built-in self-test and calibration of mixed-signal devices
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Built-In Self-Test and Calibration of Mixed-signal Devices. Wei Jiang Ph.D. Dissertation Proposal June 11, 2009. Committee Members: Fa F. Dai Victor P. Nelson Adit D. Singh. Advisor: Vishwani D. Agrawal. Outline. Overview Background Built-in Test and Calibration Approach - PowerPoint PPT PresentationTRANSCRIPT
Built-In Self-Test and Calibration of Mixed-signal Devices
Wei JiangPh.D. Dissertation Proposal
June 11, 2009Advisor: Vishwani D. Agrawal
Committee Members: Fa F. DaiVictor P. NelsonAdit D. Singh
Outline• Overview• Background• Built-in Test and Calibration Approach• Current Progress• Future Work• Conclusion
2Wei Jiang General Oral Examination
Overview• Issues
– Parameter deviation– Process variation
• Problem– Design variation-tolerant process-independent
technique for mixed-signal devices
• Approach– Test and characterization of mixed-signal
devices– Output calibration
Wei Jiang General Oral Examination 3
Mixed-signal Device• Analog and digital circuitry• Digital controllable• Typical devices
– Converters, digital-to-analog/analog-to-digital
– Amplifier
Wei Jiang 4General Oral Examination
Testing of Mixed-signal Devices• Defects and faults
– Catastrophic faults (hard faults)– Parametric faults (soft faults)
• Test approaches– Functional test (specification oriented)– Structural test (defect oriented)
Wei Jiang 5General Oral Examination
Challenges• Analog circuitry
– No convincing fault models– Difficult to identify faults– Device parameters more susceptible to
process variation than digital circuitry– Fault-free behavior based on a known range
of acceptable values for component parameters
• Large statistical process variation effects in deep sub-micron MOSFET devices
Wei Jiang 6General Oral Examination
Process Variation• Parameter variation in nanoscale process• Yield, reliability and cost• Feature size scaling down and performance
improvement• Effects on digital and analog circuitry
– Analog circuitry more affected by process variation– Parameter deviation severed in nanoscale process– System performance degraded when parameter
deviation exceeds beyond tolerant limits
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Outline• Overview• Background• Built-in Test and Calibration Approach• Current Progress• Future Work• Conclusion
8Wei Jiang General Oral Examination
Typical Mixed-Signal Architecture
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Mixed-Signal System Test Architecture
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* F. F. Dai and C. E. Stroud, “Analog and Mixed-Signal Test Architectures,” Chapter 15, p. 722 in System-on-Chip Test Architectures: Nanometer Design for Testability, Morgan Kaufmann, 2008.
General Oral Examination
Mixed-Signal System Test Architecture• Digital system
– Digital I/O– Digital signal processor (DSP)– TPG and ORA and test control unit– Digital loopback
• Mixed-signal system– DAC and ADC– Analog loopback
• Analog system– Analog circuitry– Analog signal I/O– Analog I/O loopback
Wei Jiang General Oral Examination 11
Test Criteria• Digital circuitry test
– Defect-oriented test– Defects cat be detected by wrong
output response for specific test pattern• Analog circuitry test
– Specific-oriented test– Parameter deviations vs. the acceptable
tolerant limit
Wei Jiang 12General Oral Examination
Typical Mixed-Signal Devices• DAC – digital-to-analog converter
– Digital inputs; analog outputs• ADC – analog-to-digital converter
– Analog inputs; digital inputs• Digital Controlled Amplifier
– Analog inputs/outputs with digital controlling inputs
– Analog transfer function controlled by digital device, e.g. microcontroller
– Gain/distortion/nonlinearity respond to digital controlling signal
Wei Jiang 13General Oral Examination
Existing Testing Approach• Oscillation BIST• LFSR-based TPG• FFT-based BIST
Wei Jiang 14General Oral Examination
Linearity Problem• LSB – least significant bit
– The minimum measurement for of analog value
– Represented by 1 digital bit• Non-linearity Error
– DNL – differential non-linearity
– INL – integral non-linearity
Wei Jiang 15
11
LSBDNL kk
k
kLSB
DNLINL kk
kk
00
General Oral Examination
Analog input
Dig
ital c
ode
outp
ut
Ideal
Actual (νK)
Ideal
Actual (νK)
Ana
log
outp
ut
Digital code inputNon-linearity error of ADC Non-linearity error of DAC
k
kν
ν
Non-linearity Error of ADC/DAC
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Non-linearity error
Non-linearity
error
General Oral Examination
Other Characteristics• Frequency response
– Bandwidth• Noise
– SNR – signal-to-noise ratio– SINAD – signal-to-noise and distortion
ratio• Offset, gain, harmonic distortion• Intermodulation distortionWei Jiang 17General Oral
Examination
Outline• Overview• Background• Built-in Test and Calibration
