augmenting legacy ate

8/8/2019 Augmenting Legacy Ate

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AUGMENTING LEGACY

AUTOMATIC TEST EQUIPMENT (ATE)

FOR FUNCTIONAL TEST USING

NXTEST TECHNOLOGY

to

JDMAG/JTEG

7 November, 2001


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Agenda

Legacy ATE Background

Functional vs Parametric Test

COSSI and NxTest Technology Demonstrated Results

Conclusions


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Legacy ATE

ATE

Stimulus1 Stimulus2Measurement1 Measurement2Processor

Serial Processing

ATE ApplicationsTest Avionics LRUs and SRUs

Detect and Isolate Failures

Legacy ATE OperationSingle Test Setups/Measurements are MadeTests are Performed Serially

One Parameter Verified at a Time (Parametric)


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What is Functional Test?

Functional Test is a test philosophy

that simulates the UUT operating

environment then verifies the unit

operates correctly in thatenvironment


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The Key to Functional Test

PARAMETRIC MEASUREMENT

(General Purpose ATE) FUNCTIONAL MEASUREMENT

UUT


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Functional Test Benefits

Reduce Cannot Duplicate (CNDs) Re-Test OK

(RTOK) etc. by testing UUTs in their operating

environment.

Leverages native diagnostics such as Built-In-Test (BIT)

Operational requirements verified. Keeps

good units out of the pipeline

Fast testing due to parallel, simultaneousstimulus and measurement


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Historic Perspective

Functional Test Shortcomings

Requires Custom Hardware

Either in test station or in adapter

Requires Custom Software

Multiple stimulus and measurement


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Functional Test System

Processor

Stimulus1

Stimulus2

Stimulus3

Measurement1

Measurement2

Measurement3

IATS

Parallel Processing

AirSim

Intermediate Avionics Test Station (IATS)Dedicated, Functional Tester for F/A-18 WRAs

Avionics Hardware Elements in the Tester

Parallel Stimulus/Measurement Capability

Fast Runtimes = User Satisfaction


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COSSI Program

A COSSI* program with the Navy addresses

the challenge of adapting new technology to

augment a legacy ATE to provide functional

test capability and offload an obsolete tester.

IATS

Functional Tester Requiring Offload

CASS

Parametric Legacy ATE

Functional = Parametric

*Commercial Operations and Support Savings Initiative (COSSI)


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COSSI Challenge

Augment an existing test station to perform

functional test using Commercial hardware and

software without sacrificing compatibility with

existing TPS Provide a structured TPS development

environment to reduce development costs

while reducing software maintenance

Develop an architecture which allows forinstrument replacement without significant

impact to TPS software


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Next Generation Test Requirements

Functional Test

Simultaneous Stimulus

and Measurement

Synthetic Instrumentation

Flexible architecture

Open architecture

industry standards

Programmable

Tumblers

COSSI

Commercial Operations

and Support SavingsInitiative

Apply commercial

equipment and standards

to existing equipment.

NxTest

Simultaneous Stimulus

and Measurement

Synthetic Instrumentation

Flexible Architecture

Open architecture

industry standards


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Functional Test/Real-Time Testing

Teradyne Analog Test Instrument (ATI) - AI-710 Tester-Per-Pin

Industrys first mixed-signal subsystem

Multiple Parallel Analog Channels:

32 Independent Channels per card and 192 total instruments Eliminates need for switching

Currently limited to low analog frequency

Simultaneous Source/Measure Capability: 6 independent instruments per channel

Function Generator (sine, square, triangle, sawtooth, etc) ArbitraryWaveform Generator

DMM

Timer/Counter

Limit Detector

Digitizer

Shared

Triggering


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ATI in CASS

Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer

Timer/CounterLimit Detector

Function GenAWG

DMM

Digitizer


Function GenAWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMMDigitizer


Function Gen

AWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMM

DigitizerTimer/CounterLimit Detector

Function Gen

AWGDMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


ATI

Current CASS

ATI ATIGPI

ATI can use:

