulombs

milli-volt

Lumcns/cm2

Lumcns/cm2

em

em

sec

Angstrom

in

in

in/sec

in/sec2

cycles/sec

Page 9: Calibration of an instrument to calibrate accelerometers

I. INTRODUCTION

The dynamic loading on structures and components in various envi­

ronments has put great emphasis upon the development of new measuring

devices. The need for accurate and reliable data has increased pri­

marily because of the complexity of the applications. Due to wide­

spread use of accelerometers in modern engineering research, a need

has developed for a more accurate means of calibrating this instrument.

The object of this research was to produce a motion to check the cali­

bration of an already calibrated accelerometer, and to find the effects

of added weights to the response of the instrument.

An acceleration was supplied from the shaker to the accelerometer.

Its output voltage was recorded and the acceleration was calculated,

establishing a calibration point. The amplitude and frequency of these

points must be determined in order to calculate the acceleration and to

construct the calibration curve. A piezoelectric shaker produced the

oscillation. The shaker was driven by a power amplifier, which amplified

the signal from an audio oscillator. A modified Michelson interferometer

was used in determining the amplitude of oscillation. This amplitude

could be determined by the disappearance of the Newton rings.

The effect of additional weights on the resonant points was inves­

tigated in order to see whether the resonant points of the system dif­

fer under various weights.

The system produced a suitable motion over a frequency range of

approximately 1,000 to 5,000 cycles per second. The output of the

Page 10: Calibration of an instrument to calibrate accelerometers

2

shaker became closer to sinusoidal motion as the frequency was increased.

All accelerations were calculated in terms of "g", which is the stand­

ard gravitational acceleration constant.

Page 11: Calibration of an instrument to calibrate accelerometers

3

II. REVIEW OF LITERATURE

Man's earliest production of an electric effect came through the

agency of mechanical forces. As more was learned about electricity,

its various manifestations were distinguished by special prefixes, as

galvanic, frictional, thermo-, photo-, hallo-, pyro-, and piezo-, some

of which are now obsolete or abandoned (1). ·k

It had long been observed that tourmaline crystal when placed in

hot ashes first attracted and then repelled the hot ashes. This fact

first became known in Europe about 1703, when tourmalines were brought

from Ceylon, which was sometimes called "Ceylon Magnet," and its elec­

trical character was established in 1656 by Aepinus, who noted the oppo­

site polarities at the two ends of heated tourmaline (1).

Piezoelectricity was discovered in 1880 by two French brothers,

Pierre Curie and Jacques Curie, for which they were awarded the Plante

Prize in 1895 (2).

Piezoelectricity is defined by Walter G. Cady (1) as "electric

polarization produced by mechanical strain in crystals belonging to cer­

tain classes, the polarization being proportional to the strain and

changing sign with it." This definition is known as direct effect.

Closely related to it is the converse effect, whereby, a piezoelectric

crystal becomes strained when electrically polarized, by an amount

proportional to the polarizing field.

·kAll references may be found in Bibliography.

Page 12: Calibration of an instrument to calibrate accelerometers

4

The "equivalent network" of any electromechanical system is general­

ly understood to mean an assemblage of resistors (R), inductors (L), and

capacitors (C), each independent of frequency, so interconnected that the

assemblage when substituted for the actual system will be affected the

same as that of the electromechanical system itself, at least over a

certain range of frequency. The equivalent network universally adopted

for piezoelectric systems was derived by Butterworth (3). The equiva­

lent electrical impedance consists of a certain resistance, inductance,

and capacitance in series; the whole being shunted by a second capaci-

tance.

If the convex surface of a lens is placed in contact with a plane

glass plate, a thin film of air is formed between the two surfaces.

The thickness of the film is very small at the point of contact, gradu­

ally increasing as one proceeds outward. The loci of points of equal

thickness are circles concentric with the points of contact. Since

this w&s studied by Newton, they are called Newton's rings. The thick­

ness of the air film is inversely proportional to R, which is the radius

of curvature of the convex lens (4), and is given by:

2 d = r

(1) 2R

where: d is the thickness of air film and r is the radius of any ring

for which d is calculated.

The earliest shakers were mechanically driven and consisted of a

crankshaft, connecting rods, and driving head (5). But these shakers

had a very limited operational frequency range with great distortion

due to the friction in bearings and other losses.

Page 13: Calibration of an instrument to calibrate accelerometers

5

The piezoelectric shaker was selected in this project because of

its wide frequency response. There are several papers presented by

Edelman, Jones, Smith, Thomas and Schmidt on various types of piezo­

electric shakers (6, 7, 8, 9, 10, 11, and 12).

Interferometer methods of determining the amplitudes of small

mechanical vibrations have been investigated by S. H. Cartez (13), Fuji­

moto (14), H. Osterbert (15), and W. Jay Kennedy (16), with various

degrees of success. Fujimoto (14) was able to estimate the amplitude

of oscillation by varying the voltage impressed across the electrodes

of a quartz resonator, and observing variation in the clearance of the

monochromatic interference fringes formed by using the crystal as the

mirror of the interferometer.

Page 14: Calibration of an instrument to calibrate accelerometers

III. APPARATUS

A. Electrical System: (Figures 1 and 3)

1. A Hewlett-Packard audio oscillator, model 201C, supplied the

input signal. The input frequency was monitored by using a Beckman

Counter, model 5230B. An adjustment of the attenuation caused the input

signal to produce a sine wave signal, which was observed on <1n Ana] [Jb

Dual Trace, model 1120, oscilloscope. The oscilloscope was also used

to measure the output of the accelerometer.

2. A Stromberg-Carlson, model 70807, power amplifier was used to

provide sufficient voltage gain, and to produce a signal without dis­

tortion to the shaker.

