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Automotive Test SolutionsE-band Radar、MEMS and Wireless Charging Component Test OverviewE-band雷達、微機電系統及無線充電測試簡介

Kenny Liao

Senior Project Manager

AEO, Taiwan

2016/03/16

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Automotive Applications

Automotive Radar

CTD Automotive Test Solutions 2

High power impedance

In-Vehicle Mobile Device

Charging (WPT)

MEMS Sensors

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• Component Evaluation• MEMS Sensors

Automotive Solutions

3

Automotive RadarSemiconductor / Components Connected Car

• Wireless Power Transfer (WPT)

Analysis SW

• ENA Option TDR• E5052B Signal Source

Analyzer (SSA)

• mmWave Vector Network Analyzer

• Impedance Analyzers / LCR Meters

CTD Automotive Test Solutions

• Automotive Ethernet

• In-Vehicle Mobile Device Charging

(WPT)

• EMC

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What is a MEMS device?

MEMS Production Test Challenges

MEMS: Micro Electro Mechanical Systems

4

• MEMS is a miniaturized device that contain components of minute dimensions

(on the order of micometers) that work as a system

• Usually a system consists of one or more sensors, actuators, and control

electronics on a chip

• MEMS devices are energy transducers: they take mechanical or chemical

energy and transform it into electrical energy

• Some common applications include accelerometers, gyroscopes, and

microphones

Movable

Parttransducer

Electronic

Circuit

External

Circuit

MEMS ASIC

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MEMS Applications

MEMS Production Test Challenges 5

(noise cancellation and

voice recognition)

(motion sensing)

(ESC, airbag)

(TPMS)

(GPS)

“MEMS shipments on 28.4% CAGR,

says Semico” (July 8, 2015)

http://www.electronics-

eetimes.com/en/mems-shipments-on-

28.4-cagr-says-semico.html

"MEMS are growing in part as they

replace conventional non-MEMS

sensors in automotive and industrial

applications. Accelerometers and

microphones will account for the bulk of

these shipments."

http://www.electronics-eetimes.com/en/mems-shipments-on-28.4-cagr-says-semico.html

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Pressure Sensor Accelerometer

Piezoelectric

Capacitive

MEMS Devices


Piezoelectric element

detect capacitance change

6

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MEMS DevicesSilicon Microphone


detect capacitance change

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MEMS CustomersTypical Customers


Automotive MEMS Silicon Microphone

Packaged Suppliers Bare Die Suppliers

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Test Challenges

• Low yield, because MEMS technology

involves working with very precise structures

which are fragile and many failure parts are

integrated into final packages

• Low throughput, because devices are tested

with mechanical stimulus (such as pressure

and acceleration)

• Low repeatability, because the stability of

mechanical stimulus is difficult to control

Solutions


• Use high speed tester

• Minimize the mechanical test, by

screening with on-wafer electrical test

• Use high accuracy tester

• Test as early as possible (on-wafer) to

lower production cost

• Use high repeatability tester

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Lowering Production Cost in Mass Production


Stop bad dice before packaging to lower production cost

10

Testing as early in the process as possible is key to

lowering production cost

30 40 50 60 70 80 90 1005

10

15

20

25

30

35

40

with test

without test

pri

ce

of

go

od

co

mp

on

en

t

Yield/%

Production price per good component as a

function of the yield

Cost after dicing is about 80%

MEMS wafer Die

Dicing Packaging

Packaged

Device

ShipFinal

Test

CMOS

On-wafer testing effectively lowers production cost

Source: MEMUNITY www.memunity.org/on-wafer_testing.htm

http://www.memunity.org/on-wafer_testing.htm

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Lowering Production Cost in Mass Production


On-wafer electrical tests results in faster, more accurate, and more repeatable results

11

On-wafer

Test

MEMS wafer Die

Dicing Packaging

Packaged

Device

ShipDie

TestFinal

Test

Process

Feedback

Process feedback is key to

lowering production cost.

