固体微结构物理国家重点实验室 · 2019. 10. 31. · i 南京大学固体微结构物理...

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南京大学固体微结构物理

国家重点实验室

主 任 陈延峰

副主任 王强华

桑 海

刘 辉

殷 江

实验室

办公室主任

实验室

主任助理

张文俊

郝西萍

吴 军

地 址： 南京市汉口路 22 号

邮 编： 210093

电 话： 86-25-83592756

传 真： 86-25-83595535

Email： lssms@nju.edu.cn

网 址： https://vlssm.nju.edu.cn

目 次

实验室概况………………………………………………………………………………………………….. 1

第八届学术委员会委员名单…………………………………....................................... 2

2016年实验室工作总结…………………………………………………………………………… 3

2016 年优秀论文精选 (Selected papers published in 2016)………. 31

1 He C, Ni X, Ge H, Sun XC, Chen YB, Lu MH, Liu XP, Chen YF,

Acoustic topological insulator and robust one-way sound transport,

Nature Physics 12, 1124(2016)……………………………………….

32

2 Yu SY, Sun XC, Ni X, Wang Q, Yan XJ, He C, Liu XP, Feng L, Lu MH,

Chen YF, Surface phononic grapheme, Nature Materials 15, 1243-

1247(2016)……………………………………………………………

39

3 Zhou L, Tan YL, Wang JY, Xu WC, Yuan Y, Cai WS, Zhu SN, Zhu J,

3D self-assembly of aluminium nanoparticles for plasmon-enhanced

solar desalination, Nature Photonics 10, 393(2016)…………………

45

4 Wang SM, Cheng QQ, Gong YX, Xu P, Sun C, Li L, Li T, Zhu SN, A 14

x 14 mu m(2) footprint polarization-encoded quantum controlled-NOT

gate based on hybrid waveguide, Nature Communications 7, 11490

(2016)…………………………………………………………………...

52

5 Hua SY, Wen JM, Jiang XS, Hua Q, Jiang L, Xiao M, Demonstration of

a chip-based optical isolator with parametric amplification, Nature

Communications 7, 13657(2016)……………………………………..

57

6 Xue ZG, Xu MK, Zhao YL, Wang J, Jiang XF, Yu LW, Wang JZ, Xu J,

Shi Y, Chen KJ, Cabarrocas PRI, Engineering island-chain silicon

nanowires via a droplet mediated Plateau-Rayleigh transformation,

Nature Communications 7, 12836(2016)……………………………..

63

7 Xu YL, Fegadolli WS, Gan L, Lu MH, Liu XP, Li ZY, Scherer A, Chen

YF, Experimental realization of Bloch oscillations in a parity-time

synthetic silicon photonic, Nature Communications 7, 11319(2016)…

72

8 Wang YJ, Liu EF, Liu HM, Pan YM, Zhang LQ, Zeng JW, Fu YJ, Wang

M, Xu K, Huang Z, Wang ZL, Lu HZ, Xing DY, Wang BG, Wan XG,

Miao F, Gate-tunable negative longitudinal magnetoresistance in the

predicted type-II Weyl semimetal WTe2, Nature Communications 7,

13142(2016)…………………………………………………………….

78

9 Xu T, Walter EC, Agrawal A, Bohn C, Velmurugan J, Zhu WQ, Lezec

HJ, Talin AA, High-contrast and fast electrochromic switching enabled

by plasmonics, Nature Communications 7, 10479(2016)…………….

84

10 Du ZY, Yang X, Lin H, Fang DL, Du G, Xing J, Yang H, Zhu XY, Wen

HH, Scrutinizing the double superconducting gaps and strong coupling

pairing in (Li1-xFex)OHFeSe, Nature Communications 7, 10565

(2016).…………………………………………………………………..