The amplifier produced a linear output at approximately 100 watts

over a frequency range of 500 to 12,000 cycles per second. To avoid

damage to the amplifier and retain a continuous load, a resistor of

2000 ohms was placed across the output of the amplifier, which resulted

in higher output voltages. A variable inductor was placed parallel

with the shaker, and resistor on the amplifier output, in order to

tune the circuit for different frequencies.

A Helipot, precision potentiometer with a resistance of 1,000 ohms,

was connected to the input of the amplifier to provide a precise ampli­

tude control of the input signal (Figure 2).

3. A Kistler quartz accelerometer, model 808A, weight 0.7 ounces,

that was already calibrated by the manufacturer at 1.210 Pcb/g, was used

Page 15: Calibration of an instrument to calibrate accelerometers

COUNTER OSCILLATOR

\ ~

VOLTMETER --;:7

POWER ANPLIFIER

~ ~J

VOLTMETER

SHAKER

cr~RGE I I TEST ' I I AMPLIFIER : ACCELERONETEE I 0 0 0 0 0

OSCILLOSCOPE ..... ~ 0

Figure 1. Electrical Schematic

Page 16: Calibration of an instrument to calibrate accelerometers

OSCILLATOR OUTPUT

1000 ohms HELIPOT POTENTI OHETER -

AMPLIFIER

VARIABLE INDUCTOR

2000 ohms

Figure 2. Electrical Control System.

8

S1IAKE1\ ,----l

I I I J I I I I I I I I I L ____ _j

0.182 X 10- 6F

Page 17: Calibration of an instrument to calibrate accelerometers

9

Figure 3. Electrical System.

Page 18: Calibration of an instrument to calibrate accelerometers

10

as a standard. The results obtained from the interferometer were com­

pared to those of the accelerometer. An amplifier was required to

connect the high-impedance charge of the accelerometer to a low-imped­

ance voltage which could be displayed on the oscilloscope. A Kistler

Electrostatic charge amplifier, model 566 multi-range was used, and the

output voltage was displayed on the oscilloscope.

B. Shaker and Cage:

1. Shaker: (Figure 4)

The shaker consisted of barium titanate crystals. The dimen­

sions of the crystals are as shown in Figure 5. This type of pizoelec­

tric crystal was chosen, because of its availability and its wide range

of operating frequency. The primary disadvantage was that it has only

discrete points corresponding to mechanical resonance. The points were

distinguished by varying the amplitude of oscillation, and observing

points of resonance of the accelerometer on the oscilloscope.

The crystals were polarized radially and both inside and outside

surfaces had been polished and silvered. Due to this polarization,

when an alternating electric signal was applied to the crystals, radial

expansion and contraction resulted. This radial expansion and contrac­

tion was accompanied by longitudinal expansion and contraction as pre­

dicted by Poisson's Law.

Because of the elastic properties of the crystals, the expansion

and contraction of one crystal is very small. In order to obtain mea­

surable oscillation, twelve crystals were used, which also allowed a

Page 19: Calibration of an instrument to calibrate accelerometers

11

Figure 4. Shaker and Interferometer.

Page 20: Calibration of an instrument to calibrate accelerometers

SILVERED SURFACE

DIRECTION OF POLARIZATION

1 1 2

II

1" 8

1" 1 -

2

Figure 5. Typical Barium Titanate Crystal Used.

1?

Page 21: Calibration of an instrument to calibrate accelerometers

11

wider range of operating frequency. These crystals were connected elec­

trically in parallel by soldering the leads to the crystal surfaces.

In order to have a system of one degree of freedom, the crystals

had to be fastened together in such a way as to act as a solid stack.

However, due to the high frequency vibration under which the system was

operating, high shear forces resulted at the joints between crystals.

Difficulty was experienced in the selection of an epoxy which would with­

stand these dynamically produced forces. The following list includes

the epoxies that were tested and states their advantages and disadvan­

tages:

(i) Sauereisen Adhesive Cement No. 1 paste proved to be

a very strong adhesive, under static loads. However,

after a matter of weeks the epoxy became brittle and

failed under operating conditions.

(ii) Eastman 910: The instructions for this adhesive stated

that the surfaces to be joined should be smooth and

matched. It is also necessary to apply a relatively

high pressure to the crystals while curing to insure

a good bond. These requirements were determined to

be impractical for this application since some of the

surfaces were chipped. The requirement for a high pres­

sure between the joints also proved impractical, due

to the brittleness of the crystals.

(iii) Dow Corning A-4000 Adhesive was the epoxy finally

selected. To improve adhesion, Dow Corning, A-4014

Page 22: Calibration of an instrument to calibrate accelerometers

Primer was used to pre-condition the surfaces.

The junctions bonded by this epoxy did not fail

and results were satisfactory.

14

In the process of using the various adhesives, if failure occurred

at the bond, a different adhesive was substituted. The end result was

that, three bonds were of Sauereisen Cement No. 1, three bonds were

of Eastman 910, and six bonds were of Dow Corning A-4000. After all

the experimental work was completed, the stack was oscillated at a

resonant point until failure occurred. It was concluded that Dow Corning

Adhesive A-4000, was the best as it did not fail.

The bottom end of the stack of crystals was attached to a brass

disc which weighed approximately fifteen pounds. It was then placed

on a heavy steel pad which was isolated by a cushion from the floor of

the laboratory. The other end. of the shaker was attached to the collet

so it could be fastened to the shaker.

2. Construction of Cage: (Figure 6)

The cage was designed in order to mount the accelerometer and

additional weights on the shaker. The parts of the cage were made of

T-6 aluminum in order for it to possess a high natural frequency and

also to be light and rigid.