CMOS

C-V test

E4980A LCR Meter

Leakage test

B2980A High Resistance Meter

Frequency response test

E4990A Impedance Analyzer

Micro-machining Verification

Measure the resistance between

the mass/membrane and the

frame. Well micro-machined chips

shows high resistance.

Static Performance

Sweep DC bias between the

electrodes and measure the

capacitance (C). The C-V curve is

a good measure of the static

mechanical performance of the

mass/membrane.

Dynamic Performance

Apply fixed DC bias between the

electrodes and measure the

impedance (Z). The Z is the

combination of the mechanical

impedance of the mass/membrane

and the C between the

mass/membrane and the frame.

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Test Challenges

• Low yield, because MEMS technology

involves working with very precise structures

which are fragile and many failure parts are

integrated into final packages

• Low throughput, because devices are tested

with mechanical stimulus (such as pressure

and acceleration)

• Low repeatability, because the stability of

mechanical stimulus is difficult to control

Solutions


• Use high speed tester

• Minimize the mechanical test, by

screening with on-wafer electrical test

• Use high accuracy tester

• Test as early as possible (on-wafer) to

lower production cost

• Use high repeatability tester

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DC Bias Voltage

Capacitance

C0

1.5C0

0

Capacitive MEMS Sensor Electrical Performance TestStatic Performance

Displacement

Capacitance

C0

1.5C0

0

Movable

electrode

Spring

Displacement

Damper

Mass

Capacitance

change

Fixed

electrode

Electrostatic

attraction

DC bias

voltage

Movable

electrode

Spring

Displacement

Damper

Mass

Capacitance

change

Fixed

electrode

Electrostatic

attraction

DC bias

voltage


Capacitance-Voltage (C-V) measurement

Static physical input replaced by DC voltage bias sweep and

the electrostatic capacitance is measured, which is

equivalent to the static mechanical characteristic.

Faster and more accurate

physical stimulus

electrical stimulus

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E4980A LCR Meter

Capacitive MEMS Sensor Electrical Performance TestTest Considerations


Most capacitive sensors have 0.5 to 1 pF capacitance at

the neutral position.

=> Test equipment needs to be capable of measuring

electrostatic capacitance accurately in the order of 0.1 pF

The AC test signal used for capacitance measurement

may actuate the electrodes of the DUT and cause errors.

=> Test frequency should be set much higher than the

mechanical operating frequency of the device under test.

Generally, the operating frequency of the MEMS device is in

the low kHz range, so a 1 MHz test frequency is sufficient.

Capacitive sensors have hysteresis characteristics based

on the amount of electrical charge being inducted to the

electrodes.

=> Caution must be exercised for DC voltage bias sweep

measurement

σ < 1 fF

2 MHz maximum frequency

Function available to turn off

DC bias ranging

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Capacitive MEMS Sensor Electrical Performance Test Accelerometer Static Performance Example

Courtesy of Murata Electronics Oy (formerly VTI Technologies)


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Capacitive MEMS Sensor Electrical Performance TestDynamic Performance


Dynamic physical input replaced by AC voltage

stimulus and the impedance vs frequency profile is

measured, which is equivalent to the mechanical

characteristics.

Movable

electrode

Spring

Displacement

Damper

Mass

Fixed

electrodeDC bias

voltage

AC Stimulus

Movable

electrode

Spring

Displacement

Damper

Mass

Fixed

electrodeDC bias

voltage

AC Stimulus

Model of the movable part of the electrode

(Electrostatic capacitance representing the electrode displacement)

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Capacitive MEMS Sensor Electrical Performance TestTest Considerations


DC bias voltage function up to

40 V

Equivalent circuit analysis

function enables quick-and-

easy analysis of both dynamic

performance and electrostatic

capacitance evaluation

The movable part being driven by the AC voltage has

electrostatic force between the electrodes which may

cause measurement error.

=> Apply DC bias voltage to the AC test signal. When the

amplitude of the AC voltage is adequately smaller than that of

DC bias voltage, the error is negligible.

The measured impedance profile has both impedance

representing the dynamic performance and the

electrostatic capacitance representing the electrode

displacement.

