abstract_cntfet_2015_stem-day

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Carbon Nanotube-Based Nanoelectronic Devices and Circuits Xavier Crutcher, John Elike, Richard Hamnond, Joe’l Johnson, Jada Gray, Alishia Reynolds, and Meskerem Zergaw Department of Electrical Engineering and Computer Science, Alabama A&M University Abstract: We report fabrication of single-walled carbon nanotube field-effect transistors (CNTFETs) and CNTFET-based nanoelectronic circuits using semiconductors as the source/drain contact material. Common problems in the fabrication of carbon nanotube field effect transistors (CNTFETs) include the positioning of tubes across electrodes and poor device electrical performance due to the presence of metallic nanotubes intermixed with semiconducting ones. To circumvent these problems, dielectrophoresis (DEP) will be used for tube alignment, while semiconducting electrodes such as Sb 2 Te 3 instead of metal electrodes in CNTFETs will be employed to selectively turn off metallic nanotubes resulting in improved device electrical characteristics. The submicron-meter gates within the source and drain in the fabrication of CNTFETs will be fabricated using the ion beam assisted deposition capability of the dual electron/ion beam system. Carbon nanotube-based oscillators will then be fabricated with the CNTFETs. The electrical measurements on the CNTFETs and oscillators will be performed and the measurement results will be reported.

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Page 1: Abstract_CNTFET_2015_STEM-Day

Carbon Nanotube-Based Nanoelectronic Devices and Circuits

Xavier Crutcher, John Elike, Richard Hamnond, Joe’l Johnson, Jada Gray, Alishia Reynolds, and Meskerem Zergaw

Department of Electrical Engineering and Computer Science, Alabama A&M University

Abstract:

We report fabrication of single-walled carbon nanotube field-effect transistors (CNTFETs) and CNTFET-based nanoelectronic circuits using semiconductors as the source/drain contact material. Common problems in the fabrication of carbon nanotube field effect transistors (CNTFETs) include the positioning of tubes across electrodes and poor device electrical performance due to the presence of metallic nanotubes intermixed with semiconducting ones. To circumvent these problems, dielectrophoresis (DEP) will be used for tube alignment, while semiconducting electrodes such as Sb2Te3 instead of metal electrodes in CNTFETs will be employed to selectively turn off metallic nanotubes resulting in improved device electrical characteristics. The submicron-meter gates within the source and drain in the fabrication of CNTFETs will be fabricated using the ion beam assisted deposition capability of the dual electron/ion beam system. Carbon nanotube-based oscillators will then be fabricated with the CNTFETs. The electrical measurements on the CNTFETs and oscillators will be performed and the measurement results will be reported.