Agilent 8510

System Solutions

Your bridge to the future

System Solutions

Device Type Application Segments

Millimeter-wave •collision warning radar • •components •vehicle-to-vehicle link ••wireless LAN ••on-wafer measurements • • ••waveguide measurements ••digital transmission equipment ••millimeter radar systems • •

High power •amplifiers for radio base stations •components •SSPA1, LPA2, TWTA3 • •RF and •communication equipment •microwave •satellite communication •components •device modeling •

•on-wafer pulsed measurements • • ••pulsed radar ••advanced material research ••filter tuning/alignment ••group delay measurements ••calibration of standards ••transmit/receive (T/R) module testing •

Lightwave •lightwave measurements •components Antennas •satellite communication • •1Solid-state power amplifiers (SSPA)2Linear power amplifiers (LPA)3Traveling wave tube amplifiers (TWTA)

Application guide

The guide below shows Agilent Technologies 8510-based system solutions and the key applications forwhich each solution is optimized. Building on our standard system solutions, we can provide customized, factory-integrated systems for complex or unique applications. We have the leading-edge technology tomeet your challenges today and tomorrow.

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8510XF

85106

85118

85108

85107, 50 GHz &Below

Other SystemSolutions

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Test heads designed for highestperformance Whether your measurement setup iscoax or on-wafer, the test heads aredesigned for mounting close to the device- or wafer-under-test to minimize RF cable length. For the on-wafer configuration, the test heads are especially suited for mounting on top of the probemanipulators, where they areallowed to move with the probe tips.This eliminates any relativemovement to yield the highestperformance.

On-wafer capability from our channelpartnerAgilent Technologies has been workingclosely with Cascade Microtech forover a decade to bring you excellenton-wafer measurement solutions.Agilent’s measurement expertiseand Cascade’s expertise in waferprobing have combined to produceon-wafer solutions to meet yourtoughest measurement challenges.

To complement the 8510XF, CascadeMicrotech has developed the ACP110 probes with a 1.0 mm connectorinterface that offers probing from 45 MHz to 110 GHz with low insertionloss and superior accuracy. Withcalibration standards and coefficientsavailable from Cascade Microtech,fully calibrated on-wafer measure-ments can be made from 45 MHz to 110 GHz with a single touchdown.

Many upgrade possibilitiesWhatever Agilent 8510-based system you use, there is an upgradepath available to meet your needs. Depending on your currentmeasurement setup, it may be a standard pre-configured upgradeor a customized upgrade.

Agilent partners with Cascade Microtech to deliversuperior on-wafer solutions.

ACP 110 probes with a 1.0 mm connector interface from CascadeMicrotech enable singletouchdown probing from 45 MHzto 110 GHz.

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Key Features:

❏ Broad frequency coverage — 45 MHz to 110 GHz — in a single sweep without frequency band breaks.

❏ Internal firmware provides single frequency sweep capability (external controller not required).

❏ Calibrates in both 1.0 mm coax and on-wafer.

❏ Test heads designed for convenient on-wafer and coax measurements.

❏ Dynamic range andmeasurement accuracy comparable to the performancefrom individual waveguide bands.

The 8510XF network analyzersystem has been designed tomeasure broadband devices to 110 GHz, on-wafer or in-fixture, fullycalibrated, in a single frequencysweep. By building on the 8510network analyzer, the 8510XFsystem provides high measurementperformance in frequency coverage,dynamic range and measurementaccuracy.

Single RF connection to 110 GHzThe 8510XF system providesfrequency coverage from 45 MHz to110 GHz in a single sweep with asingle connection. Productivity isimproved because you no longerneed to set up, connect anddisconnect as your measurementsmove from one frequency band to the next.

Millimeter-wave measurements in 1.0 mm coaxWith a single connection, fully error-corrected measurements to 110 GHzare made in 1.0 mm coax. Makingmillimeter-wave measurements in1.0 mm coax delivers uncompromisedperformance and improved product-ivity compared to waveguide.