Figure 7 shows how the parts of the cage were assembled. It con­

sisted of a lower disc which was fastened to the collet of the crystals

by eight screws. Four of these screws were used to hold the legs which

supported the top discs and the mirror. The accelerometer was mounted

Page 23: Calibration of an instrument to calibrate accelerometers

15

~------

Figure 6. Cage and Accelerometer.

Page 24: Calibration of an instrument to calibrate accelerometers

COLLET

ADDED WEIGHTS

BOTTOM PLATE

II

5 216

0 !

16

MIRROR

----TOP PLATE

" 52_ 16

~ ACCELEROMETER CABLE

~ SUPPORTING LEGS

~COLLET TOP CRYSTAL

Figure 7. Cage Assembly.

Page 25: Calibration of an instrument to calibrate accelerometers

17

with a stud to the lower disc, concentric to the centerline of the

shaker. The upper part of the cage consisted of two discs which were

identical to the lower disc. A stud was placed in the lower disc,

where the additional weights were added, while the upper disc was

cemented to a front surface mirror. A front surface mirror was used

in order to minimize defraction of light.

C· Interferometer:

A modified Michelson interferometer built by Richard Rabenau (5),

was used to produce and observe the Newton rings. Whereby appearance

and disappearance of these Newton rings at a certain frequency forms

the basis for determining the amplitude of oscillation, Figure 8. The

figure shows a point source of monochromatic sodium light to illuminate

the field. The light after passing through a condenser lens, was reflect­

ed by the partially silvered mirror, which was placed between the eyepiece

and the objective lens. The light passes the objective lens as a colli­

mated beam, which indicates that the beam reflected from the partial

mirror must pass through the focal point of the objective lens. The

collimated beam passes through the plano-convex lens, and is reflected

back from the mirror of the shaker. Upon return it produces Newton

rings, which was accomplished by adjusting the distance between the

shaker mirror and plano-convex lens.

The plano-convex lens was selected, with a focal length of 453 mm,

in order to produce a good image of the rings.

Page 26: Calibration of an instrument to calibrate accelerometers

LIGHT

EYEPIECE LENS ASSEMBLY

CONDENSER LENS ASSEMBLY

OBJECTIVE LENS ASSEMBLY

18

BEAM SPLITTER (PARTIALLY SILVERED MIRROR)

PLANO-CONVEX LENS-~~==~====~~ f = 453 (mm) MIRROR

COLLET

Figure 8. Optical Components of Interferometer.

Page 27: Calibration of an instrument to calibrate accelerometers

19

1. Theory of Operation:

When operating a Michelson interferometer, using a monochromatic

light source, Newton rings will shift laterally when the returning mir-

ror of the shaker is moving in a direction perpendicular to its plane.

Simple harmonic motion of the mirror and consequently the fringe system

can be achieved by keeping the output circuit tuned to a given frequency.

The resultant brightness at any point in the oscillating fringe system

is, in general, a function of both the time and the amplitude of oscil-

lation. The frequency of oscillation must be a minimum of 25 cycles per

second so that visual brightness at any point will be the time average

of the instantaneous brightness (17).

The following derivation for finding the relationship of the ampli-

tude of vibration to the Newton rings was given by Harold Osterberg in

the Journal of the Optical Society of America, Vol. 22 in 1932 (18).

If both reflecting surfaces of the mirror are at rest and uniformly

illuminated, and two interfering beams are at equal intensity, the bright-

ness of the fringes is given by:

G 2:n:xJ Io : Kll + cos ~ (2)

where: K constant (Lumens/cm2)

h fringe width (em)

x : distance measured perpendicularly across the fringes.

With sinusoidal vibration of the mirror, a simple harmonic motion of

amplitude Ao and frequency 1/T is imparted to the fringe system. At

any point the instantaneous brightness Ii is given by:

Page 28: Calibration of an instrument to calibrate accelerometers

(3)

As was mentioned before the visual brightness at any point is the

time average of the instantaneous brightness provided that the frequency

is greater than 25 cycles per second, then I can be written as:

Now let

2nAo 2nt ~ -n-- = Z and ~ = T

By substituting and rearrangin& I becomes:

By evaluating the integrals it can be found that:

Jsin(Z 0

cosrp)df> = 0

and

n

~ J cos(Z cos f) d{J = B0

(Z) 0

where: B0 (Z) is a Bessel function of order zero (19).

(4)

(6)

(7)

In order to calculate the amplitude of oscillation, the relation-

ship between the amplitude and the wavelength,)\, of the light used is

Page 29: Calibration of an instrument to calibrate accelerometers

necessary. Let A denote the amplitude of oscillation of the mirror

surface, then:

Ao h

2A·k

)\

By substituting (6), (7) and (8) into (4), then:

_ r,l (4rr.A) 2rcxJ I - KL + B0 ~ cos~

An examination of this expression shows that for B0 (4~)= 0,

(8)

(9)

I = K and the fringes disappear and the field is uniformly illuminated.

That is, for all values of A which give B0(~A) = 0, the fringes dis­

appear; this disappearance is quite sharp. Since the maximum value

of B0 ( 4~A) = B0 (0) = 1, the fringes display the greatest contrast only

when the interferometer mirror is stationary.

There are an infinite number of values of A which satisfy Bo(4;A}

0 for a particular light source.