=> Subtract the electrostatic capacitance to determine the

dynamic performance of the device itself.


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Additional ResourcesWebsites

• MEMS Application Portal http://www.keysight.com/find/mems/

• LCR Meters and Impedance Measurement Products http://www.keysight.com/find/impedance/

Brochure

• Accelerate Your MEMS Device Development and Manufacturing Efficiency Using Best-In-Class Impedance

Test Instruments Brochure (5989-7517EN)

Application Notes

• Impedance Measurement Handbook (5950-3000)

• MEMS On-wafer Evaluation in Mass Production (5989-7691EN)

• Accurate Evaluation of MEMS Piezoelectric Sensor and Actuator using the 4294A (5989-6516EN)

• Characterizing MEMS Magneto-Impedance Sensor using the Keysight Impedance Analyzer (5989-6517EN)

• Improving the Test Efficiency of the MEMS Capacitive Sensor using the E4980A (5989-6518EN)

• Characterizing Electromagnetic MEMS Optical Switch Actuator using the E4980A (5989-6519EN)

• Characterizing Electromagnetic MEMS Optical Scanner using the E4980A (5989-6520EN)

• Improving Test Efficiency of MEMS Electrostatic Actuator using the E4980A (5989-6521EN)

• Accurate Impedance Measurement with Cascade Microtech Probe System (5988-3279EN)

• Evaluation of MOS Capacitor Oxide C-V Characteristics Using the Agilent 4294A (5988-5102EN)


http://www.keysight.com/find/mems/

http://www.keysight.com/find/impedance/

http://literature.cdn.keysight.com/litweb/pdf/5989-7517EN.pdf

http://literature.cdn.keysight.com/litweb/pdf/5950-3000.pdf










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On-Wafer MEMS Sensor Test


Lower your production costs with electrical test solutions

PC

Probe

Station

Switch Matrix

C-V Test

E4980A LCR Meter

Leakage Test

B2985A High Resistance Meter

Frequency Response Test


Probe Card

19

Test Station

Device

• Best-in-class accuracy (0.05%)

• Superb repeatability (σ<1fF)

• 40 Vmax built-in DC voltage source

• Fast (typically 5x faster than 4284A)

• 10 PΩ (10x1015Ω) measurement range

• High stability

• Fast (20,000 readings/s)

• ±40 Vmax built-in DC voltage source

• Resonance/Anti-Resonance, Q-Factor

Evaluation

• Equivalent Circuit Analysis

www.keysight.com/find/mems/

http://www.keysight.com/find/mems/

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Automotive Component Test Solutions

20



Analysis SW


Analyzer (SSA)






(WPT)

• EMC

mmW Component Evaluation for Automotive Radar

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Oscillator Phase Noise MeasurementE5052B Signal Source Analyzer (SSA)• Oscillator phase noise affects the clarity of the target

• Measure CW phase noise of automotive radar oscillator

• Ability to measure unstable oscillators, which can not be measured on a spectrum

analyzer

76 GHz Oscillator Phase Noise Measurement


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Automotive Radar Component TestingAnalog / Microwave Component Test

MM Tx

MM Rx

DAC AMP

AMPADC

VCO

LPF

AMP

LNA

Millimeter Section

AMP

Analog Section

Xn

23

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Automotive Radar Component Testing

Flexible signal routing

• Internal signal combiner

• Use for IMD, Hot S22, phase versus drive measurements

• Easily switch between one and two source measurements

• Front panel jumpers to access couplers and receivers

• Add high-power components for power amplifier

measurements

• Add reference mixer for mixer/converter measurements

• Rear-panel signal routing with mechanical switches

• Add signal-conditioning hardware like filters, amplifiers

• Add other test equipment to extend suite of measurements

Key Features Enabling Testing

24

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Automotive Radar Component TestingSingle Connection Multiple Measurements

Ch1: S-parameters

Ch6: Pulse profile

Ch3: Gain compression

Ch2: Two-tone IMD

Ch4: Noise figure

• Internal signal combiner (IMD, Hot S22, phase versus drive)

