ars.els-cdn.com · web viewthe roughness of the tscupc-swcnt films on glass is rms ~ 20nm with a...

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Supporting information Soluble Carbon Nanotubes/Phthalocyanines transparent electrode and interconnection layers for flexible inverted Polymer Tandem Solar cells M. Raïssi* 1a) , L. Vignau 2 , E. Cloutet 3 , B. Ratier *1 1 XLIM, UMR-CNRS 7252, University of Limoges, 123 avenue Albert Thomas, 87060 Limoges cedex, France. 2 IMS, UMR-CNRS 5218, University of Bordeaux, Bordeaux INP/ENSCBP, , 16 avenue Pey Berland, 33607 Pessac Cedex, France. 3 LCPO, UMR-CNRS 5629, ENSCBP, IPB, University of Bordeaux, 16 avenue Pey Berland, 33607 Pessac Cedex, France The morphology of the different films was characterized by tapping mode AFM, SEM and TEM. The topography and phase images of SWCNTs/TSCuPc films on glass and PET are shown in fig.S1. The roughness of the TSCuPc-SWCNT films on glass is RMS ~ 20nm with a Peak to valley Pv of 45 nm [2µmx2µm] with an approximate thickness of 30nm, and on PET is 12 nm with a Peak Valley of 23 nm. Fig.S2 and S3 show the SEM and TEM images of the SWNTs:TSCuPc. 1a) Corresponding author. Tel.: +33-625010643, E-mail address: [email protected] 1

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Page 1: ars.els-cdn.com · Web viewThe roughness of the TSCuPc-SWCNT films on glass is RMS ~ 20nm with a Peak to valley Pv of 45 nm [2µmx2µm] with an approximate thickness of 30nm, and

Supporting information

Soluble Carbon Nanotubes/Phthalocyanines transparent electrode and interconnection layers for flexible inverted Polymer Tandem Solar cells

M. Raïssi*1a), L. Vignau2, E. Cloutet3, B. Ratier *1

1XLIM, UMR-CNRS 7252, University of Limoges, 123 avenue Albert Thomas, 87060 Limoges cedex, France.2IMS, UMR-CNRS 5218, University of Bordeaux, Bordeaux INP/ENSCBP, , 16 avenue Pey Berland, 33607 Pessac Cedex, France.3LCPO, UMR-CNRS 5629, ENSCBP, IPB, University of Bordeaux, 16 avenue Pey Berland, 33607 Pessac Cedex, France

The morphology of the different films was characterized by tapping mode AFM, SEM and TEM. The topography and phase images of SWCNTs/TSCuPc films on glass and PET are shown in fig.S1. The roughness of the TSCuPc-SWCNT films on glass is RMS ~ 20nm with a Peak to valley Pv of 45 nm [2µmx2µm] with an approximate thickness of 30nm, and on PET is 12 nm with a Peak Valley of 23 nm. Fig.S2 and S3 show the SEM and TEM images of the SWNTs:TSCuPc.

1a) Corresponding author. Tel.: +33-625010643, E-mail address: [email protected]

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Page 2: ars.els-cdn.com · Web viewThe roughness of the TSCuPc-SWCNT films on glass is RMS ~ 20nm with a Peak to valley Pv of 45 nm [2µmx2µm] with an approximate thickness of 30nm, and

Fig.S1: Topography and phase AFM images [2µmx2µm] of SWCNTs/TS-CuPc on glass.( a,b) and PET ( c, d) The roughness of the films is 20nm and 12 nm respectively

Fig.S3 : SEM image of TSCuPc:SWCNTs film on glass (left) and PET ( right) before washing

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Page 3: ars.els-cdn.com · Web viewThe roughness of the TSCuPc-SWCNT films on glass is RMS ~ 20nm with a Peak to valley Pv of 45 nm [2µmx2µm] with an approximate thickness of 30nm, and

Fig.S3 : TEM image of TSCuPc:SWCNTs film

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