Approach• Current Progress• Future Work• Conclusion
18Wei Jiang General Oral Examination
Typical Mixed-Signal System with DAC/ADC
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Proposed Test and Calibration Architecture
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Components Description• Digital circuitry (including DSP) as BIST control unit
– Test pattern generation (TPG) and output response analysis (ORA)
• Measuring ADC– First-order 1-bit Sigma-Delta modulator– Digital low-pass filter– Measuring outputs of DAC-under-test
• Dither DAC– Low resolution DAC– Generating correcting signal for calibration– Calibrated DAC for test of ADC-under-test
• ADC Polynomial Fix– Digital process to revise ADC output codes
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Testing Procedure• Self-test of testing and calibrating components
– Self-test of BIST control unit (including DSP, TPG/ORA)
– Self-test of measuring ADC– Test of dithering DAC by measuring ADC
• Test of On-chip DAC– Ramp test of on-chip DAC– Characterizing on-chip DAC by DSP– Calibration of on-chip DAC by dithering DAC
• Test of on-chip ADC– Ramp test of on-chip ADC– Characterizing and fixing on-chip ADC outputs by
DSP
Wei Jiang 22General Oral Examination
Faulty Mixed-Signal Circuitry• Good circuitry
– All parameters and characteristics are within pre-defined specified range
• Fault-tolerant factor– Post-fabrication and software-controllable– Fault-tolerant factor varies for different
application– Trade-off between fault-tolerance of
parameter deviation and calibration resolution
Wei Jiang 23General Oral Examination
Determine Faulty DAC/ADC• Coefficients representing offset, gain
and harmonic distortion exceeding specific limit
• Maximum INL error exceeding calibration range (depending on fault-tolerant factor)– ±4LSB for fault-tolerant factor 3
• INL errors of all calibrated outputs must be within ±0.5LSB
Wei Jiang 24General Oral Examination
Device Test and Calibration• During BIST
– Test DAC/ADC with ramp signals– Measure response of each test code– Obtain INL error for each code– Characterize device by INL error
• After BIST– Determine faulty devices by deviation of
parameters– Generate correcting signal/data (identical to
INL error) for each code– Calibrate DAC/ADC output using correcting
signal/data by removing INL errorWei Jiang 25General Oral
Examination
The ONLY Problem• Storing all INL errors for every input
code of DAC/ADC is impossible– Requiring huge amount of memory– Needing lots of access time to retrieve
specific data from memory– Prohibiting cost
• Solution– Polynomial fitting– Storing several coefficients instead of all
dataWei Jiang 26General Oral
Examination
Test Pattern• Test pattern
– Ramp code– Least value to most value– Testing time for each pattern depends
on the converting speed of measuring ADC
• Single-tone and multi-tone test patterns can also be used
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Test of Digital Circuitry• Conventional digital BIST technology• LFSR-based random test; Scan-based
deterministic test• Digital loopback conducted• Fault-free digital circuitry then used
for mixed-signal test• May be hardware- or software-based
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Measuring ADC• First-order 1-bit sigma-delta ADC• Perform self-test before any other
mixed-signal test• Make sure each components of
sigma-delta ADC working• Quantization noise• Bit-stream output pattern
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Sigma-Delta Modulator
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Sigma-Delta Modulator (cont.)• Advantage
– Oversampling and noise-shaping– High resolution and linear results– Resolution depends on OSR (oversampling
ratio)– Simple structure and low cost
• Disadvantage– Very slow converting speed– Bit-stream output pattern issue for low-order
modulation– Requiring high-speed clock
• Higher order and/or multi-bit modulationWei Jiang 31General Oral
Examination
Selection of Sigma-Delta Modulator
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First-order
Second-order
Third-order
17-bit ENOB104.1LSB
Oversampling ratio (OSR)General Oral Examination
Digital Filter• Sigma-delta ADC consists of sigma-
delta modulator and digital filter• Low-pass filter (LPF)• Integrator• Comb filter
Wei Jiang 33General Oral Examination
Dithering DAC • Low-cost low-resolution DAC• Better linearity output with DEM
technique• Must be tested by measuring ADC
before test of on-chip mixed-signal devices
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Resolution of Dithering DAC
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3
α=1
17bits
Resolution of dithering-DAC (bits)
Ove
rsam
plin
g ra
tio
(OSR
)
2
General Oral Examination
Polynomial Fitting Algorithm• Introduced by Sunter et al.