90

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/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhu,%20J&dais_id=2006364350&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Wang,%20SM&dais_id=2004710578&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Cheng,%20QQ&dais_id=2004404205&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Gong,%20YX&dais_id=2004465522&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Xu,%20P&dais_id=2004727041&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Sun,%20C&dais_id=2004678269&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Li,%20L&dais_id=2004546055&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Li,%20T&dais_id=2004543267&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhu,%20SN&dais_id=2004749252&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Hua,%20SYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Wen,%20JMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Jiang,%20XShttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Hua,%20Qhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Jiang,%20Lhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2CzzIUVmmxq9TAaYI57&field=AU&value=Xiao,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Xue,%20ZGhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Xu,%20MKhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Zhao,%20YLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Jiang,%20XFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Yu,%20LWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20JZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Xu,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Shi,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Chen,%20KJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Cabarrocas,%20PRIhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Xu,%20YL&dais_id=2005064618&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Fegadolli,%20WS&dais_id=2004831117&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Gan,%20L&dais_id=2004839967&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Lu,%20MH&dais_id=2004923789&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Liu,%20XP&dais_id=2004920869&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Li,%20ZY&dais_id=2004913062&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Scherer,%20A&dais_id=2005000354&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Chen,%20YF&dais_id=2004799183&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Chen,%20YF&dais_id=2004799183&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20YJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Liu,%20EFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Liu,%20HMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Pan,%20YMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Zhang,%20LQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Zeng,%20JWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Fu,%20YJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Xu,%20Khttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Huang,%20Zhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20ZLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Lu,%20HZhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Xing,%20DYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wang,%20BGhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Wan,%20XGhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1BFzL46AmQsfa2Bb6fK&field=AU&value=Miao,%20Fhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Xu,%20T&dais_id=2002273151&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Walter,%20EC&dais_id=2002167642&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Agrawal,%20A&dais_id=2000018665&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Bohn,%20C&dais_id=2000198084&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Velmurugan,%20J&dais_id=2002134066&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhu,%20WQ&dais_id=2002399731&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Lezec,%20HJ&dais_id=2001158078&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Lezec,%20HJ&dais_id=2001158078&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Talin,%20AA&dais_id=2002015659&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Du,%20ZY&dais_id=2000508746&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Yang,%20X&dais_id=2002306616&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Lin,%20H&dais_id=2001191739&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Fang,%20DL&dais_id=2000565161&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Du,%20G&dais_id=2000507510&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Xing,%20J&dais_id=2002268376&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Yang,%20H&dais_id=2002317484&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhu,%20XY&dais_id=2002406048&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Wen,%20HH&dais_id=2002206532&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Wen,%20HH&dais_id=2002206532&excludeEventConfig=ExcludeIfFromFullRecPage

National Lab of Solid State Microstructures

ii

National Lab of Solid State

Microstructures

Nanjing University

Director Yanfeng CHEN

Deputy

Director

Qianghua WANG

Hai SANG

Hui LIU

Jiang YIN

Director of

the Office

Assistant to

the Director

Wenjun ZHANG

Xiping HAO

Jun WU

Address: 22 Hankou Road

Nanjing, China

Zip Code： 210093

Tel: 86-25-83592756

Fax: 86-25-83595535

Email: lssms@nju.edu.cn

Web

Address:

http://vlssm.nju.edu.cn

11 Ruan JW, Jian SK, Yao H, Zhang HJ, Zhang SC, Xing DY, Symmetry-

protected ideal Weyl semimetal in HgTe-class materials, Nature

Communications 7, 11136(2016)……………………………………..

98

12 Sheng C, Bekenstein R, Liu H, Zhu SN, Segev M, Wavefront shaping

through emulated curved space in waveguide settings, Nature

Communications 7, 10747(2016)…………………………………….