In Table I the number of zeros is given with the corresponding

roots of Bo(4~A) in columns 1 and 2, while column 3 contains the appro­

priate values of A/~. The corresponding values of A are in inches and

centimeters in columns 4 and 5. A sodium vapor lamp was used \vith a

wavelength of 5,892 A0•

*See Bibliography (5)

Page 30: Calibration of an instrument to calibrate accelerometers

Table I

Number Root A~~ A A

of of Zeros Bo(4~A) (in.x 105 ) (em x 105 )

1 2.40 .191 .444 1.12

2 5.52 .439 1.020 2.59

3 8.65 .688 1.590 4.06

4 11.80 .938 2.180 5.53

5 14.90 1.190 2. 750 7.00

The values given in Table I are in close agreement with those that

were published by S. H. Cortz (13) and W. J. Kennedy (16).

In order to develop an expression for calculating the acceleration,

simple harmonic motion was assumed. The equation of motion of a body

in simple harmonic motion can be written as:

where: A 2Ao

s = A sinW t 2

S = displacement (inches)

A = amplitude of motion (inches peak to peak)

GO = angular velocity (~)

t =time (sec).

(10)

By obtaining the first and second derivatives, the expressions for velo-

city and acceleration may be obtained as follows:

s = ds dt

= v A WcosWt 2

(11)

Page 31: Calibration of an instrument to calibrate accelerometers

and

a =

where: V = velocity (in/sec)

a= acceleration (in/sec2).

_/::; w2 sinwt 2

23

(12)

NowJ by substituting W = 2nf and dividing both sides of the equation

by the standard gravitional acceleration gJ the "g level" can be

obtained as follows:

G

and

a g

-A4n2f2 sin 2nft 2 X 386

.0511 Af 2 sin 2nft

Gmax. = .0511 Af 2

where: f frequency (cycle/sec).

(13)

(14)

By obtaining the value of A from Table 1 which corresponds to a

certain number of the zero of Bo(4~~' and the frequency, the maximum

acceleration can be calculated from equation (14).

Page 32: Calibration of an instrument to calibrate accelerometers

24

IV. DISCUSSION

A. Operating Procedure:

1. Calibration:

The accelerometer was attached to the cage by means of a stud.

The stud was tightened so as to assure a minimum of relative motion bet­

ween the accelerometer and the cage (Figure 7).

The interferometer was properly aligned over the shaker in accord­

ance with Appendix B. The interferometer was then lowered over the

mirror on the shaker head until a fringe pattern could be observed.

Extreme caution was exercised in lowering the interferometer so as to

prevent damage to the mirror. A gap of a few thousandths of an inch was

maintained between the mirror and the plano-convex lens in order to

allow the mirror to oscillate freely.

The electrical equipment was connected as shown in Figure 1. This

equipment was allowed to warm up for a period of at least one hour prior

to taking any data, in order to assure steady state operation. The os­

cillator frequency was then increased until the fringes disappeared.

Then, without readjusting the frequency of the oscillator, the variable

inductance was set so as to tune the circuit to have a harmonic signal

to the shaker. The fringes did reappear occasionally due to the increase

of voltage across the crystals. In this case the amplitude of the os­

cillation was increased slowly using the Helipot potentiometer until the

fringes finally disappeared. When the fringes disappeared the output vol­

tage of the accelerometer was measured by the vernier of the oscilloscope.

Page 33: Calibration of an instrument to calibrate accelerometers

25

The frequency, voltage across the crystal, and the oscillator output

voltage were also recorded (Appendix A). Throughout the runs the out­

put voltage of the oscillator was monitored on the oscilloscope to check

for distortion (see Figures 9, 10, and 11). The amplitude of oscillation

was then increased until the fringes again disappeared and the data was

taken again as explained above. At the same frequency the amplitude

was then increased and the above procedure was repeated until five

points were determined where the fringes disappeared. Then frequency

was adjusted to the next calibration point and the same procedure was

followed. The instrument was calibrated for three resonant points;

this was the limit of this equipment.

2. Effect of Added Weight:

The interferometer was set as described in the calibration run,

and a 0.7 ounce weight was then added to the cage as shown in Figure 8.

As before the frequency was increased up to the first calibration point

at which the fringes disappeared. The amplitude of oscillation was then

increased by the Helipot potentiometer, until the last fringe disappear­

ance was obtained; this was the point with maximum amplitude for that

particular frequency. The output voltage of the accelerometer, fre­

quency, and voltage across the crystal were recorded and output voltage

of the oscillator was monitored on the oscilloscope to check the distor­

tion. The frequency was then increased to the next calibration point

and the variable inductance was set so as to tune the circuit. If the

fringes reappeared the frequency was increased or decreased slightly

until the fringes again disappeared. A trial and error method was

used in order to find the right combination of inductance and frequency

Page 34: Calibration of an instrument to calibrate accelerometers

Figure 9. Output Waveforms at f = 1037 cps.

26

ACCELEROMETER OUTPUT

OSCILLATOR OUTPUT

Page 35: Calibration of an instrument to calibrate accelerometers

Figure 10. Output Waveforms at f = 2348 cps.

27

ACCELEROMETER OUTPUT

OSCILLATOR OUTPUT

Page 36: Calibration of an instrument to calibrate accelerometers

Figure 11. Output Waveforms at f

28

ACCELEROMETER OUTPUT

OSCILLATOR OUTPUT

3667 cps.

Page 37: Calibration of an instrument to calibrate accelerometers

29

such that the circuit was simultaneously tuned and the fringes disappeared.

This had to be done since the value of the resistance of the Helipot paten-

tiometer was not readjusted after the first time, in order to study the

effect of weight on the oscillation. After the last calibration point

was reached and data was taken, additional weight was added and the same

procedure was repeated for 1.0, 1.7, and 2.7 ounces added weight.

B. Discussion of Results:

The primary purpose of this research was to determine whether accel-

erometers can be calibrated accurately with this instrument; that is

whether the system is capable of producing a stable known acceleration

which can be used for calibration.

