colorimeter & thin film thickness & transmittance ...thin film thickness & colorimeter...
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Colorimeter &
Thin Film Thickness &
Transmittance
Combine Measurement System
The SCM-2020 is Thin Film Thickness & Colorimeter & Transmittance Combine Measurement System, that using spectrometer.
The SCM-2020 has Variable function, Tabletop size. Suitable for touch panel.
Microscope
System size: 400(W) X 500(L) X 500(H)mm
Stage Size: 280 x 270 mm
Travel Distance: 204 x 204 mm
Measurement Lens : 5X, 10X, 50X
Detector
System size: 190(W) X 265(L) X 316(H)mm
Choose Wavelength : 350~1000nm
Fiber diameter: 200um
Tungsten-Halogen stabilized technical lamp
Easy to Use - Just Click ‘Get Reference’ ⇒ ‘Get Dark’ ⇒ ‘Get Sample’ - Choose recipe to measurement function and anther pre-stored setting.
Stable Operation - Permission is divided to ‘Engineer mode’ and ‘Maintenance mode’
-Measurable Wavelength range: 380 ~ 780nm -Detector (Linear Array Type): 2048 pixels -Chromaticity result: XYZ, xy, u’v’, u*v*, Lab, L*a*b*, ΔCCT -Repeatability (1σ): x ≤ 0.001, y ≤ 0.001, Y ≤0.1 (Continuously, Measuring the same point 30 times ) -Semi automatic chromaticity measurement -Measurement results should be saved as Excel format
Chromaticity result XYZ, xy, u’v’, u*v*, Lab, L*a*b*, ΔCCT
Calibration function
Measurement data table
Up to 3 layers
Can use a lot of pre-stored
material data.
-Thickness and optical N,K measurement by a spectrometer with a grating and a linear CCD detector -Wavelength resolution : 2nm -Detector (Linear Array Type) : 2048 pixels -Wavelength range : 350nm ~ 1000nm
-Thickness measurement range : 200Å ~35㎛ -Measurement spot size : φ40㎛(5x), φ20㎛(10x), φ4㎛(50x) -Multi-layer measurement : Up to 3 layers -Measurement Lens : 5X, 10X, 50X -Measurement Result could be saved as Excel format. -Repeatability (1sigma) : ± 10Å at 5000 Å (Continuously, Measuring the same point 10 times)
-Measurable Wavelength range: 380 ~ 1000nm -Light receiving spot size: < 3mm -Repeatability (1σ) ≤ 0.5 % at 550nm
Select wavelength
Calibration function
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