104

13 Hu FR, Lv BH, Yin CY, Zhang CF, Wang XY, Lounis B, Xiao M,

Carrier multiplication in a single semiconductor nanocrystal, Physical

Review Letters 116, 106404(2016)……………………………………

112

14 Li XB, Huang WK, Lv YY, Zhang KW, Yang CL, Zhang BB, Chen YB,

Yao SH, Zhou J, Lu MH, Sheng L, Li SC, Jia JF, Xue QK, Chen YF,

Xing DY, Experimental observation of topological edge states at the

surface step edge of the topological insulator ZrTe5, Physical Review

Letters 116, 176803(2016)…………………………………………….

117

15 Ruan JW, Jian SK, Zhang DQ, Yao H, Zhang HJ, Zhang SC, Xing DY,

Ideal Weyl semimetals in the chalcopyrites CuTlSe2, AgTlTe2, AuTlTe2,

and ZnPbAs2, Physical Review Letters 116, 226801(2016)…..............

122

16 Zhou J, Liang QF, Weng HM, Chen YB, Yao SH, Chen YF, Dong JM,

Guo GY, Predicted quantum topological hall effect and noncoplanar

antiferromagnetism in K0.5RhO2, Physical Review Letters 116,

256601(2016) …………………………………………………………..

127

17 Zhang YH, Qiao JS, Gao S, Hu FR, He DW, Wu B, Yang ZY, Xu BC, Li

Y, Shi Y, Ji W, Wang P, Wang XY, Xiao M, Xu HX, Xu JB, Wang XR,

Probing carrier transport and structure-property relationship of highly

ordered organic semiconductors at the two-dimensional limit, Physical

Review Letters 116, 016602(2016)……………………………………

132

18 Xu YQ, Chen Q, Zhang CF, Wang R, Wu H, Zhang XY, Xing GC, Yu

WW, Wang XY, Zhang Y, Xiao M, Two-photon-pumped perovskite

semiconductor nanocrystal lasers, Journal of The American

Chemical Society 138, 3761-3768(2016)……………………………...

138

19 Ju CC, Yang JC, Luo C, Shafer P, Liu HJ, Huang YL, Kuo HH, Xue F,

Luo CW, He Q, Yu P, Arenholz E, Chen LQ, Zhu JS, Lu XM, Chu YH,

Anomalous electronic anisotropy triggered by ferroelastic coupling in

multiferroic heterostructures, Advanced Materials 28, 876 (2016)…...

146

20 Chen F, Li JN, Yu FF, Zhao D, Wang F, Chen YB, Peng RW, Wang M,

Construction of 3D metallic nanostructures on an arbitrarily shaped

substrate, Advanced Materials 28, 7193(2016)………………………

154

21 Liu XL, Luo XG, Nan HY, Guo H, Wang P, Zhang LL, Zhou MM, Yang

ZY, Shi Y, Hu WD, Ni ZH, Qiu T, Yu ZF, Xu JB, Wang XR, Epitaxial

ultrathin organic crystals on graphene for high-efficiency

phototransistors, Advanced Materials 28, 5200(2016)……………….

161

22 Yu ZH, Ong ZY, Pan YM, Cui Y, Xin R, Shi Y, Wang BG, Wu Y, Chen

TS, Zhang YW, Zhang G, Wang XR, Realization of room-temperature

phonon-limited carrier transport in monolayer MoS2 by dielectric and

carrier screening, Advanced Materials 28, 547(2016)……………….

