a 128-channel event-driven readout asic for the r 3 b tracker twepp 2015, lisbon lawrence jones asic...
TRANSCRIPT
A 128-channel event-driven readout ASIC for the R3B
Tracker
TWEPP 2015, Lisbon
Lawrence Jones
ASIC Design GroupScience and Technology Facilities Council
Rutherford Appleton Laboratory
Superconducting Fragment Separator (Super-FRS) at FAIR, GSI
High-energy branch
Nuclear reactions using high-energy radioactive beams.
Introduction
R3B Experiment
Reactions with Relativistic Radioactive Beams - R3B
Target recoil detector measures light charged particles and gamma rays
Silicon Tracker surrounds the target together with CALIFA calorimeter
R3B silicon tracker
Silicon microstrip sensor
Dual-sided silicon strip sensorsConsists of 3 layers120,000 channels100 micron thickness for the inner layer and 300 micron thickness for the two outer layers.
Introduction
R3B ASICs
Detector Geometry
50um pitch
Double-sided (n & p) stereoscopic strips
Strip length varies depending on position
Capacitance – few pF to 80pF
Data rate – Dependent on position in detector. Worst case: 5kHz/channel
Occupancy – Dependent on position in detector. Worst case: 15%
ASICs on p side at high voltage
Proton rate is ~100s of Hz
Delta electron (background) rate ~100s of kHz (some reactions)
Worst case count rate limited by ADC occupancy
Califa calorimeter will see the protons but not the electrons
Califa produces a “proton detected” validation signal to the ASIC
Tells ASIC to only buffer events when validation is high
The front end must cope with the100kHz electron rate even if the data is not read out
The front end must also recover from 1GeV signals caused by beam misalignment
High dynamic range 50MeV (2V), low threshold 100keV (2mV)
Transistor mismatch
Challenges
Specification
Functional128 ChannelsDetector capacitance: up to 80pFSignal polarity: selectableEnergy range (silicon strips): 50MeVDC input couplingLeakage current compensation: up to 100nASelectable shaping time: 0.5s – 8 sNoise: ~7keV + 0.15keV/pF (RMS) at 2us shapingData Driven readoutADC: 12 bit SAR, ~1 Msample/sNearest neighboursInput Clock Frequency: 100MHz or 200MHzDaisy chainable (50MHz)Manchester coded output (selectable)15 bit Timestamp (5ns or 10ns)On-chip bandgap and DACs for bias generationPower consumption: 7mW /ChannelPower supply: 3.3V
PhysicalProcess: AMS 0.35um CMOSSize: 12.9mm x 6.2mm
R3B ASIC Block Diagram
……
…..
.
Preamplifier Shaper
Gain Amplifier
Peak Hold
Comparator
Comparator
Time StampCounter
AnalogueMultiplexer
12 bit ADC
CalibrationMask
Time Stamp Clock
Energy Threshold
Time Stamp Threshold
CalibrationVoltage Level
CalibrationControls
128 Channels
Signal
I2C Interface
128 bit OR
…….
Trigger
Channel Control Logic
Gain Amplifier
Hit
fro
m
Nei
ghb
our
Hit
to
Nei
ghb
our
Chip Control Logic
DataBuffer
Va
lidat
ion
Hit
fro
m
Nei
ghb
our
Hit
to
Nei
ghb
our
200/
100M
Hz
50M
Hz
Dat
a
Dat
aV
alid
Rea
dEna
ble
50M
Hz
Dat
a
Dat
aV
alid
Rea
dEna
ble
Control Registers
Energy
Timestamp
Channel Readout
Dai
sy C
hain
Rea
dout
Interface & Registers
Test Pulse Circuit
Preamps Shapers x10 amps Com
ps
PHTes
t Channel logic ADC I2C
Control Logic
Bandgap & Bias DACs
R3B ASIC Layout
+
-
-
+
RST
Detector
Cf = 1.41pF
VPRE
TrimmedVPREMiller Comp Control
Ibias
Icom
p
To Shaper
Leakage Compensation Circuit
Constant Current Feedback
Overload Protection
PreamplifierDetector DC coupled, capacitance up to 80pF
Two feedback circuits, one for leakage current compensation up to 100n. Either can be powered down
Programmable compensation to minimise the rise time and keep the amplifier stable over the different strip capacitance
Range 50MeV (silicon strips)
Pulsed reset, to recover from delta electrons
Switchable polarity feedback
Programmable bias between 0.5V and 2.5V
Overload recovery for 1GeV signals.