The calculations to find acceleration were based upon the assump-

tion that simple harmonic motion was obtained on the shaker. For this

reason, an attempt was made throughout the runs to keep the output cir-

cuit of the amplifier tuned while selecting the proper calibration fre-

quencies for the resonant points of the shaker.

These objectives were achieved quite closely in the frequency range

of 1,000 to 4,000 cycles per second, but for higher frequencies a differ-

ent variable inductor was necessary in order to tune the circuit.

The accelerometer was calibrated by calculating the acceleration

using equation 14, and the amplitudes in column four of Table I. These

results were then compared with the output of the accelerometer. Diffi-

4nA culties were encountered in finding all five zeros for B0 (~) at a par-

ticular frequency during runs due to the weakness of the light source.

Page 38: Calibration of an instrument to calibrate accelerometers

30

As a result, it was necessary to make each run a number of times to

determine all the data points. The calculated values of acceleration

and their percent of deviation are listed in Table II.

Percent of deviation is defined as:

% Deviation X 100

where: ac = Acceleration calculated by the interferometer method

(Equation 14).

aa Acceleration found from the Kistler 808A Accelerometer

output.

Table II shows that percent deviation ranges from approximately

0.4% to 8%.

Due to the fact that the plano-convex lens was loosely mounted on

the interferometer, other relative motion, in addition to the shaker

motion, existed. This made it more difficult to find the disappearance

points.

The mechanical structure of the shaker provided some damping. This

also resulted in motion other than simple harmonic.

Another source of error was in assuming that the shaker was a pure

capacitive load when making calculations to tune the circuit. As men-

tioned in the first section of this thesis, the shaker actually has

both resistance and inductance. This was partially overcome by moni-

taring the amplifier input signal on the oscilloscope.

Page 39: Calibration of an instrument to calibrate accelerometers

31

TABLE II

Number Frequency Voltage Accele- Acceleration Accele- Percent Across rometer Calculated ration

of the Output by from the De via-Shaker Voltage Equation 14 Accele-

Zeros (cps) (volts) (mv) (g) rometer (g) tion

1 1037 3.00 2. 90 0.244 0.240 1.600

2 If 3.60 6.50 0.560 0.538 3.930

3 If 6.00 10.75 0.874 0.884 1.150

4 " 6. 72 14.40 1.200 1.190 0.834

5 " 7.00 18.50 1.510 1.540 2.650

1 2348 3.10 15.70 1.305 1.293 0.922

2 " 6.20 37.00 3.000 3.060 2.000

3 " 7.10 57.00 4.670 4.710 0.869

4 " 8.90 82.50 6.400 6.800 o. 625

5 " 11.00 105.00 8.909 8.250 1.980

1 3667 8.00 41.50 3.050 3.300 8.200

2 " 11.00 84.50 7.010 6.980 0.427

3 " 13.30 130.00 10.920 10.710 1.920

4 " 14.50 180.00 15.000 15.300 2.000

5 " 14.90 226.00 18.900 18.700 1.060

Page 40: Calibration of an instrument to calibrate accelerometers

32

The sodium spectrum lines of the light source vary between 5890 A0

and 5896 A0 (5), for calculation a value of 5893 A0 was used which could

have produced an error in acceleration of up to± 0.05 percent.

Deviation of ± 5.0 cycles per second were quite common during the

runs. This was a source of error because the acceleration is a function

of frequency squared.

The acceleration produced by the shaker was converted to an elec­

trical signal by the accelerometer, and transmitted to the oscillo­

scope. From the output voltage indicated on the oscilloscope, the

acceleration could be calculated. The acceleration was also determined

by using the interferometer method. The values of acceleration obtained

by both methods were plotted against the frequency of oscillation as

shown in Figures 12 through 16. It may be seen from the graphs that

the values for acceleration obtained by the interoferometer method

correspond quite closely to those obtained by the accelerometer. The

largest deviation as shown in Table II was found to be 8.2%.

The procedure of calibrating an unknown accelerometer will now be

given: In this procedure the standard accelerometer was used as the

unknown.

The g level was calculated from the observed frequency at which

disappearance of the Newton rings occur as discussed in the operating

procedure. The amplitude of oscillation of the accelerometer was

measured on the oscilloscope in milli-volts. The setting on the range

switch of the charge amplifier was ~ecorded (mv/Pcb)· The output

charge of the accelerometer was then determined in Pcb· After a

Page 41: Calibration of an instrument to calibrate accelerometers

,....... .-! (])

:> (])

.-! I bO

'-"'

d 0

•r-1 ~ ttl ~ (])

.-! (]) C) C)

<

2.0

1.5

1.0

0 1000

First Zero

2000 3000

33

(V Interferometer Method

b. Accelerometer Output

4000 5000

Frequency (Cycles per second)

Figure 12. Acceleration Versus Frequency (First Zeros).

Page 42: Calibration of an instrument to calibrate accelerometers

34

() Interferometer Method

~ Accelerometer Output

10.0

8.0

6. 0 -.. .--1

Q)

:> Q)

.--1 I 0.0 ~

d 4.0 0 ·.-I ~ cU ~ Q)

.--1 Q) (.) (.)

~ 2.0

0

0 1000 2000 3000 4000 5000

Frequency (Cycles per second)

Figure 13. Acceleration Versus Frequency (Second Zero s ) .

Page 43: Calibration of an instrument to calibrate accelerometers

12.0

10.0

0

'

1000 2000

...

35 () Interferometer Method

~ Accelerometer Output

+ ...

j

...

++

3000 4000 5000

Frequency (Cycles per second)

Figure 14. Acceleration Versus Frequency (Third Zeros).

