04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

1

Automated Testing Environment

Concepts required for testing embedded systems adopted in this course

(quizzes, assignments and laboratories)

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

2 / 28

To be tackled today

Why test, and what kinds of tests are there? Difference between

TLD – Test Last Development TDD – Test Driven Development

(Test First Development) How do you add tests? More details on the testing process E-TDD and

the testing toll E-UNIT Other kinds of available tests – time and access Design of custom TESTs and ASSERTS

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

3 / 28

Why test?

Unit test I AM CURRENTLY BUILDING A NEW FUNCTION –

does it work the way I expect? Testing my and my partner’s understanding of the

Design WE ARE DESIGNING A NEW PRODUCT

-- If we can’t explain (to ourselves via a test) the product ideas – how do we know when product is working?

Regression testing MY PARTNER ADDED A NEW FEATURE to a product –

how do I know it did not “break something” I wrote? System testing

How do I PROVE TO THE CUSTOMER that the product (Lab. or assignment) works the way that was requested?

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

4 / 28

What are the problems with this sort of “Human intervention” test?

This code would be placed

inAssignments1

directory with the rest of the

customer code

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

5 / 28

VisualDSP development environment(IDDE) – Communication overhead

DebuggingInterface

“JTAG” boundary scan operation

Processor

Peripherals

BF533 Evaluation Board

VisualDSP++

program

Debugging Interface

HPPCIce

Lab. station (ICT318 / 320)

Each time we want to send a message (via printf( ) or cout) we must “stop” the processor from doing what we want it to do, and then send messages over the interface – Slow, plus the testing can impact on peripheral performance.

E.g. no sound while doing printing in Assignment 2 and Lab. 1

THIS PROBLEM IS COMMON TO ALL EMBEDDED SYSTEM DEVELOPMENT NOT JUST THE BLACKFIN USED IN THE LAB.

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

6 / 28

More issues with this sort of test!

Tests are mixed up “with production code”, in many places Must remove tests before release to customer

Unreliable – may result in test messages at wrong time in released code

Difficult to “add” and “remove tests” from production code without introducing new errors

Results can be checked automatically – therefore unlikely to have tests run often during development – leads to unreliable product

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

7 / 28

E-TDD Tool

E-TDD – embedded test driven development Build-the-tests-first (during design) ideas for product

development has been made popular by the “Agile” approach

Requires an automated testing approach (test framework) In this class, we are going to use the E-Unit tool for

its automated behaviour Will use in both “test last” development (what most people

currently do) and in “test first” development (trying to encourage).

I (the customer) will provide tests so that you can check that you have developed the “right” stuff at the “high” level

You will build additional tests to check your own code at the “low level”

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

8 / 28

Test Environment

Can download “LabTestEnvironment.zip” file from the web (Check the September webpages for exact name of file)

LabX directory is where you keepyour “project” code LabXcode_main.cpp LabX_start.cpp LabX_initializeASM.asm

LabXTests is where you keep the tests for LabX

LabXtests_main.cpp (built by GUI) Tests_for_LabX_start.cpp Tests_for_LabX_initializeASM.cpp written in C++) E_UnitConnect.cpp (built by GUI)

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

9 / 28

Build a new VDSP project “Assignment1Test” and place in “Assignment1Tests” directory

Now add certain standard files to the project Same set of files for all assignments and

laboratory Use the automated features of the GUI

to “convert” VDSP project to test project

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

10 / 28

Now add your Assignment1 subroutines files to the Assignment1Test project

Don’t move or copy the files into the test directory – just “add” them to the project

Note the use of “Assignment1.h” which has the prototypes for all “C++” and “assembly code” functions used (from AssignmentX dir.)

This files are “added” using VDSP to the“Test” project and NOT copiedfrom the Assignment1 directory

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

11 / 28

The GUI has automatically added the “Tests_main.cpp”

The GUI has automatically added a “TestGroup” file for you

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

12 / 28

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

13 / 28

Modify “Assignment1Tests.cpp” to perform the needed testing

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

14 / 28

Tests and Test Groupshave a standard format

TESTGROUP NAME

TESTGROUP NAME,

TEST NAME

Add further tests at this location

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

15 / 28

Tests then need to be customizedA lot of this can be automated by GUI

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

16 / 28

Test ComponentsRemember format for “exams” and “quizzes”

The ACTUAL Test (This is a TEST MACRO)CHECK(result1 == result2) – If an error occurred what

was ‘result1’ being used for?Error result1 != result2

Would get better test error messages if we “self-documented the code”

int resultCPPCode = ; int resultASMCode = CHECK(resultCPPCode == resultASMCode);Error resultCPPCode != resultASMCode

Test CONTROL statements (ALL MACROS) TEST_CONTROL( testgroup_name) TEST_FILE_RUN_NOTIFICATION( testgroup_name)

Have added stub versions of functions

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

17 / 28

Note “code DEFECT”

There is NO return valueplaced in R0

Now build source files to make executable

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

18 / 28Note the format of the error messages with both C / C++ and name-mangled ASM name shown

Fix the code. Review the code for syntax errors and “logical” errors

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

19 / 28

DON’T IGNORE WARNINGSFIX THE PROBLEM, e.g. add .extern or fix type

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

20 / 28

Now “build and run” the testsAll the tests MUST fail (no code written) otherwise using bad tests

Quick test failure visualization

Detailed test failure information

Something wrong – how did the test pass with no code?

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

21 / 28

Now “build and run” the testsAll the tests should fail (no code present)

Quick test failure visualization

Detailed test failure information

Clicking on the “detailed test info”automatically takes you to the “test” that failed

The test that failed

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

22 / 28

Clicking on the “detailed test info”automatically takes you to the “test” that failed

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

23 / 28

Test information modes arecontrolled in “Test_main” Show Failures and Expected Failures only

Show Failures and Successes

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

24 / 28

Add a separate test to show that result2(from the ASM code) is equal to 42

Add further tests at this location

Gui automatically adds new test

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

25 / 28

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

26 / 28

Write the tests for “self-documenting” messages(What does “result1 == result2” mean if 200 tests present?)

HAVE – What is a ‘result1’ and a ‘result 2’

WANT

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

27 / 28

Write the “CPP” code to get to workbut “Write the ASM for speed”

FAIL

SUCCESS

SUCCESS

“../E-UNITIncludes/E-UNIT_Tests1Sept07.h”

Get a “Volun-tell” to come to the front and write the “better” test

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

28 / 28

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

29 / 28

Available ASSERTS More can be “customized”

CHECK(expected == actual) – Success if passes

XF_CHECK(expected == actual) – Success if “fails”

CHECK_EQUAL(expected, actual)

XF_CHECK_EQUAL(expected, actual) – Success if fails

CHECK_CLOSE(expected, actual, tolerance)

CHECK_ARRAY_EQUAL(expected, actual, length)

CHECK_ARRAY_CLOSE(expected, actual, length, tolerance)

REPORT(“character message”);

Special changes to editor .ini file makes this ASSERTS into highlighted key-words

04/21/23 Concept of Test Driven Development applied to Embedded Systems M. Smith University of Calgary, Canada

30 / 28

Handled today – some easy “non-programming” quiz and midterm questions

Why test, and what kinds of tests are there? Difference between

TLD – Test Last Development TDD – Test Driven Development

(Test First Development) How do you add tests for Assignment 1? More details on the testing process E-TDD and

the testing tool E-UNIT Other kinds of available tests – time and access Design of custom TESTs and ASSERTS