in ITC’97 and A. Roy et al. in ITC’02
• Summary:– Divide DAC transfer
function into four sections
– Combine function outputs of each section (S0, S1, S2, S3)
– Calculate four coefficients (b0, b1, b2, b3) by easily-generated equations
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33
2210 xbxbxbby
General Oral Examination
Third-order Polynomial
Wei Jiang 37
343
232
3121
200
01233
01232
01231
01230
33
2210
3128
16344341
33B
nb
Bn
b
BBn
b
BBn
b
SSSSBSSSSBSSSSBSSSSB
xbxbxbby
General Oral Examination
Adaptive Polynomial Fitting• Dynamically choose polynomial degree• Low-order polynomial
– Simple to design and implement– Less area and performance overhead– Large fitting error
• High-order polynomial– Better fitting results– More coefficients to store– Much more complicated polynomial
evaluation circuitry design and heavy area and performance overhead
Wei Jiang 38General Oral Examination
Test and Calibration of On-Chip DAC
BIST CONTROL
DACunder-test
1st-order 1-bit ΣΔ Modulator
LPFDigital Filter
Ramp code generator
Characteristics analysis
Pass/fail indicator
Offset,Gain,2nd and 3rd harmonic distortion
Coefficientsfor polynomial evaluation
14
ΣΔ ADC
Polynomial evaluation
Dithering DAC
Wei Jiang General Oral Examination 39
Test and Calibration of On-Chip ADC
ADCunder-test
DACunder-test
Polynomial Fix
Polynomial evaluation
Dithering DAC
coefficients
BIST CONTROL
Pass/fail indicator
Offset,Gain,2nd and 3rd harmonic distortion
Coefficientsfor polynomial fit
Ramp code generator
Characteristics analysis
14
14
Wei Jiang General Oral Examination 40
General Mixed-Signal Test• Variation-tolerant design• Digital controlled BIST• Digitalized TPG/ORA• Self-testable measuring components• Characterization of device-under-test by
DSP• Faulty circuitry determined by
characterized parameters• Coefficients of output fix/correction signals
calculated by DSPWei Jiang 41General Oral
Examination
Outline• Overview• Background• Built-in Test and Calibration Approach• Current Progress• Future Work• Conclusion
42Wei Jiang General Oral Examination
Publications• W. Jiang and V. D. Agrawal, “Built-In Test and Calibration of DAC/ADC Using A Low-Resolution Dithering DAC,” NATW’08, pp. 61-68.
• W. Jiang and V. D. Agrawal, “Built-in Self-Calibration of On-Chip DAC and ADC,” ITC’08, paper 32.2.
• W. Jiang and V. D. Agrawal, “Built-in Adaptive Test and Calibration of DAC,” NATW’09, pp. 3-8.
• W. Jiang and V. D. Agrawal, “Designing Variation-Tolerance in Mixed-Signal Components of a System-on-Chip,” ISCAS’09, pp. 126-129.