Convenient millimeter-wave on-wafer measurementsThe 8510XF system is designed forconvenient on-wafer measurements.By using the 1.0 mm coax connectorto interface with the 1.0 mm waferprobe, fully calibrated measurementswith the highest measurement perfor-mance can be made to 110 GHz witha single touchdown on the wafer.

Broadband calibration with built-infirmwareThe built-in firmware of the 8510XFsystem enables you to perform asingle calibration from 45 MHz to110 GHz, either in coax or on-wafer.The single, broadband calibrationcan be applied to either broadbandor narrowband devices.

110 GHz single-sweep systemsAgilent 8510XF

Convenient on-wafermeasurements with the 8510XF using a CascadeMicrotech wafer probing station and APC 110 probes

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Key Features:

❏ Banded S-parameter measurements to 110 GHz with high speed, accuracy and dynamic range.

❏ Excellent dynamic range for more accurate, repeatablemeasurements.

❏ High output power delivers more power to the device-under-test without external amplifiers.

❏ System can be expanded to include coaxial and waveguide capabilities; with easy-to-use built-in RF switching, measurements can be made in coax below 50 GHz, and in waveguide above 50 GHz.

The 85106 network analyzer systemis configured to make fast, accurateS-parameter measurements ofwaveguide components in fourwaveguide bands from 33 to 110 GHz.

Calibration accuracy and stabilityimprove productivityPrecision calibration standards forall bands permit full use of all built-in 8510 accuracy enhancement anddata processing features. Because ofthe accuracy and stability of the 8510,your calibrations last longer, allowingyou to measure more devices percalibration, improving productivity.

Measurement convenienceAll system functions, from setting up the measurement frequencies tocalibration and measurement, arecontrolled directly from the 8510front panel. The measurement resultsare displayed on the receiver CRT inthe frequency and/or time domain.With the 8510 in multiple sourcemode, operating the 85106 system is as easy as using the microwavereceiver.

Coaxial and waveguide capabilities all in oneWith the addition of a microwavetest set and RF switching controlhardware, the 85106 system mayalso be configured for coaxial mea-surements from 45 MHz to 50 GHz.A single system can cover the entirefrequency range from 45 MHz to 110 GHz with convenient switchingbetween coaxial and waveguidemeasurements.

This level of performance can beachieved by extending any existing8510 microwave system to themillimeter-wave frequencies withadditional hardware.

Millimeter-wave systemAgilent 85106

Agilent 85106 configured forwaveguide measurements

Agilent 85106 flexibilityprovides coaxial andwaveguide capabilities all in one system.

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Key Features:

❏ High RF power handling capability; up to 40 watts (+46 dBm) of output power from an amplifier can be handled. Higher-power options are also available for higher-power amplifiers.

❏ Single-connection multiple-measurement system architecture permits measurements of the amplifier under test, such as S-parameters (magnitude and phase response), noise figure, gain compression, and intermodulation distortion with one connection at high RF power levels.

❏ Adaptable and expandable system configurations to meet special measurement needs, such as high RF power levels within a particular frequency band, high throughput options, or system flexibility for high product mix manufacturing.

The 85118 high-power amplifier testsystem is designed for the completeRF characterization and manufac-turing test of power amplifiers usedin communications systems.

High-performance phase, group delayand distortion measurementsKey measurements for poweramplifiers used in communicationssystems include phase linearity(transmission phase), absoluteoutput power and group delay.Another important measurement is intermodulation distortion, sincethis measurement helps to ensurethat requirements for in-band andout-of-band operation are met. Thisis especially important for digitalcommunications systems, which usenarrower channel spacing thananalog systems. The 85118 testsystem is configured to providehigh-performance, high-resolutionphase, group delay and distortionmeasurements.

Single-connection multiple-measurementsolutionThe 85118 test system combines thehigh-speed measurement capabilitiesof a microwave receiver with the S-parameter test set to provide CWor pulsed-RF, S-parameter and noisefigure measurement capability.These flexible systems also permitspectrum analysis and measurementof S-parameters, noise figure, powerand gain compression as a functionof frequency, power level, device-under-test (DUT) state, and/or otherprogrammable conditions.