167

2016 年发表论文摘要(Abstract list of publications in 2016)………. 173

I Science and Engineering of Artificial

Microstructures

174

http://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Ruan,%20JW&dais_id=2003153544&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Jian,%20SK&dais_id=2002816665&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Yao,%20H&dais_id=15491014&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhang,%20HJ&dais_id=2003412758&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhang,%20SC&dais_id=2003402946&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Xing,%20DY&dais_id=2003360541&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Sheng,%20C&dais_id=2001876574&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Bekenstein,%20R&dais_id=2000150489&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Liu,%20H&dais_id=2001233515&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Zhu,%20SN&dais_id=2002400432&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2AtueHuBvV154uNVINd&author_name=Segev,%20M&dais_id=2001846554&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Hu,%20FR&dais_id=6995192&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Lv,%20BH&dais_id=20416266&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yin,%20CY&dais_id=20033372&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20CF&dais_id=1000423027&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Wang,%20XY&dais_id=85338915&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Lounis,%20B&dais_id=47404115&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xiao,%20M&dais_id=1000318828&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Li,%20XB&dais_id=2000844700&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Huang,%20WK&dais_id=2000597027&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Lv,%20YY&dais_id=2000880356&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20KW&dais_id=2001635025&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yang,%20CL&dais_id=2001585953&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20BB&dais_id=2001637555&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Chen,%20YB&dais_id=2000252607&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yao,%20SH&dais_id=2001584910&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhou,%20J&dais_id=2001658564&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Lu,%20MH&dais_id=2000866352&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Sheng,%20L&dais_id=15987767&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Li,%20SC&dais_id=2000816215&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Jia,%20JF&dais_id=2000644003&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xue,%20QK&dais_id=2001569414&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Chen,%20YF&dais_id=2000253028&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xing,%20DY&dais_id=2001564060&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Ruan,%20JW&dais_id=14994462&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Jian,%20SK&dais_id=16035646&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20DQ&dais_id=2001642728&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yao,%20H&dais_id=1000346201&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20HJ&dais_id=2001671880&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20SC&dais_id=2001653369&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xing,%20DY&dais_id=37183461&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhou,%20J&dais_id=34184979&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Liang,%20QF&dais_id=2000799952&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Weng,%20HM&dais_id=1000363148&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Chen,%20YB&dais_id=2000253277&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yao,%20SH&dais_id=2001584897&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Chen,%20YF&dais_id=2000251566&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Dong,%20JM&dais_id=2000351012&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Guo,%20GY&dais_id=1000346860&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Zhang,%20YH&dais_id=32966899&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Qiao,%20JS&dais_id=13997182&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Gao,%20S&dais_id=4923877&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Hu,%20FR&dais_id=6995192&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=He,%20DW&dais_id=6367352&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Wu,%20B&dais_id=19345617&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Yang,%20ZY&dais_id=29636849&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xu,%20BC&dais_id=1302683&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Li,%20Y&dais_id=1000338860&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Li,%20Y&dais_id=1000338860&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Shi,%20Y&dais_id=19902469&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Ji,%20W&dais_id=1000423560&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Wang,%20P&dais_id=1000101978&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Wang,%20XY&dais_id=24998134&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xiao,%20M&dais_id=1000318828&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xu,%20HX&dais_id=27675594&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Xu,%20JB&dais_id=1000299165&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2EZg9TpeKk2sUt7qOSL&author_name=Wang,%20XR&dais_id=85340355&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Xu,%20YQ&dais_id=2003365336&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Chen,%20Q&dais_id=2002572665&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Zhang,%20CF&dais_id=24320639&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Wang,%20R&dais_id=2003318847&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Wu,%20H&dais_id=2003354553&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Zhang,%20XY&dais_id=2003420864&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Xing,%20GC&dais_id=2003360568&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Yu,%20WW&dais_id=2003386542&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Yu,%20WW&dais_id=2003386542&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Wang,%20XY&dais_id=2003330252&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Zhang,%20Y&dais_id=2003425719&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=2F4fPosUhFzs8QacHG3&author_name=Xiao,%20M&dais_id=15026602&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Ju,%20CC&dais_id=2000951000&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Yang,%20JC&dais_id=2002314556&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Luo,%20C&dais_id=2001268499&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Shafer,%20P&dais_id=2001860907&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Liu,%20HJ&dais_id=2001235011&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Huang,%20YL&dais_id=4555847&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Kuo,%20HH&dais_id=2001093258&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Xue,%20F&dais_id=2002275126&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Luo,%20CW&dais_id=2001268539&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=He,%20Q&dais_id=2000791903&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Yu,%20P&dais_id=2002342221&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Arenholz,%20E&dais_id=2000077350&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Chen,%20LQ&dais_id=2000334004&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhu,%20JS&dais_id=2002412547&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Lu,%20XM&dais_id=2001256383&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Chu,%20YH&dais_id=2000359046&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Chen,%20Fhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Li,%20JNhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Yu,%20FFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Zhao,%20Dhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Wang,%20Fhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Chen,%20YBhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Peng,%20RWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4DZ2HMVbIHoixRGvqX2&field=AU&value=Wang,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Liu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Luo,%20XGhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Nan,%20HYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Guo,%20Hhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Wang,%20Phttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Zhang,%20LLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Zhou,%20MMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Yang,%20ZYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Yang,%20ZYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Shi,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Hu,%20WDhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Ni,%20ZHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Qiu,%20Thttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Yu,%20ZFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Xu,%20JBhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Wang,%20XRhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Yu,%20ZH&dais_id=2002346593&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Ong,%20ZY&dais_id=46079532&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Pan,%20YM&dais_id=2001569643&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Cui,%20Y&dais_id=2000409262&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Xin,%20R&dais_id=2002267361&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Shi,%20Y&dais_id=2001883680&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Wang,%20BG&dais_id=2002171781&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Wu,%20Y&dais_id=2002269774&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Chen,%20TS&dais_id=2000318490&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Chen,%20TS&dais_id=2000318490&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhang,%20YW&dais_id=2002440887&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhang,%20G&dais_id=24527659&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Wang,%20XR&dais_id=2002230861&excludeEventConfig=ExcludeIfFromFullRecPage&cacheurlFromRightClick=no