64 pins x 6 instr/pin = 384 instruments

Current GPI uses 1 instrument at a time

Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function GenAWG

DMM

Digitizer


Function GenAWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMMDigitizer


Function Gen

AWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMM

DigitizerTimer/CounterLimit Detector

Function Gen

AWGDMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function GenAWG

DMMDigitizer

Timer/Counter

Limit Detector

Function Gen

AWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMMDigitizer


Function Gen

AWG

DMM

Digitizer

Timer/Counter

Limit Detector

Function GenAWG

DMM

Digitizer

Timer/Counter

Limit Detector


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Resource

Manager

Handler

COSSI Software Architecture

COMMERCIAL TEST EXECUTIVE

Functional Test Manager

Resource

Manager

Handler

VPP

IVI

CUSTOM

LEGACY

INSTRUMENTATION

NEW

INSTRUMENTATION

Resource

Manager

Handler

Resource

Manager

Handler


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Upgrade Kit

+ =

CASSCASS COSSI KitCOSSI Kit

ATI VXI Modules

Cables Software


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COSSI Proof of Concept

Performance Demonstration held Aug 14-15.

Build a partial ID

Currently all wire

Used for both CASS and COSSI Enabled CASS Run a representative group of tests on each

following:

IATS for benchmark

Legacy CASS

COSSI Enabled CASS


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COSSI Proof of Concept Demo

0

100

200

300

400

Run Time

UUT 1 UUT 2COSSI CASS

IATS

CASS (Projected)


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Conclusions

COSSI successfully demonstrated in a real

world situation

NxTest technology enables Functional Testwhile reducing custom hardware requirements

Those technologies can be installed into

legacy systems to provide significantperformance enhancement while maintaining

compatibility with existing test programs


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Backup


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COSSI OVERVIEWKit Benefits

Cost Reduction TPS Development

Reduced runtimes

Less time spent in integration

Less on-station time less station maintenance

Reduced ID complexity Direct connections to 96 instruments channels

Reduced switch tree/matrix requirements

Reduced ID density

Some UUT interfaces can be emulated in software

Software on PC can provide realtime feedback functions to UUT thru

Ai7

Realtime adjust to reach capability

ID circuitry not required

Enhanced debug features

Simultaneous stim/measurement on each Ai7 channel


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Functional Testing

Analog Test Instrumentation (Ai7) channels enablefaster, more effective test of UUTs

Test techniques applicable to Legacy test program*performance/diagnostic strategies

Single input, multiple outputs

Multiple inputs, single outputs

One time capture, multiple analyses of waveform

Parallel execution of independent test sequences

Diagnostic pre-fetch (capture test point data concurrent withperformance test)

*Note: These techniques can be implemented

WITHOUTAFFECTING the DIAGNOSTIC REASONING and FLOW PROCESS


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UUT Functional Testing Examples

Legacy Test Flow

3 Sequential Tests

Apply Input to A

-Measure/Verify Output 1-Measure/Verify Output 2

-Measure/Verify Output 3

Ai7 Enabled Test Flow

3 Parallel Tests

Apply Input to A

-Measure /Verify Outputs 1,2,3(simultaneously)

UUT with single input to multiple outputs

UUT

Input Output

A 1

2

3


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Legacy Test Flow

3 Sequential Tests

Apply Input to A


Apply Input to B


Apply Input to C



1 Composite Test

Apply Inputs to A, B, C

(simultaneously)

-Measure /Verify Output 1

UUT with multiple inputs to single output

1

UUT

OutputInputA

B

C


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Legacy Test Flow

3 Sequential Tests

Input to A

-Measure/Verify Output 1 AC

Voltage


Frequency

-Measure/Verify Output 1 DC

Offset


1 Measurement/3 Analyses

Input to A

-Measure Output 1

-Verify AC Voltage-Verify Frequency

-Verify DC Offset

One time capture, multiple analysis of waveform

UUT

Input Output

A 1


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Legacy Test Flow

3 Separate Sequential Tests

Input toA


Input to B


Input to C



3 Parallel Tests

Inputs to A, B, C (simultaneously)

-Measure /Verify Outputs 1,2,3

(simultaneously)

Parallel execution of independent test sequences

UUT

Inputs Outputs

A 1

B 2

C3


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Legacy Test Flow

1 Performance, 2 Diagnostic Tests

Input to A


If NOGO, Input A

-Measure/Verify Testpoint x

If NOGO, Input A

-Measure/Verify Testpoint y


1 Test captures Performance and

Diagnostic Information

Input to A

-Measure Output 1, Testpoints x & y

-Verify Output 1

If NOGO, verify Testpoint x

If NOGO, verify Testpoint y

Diagnostic pre-fetch of fault isolation data

UUT

Input Output

A 1

x

yTestpoints

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