Complete solutions for your measurementneedsThe 85118 test system can becustomized depending on testrequirement. Each test systemincludes complete automationsoftware, allowing the system to be used in manufacturingenvironments where continuousoperation in volume testingsituations is required.

High-power amplifier test systemAgilent 85118

Fully automated testing of high poweramplifiers with the Agilent 85118

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Key Features:

❏ Wide dynamic range allows for accurate pulsed measurements at any duty cycle.

❏ Low duty cycles allowhigh-power measurements of on-wafer or in-fixture devices.

❏ By measuring high-performancedevices under pulsed conditions,on-wafer or in chip form,production-process-relatedproblems can be detected andsolved early enough to improveyields and lower productioncosts.

The 85108 features a completeconfiguration for high-volume, high-power and pulsed-RF testing ofcomponents and devices at IF, RF and microwave frequencies.With a wider-bandwidth receiver,these systems perform pulse profilenetwork analysis of devices thatrequire a pulsed stimulus.

Pulsed-RF measurementsUsing the 8510, with its wide IFbandwidth option, swept-frequencypulse testing can be achieved withthe press of a single key, and in realtime. In addition to swept-frequencytesting, the 8510 also permitsanalysis of a device’s dynamicbehavior during a pulse, at a singleRF frequency, using repetitivesampling.

High-power device measurementsThe 85108 pulsed-RF systems havebeen designed to measure high-power devices under both CW andpulsed conditions. These systemshave the capability to provide thenecessary RF drive level to thedevice-under-test. If needed, anamplifier can be added to boost thesignal power level to the DUT. Withthe open-architecture design of thepulse test set, this amplifier can beplaced behind the network analyzertest set’s port 1 couplers to ensurethat its effects are removed from themeasurements during systemcalibration.

Your system grows with youA pulsed-RF system can be config-ured from any existing 8510 networkanalyzer system by adding pulsed-RFcapability to the network analyzerand a pulse test set. In addition,other measurement capabilities suchas spectral analysis, noise figure andload pull can be added easily withoutdegrading the uncorrected perfor-mance of the basic system.

Pulsed-RF systemsAgilent 85108

Agilent 85108 offers pulsed-RF measurements in frequency and time domain.

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Key Features:

❏ S-parameter measurements to 50 GHz with high accuracy and speed. Measurements include, but are not limited to, gain, flatness, VSWR, group delay, gain compression and power.

❏ Excellent performance at 50 GHz. With Option 007, the port power level is –16 dBm with 75 dB of dynamic range from 40 to 50 GHz, reducing the need for external amplification.

❏ Superior performance of the 8517 test set delivers exceptional confidence in all your measurements.

The 85107 vector network analyzer(VNA) system is a complete systemconfigured with a 50 GHz synthesizedsweeper and a 50 GHz S-parametertest set in a system rack. This systemdelivers uncompromised performanceto 50 GHz.

Outstanding performanceThe basis for the 85107 VNA’sexcellent performance lies in the8517 test set. This test set hasexceptional raw (uncorrected) testport characteristics—20 dB ofdirectivity and 16 dB of sourcematch to 50 GHz. These intrinsiccharacteristics of the test set priorto calibration substantially improvethe overall calibration accuracy andstability that can be achieved. Thesecapabilities help to ensure a moreprecisecharacterization of amplifiersand active devices.

High dynamic rangeWith the 8517 test set, 75 dB ofdynamic range is available at 50GHz. High test port output powerand sensitivity directly affect boththe accuracy and speed of yourmeasurements. High dynamic rangecoupled with outstanding rawdirectivity gives you confidence in measurements to 50 GHz.

The premier measurement solution to 50 GHzThe 85107 delivers unmatched RFperformance to 50 GHz. Combiningthe 85107 with a wafer probingstation allows on-wafer devices to be fully characterized over thefrequency range of 45 MHz to 50 GHz.

