baeg, sanghyeon reliable & high speed computing lab. hanyang university
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Baeg, SanghyeonReliable & high Speed Computing Lab.
Hanyang University
External MemoryExternal Memory
SensorsSensorsMicro Controller
Micro Controller
Communication
device
Communication
device
Power SourcePower Source
Energy is typically more limited in sensor Energy is typically more limited in sensor networks than in other wireless networks networks than in other wireless networks because of the nature of the sensing devices because of the nature of the sensing devices and the difficulty in recharging their power and the difficulty in recharging their power sources.sources.
Power consumption in the sensor node is Power consumption in the sensor node is for the Sensing, Communication and for the Sensing, Communication and Data Data Processing.Processing. Ex) monitoring or at detecting phenomena. Ex) monitoring or at detecting phenomena.
Examples include office building Examples include office building environment control, wild-life habitat environment control, wild-life habitat monitoring, etc.monitoring, etc.
More energy is typically required for More energy is typically required for data communication in sensor node. data communication in sensor node. Energy expenditure is less for sensing Energy expenditure is less for sensing and data processing.and data processing. The energy cost of transmitting 1 Kb a The energy cost of transmitting 1 Kb a
distancedistance of 100 m is approximately the same as that of 100 m is approximately the same as that for for the executing 3 million instructions by 100 the executing 3 million instructions by 100 million million instructions per second/W processorinstructions per second/W processorLOW
POWER!!
IC should perform in accordance with IC should perform in accordance with expectations for a predetermined expectations for a predetermined period.period.
Sudden death of sensor nodes cost Sudden death of sensor nodes cost replacing and management efforts.replacing and management efforts.
Sensor nodes are typically exposed to Sensor nodes are typically exposed to extreme environmental situations such extreme environmental situations such as temperature changes, weathers, as temperature changes, weathers, animals.animals.
Mission critical sensor nodes needs high Mission critical sensor nodes needs high probability of surviving through self-probability of surviving through self-guarding/guarding/diagnosis features.diagnosis features.
RELIABILITY!!
Power reduction for memories used in Power reduction for memories used in sensor networksensor network
Research for cross talks in memory Research for cross talks in memory cellscells Increasing memory density and
decreasing technology geometry Increasing capacitive cross talks
Reduced reliability because of additional power consumption and noise paths Becomes the source of intermittent failure Crosstalk in marginal size is not detected by normal test Increasing costs for test Test method using negative voltage stress Testable method with low cost
Analysis for High-speed Interface IssuesAnalysis for High-speed Interface Issues
Chip Schematic & Test ResultChip Schematic & Test Result
Micro Processor(8051) as underlying uPMicro Processor(8051) as underlying uP Implement Processor in FPGA as initial stage with Implement Processor in FPGA as initial stage with
reduced instruction for power savingreduced instruction for power saving
FPGA
MC8051_ALU
SIU
TMRCTR
TMRCTR
SIU
CONTROL
RAM(128X8)
ROM(64KX8)
RAM(64KX8)
Customized IP Design is beneficial in low power design by Customized IP Design is beneficial in low power design by reducing unnecessary capacitance in design.reducing unnecessary capacitance in design.
Equipment for development and testingEquipment for development and testing
Logic AnalyzerFunction GeneratorBER TesterOscilloscopePower Supply
Logic AnalyzerFunction GeneratorBER TesterOscilloscopePower Supply
FPGA Board
for Development & Testing
FPGA Board
for Development & Testing
Chip Test
Board(Interconnection
Testing Board)
Chip Test
Board(Interconnection
Testing Board)
Memory Test BoardMemory Test Board
In the second year of sensor hardware In the second year of sensor hardware nodesnodes
Focused on development in low power Focused on development in low power and reliable sensor node systemand reliable sensor node system
Currently focusing on IP developmentCurrently focusing on IP development Will be moving to FPGA system Will be moving to FPGA system
developmentdevelopment Eventually, single chip solutionEventually, single chip solution
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