Page 44: Calibration of an instrument to calibrate accelerometers

20.0

16.0

r--.12.0 ~

Cl) :> Cl)

.....:! I bO

'-"'

c 0 'j 8.0 co ~ Cl) ~ Cl) CJ CJ

<!!

4.0

0

36

() Interferometer

~ Accelerometer Output

r. ·t H- . , -IT

,. ~ fi++ -l +- ....

+--

t ~- + +- +± t ;- t . + ~- ' ~

t : i

~ ·t-

t + H- It-It ~ ~ ~H 1 ~r;f 1::. .. ~ t1 :ff -+ +

+ ~~,.... li t

I+ .l ~; t . r 1 j +.i t .. T ~f h ~ ,::

++~ ±t + ~ ~ .. .. ..

::rft ~ .. ~ .. ! :-t t tt rt .. ~-t: ~ ·; :- -+-+ -+ + •• +-+ + .. ,+ H-. ·; ..

lri~ i. ~ tIt t:·n ~t+ ++~ 1 f+- + t ·+i · · ]V l~f .f l·t· . + .. ~ t +~ +

+-+ r ... .. . ~ ~ t-+ +- .. +

~~ ~ ~- ~ 4 . t rtt- :r ,) '/ ~~ :·.L·t f- t .. t~ +-tt- • t"-...

lJt ~ +H- r·

. l t r:::r .... itl t lA rF .. .. + ....

tt ++ t+ It t~ h- ' r · rt- h:

l- 1- f 11 . P:l 8-ill t ~.t~+ ·t H·

1" t +++ t h- .. ·+

-± ~ t t ... :tt. ~ ....

-:- +-H ... ~--~-

+ i ~

+ t- f i ~ +

~ !! +

t f +· + + .. p+ t +

+-+ t

t a I+ + t + t

+ t t +t

:r ++ .... ~ t-t + r :- .. ...

t

j ti:· r .... j ! h ,..; +: tt·

' .. r ij .. it~}

0 1000 2000 3000 4000 5000

Frequenc y (Cycles per second)

Figure 15. Acceleration Versus Frequency (Fourth Zeros)

Page 45: Calibration of an instrument to calibrate accelerometers

37

0 Interferometer Method

~ Accelerometer Output

20.0 1 ~ ++--< ~ + !_-t + " -t

-+ t <T

~

II

~+ + -1

+

16.0

+ + + I t t ' t

t

'h ti II f-t

t T t +

l

~: t + +

,-... t

.-1 (])

!> 12~0 (]) .-1

I bll

'-"'

d 0

r::-

* -1

I. irrl~ ir. 1'-1 j

l I

+ , .....

t ·M ~ ttl $-4 8.0 (])

:t-

f + +

.-1 ... (])

u u <!!

4.0

I

\ il H-- + , 0

0 1000 2000 3000 4000 5000

Frequency (Cycles per second)

Figure 16. Acceleration Versus Frequency (Fifth Zeros).

Page 46: Calibration of an instrument to calibrate accelerometers

38

number of observations were made, the calibration curve was plotted

(Figure 17). The slope of the calibration curve was found to be 1.23

Pcb/g, which is the sensitivity of the accelerometer.

The actual sensitivity of the accelerometer as determined by the

manufacturer is 1.21 Pcb/g. This shows that the results of the inter­

ferometer method of calibration is quite close to that of the manufac­

turers.

Weights were added to the shaker. It may be seen from Figure 18

that these added weights did not noticably alter the mechanical resonance

frequencies, but the amplitude of oscillation was noticeably reduced.

This was as predicted considering that the Helipot Potentiometer was

maintained at its highest value and the added weights served as an

energy absorber. The final value of additional weight used was 2.7 oz.

With this weight the fringes did not disappear due to the amplitude of

the oscillation dropping below .445 x lQ-5 inches. This could be over­

come by using a more powerful oscillator.

Figures 9, 10 and 11 show the output waveform of the accelerometer

and the oscillator at the first zero of resonant points. It can be

seen that as the frequencies increase the output of the accelerometer

will approach a sine wave. This could be justified, due to the fact

that as the frequencies increase the oscillation of the shaker approaches

a simple harmonic motion.

Page 47: Calibration of an instrument to calibrate accelerometers

39

24.0 t "ffJ-. -

H4+ + r-., It"'"· ~~ f- f{ :t'

............._ ... 1-+ ..-4-~f-.-T~rj 1

+

+ 1 H· ..... Q-+..-

20.0

+ u f+ +~~~~"· + "t- .

.. + ;.

H-t-f+ . ±

+I-+- RE·~ T LJJ -~ + r=tl :h f·1r

.l, Itt' ' 1 i +

H- +: t t Wit ~.+ ~ !7 J. f1 w~j ~ t "l I+

j:+ 't ~ ~t-~ +

H ~~~ t~ ili f-4 l )~ Lttft .. ~ t t

-. + Hi !i ·t m H~~ L ~-~. . . •-;: ~ t-i± -'t

•t ,..0 (.)

P-1 16.0 '-"

Q) bO ~ cU

~ J . I +t . ~t

~~T~Jtt r:t t ~ L +

~· j-. •-'

I ~ .;. rt t-J. ~ ~-t +

FE lt rit f-:_: + t!

hff H trt±: f¥+1 lijlfl~Lj ij fi ti rnt+ '+ +

r:r-1+ ·· -l:t ·1+f +++

!7H- t . tfi

·t- H+ / '"f m.n . r n. "t1 ·t f+

. HI-I- l1 ~ 1-1-f !t !. ~t ..c u tt h fb.l~ tt ~ t++::. tt tt·

t+ H :l++ -t!... .f '::~ .w ::l 0.. 12.0 .w ::l 0

~ Q)

·I

j ~ . I] ++ v :!- H·+ +.it + t+ T '~

-, ;; ~ ... 't+- +t#-! ·+++- tt-t- H tl ' F-t 1 tt:t -+++ lti· 1' '±. H-. -x Lf+:. ~ .l - u~· t • t..;.J ... : t~ ~p .. :i ++ t I-tt! :::

h-~ +· ->+h ~+ t ~t t-t

+t I !~ ~H tr+ -i •

++ ~f. tTt t ++- r· ++ t ~t+ ~ '+

H- t ~-::t .t n .w Q)

s 0 ~ Q) 8.0 .-l Q) (.) (.)

