The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices.

The A3050 offers a suite of options to address the variety of testing needs in the low-end and mid-range semiconductor markets, including the Converter Test Option, Memory Test Option, Mixed-Signal Option. Its small footprint and high parallel test throughput provide the most economical approach to testing complex VLSI devices with embedded memory and analog cells.

TM

Low cost  New technology High performance

Cogent ATEA3050

applications ✱ Logic ✱ Memory ✱ FPGA ✱ Consumer soc ✱ Microcontrollers ✱ ASIC

summary The A3050 delivers up to 512 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities up to 16 devices.

specications

Digital I/O Channels 512 Max, 32Channels/Board

Parallel Test Site 16

Data Rate 50MHz

Clock Rate 100MHz

Timing Generators 6 edge/Pin

Edge Placement Res. 1nS

Pattern Memory Depth 4M

Strobe Mode Edge/Windows

Pin Electronics Driver -2.0V～+7.0V

Rise/Fall 2.8nS/3V

Min Pulse Width 4nS/5V

Pin Electronics Comparator

-2.0V～+11.0V

Utility Relay 64

Format NRZ/RZ/RO/XOR/INVNRZ/INVRZ/INVRO/INVXOR

APG X-GEN16bits, Y-GEN 16bits, D-GEN 16bits

PMU PPMU,BPMU

DPS 16

OPTIONS

DPS Device Power Supply

HDVI High density VI Source

MT Memory Test Option

APMU Analog Pin Measuerment Unit

ADT Converter Test Option

*All specifications subject to change without notice.

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