50 GHz vector network analyzer systemAgilent 85107

Agilent 85107 delivers unmatchedRF performance to 50 GHz.

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There are three 8510 systemsavailable below 50 GHz. Twosystems are configured for S-parameter measurements, and the third is for lightwavecomponent measurements. Thesesystems deliver uncompromisedmeasurement performance, andnumerous upgrade paths areavailable.

In addition to the Agilent 8510system solutions, Agilent offers the8720 vector network analyzer family.

26.5 GHz S-parametermeasurement systemThe 26.5 GHz 8510 system isconfigured with the 8515 26.5 GHz S-parameter test set and an 83631synthesizer in a system rack. The8515 S-parameter test set offerssuperior uncorrected performanceup to 26.5 GHz. Its uncorrecteddirectivity is outstanding, providingexceptional stability and long-termcalibration accuracy.

20.0 GHz S-parametermeasurement systemThe 20 GHz 8510 system is a bench-top system configured with the 851420 GHz S-parameter test set and an 83621 synthesizer. This systemdelivers wide dynamic range andhigh output power for measurementsup to 20 GHz. The system componentswill fit on a benchtop to save space,or they can be mounted in a systemrack (system racks are availableseparately).

Lightwave componentmeasurementsThe 8510 network analyzer can beconfigured to measure the modula-tion amplitude and phase of opticalmodulators and receivers to 20 GHzor 50 GHz. The 8510 can be extendedto become a 20 GHz lightwave com-ponent analyzer system by addingthe 83420 lightwave test set, asystem controller and software. A 50 GHz lightwave componentanalysis system can be configuredby incorporating an 8510, a specially-developed lightwave test set, a systemcontroller and software. Both systemsperform calibrated electro-optical(E/O and O/E), optical (O/O) andelectrical (E/E) transmission andreflection measurements using acalibrated, swept signal-modulatingoptical source (either 1300 or 1550 nm). Both frequency anddistance/time-domain measure-ments are available.

Agilent 8720 vector networkanalyzer family, 50 MHz to 40 GHzThe 8720 vector network analyzerfamily combines a fast synthesizedsource, tuned receiver and S-parameter test set in a single, fully-integrated instrument. Quickly andaccurately, this compact instrumentmeasures magnitude, phase andgroup delay of all four S-parameters,in addition to absolute output powerof microwave components. Config-urations are available for highpower, high dynamic range, timedomain, frequency translation andnon-coaxial measurements. The8720 analyzers have the perfor-mance and flexibility needed tosolve difficult measurementproblems and cut test times.

Solutions below 50 GHz

Agilent 8720 vector networkanalyzer, a single, fully-integratedinstrument

20 GHz Agilent 8510benchtop system

50 GHz lightwavecomponent analysissystem

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Transmit/Receive (T/R) moduletestTo be competitive in today’s T/Rmodule market, manufacturers needto test modules in many phase andamplitude states and still maintainhigh throughput. Agilent’s T/Rmodule test solution includes a high-speed S-parameter test stationusing a single-connection multiple-measurement (SCMM) architecture.SCMM permits all measurements to be made with a single connectionto the DUT. Measurement capabil-ities include fully error-corrected S-parameters in either CW or pulsed-RF conditions, input/output VSWR,high-power gain, error-correctednoise figure, spectrum analysis(including harmonic distortion and spur measurement), absolutepower, and power-added efficiency.Frequency coverage spans from 45 MHz to 50 GHz.

Device modeling systemsAgilent’s device modeling systemcapability consists of complete,integrated systems of test hardwareand modeling software. Thesesystems provide the accurate devicemodel parameters needed tosimulate circuit performance inSPICE or Agilent’s Advanced DesignSystem. Circuit simulations are onlyas accurate as the device modelsused, and Agilent’s device modelingsystems are designed to accuratelyand efficiently extract modelparameters used to simulate DC andhigh frequency performance.