~

t:±· I t. ~

·l_J+. +- +-+r ; ~t l-H !it: :- t

P= Ifff ++++ + j

p .... I •t++. ~ I

-.-1 1, ...j f+t-t-r- '-rtt. tj

~= 17 h -+: ~~;l::tft +++.+ ~; I

.. + t-+

~i V:"f .t I ....::!± t • I A!"" ""'-t-r . ~ Itt

1 b f ~

. 1 t R=tt t .;t ... -·~ H- Tt + + t•

h± ~

ll_t l4t H W- tt~t ·r _ nl: + littt fi~ ~ff q~;

t.:i+- .,; rn Hi-t ! 1 +::.!:f.l-i"T- hh . !t [:f '~l : 1 ... ~~ !WI#

++ ~t= . ·+H++ +. ~ .. .I: ~ flLt l,lf 1 i ht + R-+t-t +~::: 1~£ +;£

.. t"

- .. ft++. t+ :~ + 1 +

~1 l~ ~ tjl I+· ff~~ ~# +• .;.+ ~r ~ "'"+ }fi

ii 1 - ~.. + ~"t ~ f-h- + ~ j. + ~: -~;: ~It: . ~ ~ + +

1 ~ Ri-t ~ -g~ t ~s!: 11 ~t ~

rt1 j I ;..

~

4.0

!t j ' i_

lJrt r+: !H tl

·a ++ r+ ~1 ~

+J

0

~I+, g:f-=-~mll ':;: -+ H+ t ~-a rH .. ·· ~~~ i . rt f+ ~

~ •• t++-

t : 14+ ! t-4

t~lh ff+B 4 ~ l: 8- ~t~w ~-+1 :tt ~~ ·- ~ • 11 ++ +++

IT J-rift:rt . . ~ tt f+ ~ --~ .::· t-~ i·l ''"!"!. !-ml+t It ~-+ + • , • • ~ ..... ,

0 4 8 12 16 20

Accelerat ion Calculated (g- Level)

Figure 17 . Calibration Curve.

Page 48: Calibration of an instrument to calibrate accelerometers

,...., ~ Q)

:> Q) ~

I bO '-"

+.J ;:.1 0.. +.J ;:.1 0

~ Q) +.J Q)

s 0 ~ Q) ~ Q) C) C)

~

20

16

12

8

4

0

n t!

0

~

40

0 Added Weight 0.7 ounce

GJ Added Weight 1.0 ounce

& Added Weight = 1.7 ounce

-ttt- ~rr- m ~h - ~

.1- 1- -1= t-. :- + • -. --rt ,_. t+ ~

f-+-++~ ~~ -1--f- ... "1 +

H-t· 1 + ~ + ~ rtl

t

i t ~+41 f:: 1

l 1 ~' ~~~~~ ~~ i+ =t= +R- ~ ;:t: j .1 t ~ 1 i j-~ I+ ~ i + ~_;_ - ~l, L ~ -+-r t- . ~ T ~ . j 1; I l . IT -....-- r-..-----'-+ + t +t-t- j-1 -t : t + '+-t t + l .l + f:: ~.. 1 ,_ +-r + ~: • ; , ,_' , ~ :. : .:!:!:

+

t . --1 . I t - t+--- t· !-- ]" - J -t- t . II f ~ t H -i- - ~ t • + +--l ~ t- +: • ~ ~ ~ j -i= ~- -:! t- ~- : • + ~ t- t- : -t- • ~ j .!:... .... ~

:t ,, ... lj~ +-- ~ +--Jt-_,- t ... J~ t-+t +-•+ •ji /~ Lt:t+t:'~~~!tU:t1!!:ttl q +_+~t ,_f. --j-i_,___,__j; -i---l t--t =r lj +;+---+-;.j. ~- tt ... It-t- t. ~··· Ut-f •t+ )., • yt~ H:: f+:

:tt t -t-It"

1---1---t

-t t ~

~:t t-

~ 1 .I

1 --1

4- i

1--H- 1-<--+--

1000 2000 3000 4000 5000

Frequency (cycles per second)

Figure 18. Effect of Added Weight.

Page 49: Calibration of an instrument to calibrate accelerometers

41

V. RECOMMENDATIONS

Certain changes can be made in order to improve the accuracy and

ease of operation of the entire system.

In order to increase the range of operation of the interferometer

a very strong light source is needed, so any slight change in fringe

pattern can be noticed. Also, the power of the microscope of the inter­

ferometer should be increased by selecting more powerful lenses.

The plano-convex lens at the end of the interferometer was assem­

bled loosely so as to prevent damage to the mirror of the shaker. This

should be changed to a system more rigid and fine adjustment for adjust­

ing the spacing between the mirror and the lens. Also, the fixtures

should be redesigned so that a higher focal length lens can be used.

The stack of crystals that were used for the shaker may be replaced

by a single crystal with the same dimension, in order to prevent rela­

tive motion between the different segments of the crystal and to increase

the range of operating frequency of the shaker.

