17-00 hafed introspect new trends in the high-volume ......manufacturing-test/ – solutions for...
TRANSCRIPT
Mohamed HafedIntrospect Technology
New Trends in the High-Volume Manufacturing Test of MIPI-Based Devices
© 2019 MIPI Alliance, Inc. 2
Agenda• Introduction• Hardware Requirements for MIPI Testing in Production• Protocol Requirements for MIPI Testing in Production• System-Oriented Testing & Case Studies
© 2019 MIPI Alliance, Inc. 3
Typical Device Classes
© 2019 MIPI Alliance, Inc. 4
Golden Device
Methodology
ATE or Bench Instrument
Add-On(e.g. Scope)
Test Methodology Spectrum
Reduce Cost / Increase Quality
Test Module
Test Methodology Spectrum
Achieve Instrument Grade
© 2019 MIPI Alliance, Inc. 5
Test Methodology Spectrum – On-Board Channel Card
Hardware Requirements
© 2019 MIPI Alliance, Inc. 7
Low-Power (LP) and High-Speed (HS) Signaling
*LVCMOS = Low-Voltage Complementary Metal Oxide Semiconductor Logic
© 2019 MIPI Alliance, Inc. 8
Switching Challenges on ATEIntegrated Driver Conventional Switch-Based Solution
With Hi-Z loadWith Hi-Z loadSwitch timing & charge
injection cause poor timing control
Challenges exist because of receiver switchable
termination as well
Proper D-PHY LP/HS transition
Proper C-PHY LP/HS transition
© 2019 MIPI Alliance, Inc. 9
Multi-Level HS Drivers and Comparators
© 2019 MIPI Alliance, Inc. 10
Equalization WaveformsD-PHY C-PHY
© 2019 MIPI Alliance, Inc. 11
Bidirectional Bus Control
Protocol Requirements
© 2019 MIPI Alliance, Inc. 13
Packet Based Communication
© 2019 MIPI Alliance, Inc. 14
DUT Configuration Through the MIPI Bus
© 2019 MIPI Alliance, Inc. 15
Functional Testing on ATE
System-Oriented Testing and Case Studies
© 2019 MIPI Alliance, Inc. 17
Microcontroller CSI-2 Input Test
© 2019 MIPI Alliance, Inc. 18
Microcontroller CSI-2 Input Test
© 2019 MIPI Alliance, Inc. 19
DDIC* with Integrated Device Response Checking
*DDIC = Display Driver IC
© 2019 MIPI Alliance, Inc. 20
Image Sensor Test
Low-Speed ATE with Image Processor
Illuminator
DUT
Module used as a fast capture tool
© 2019 MIPI Alliance, Inc. 21
Summary• Increasing requirements have emerged for at-speed testing
of MIPI-based devices• System-like solutions are being developed by manufacturers
of microcontrollers, image sensors, display drivers, and storage devices
• Hardware and protocol requirements for enabling the test of such solutions have been described in this presentation
© 2019 MIPI Alliance, Inc. 22
• https://introspect.ca/– Total solutions for most high-speed interface technologies
• https://introspect.ca/products-solutions/high-volume-manufacturing-test/– Solutions for at-speed testing during mass production
• https://introspect.ca/products-solutions/mipi-camera-and-imaging/– Image sensor test and validation solutions
• https://introspect.ca/products-solutions/mipi-display-and-touch/– Display test and validation solutions
https://introspect.ca
ADDITIONAL RESOURCES