Agilent offers two CW systems (RFand microwave) and a pulsed system.The CW modeling systems combinean 8510 (or an 87xx) network analy-zer system with a DC current-versus-voltage (I-V) subsystem. Thepulsed modeling system combinesan 8510 pulsed-RF network analyzersystem with a pulsed-DC I-V subsys-tem. By pulsing the bias and RFstimuli to the device during charac-terization, self-heating can be con-trolled. This makes it possible todevelop new models that incorporatethermal effects, improving circuitsimulation accuracy.

Antenna pattern and RCSmeasurementsBuilding upon the advanced designand proven hardware of the popular,high-performance 8510 networkanalyzer, Agilent’s antenna and RCSmeasurement systems offer excep-tional performance and configurationflexibility to meet all of your far-field,near-field and radar cross section(RCS) measurement needs todayand in the future.

Other Agilent system solutions

Far-field antenna measurements are one of the capabilities of theAgilent antennameasurement system.

The pulsed modeling system is acompletely integrated tool forinvestigating device self-heating and for developingnew thermal models.

Agilent 85120 test systemprovides high throughput esting of transmit/receive (T/R) modules.

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Performance and convenienceThe 8510 is the foundation from which to expand yourcapability for future applications, and continues to bethe best network analyzer investment that you can make.

To protect your investment in an 8510, any version ofthis instrument can be updated to the latest, state-of-the-art 8510 using upgrade packages. Upgrade packagestypically include a hardware and firmware upgrade, andon-site installation. These upgrades are performed in amatter of hours, so you’ll be up and running quickly withall new capabilities.

Versatility that can be tailored to your unique requirementsThe 8510 network analyzer easily adapts to differentmeasurement requirements without compromisingperformance; from basic component testing to on-waferprobing, pulsed device characterization, and antennaand RCS measurements. Just choose the appropriatesystem components to match the needs of your particularapplication. Any existing 8510 network analyzer systemcan be reconfigured into a different system to meet newmeasurement needs.

System flexibility and versatility offer you optionsfor today and tomorrow

Agilent 8510 SYSTEM SOLUTIONS

85107 85106 85108 8510XF 85118 Other System Solutions

Satellite communication

On-wafer measurements

On-wafer pulsed measurements

Collision warning radar

Amplifiers for radio base stations

On-wafer, CW/pulsed, measurements

Advanced material research

Waveguide measurements

Pulsed radar Communication equipment

Solid-state power amp. (SSPA)

Amplifier test systems

Filter tuning, or alignment

Millimeter radar systems

Wireless LAN Linear power amplifiers (LPA)

Satellite communication

Group delay measurements

Collision warning radar

On-wafer, CW/pulsed, measurements

Traveling wave tube amp. (TWTA)

Transmit/receive (T/R) module test

Calibration of standards

Millimeter radar systems

Device modeling, parameter extraction

Lightwave measurements

Vehicle-to-vehicle link

Antenna measurements

Digital transmission equipment

83622

83624

85110

8760

8510

83622

8510

83623

85110

83651

8517

85105

8510

83621

83651

8517

8510

MMController

83620

83650

8510

RF Source

Test Set

8510

LO Source

DC Power Supply

Multimeter

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Agilent has unsurpassed expertisein RF and microwave measurements,with decades of experience creating some of the industry’s finest testsystems, instruments and software.We are dedicated to providing inno-vative, reliable system solutions fora wide range of measurement needs.These solutions incorporate the neces-sary hardware, software, customizedfixturing and on-going support toform a complete single-source answerto your measurement challenges.

Whether your needs are for coveragewithin a particular frequency bandat high RF power levels, minimumtest time for high throughput, systemflexibility for high-mix manufacturing,or simply long-term upgradabilityand system support, Agilent canprovide a system that meets yourdevelopment and production testrequirements.

From software integration toinstallation and training, Agilentoffers a complete range of servicesto implement the test solution. We’llwork with you to define the bestcombination of resources to get thejob done quickly and correctly.Complete test system solutions letyou focus your engineering andmanagement resources on thesuccessful development of yourbusiness.