• Front panel jumpers to access couplers and receivers (power

amplifier, mixer)

• Rear-panel signal routing (signal-conditioning, other test

equipment)


PageAgenda

• Automotive Component Testing

• Analog / Microwave Component testing

• Solutions For Millimeter wave Component Testing

26

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Automotive Radar Component Testing

Millimeter Wave Component Testing

Millimeter wave Devices Millimeter wave Measurements

• Passive Devices

• Amplifiers

• Mixers

• Semiconductors

• Antennas

• Materials

MM Tx

MM Rx

DAC AMP

AMPADC

VCO

LPF

AMP

LNA

Millimeter Section

AMP

Analog Section

Xn

• S-Parameters (N-Port,Differential )

• Absolute power

• Gain compression

• Pulsed measurements

• Material parameters

• Time domain

27

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Network Analyzer is the measurement engine.

Optional Test Set Controller interfaces to modules

THz Frequency Extenders provide frequency conversion and signal coupling

HUAWEI Presentation

Automotive Radar Component testing

Vector Network Analyzer

Millimeter Wave Test Set controller

Frequency

Extenders

Device under test

Frequency

Extenders

Frequency

Extenders

Frequency

Extenders

Millimeter Wave Solution Architecture

28

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• Single-sweep over 10MHz-110GHz

• 2-port & 4-port options

• Uses 67GHz PNA-X

• Interface = 1mm coax

• Features

• Bias Tees

• Power leveling

• True differential drive

• Pulse measurements

• Mixer measurements

Automotive Radar Component TestingBroadband 10 MHz to 110 GHz Solution

29

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Automotive Radar Component testing Example Banded Millimeter Wave Solutions

PNA / PNA-X Banded Waveguide

Solution With Test Set Controller

Banded Waveguide solution Without

Test Controller

• Interfaces to WinCal to provide S-

Parameter and Power Cal

• Receiver levelling allows for

controlled power applied to DUT

at the probe tip

• Ability to make a single

connection measurement of on-

wafer components.

• Four port configuration for support

of True Mode measurements of

differential components.

30

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Automotive Radar Component testing Application Example for 77 GHz Automotive Component test

G

S

G

S

G

G

S

G

S

G

IN

GSGSG

100um

OUT

GSGSG

100um

V1

GSGSG 150um

V2

V3 V4

GSGSG

150um

RF

GSGSG

100um

OL

GSGSG

100um

PPGPP 100um

(Z-probe)

DC

GSGSG 100um

80 GHz Power Amplifier 80 GHz Mixer

31

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(WPT)

• EMC


CTD Automotive Solutions

32



Analysis SW


Analyzer (SSA)




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• BroadR-Reach is an Ethernet PHY standard

designed for use in automotive connectivity

applications. BroadR-Reach enables 100 Mbps data

transmission over one unshielded twisted pair

• The OPEN Alliance SIG is a special interest group

formed to establish BroadR-Reach as an open

standard.

Automotive Ethernet


BroadR-Reach - Optimized for a broad spectrum of ADAS and infotainment applications

33

Why single pair?

Cable harness is 3rd heaviest and 3rd most costly

component (behind engine and chassis)

•Reduces connectivity costs up to 80%

•Reduces cabling weight up to 30%

Source: CFI 1 Twisted Pair 100 Mbit/s Ethernet (1TPCE)

http://www.ieee802.org/3/cfi/0314_2/CFI_02_0314.pdf

http://www.ieee802.org/3/cfi/0314_2/CFI_02_0314.pdf

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BroadR-Reach PHY Compliance Solutions


Link Segment Test Solution

34

TDR

Scope

Vector

Network

Analyzer

(VNA)

Frequency Domain

•Insertion Loss (Sdd21)

•Return Loss (Sdd11)

•Mode Conversion (TCT,

TCTL)

•Alien Crosstalk

(PSANEXT, PSAACRF)

BroadR-Reach link segment testing requires parametric measurements in both time and frequency

domains.

