atlas muon week in seattle 30/june/04 1 test beam of tgc electronics in 2004 introduction member...

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ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003 Preliminary Results in 2004 Plan for next beam test in Sept./Oct. this year Chikara Fukunaga (TMU)

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Page 1: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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Test Beam of TGC electronics in 2004

Introduction Member ListElectronics SetupTGC SetupOverlap problem in 2003Preliminary Results in 2004Plan for next beam test in Sept./Oct. this year

Chikara Fukunaga (TMU)

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Introduction

In June 2004 TGC electronics has been also brought into H8 and made performance test with a 25ns bunch structured muon beam (we will do again in September).

The same electronics set has been used as in 2003. The current test is to confirm the performance we have achieved last year, and test trial of the configuration database. We will bring new (almost final) electronics before September. 

Page 3: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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TGC electronics Member List for June 2004 Beam Test

IsraelY.Benhammou, E.Etzion, A.Harel, L.Levinson,D.Lellouch, R.Lifshitz, N.Lupu, G.Mikenberg, S.Schwarzmann, S.Tarem

JapanO.Sasaki et al. (> 20 people participated)

Page 4: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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TGC Test Beam Electronics Overview

TTC/CCI

Test ROD crate

Page 5: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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Electronics Setup Chamber (Triplet 32(Strip) x 24(wire), Doublet both 32 chan.)

ASD board (16ch.) x 2 PS pack PS board {8 PP (32 ch.) ASICs (Product.), 2 SLB ASICs (Proto. Version 2) , 1 DCS-PS }

x2 Hi-pT crate

Forward Type Hi-pT board (4 Hi-pT ASIC (Proto. Version 3 ~ final) x1 Proto. Star Switch (SSW) module x2 HSC

ROD crates Sector Logic for r- coincidence RODs (ROD and Test-ROD simultaneously in different crates)

TTC/CCI crate TTCvi - TTCvx CCI

Cables AWT-28 40 twisted pair cable with 10 from ASDs to PS boards Individually shielded TP Category-5 cable from PS board to Hi-pT crate 10m (ATLAS:15

m) for LVDS Optical fiber from Hi-pT crate to Sector Logic/ROD in the hut 30m (ATLAS:150m) for G-

link. DCS

Final DCS-PS board with ELMB, mezzanine on a PS board Two DCS-PS boards

The same set was used this time as one used in 2003

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T8 type chambers were used for all M1(Triplet), M2(Middle) and M3(Pivot). In 2003 We used the same type chambers for both M2 and M3 – overlap problem This year correct chamber set for M2 is used.

Trigger Electronics used was for forward type (PS-board, Hi-pT board) Channels M1 M2 M3

Wire 24 32 30 Strip 32 32 32

TGC Setup The chamber

configuration has been slightly changed

Page 7: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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7DoubletDoubletTripletTriplet

Wire Support overlap problem in 2003

M1 Triplet

M2 Middle

M3 Pivot

10cm

10cm

wire~5cm strip~4.5cmwire~5cm strip~4.5cm

~Layer6 ~Layer7

The beam was injected just on the wire support

accidentally

Page 8: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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Detection Efficiency distorted due to overlap in 2003

Chamber efficiency (Wire) Chamber efficiency (Strip)

M1 M2 M3 M1 M2 M3

Lower Efficiency due to Wire support

Lower Efficiency due to Wire support

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Trigger Efficiency distorted by overlap in 2003

Overlap of wire supports in 2 Identical chambers for

M2 and M3

Triplet Low-pT logic :2 out-of- 3, 1 out-of-2 worked fine.

Doublet Low-pT logic: 3 out-of-4 did not work because 2 ineff. chambers.

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2004 Preliminary Results (1) The trigger efficiency problem was cured this

year using correct chamber setup for doublets

High Trigger Efficiencies for both doublet strip and wire

obtained in this year

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Preliminary Results (2)HpT coincidence efficiency versus Chamber position

Green: Trigger efficiency

Red: Pt=6

Magenta: Pt=5

Blue: Pt=4

Cyan: Pt=3

Yellow: Pt=2

Black: Pt=1

Page 12: ATLAS Muon Week in Seattle 30/June/04 1 Test Beam of TGC electronics in 2004 Introduction Member List Electronics Setup TGC Setup Overlap problem in 2003

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Preliminary Results (3) Hi-pT and Sector Logic Trigger efficiencies versus PP ASIC Delay

Hi-pT Sector Logic

Previous

Current Bunch

Next

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MDT-TGC Combined Test

TGC has stable runs with MUCTPI and full readout chain, together with the MDT tracking chambers and their alignment. A trigger efficiency of 99.5% was obtained with respect to reconstructed MDT tracks.

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VERY Preliminary Result Summary

Low pT Trigger efficiency > 99.5%High pT Trigger efficiency > 98.0% (~ SL efficiency)SL output and MUCTPI input match perfectly > 99.99%Electronics components for both on- and off- detector worked

reliably, no problem.Test trial of Integration of a Condition Database worked fine.Need some more time for results of Combined Test Beam

Analysis.

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Hardware Update Plan (July and Aug.)for the Next Test Beam in Autumn

PS boards of nearly- production-version with updated SLB ASICs (proto. ver.2 to ver.4, which is final one but 1 known bug)

Production-version Hi-pT boards with production version Hi-pT ASICs (so far proto. ver.3 has been used) + Anti-fuse FPGA

Nearly-final-design SSW boards (but FPGA is conventional one, Anti-fuse one will be mounted in the final one)