Agilent channel partners provideadditional expertiseAgilent also has a network of value-added third-party integrators thatspecialize in specific test andmeasurement applications. Agilentwill employ these integrators asneeded to provide a complete testsystem solution to your measure-ment needs. For example, Agilentpartners with ATN Microwave, Inc.to provide fully-configured load pullsystems for large-signal devicecharacterization.

System support servicesSystem support is as critical asdesign, components and integration.From the moment you begin to workwith us to define your system needs,our support team is part of theprocess. Our engineers identify yourrequirements from a thorough under-standing of how your businessoperates. We then tailor a supportplan that includes information aboutsystem installation and verification;support options and training; andwho to call if the need arises.

From preventative maintenance that minimizes downtime to rapid-response parts replacement thatgets you back on-line quickly ifproblems do occur, we’ll be there foryou. You’ll be supported by Agilent’sglobal network. We can even arrangesupport for non-Agilent equipment,giving you the convenience of single-vendor service. Support offereddepends on system requirements.

System solutionsComplete system solutions to meet your ever-changing measurement challenges

Agilent partners with ATNMicrowave to provide load pullsystems. Shown here are theelectronic load modules (ELM), the electronic mainframe (EM) and a signal conditioning module(SCM) from ATN Microwave thatare typically integrated into a loadpull system.

Customized solutions areavailable for most systems,as with this single-connectionmultiple-measurement(SCMM) test system.

For More InformationPlease request the following literature foradditional information:

Literature Pub. numberAgilent 8510 Network Analyzer,Color Brochure 5091-8970E

Agilent 8510 Family Network Analyzer, Configuration Guide 5091-8967E

Agilent 8510 Family Network Analyzer, Data Sheet 5091-8484E

Agilent 85103 Upgrade Packages to the Agilent 8510 5091-8969E

Agilent 85106 Millimeter-wave Network Analyzer System, Product Overview 5964-4229E

Agilent 85108 Series Network Analyzer Systems, Product Overview 5091-8965E

Agilent 8510XF 110 GHz Single-Sweep Systems, Product Overview 5965-9888E

Agilent 85118 Series High-Power Amplifier Test Systems, Product Overview 5963-9930E

Agilent 85120 Series T/R Module Automated Test Systems, Product Overview 5965-2974E

Agilent 8530 Microwave Receiver, Color Brochure 5091-0699E

Agilent Technologies’ Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive,while minimizing your risk and problems. We strive to ensurethat you get the test and measurement capabilities you paid for and obtain the support you need. Our extensive supportresources and services can help you choose the right Agilentproducts for your applications and apply them successfully.Every instrument and system we sell has a global warranty.Support is available for at least five years beyond the productionlife of the product. Two concepts underlie Agilent’s overall support policy: “Our Promise” and “Your Advantage.”

Our Promise“Our Promise” means your Agilent test and measurementequipment will meet its advertised performance andfunctionality. When you are choosing new equipment, we willhelp you with product information, including realisticperformance specifications and practical recommendationsfrom experienced test engineers. When you use Agilentequipment, we can verify that it works properly, help withproduct operation, and provide basic measurement assistancefor the use of specified capabilities, at no extra cost uponrequest. Many self-help tools are available.

Your Advantage“Your Advantage” means that Agilent offers a wide range of additional expert test and measurement services, which you can purchase according to your unique technical and businessneeds. Solve problems efficiently and gain a competitive edge by contracting with us for calibration, extra-cost upgrades, out-of-warranty repairs, and on-site education and training, as well as design, system integration, project management, and otherprofessional services. Experienced Agilent engineers and tech-nicians worldwide can help you maximize your productivity,optimize the return on investment of your Agilent instrumentsand systems, and obtain dependable measurement accuracy for the life of those products.

Get assistance with all your test and measurement needs at: www.agilent.com/find/assist

Product specifications and descriptions in this document subject to change without notice.

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