Traditional Solution New Solution

ALL parameters can be

measured with

ENA Option TDR

Time Domain

•Characteristic Impedance

(TDR)

One-box solution

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(WPT)

• EMC


CTD Automotive Solutions

35



Analysis SW


Analyzer (SSA)




Wireless Power TransferTest Solution Overview

Agenda

• WPT Introduction and Market Trends

• Visualize WPT Coupling Efficiency with the ENA Series Network

Analyzer

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What is Wireless Power / Charging?

38

Wireless power transfer (WPT) is the transmission of electrical power from a power

source to a consuming device without using discrete manmade conductors. It is a

generic term that refers to a number of different power transmission technologies

that use time-varying electromagnetic fields.

(Source: Wikipedia https://en.wikipedia.org/wiki/Wireless_power)

Wireless Power Transfer

https://en.wikipedia.org/wiki/Wireless_power

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Wireless Power Transfer (WPT) Market Overview

• WPT market will increase

3x in revenue to $8.5B in

2018

• Market growth driven by

mobile terminals with 4x

growth in number by 2018

• Challenge: there are

currently conflicting

standards and multiple

alliances which are not

interoperable => multi-

mode solutions

forecast

forecast

Wireless Power Transfer 39

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Wireless Power Transfer (WPT) Market OverviewIn-Vehicle Mobile Device Charging

40

http://www.dbusiness.com/daily-news/Annual-2014/Visteon-Debuts-

Wireless-Charging-on-2015-Cadillac-ATS/

http://toyotanews.pressroom.toyota.com/releases/toyota+2013+avalon+fi

rst+qi+wireless+charging+dec19.htm


http://www.dbusiness.com/daily-news/Annual-2014/Visteon-Debuts-Wireless-Charging-on-2015-Cadillac-ATS/

http://toyotanews.pressroom.toyota.com/releases/toyota+2013+avalon+first+qi+wireless+charging+dec19.htm

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What types of wireless power transfer technologies exist?


Inductive (tightly coupled – requires

precise alignment)

Magnetic Resonance (loosely coupled –

allows spatial freedom)

Overview

Frequency 10 kHz to several 100 kHz Several 100 kHz to several 10s of MHz

Transmit power Several W to several kW Several W to several kW

Transmit distance Short (Z: “mm”) Mid (Z: “cm”)

Efficiency 70 to 90% 40 to 60%

Cost Lowest Fair

Device placement flexibility No (* multi-coil designs only, which add cost) Yes

• Existing solutions are predominantly built

on inductive or magnetic resonance

technology

• Power efficiency is key parameter

• Lower efficiency of magnetic resonance

offset by better user experience

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Standard Bodies

WPC PMA A4WP

Logo

(Qi) (Power 2.0) (Rezence)

Technology Inductive Inductive Magnetic resonance

Frequency100 ~ 205 KHz

80 ~ 300 kHz205 ~ 300 KHz 6.78 MHz

Communication SystemIn-band load modulation

(bi-phase modulation)

In-band load modulation

(pulse frequency modulation)Bluetooth (BLE)

Max. Power Transfer

15 W (Low)

120 W (Medium)

2 kW (High)

5 W 70 W

Max. Transfer Distance 5 mm 50 mm

# of Device Charging Single Multiple

Key MembersPhilips, TI, Logitech, Fulton,

SANYOIEEE, Powermac, P&G

Broadcom, Qualcomm, Intel,

Samsung, Witricity

Members 216 companies 68 companies 124 companies

Wireless Power Transfer (WPT) Standards

• PMA & A4WP merged in Jun-15, announced new name “AirFuel Alliance” Nov-15

• WPC currently working on magnetic resonance spec


http://www.wirelesspowerconsortium.com/

http://www.powermatters.org/

http://www.a4wp.org/index.html

http://www.powermatters.org/index.php?option=com_content&view=article&id=72&Itemid=117

http://www.powermatters.org/index.php?option=com_content&view=article&id=72&Itemid=117

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Keysight Taiwan WPT Forum (Sep 22, 2015)

12:40~13:20 報到暨展攤交流.

13:20~13:30 歡迎詞及簡介.