Page 50: Calibration of an instrument to calibrate accelerometers

BIBLIOGRAPHY

1. Cady, W. G. (1964). Piezoelectricity, Vol. 2, 2nd Edition, New York, Dover Publications, Inc.

42

2. Cady, w: G. (1922). "Theory of Longitudinal Vibrations of Viscous Rods," Physical Review, January.

3. Dye, w. D. (1932). "The Modes of Vibration of Quartz Piezoelectric Plates as Revealed by an Interferometer," Royal Society, June.

4. Jenkins, A. and White, H. E. (1957). "Fundamentals of Optics," 3rd Edition, New York, McGraw-Hill.

5. Rabenau, R. (1965). "The Design and Construction of an Instrument for Calibrating Accelerometers," Master's Degree Thesis, University of Missouri at Rolla.

6. Edelman, Jones, and Smith (1955). "Some Developments in Vibration Measurement," Journal of Acoustical Society of America, July.

7. Edelman, Jones and Smith (1957). "Displacement Measurement by Elec­tronic Counting," Journal of the Acoustical Society of America, October.

8. Smith, Edelman, Jones, and Schmidt (1958). "Stroboscopic Interfero­meter for Vibration Measurement," Journal of Acoustical Society of America, September.

9. Smith, D. H. (1945). "A Method of Obtaining Small Mechanical Vibra­tions of Known Amplitude," Proceedings of the Physical Society, July.

10. Thomas, H. A. and Warren, G. A. (1928). "An Optical Method of Mea­suring Small Vibrations," Philosophy Magazine.

11. Schmidt, Edelman, Smith, and Pierce (1962). "Modulated Photoelectric Measurement of Vibration," Journal of the Acoustical Society of America, April.

12. Schmidt, Edelman, Smith, and Jones (1961). "Optical Calibration of Vibration Pickups at Small Amplitudes," Journal of the Acousti­cal Society of America, June.

13. Cortez, s. H. (1934). "Interferometer Method for Measuring the Amplitude of Vibration of Quartz Bar Crystals," Journal of the Optical Society of America, May.

14. Fujimoto, T. (1927). "Measuring the Amplitude of Vibration of Quartz," Ph.D. Thesis, Ohio State University.

Page 51: Calibration of an instrument to calibrate accelerometers

43

15. Osterberg, H. (1932). "An Interfermeter Method of Studying Vibra­tions of an Oscillating Quartz Plate," Journal of the Optical Society of America, September.

16. Kennedy, W. J. (1941). "The Interferometer Method of Determining the Amplitudes of Small Mechanical Vibrations," Journal of the Optical Society of America, February.

17. Talansky, s. and Bardsley, W. (1950). "Interferometric Studies on Vibration of Piezoelectric Plates," Proceedings of the Physi­cal Society.

18. Osterberg, H. (1929). "An Interferometer Method of Observing the Vibrations of an Oscillating Quartz Plate," Physics, November.

19. Churchill, R. v. "Fourier Series and Boundary Value Problems" 2nd Edition, New York, McGraw-Hill.

Page 52: Calibration of an instrument to calibrate accelerometers

44

VITA

The author, Nader Khorzad, was born on June 14, 1939, in Tehran,

Iran. He received his primary and secondary education in Shemiran,

Iran, his college education at Queens College, Queens, New York and at

the University of Missouri at Rolla, Rolla, Missouri. In August, 1964,

he received a Bachelor of Science in Mechanical Engineering from the

University of Missouri at Rolla, and was employed as a design engineer

at Lindberg Steel Treating Equipment Company, Melrose Park, Illinois,

from September, 1964 to September, 1965. Since September, 1965, he has

been a graduate student at the University of Missouri at Rolla.

Page 53: Calibration of an instrument to calibrate accelerometers

45

APPENDICES

Page 54: Calibration of an instrument to calibrate accelerometers

46

APPENDIX A

The results of the calibration runs are listed below:

Frequency Oscillator Voltage Accelerometer Charge Variable Output Across the Output Amplifier Inductance Voltage Shaker Voltage Switch

(cps) (volts) (volts) (mv) (mv/Pcb) (mh)

1037 3.20 3.00 2.90 10 52

1036 4.00 3.60 6.50 10 52

1038 5.90 6.00 10.75 10 52

1037 6.20 6. 72 14.40 10 52

1035 7.10 7.00 18.50 10 52

2398 3.35 3.10 15.70 10 23

2396 6.60 6.20 37.00 10 23

2395 7.20 7.10 57.00 10 23

2398 9.00 8.90 82.50 10 23

2398 11.00 11.00 104.00 10 23

3667 8.40 8.00 41.50 10 18

3668 11.20 11.00 84.50 10 18

3663 13.80 13.30 130.00 10 18

3667 14.80 14.50 185.00 10 18

3668 15.10 14.90 226.00 10 18

Page 55: Calibration of an instrument to calibrate accelerometers

APPENDIX B

Instructions for setup of the Michelson Interferometer used in

this research:

1. Allow the sodium vapor lamp approximately one hour to sta­

bilize and reach its maximum intensity.

2. Level the shaker base with adjusting screws.

3. Align the axis of the shaker with the optical axis of the

interferometer.

4. Lower the interferometer until the plano-convex lens barely

touches the mirror on the shaker head.

47

5. Adjust the condenser lens, in or out, until the entire field

of view is uniformly illuminated.

6. If the circle of light is not in the center of the optical

lens, move the center of the circle to the center of the

sight picture by adjusting the beam splitter mirror.

7. The focus is now adjusted by turning the knurled knob on the

eyepiece until a sharp image is obtained.

8. Raise the interferometer a few thousandths of an inch while

still retaining the fringes.

9. The interferometer is now properly adjusted for calibration.