Trimmable bias to feedback to compensate for mismatches in the preamp
Electrons mode
1.3pF
1.3pF
2.6pF
5.2pF
10.4pF240k
1M
RST
500f
500f
1p
2p
4p
RST
From Preamp
To Peak Hold
VSHA
380k
ShaperDifferential amplifier
CR-RC
Bias programmable between 0.5V and 2.5V
Pulsed reset
Programmable shaping time between 0.5us and 8us (4 bit)
12
1.1pF Resistive Feedback
RST
110fF
From Preamp/Shaper
To Comparator
VPRE10 / VSHA10
x10 Amplifier
Low threshold requires gain before comparators
Differential amplifier
Gain set by capacitors
Large value resistive feedback to avoid drift when no signals
Bias programmable between 0.5V and 2.5V
Pulsed reset
Peak Hold
Dual polarity peak hold circuit One amp used as buffer Common capacitor to save space
S a m p l e B
Sa
mp
le
S a m p l e B
S a m p l e
Hit
B
Rs
t
C P H
C S H
S a m p l e
F r o mS h a p e r
T o A n a l o g u eM u l t i p l e x e r
1 s t a g e d i f f a m p
1 s t a g e d i f f a m p
V P H
V O U T
V S H A
T r i c k l e C u r r e n t
V S H A
V P H
V O U T
Hi t
Samp le
Rs t
Peak Hold (holes mode)One amp used in peak hold circuitOther amp used as bufferTrickle current keeps circuit biased when there is no signal to avoid it drifting due to leakage currentsTrickle current removed when a signal occurs
Preamp
Preamp Reset
Shaper
Shaper Reset
Peak Hold
HitSamplePeak Hold Reset
Analog Mux Out
PH Sample
Simulation of analogue data path
Hit synchronised here
Hit occurs here
Programmable dependingon peaking time
1MHZ Clk
Sample
PreampRst
ShaperRst
Peak Hold RstB
Programmable
Minimum (1)
(2)
(3)
(0)
ShaperOutput Timing
Programmable sample time to account for shaping time
Programmable Peak hold reset length (also resets digital)
Preamp and shaper have fixed length resets
12 bit successive approximation ADC
4 MSBs from resistor string
8 LSBs from capacitor array
Runs at
1 Msample/s
Variable clock period
Comparator Input
ADCDV
RUN
CLK
……
…...
Preamplifier Shaper
Gain Amplifier
Peak Hold
Comparator
Comparator
Time StampCounter
AnalogueMultiplexer
12 bit ADC
CalibrationMask
Time Stamp Clock
Energy Threshold
Time Stamp Threshold
CalibrationVoltage Level
CalibrationControls
128 Channels
Signal
I2C Interface
128 bit OR
…….
Trigger
Channel Control Logic
Gain Amplifier
Hit
from
N
eigh
bour
Hit
to
Nei
ghbo
ur
Chip Control Logic
DataBuffer
Val
idat
ion
Hit
from
N
eigh
bour
Hit
to
Nei
ghbo
ur
200/
100M
Hz
50M
Hz
Dat
a
Dat
aVal
id
Rea
dEna
ble
50M
Hz
Dat
a
Dat
aVal
id
Rea
dEna
ble
Control Registers
Channel Control LogicDetects Hits and sequences sampling of data. Runs at 1Mhz clock
Controls the resetting of the analogue channels
Reads out data stored in channels to ADC and FIFO
Generate an OR of all hits which can be transmitted off chip as a trigger
Chip Control LogicGenerates clocks
Reads out ADC and FIFO
Shifts data off-chip
Controls daisy chaining
3
Clk
Ou
t
Da
taO
ut
DA
Vin
RE
No
ut
Clk
In
Da
taIn
DA
Vo
ut
RE
Nin
2
Clk
Ou
t
Da
taO
ut
DA
Vin
RE
No
ut
Clk
In
Da
taIn
DA
Vo
ut
RE
Nin
1
Clk
Ou
t
Da
taO
ut
DA
Vin
RE
No
ut
Clk
In
Da
taIn
DA
Vo
ut
RE
Nin
0
Clk
Ou
t
Da
taO
ut
DA
Vin
RE
No
ut
Clk
In
Da
taIn
DA
Vo
ut
RE
Nin
F i r s t
L a s t
C l k S e l
F i r s t
L a s t
C l k S e l
F i r s t
L a s t
C l k S e l
F i r s t
L a s t
C l k S e l
1
1
0
0
0
0
0
0
0
0
1
0
0
00
Ch ip 0
Ch ip0 Ch ip 1
Ch ip0 Ch ip1 Ch ip2
Ch ip 0 Ch ip1 Ch ip2 Ch ip3
DAVout0
DAVout1
DAVout2
DAVout3
RENout0
RENout1
RENout2
RENout3
DataOut0
DataOut1
DataOut2
DataOut3