13:30~13:55 Qualcomm® WiPower™ Technology

Qualcomm, Jack Chen

13:55~14:20 PTU and PRU Design Challenges

iCirround, Boson Chuang

14:20~14:45 Overview of Wireless Charging Technologies

Gotrend, Benson Wang

14:45~15:10 Wireless Charging Turnkey Test Solutions

Keysight, Hidekazu Manabe

15:35~16:00 Multi-mode Wireless Charging Solutions

NXP, Rebecca Chen

16:00~16:25 Wireless Charging Applications and Markets

Avnet, Andy Yang

16:25~16:50 WPC Overview and Certification Process

SGS, Leo Hsu

16:50~17:15 Introduction of MR Technology and Standard

ETC, Roy Lin


Agenda

• WPT Introduction and Market Trends

• Visualize WPT Coupling Efficiency with the ENA Series Network

Analyzer

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• PTU Output Impedance => Z ≠ 50 Ω

• PRU Impedance => ZL=R+jX

• Measurement System => 50 Ω

• Different impedances…

• What is the voltage?

current? efficiency?

WPT Measurement Challenges

45

PTU (Power Transmitter Unit)

Output Z ≠ 50 Ω

PRU (Power Receiver Unit)

Arbitrary load impedance ZL=R+jXLC resonant circuit

Measure in 50 Ω environment

DC

Supply

Rectifier

Load


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Wireless Power Transfer Coupling EfficiencyOption 006 Wireless Power Transfer Analysis Software

46

Note:

• Available on E5072A / E5061B / E5063A with Win7 OS

• Not applicable for E5061B Options 1x7/2x7 (75 ohm) and 1x5 (T/R)

• Supports RCE measurements (specified by A4WP)

Port1 Port2

Device Under Test

LoadZ(Ω)=R+jX*Defined

by userMeasured

S-parameter(S11,S21,S12,S22)

Iin(A)

Vout(V)

Iout(A)

Vin(V)*Defined

by user

Pin Pout

Efficiency(%)=Real(Pout)/Real(Pin)x100

Zin(Ω)

Option 006 provides real-time analysis of voltage, current, and power transfer

efficiency of Wireless Power Transfer (WPT) coils and resonators, from 50 ohm S-

parameter measurements.


• Intuitive WPT parameter display,

based on arbitrary load impedance

• Real-time power transfer efficiency

analysis

• Advanced 2D/3D simulation for

efficient determination of optimum load

impedance

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Option 006 Wireless Power Transfer Analysis

47

Modes of Operation

Source voltage and

load impedance can

be user defined

Display real-time measurement results of

power transfer efficiency. Resonator Coupling

Efficiency (RCE) measurements available.

Display simulated results in 2D/3D by

sweeping one or two of the following

parameters:

･ R

･ X

･ Frequency

Useful for R&D engineers to evaluate the

load impedance dependency.

Mode-1: Real-time analysis Mode-2: Advanced 2D/3D simulation

Measures up to four parameters at the same time

Select parameters for

analysis, including.

coupling efficiency.

Maximum power transfer efficiency


Page

Power Receiver (Rx)

Power Transmitter (Tx)

VNA Test Items in WPT System

48

Power

Inverter

Power

Amp

Matching

CircuitTx Coil

Rx CoilRectifier,

DC-DCLoad

Coupling Efficiency

(Tx & Rx Coils/Resonators)

Loop Gain, Output Z

(DC-DC Converter)

S-parameters

(S11, S22, S21)

(High Power Amp)

Impedance (R, X)

(Matching Circuit,

Tx Coil/Resonator and Rx

Coil/Resonator including Load)

Impedance(R, X),

Inductance (L), Q

(Coils/Resonators)

Coupled Coils/Resonators

Compliance Test Requirements

Component Characterization

(provides additional value for R&D)

Capacitance (C)

(Matching Circuit)

Impedance(R, X),

Inductance (L), Q

(Coils/Resonators)


Page

A4WPSpec Documents & Working Committees(WC)

49

Baseline System Spec (BSS)

Conformance Test Spec

Interoperability Test Spec (IOT)

ApplicationPhysical

Layer

Base Spec

Test Specs

Evaluation of PRU, PTU and BTLE

(e.g., power transfer/control, state transition, signaling)

Testing of overall system functions

(mimic real-world use cases, e.g.,

charging multi-devices, fault operation)

PTU Resonator

Acceptance Test

(RAT)

Qualification of new PTU

resonators (golden device

used in Conformance Test)

to be added into Approved

PTU Resonator List

Technical requirements for WPT systems such as behaviors and interfaces necessary for

ensuring interoperability.

