broad-band mos v pn cross-calibration study

XMMEPICMOS

Steve Sembay ([email protected])EPIC Calibration MeetingRingberg 2-5/April/2002

Broad-Band MOS v PN Cross-Calibration Study8 Observations of 4 BL Lacertae Objects

MOS - SAS 5.3 (development version) event files

Pattern 0-12 (all X-ray) selected events

MOS Q20 and Q21 response matrices

CCF and LUX PSF correction

PN - Jan02 MPE processed events files

Pattern 0-4 (singles + doubles) selected events

PN - Nov01 (FF) and Jan02 (SW) response matrices

CCF PSF correction

Pile-up events excluded by pattern ratio analysis

XMMEPICMOS


Object Rev Annulus Mode M1 Filter M2 Filter PN Filter

MS0737 0063 0-26 FF Thin Thin Thin

MS1229 0082 0-44 FF Thin Thin Thin

Mrk 421 0165 8-44 SW Medium Medium Thick

Mrk 421 0171 18-44 SW Medium Medium Thick

Mrk 421 0259 18-44 SW Thin Thin Thin

PKS 2155 0362 15-40 SW Medium Medium -

PKS 2155 0362 15-40 SW Thick Medium -

PKS 2155 0362 15-40 SW Thin Medium Medium

Observation Summary

XMMEPICMOS


Analysis Method:Define non-piled-up annulus from MOS1 data (use same for MOS2, pn).

Generate appropriate arf correction files.

Extract source and background spectra (although background mostly

negligible) in the 0.2-10 keV band.

Fit phabs * bknp model to MOS2 data…fold model through MOS1,

MOS2 and pn instrument response.

Fit phabs * bknp model to pn data…fold model through MOS1,

MOS2 and pn instrument response.

Examine DATA/MODEL ratio plots for trends.

Examine best-fit model parameters to instruments fitted individually.

XMMEPICMOS


+5%

-5%

+20%

-20%

Ratio Plot:

DATA/MODEL

MOS1

MOS2

PN

Smoothed:

MOS1

MOS2

PN

+20%

+5%

-5%

-20%

XMMEPICMOS


Effect of Q20 to Q21

PKS2155 0362 15-40 SW Med/Med CCF-PSF

Q20 Q21

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Calibration of MOS1 Thick Filter

PKS2155 0362 15-40 SW Thick/Med

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MS0737 0063 0-26 FF Thin/Thin/Thin MS1299 0082 0-44 FF Thin/Thin/Thin

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Mrk 421 0259 18-44 SW Thin/Thin/Thin

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PKS2155 0362 15-40 SW Thin/Med/Med

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Mrk421 0165 8-44 SW Med/Med/Thick Mrk421 0171 18-44 SW Med/Med/Thick

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0-26ThinThinThin

8-44MedMedThick

15-40MedMed

15-40ThinMedMed

18-44MedMedThick

18-44ThinThinThin

Trends due to PSF ?

--- CCF-PSF Corrected

XMMEPICMOS


8-44

15-40

18-44

CCF PSF LUX PSF

Comparison of CCF and LUX PSF correction

XMMEPICMOS


Q20 - Q21 increases relative difference between model fits to MOS1 and MOS2 data in the high energy band.

Q21 residuals better than Q20 in 2-3 keV band.

Both MOS and PN show consistent residual features at different energies indicating narrow band calibration problems.

MOS1 Thick filter calibration is incorrect.

Energy correction due to PSF creates an increasing discrepancybetween MOS1 and MOS2 as extraction radius increases.

There is a systematic broad band difference between MOS and PNwhich is independent of Mode/Filter/Extraction radius.

Interim Conclusions

What do the spectral parameters tell us ?

XMMEPICMOS


Spectral Fit Parameters:

Mrk 421 NH = 1.6e20 z = 0.031

PKS 2155 NH = 1.36e20 z = 0.116

MS 0737 NH = 3.2e20 z = 0.315

PN Thick 0.89 (0.15) 1.77 (0.04) 0.69 (0.01) 2.59 (0.01) 1.37/1191

MOS2 Med 1.33 (0.15) 2.37 (0.02) 1.82 (0.11) 2.55 (0.03) 1.39/404

PN Med <0.25 2.09 (0.05) 0.73 (0.02) 2.82 (0.02) 1.38/720

MOS2 Med 1.36 (0.25) 2.66 (0.04) 1.59 (0.20) 2.90 (0.05) 1.22/266

PN Thin 3.60 (0.07) 1.63 (0.20) 0.64 (0.05) 2.35 (0.03) 0.99/475

MOS2 Thin 4.92 (0.10) 2.21 (0.05) 1.72 (0.90) 2.25 (0.05) 1.08/165

NH Γ1 EB Γ2 χ2υ

broad-band mos v pn cross-calibration study

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