Daisy ChainOne chip is Master - can generate 50MHz clock
All DAV (data available) signal are ORed as they pass down chain
REN (readout enable) signals stay high until sequence complete
Master finishes the readout cycle once the REN signal returns from the end
Data can be Manchester Coded to allow for capacitive coupling from HV domain
Programmable number of data packets per chip (0-255)
Binary
MC
CLK50MHz
Ma
ste
r
MC output
9 -b i ts - 0 07 -b i ts - 0 14 -b i ts - 0
2 start bits (11)
10 bit chip address
7 bit channel address
15 bit timestamp
12 bit ADC data
1 hi
t bit
1 st
op b
it (0
)
11 -b i ts - 0
1 2 3 4 5 6 7 98 10 11 12 13 14 15 16 17 1918 20 21 22 23 24 25 26 27 2928 30 31 32 33 34 35 36 37 3938 40 41 42 43 44 45 46 47 48
Data Format
Start bits “11”
10 bit chip address
7 bit channel address
15 bit timestamp
12 bit ADC data
1 bit hit status
Stop bit “0”
Timestamp correction If Hit Bit =1 - Indicates the timestamp comparator has fired
If Hit Bit = 0 - Indicates the timestamp comparator has not fired
In this case the timestamp is generated by the slower energy comparator and needs correcting
Timestamp threshold has to be set higher than energy due to noisier chain
In case of small signals, the timestamp may not fire. In case of large signals when reading neighbours (charge sharing)
Example – channels 16 and 24 are hit and have correct timestamp (274)
Neighbours timestamps are generated by the energy comparator which is passed to the neighbours (285)
Trimming of Energy Threshold
Before trimming After trimming
Channel Number
Th
resh
old
Se
ttin
g
118
138
128
158
148
98
108
0 20 40 60 80 100 120
Channel Number
118
138
128
158
148
98
108
0 20 40 60 80 100 120
Th
resh
old
Se
ttin
g
Sweep threshold across noise and histogram number of hits for each channel
No
rma
lise
d c
ou
nt
Threshold
x10Amp
Shaper
Vbias
Trim
HIT
LinearityA
DC
cod
e
Test pulse amplitude code
HolesElectrons
Non-Linearity
Non-linearity <1 %
Obtained using the on-chip test pulse circuit
ADC Non-linearity
INL = 2LSB
DNL = 0.6 LSB
Obtained by bypassing the front end
Noise
Energy(keV)
Input Capacitance (pF)
Noise measured at output of ADC with ADC noise removed
Test with mixed-alpha source
Source position in middle of detctor
Vacuum (2.5x10-7 bar)
N-side is face up, P-side face down
Test with mixed-alpha source
N-side P-side
No charge sharing corrections
Can identify the three energy peaks on the N-side
Present status of the R3B ASIC
R3B ASIC is under test in conjunction with the silicon sensors
Channel readout and daisy chaining are fully functional
It’s possible to trim the comparators for energy and timestamp
ADC is operational with no missing codes - INL 2LSB, DNL 0.6LSB
Linearity is good to 99%
Noise: 7keV (RMS) for short strips, 20keV for long strips at 2s shaping
Timestamp working
Daisy chaining fully functional
Tests are continuing
Present status of the R3B Tracker
4 full outer detectors with 32 ASICs on each are complete4 chains per side of detector, 2 are fully bonded, tested and workingInner layer and one outer layer will be fully assembled and tested by March 20163rd layer will be added at a later date
Thanks to the R3B tracker collaboration
Contact Details
Lawrence JonesIC Design Engineer, ASIC Design Group
Science and Technology Facilities CouncilRutherford Appleton Laboratory,Harwell Campus,DidcotOX11 0QXUnited Kingdom
Tel +44(0)1235 446508 Fax +44(0)1235 445008Email: [email protected]
Thank you for Listening