RAT VNA Measurements:

4.1 RAT/ScanPattern/MinMaxX

4.2 RAT/ScanPattern/MinMaxZ21

4.4 RAT/ImpedanceBox (HPNA)

4.5 RAT/RCE

4.6 RAT/kandZ21 (informative)

4.7 RAT/QandL (informative)

Technology

Conformance &

Interoperability

WC (TCIWC)

Technical WC

(TWC)

Resonator

Administration WC

(RAWC)

PTU: Power Transmitting Unit


Page

RAT HPNA Measurement4.6 RAT/ImpedanceBox

50

E5072A

This test characterizes the range of reflected Impedance to the PTU Resonator by

all valid RITs (approved Rx devices)


Page

RAT TestingMethod of implementation (MOI) using Option 006

51

(Reserved for Ch1)

Ch2

2-port meas.

(MinMaxZ21*, RCE*)* Directly display above parameters

with Option 006

Ch1

1-port meas.

(MinMaxX, ImpedanceBox)

Ch3

1-/2-port meas.

(k*, Q* and L*)* Post processing is required

to calculate above parameters

Ch4


Page

Tx

Rx

Option 006 Wireless Power Transfer Analysis

Demo

52Wireless Power Transfer

Page

ENA Selection Guide for WPT customers

53

Requirements Solutions for WPT customers List Price

For compliance tests (A4WP RAT)

High-power measurements

Reflected impedance test

Coupling efficiency test• E5072A-245/006*

4.5 GHz, $44K

For component characterization

Wireless power transfer analysis

Impedance analysis

Power integrity analysis• E5061B-3L5/005/006

3GHz, $42K

Affordable solution

Wireless power transfer analysis

• E5063A-205/006

500 MHz, $15K

(*) Option 006 is optional


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Measurement Results VerificationMeasurement Setup and DUT

54Wireless Power Transfer

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Measurement Results VerificationADS Simulation Circuit

7.57 uH 1.74 uH

Efficiency

Calculation

Variables used in the circuit model are determined by actual

measurements using E4990A Impedance Analyzer.

Load Impedance:

R=10 Ohm, X=0 Ohm


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Measurement Results VerificationWPT Analysis Software (E5061B Option 006) vs. ADS

Excellent correlation!

efficiency @ 6.78 MHz

= 85.5% (E5061B Option 006)

= 85.3% (ADS)


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Measurement Results VerificationComparison among VNAs (E5072A/61B/63A)

Excellent correlation!


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Three New A4WP Application Notes Available


www.keysight.com/find/scopes-power

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Keysight InfiniiVision X-Series Oscilloscopes

Bandwidth Sample

Rate

Mem

(max)

Seg

Mem

Update

Rate

MSO

Option

Zone

Trig

Power

Option

2000X70 to 200

MHz2 GSa/s 1M Option 50k/sec 8-ch No No

3000X100 MHz to

1 GHz5 GSa/s 4M Std 1M/sec 16-Ch Yes Yes

4000X200 MHz to

1.5 GHz5 GSa/s 4M Std 1M/sec 16-Ch Yes Yes

6000X1 GHz to

6 GHz20 GSa/s 4M Std 500k/sec 16-Ch Yes Yes

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Keysight products for characterizing power supplies

B1506A Power Device Analyzer

InfiniiVision & Infiniium S-Series Oscilloscopes

PA2201A IntegraVision AC Power Analyzer

N6705B DC Power Analyzer

E5061B Network Analyzer

New!


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