Annual Report 2016——Content

iii

1 Constructing two-, zero-, and one-dimensional integrated nanostructures: an effective strategy for high microwave

absorption performance, Sun Y, Xu JN, Qiao W, Xu XB, Zhang WL, Zhang KY, Zhang X, Chen X, Zhong W, Du YW,

ACS Applied Materials & Interfaces 8, 31878-31886(2016)………………………………………………………..

174

2 Ferroelectric resistive switching in high-density nanocapacitor arrays based on BiFeO3 ultrathin films and ordered Pt

nanoelectrodes, Lu ZX, Fan Z, Li PL, Fan H, Tian G, Song X, Li ZW, Zhao LN, Huang KR, Zhang FY, Zhang Z, Zeng

M, Gao XS, Feng JJ, Wan JG, Liu JM, ACS Applied Materials & Interfaces 8, 23963-23968(2016)……………….

174

3 Brianyoungite/graphene oxide coordination composites for high performance Cu2+ adsorption and tunable deep-red

photoluminescence, Zhu XB, Shan Y, Xiong SJ, Shen JC, Wu XL, ACS Applied Materials & Interfaces 8, 15848-

15854(2016)…………………………………………………………………………………………………………….

174

4 Synergistic WO3 center dot 2H(2)O nanoplates/WS2 hybrid catalysts for high-efficiency hydrogen evolution, Yang L,

Zhu XB, Xiong SJ, Wu XL, Shan Y, Chu PK, ACS Applied Materials & Interfaces 8, 13966-13972(2016)……….

175

5 Morphology and pattern control of diphenylalanine self-assembly via evaporative dewetting, Chen JR, Qin SY, Wu

XL, Chu PK, ACS Nano 10, 832-838(2016)…………………………………………………………………………..

175

6 Magnetoelectric coupling in well-ordered epitaxial BiFeO3/CoFe2O4/SrRuO3 heterostructured nanodot array, Tian G,

Zhang FY, Yao JX, Fan H, Li PL, Li ZW, Song X, Zhang XY, Qin MH, Zeng M, Zhang Z, Yao JJ, Gao XS, Liu JM,

ACS Nano 10, 1025-1032(2016)……………………………………………………………………………………….