Wei Jiang 43General Oral Examination
Progress• Presenting a novel approach to test and
calibration DAC/ADC• Presenting a method to dynamically
determine the order of curve fitting polynomial for INL errors
• Proved by Matlab simulation theoretically
• Applicable for digitally controllable mixed-signal devices
Wei Jiang General Oral Examination 44
Simulation of DAC Test
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• 14-bit DAC• 16K ramp
codes• INL error up
to ±1.5LSB
Indices of 14-bit DAC-under-test
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Simulation (Cont.)
General Oral Examination 46
• Fitting results by different order polynomial
Indices of 14-bit DAC-under-test
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Best-matching Polynomial
General Oral Examination 47Wei Jiang
Fitting Algorithm• Third-order polynomial fitting
algorithm• Adaptive polynomial fitting algorithm• Determination of best matching
polynomial degree
Wei Jiang 48General Oral Examination
Measuring ADC / Dithering DAC• Measuring ADC
– First-order 1-bit Sigma-Delta ADC– Higher-order multi-bit Sigma-Delta ADC– Non-Sigma-Delta ADC– Digital low-pass filter
• Dithering DAC– Binary weighted DAC
Wei Jiang 49General Oral Examination
Current Tasks• Modeling and hardware verification
of proposed testing approach• Programming of third-order
polynomial fitting algorithm• Implementation and optimization of
digital polynomial evaluation circuit• Design and verification of the whole
test and calibration systemWei Jiang General Oral
Examination 50
Outline• Overview• Background• Built-in Test and Calibration Approach• Current Progress• Future Work• Conclusion
51Wei Jiang General Oral Examination
Future Tasks and Schedule• Testability of measuring ADC (~2 months)• Best matching polynomial (~2 months)• At-speed characterization (~1 month)• Dynamic Element Matching (~1 month)• Other testing techniques (~2 months)• Dissertation and defending (~2 months)
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Testability of Measuring ADC• Measuring ADC must be self-testable• Testability of Sigma-Delta modulator• Problem
– Using digital circuitry and DSP to test analog circuitry
– Measuring ADC must tell faulty or healthy by itself
– Test of measuring ADC must be done before test of all other mixed-signal components
Wei Jiang 53General Oral Examination
Best Matching Polynomial• Degree determination of best
matching polynomial• Problem
– Find cut-off degree of INL errors– Higher-order polynomial brings heavy
hardware overhead– Lower-order polynomial gives more
fitting error
Wei Jiang 54General Oral Examination
At-Speed Characterization• An approach to utilize idle time of DSP to
re-calibrate mixed-signal devices• Performance of analog components varies
by environment, i.e. temperature, usage time
• Characterization during boot time may be inaccurate and need continuous revision during its lifetime
• Dynamic re-characterization of mixed-signal devices may reflect real condition of the devices and generate better results
Wei Jiang 55General Oral Examination
Dynamic Element Matching (DEM)• Reduce non-linearity error of DAC/ADC• Fault-tolerant for analog elements• Approaches
– Dynamically change/rotate matching elements to generate desired outputs for specific inputs
– Reduce non-linearity of mismatching elements
• Disadvantage– Output pattern issue for low-order matching
algorithm– Requiring high-speed clock
Wei Jiang 56General Oral Examination
Other Things…• Frequency response test• Noise test and removal• Delay test• Single-tone and multi-tone test
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Outline• Overview• Background• Built-in Test and Calibration Approach• Current Progress• Future Work• Conclusion
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Conclusion• A post-fabrication built-in test and calibration
approach for mixed-signal devices is proposed• This approach relies on digital circuitry and DSP for
TPG/ORA and BIST control• Digital circuitry is testable by conventional digital
testing approaches and therefore guarantee the testability of analog circuitry
• The approach has been applied to test of DAC/ADC• The same idea can be widely used for other
digital-controlled mixed-signal devices• Calibration on mixed-signal devices will
significantly reduce defects, improve die yield and lower manufacturing cost
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Q&ATHANKS
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