175

7 Defect mode passband lasing in self-assembled photonic crystal, Zhong K, Liu LW, Xu XD, Hillen M, Yamada A,

Zhou XP, Verellen N, Song K, Van Cleuvenbergen S, Vallee R, Clays K, ACS Photonics 3, 2330-2337(2016)………

176

8 Squeezing a surface plasmon through quadratic nonlinear interactions, Ming Y, Zhang WH, Chen ZX, Wu ZJ, Tang J,

Xu F, Zhang LJ, Lu YQ, ACS Photonics 3, 2074-2082(2016)…………………………………………………………

176

9 Auger-assisted ultrafast fluorescence measurement of semiconductor single-walled carbon nanotubes, Hu FR, Cao

ZL, Hua Z, Xu QF, Zheng M, Zhang CF, Wang XY, Xiao M, ACS Photonics 3, 1415-1420(2016)…………………..

176

10 Great enhancement of transversal magneto-optical Kerr effect for magnetic dielectric film embedded by one-

dimensional metallic grating, Chen Y, Liu L, Huang Z, Tu LL, Zhan P, Acta Physica Sinica 65, 147302(2016)……..

177

11 Theoretical investigation on a kind of time-dependent Bessel beam, Yue YY, Zhang XY, Yang B, Lu RE, Hong XH,

Zhang C, Qin YQ, Zhu YY, Acta Physica Sinica 65, 144201(2016)………………………………………………….

177

12 Subwavelength light focusing using quadric cylinder surface plasmonic lens with gold film slits filled with dielectric,

Hu CB, Xu J, Ding JP, Acta Physica Sinica 65, 137301(2016)…………………………………………………………

178

13 Ferroelectric polarization switching dynamics and domain growth of triglycine sulfate and imidazolium perchlorate,

Ma H, Gao WX, Wang JL, Wu T, Yuan GL, Liu JM, Liu ZG, Advanced Electronic Materials 2, 1600038(2016)……

178

14 Construction of 3D metallic nanostructures on an arbitrarily shaped substrate, Chen F, Li JN, Yu FF, Zhao D, Wang F,

Chen YB, Peng RW, Wang M, Advanced Materials 28, 7193(2016)………………………………………………….

179

15 Anomalous electronic anisotropy triggered by ferroelastic coupling in multiferroic heterostructures, Ju CC, Yang JC,

Luo C, Shafer P, Liu HJ, Huang YL, Kuo HH, Xue F, Luo CW, He Q, Yu P, Arenholz E, Chen LQ, Zhu JS, Lu XM,

Chu YH, Advanced Materials 28, 876-883(2016)…………………………………………………………………….

179

16 Quantum spin Hall insulator phase in monolayer WTe2 by uniaxial strain, Xiang H, Xu B, Liu JQ, Xia YD, Lu HM,

Yin J, Liu ZG, AIP Advances 6, 095005(2016)…………………………………………………………………………

179

17 Shaping the photoluminescence from gold nanoshells by cavity plasmons in dielectric-metal core-shell resonators,

Sun R, Wan MJ, Wu WY, Gu P, Chen Z, Wang ZL, AIP Advances 6, 085216(2016)………………………………….

179

18 Ferroelectric domain inversion and its stability in lithium niobate thin film on insulator with different thicknesses,

Shao GH, Bai YH, Cui GX, Li C, Qiu XB, Geng DQ, Wu D, Lu YQ, AIP Advances 6, 075011(2016)………………..

179

19 The structure and electronic properties of hexagonal Fe2Si, Tang CP, Tam KV, Xiong SJ, Cao J, Zhang XP, AIP

Advances 6, 065317(2016)……………………………………………………………………………………………..

180

20 Coexistence of negative photoconductivity and hysteresis in semiconducting grapheme, Zhuang SD, Chen Y, Xia YD,

Tang NJ, Xu XY, Hu, JG, Chen Z, AIP Advances 6, 045214(2016)……………………………………………………

180

21 Detection of defects on the surface of a semiconductor by terahertz surface plasmon polaritons, Yang T, Li YY,

Stantchev R, Zhu YY, Qin YQ, Zhou XH, Huang W, Applied Optics 55, 4139-4144(2016)…………………………...

180

22 Generalized phase-shifting for three-wave shearing interferometry, Xia JP, Chen ZZ, Sun H, Liang PY, Ding JP,

Applied Optics 55, 2843-2847(2016)………………………………………………………………………………….

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p://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AdrwcL7uWXd1WBJhSn&field=AU&value=Liu,%20JMhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Zhu,%20XBhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Shan,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Xiong,%20SJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Shen,%20JChttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=1D7q14jjSKL6xrVWnYb&field=AU&value=Wu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Yang,%20Lhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Zhu,%20XBhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Xiong,%20SJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Wu,%20XLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Shan,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&field=AU&value=Chu,%20PKhttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&author_name=Chen,%20JR&dais_id=2000344258&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&author_name=Qin,%20SY&dais_id=2001674129&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&author_name=Wu,%20XL&dais_id=2002256906&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&author_name=Wu,%20XL&dais_id=2002256906&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4A1wxhrGOWZzRV3glT4&author_name=Chut,%20PK&dais_id=2000362112&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Tian,%20G&dais_id=2002053884&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhang,%20FY&dais_id=2002380682&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Yao,%20JX&dais_id=2002301575&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Fan,%20H&dais_id=2000563463&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Li,%20PL&dais_id=2001160757&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Li,%20ZW&dais_id=2001183514&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Song,%20X&dais_id=2001937872&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhang,%20XY&dais_id=2002433746&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Qin,%20MH&dais_id=50522140&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zeng,%20M&dais_id=2002364918&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Zhang,%20Z&dais_id=2002418195&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Yao,%20JJ&dais_id=2002301692&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Gao,%20XS&dais_id=2000645598&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/DaisyOneClickSearch.do?product=WOS&search_mode=DaisyOneClickSearch&colName=WOS&SID=4F3ejemiLDfOpAY6QgK&author_name=Liu,%20JM&dais_id=2001243967&excludeEventConfig=ExcludeIfFromFullRecPagehttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Zhong,%20Khttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Liu,%20LWhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Xu,%20XDhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Hillen,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Yamada,%20Ahttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Zhou,%20XPhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Verellen,%20Nhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Song,%20Khttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Van%20Cleuvenbergen,%20Shttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Vallee,%20Rhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2EG7CZHsziCJHsRHCBl&field=AU&value=Clays,%20Khttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Ming,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Zhang,%20WHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Chen,%20ZXhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Wu,%20ZJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Tang,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Xu,%20Fhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Zhang,%20LJhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=4AKtx6PiacbF5ZGI8pT&field=AU&value=Lu,%20YQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Hu,%20FRhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Cao,%20ZLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Cao,%20ZLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Hua,%20Zhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Xu,%20QFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zheng,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zhang,%20CFhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Wang,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Xiao,%20Mhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Chen,%20Yhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Liu,%20Lhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Huang,%20Zhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Tu,%20LLhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zhan,%20Phttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Yue,%20YYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zhang,%20XYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Yang,%20Bhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Lu,%20REhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Hong,%20XHhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zhang,%20Chttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Qin,%20YQhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Zhu,%20YYhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Hu,%20CBhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SID=2F4eYrPexQRUvewmONE&field=AU&value=Xu,%20Jhttp://apps.webofknowledge.com/OneClickSearch.do?product=WOS&search_mode=OneClickSearch&excludeEventConfig=ExcludeIfFromFullRecPage&colName=WOS&SI