10656[1]

BIS 2005

B U R E A U O F I N D I A N S T A N D A R D SMANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARG

NEW DELHI 110002

IS : 10656 - 1983(Reaffirmed 2000)

Edition 1.1(1999-03)

Price Group 4

Indian StandardSPECIFICATION FOR

INSULATION RESISTANCE TESTER (ELECTRONIC TYPE)

(Incorporating Amendment No. 1)

UDC 621.317.735

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IS : 10656 - 1983

BIS 2005

BUREAU OF INDIAN STANDARDS

This publication is protected under the Indian Copyright Act (XIV of 1957) andreproduction in whole or in part by any means except with written permission of thepublisher shall be deemed to be an infringement of copyright under the said Act.



Electronic Measuring Equipment Sectional Committee, LTDC 21

Chairman Representing

SHRI C. S. RANGAN National Aeroneutical Laboratory (CSIR),Bangalore

Members

SHRI A. N. AGARWAL Central Scientific Instruments Organization,(CSIR), Chandigarh

SHRI R. V. AMARNATH Electronics Corporation of India Ltd, HyderabadSHRI ARJUN RAMAN Hindustan Instruments Ltd, New Delhi

SHRI D. H. PHADNIS ( Alternate )DR A. K. BANERJEE Bharat Heavy Electrical Ltd, Hardwar

SHRI B. B. VERMA ( Alternate I )SHRI R. JAYAPAL ( Alternate II )

SHRI A. K. BASAK Development Commissioner, Small ScaleIndustries, New Delhi

SHRI A. N. SAHAI ( Alternate )DR K. CHANDRA National Physical Laboratory, New Delhi

DR SARWAN KUMAR ( Alternate )SHRI K. L. GARG Directorate General of Supplies and Disposals

(DGS & D), New DelhiSHRI R. V. NARAYANAN ( Alternate )

SHRI G. R. GHOSH Ministry of Defence (DGI), New DelhiSHRI N. NARAYANA RAO ( Alternate )

DR GULSHAN RAI Department of Electronics, New DelhiSHRI B. S. BEDI ( Alternate )

SHRI M. M. KELA All India Instrument Manufacturers and DealersAssociation, Bombay

DR C. G. KHOT Ministry of Railways (RDSO), LucknowSHRI D. L. SAWHNEY ( Alternate )

SHRI S. D. KULKARNI Ruttonsha Simpson Pvt Ltd, BombaySHRI M. P. PARMAR ( Alternate )

SHRI B. C. MATHUR Unitron Ltd, Faridabad

( Continued on page 2 )

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IS : 10656 - 1983

2

( Continued from page 1 )

Members Representing

SHRI N. C. MISHRA Posts & Telegraphs Department, New DelhiSHRI R. K. ANGRISH ( Alternate )

SHRI B. L. NAGAR Toshniwal Bros Pvt Ltd, AjmerSHRI RAVINDER KUMAR TREHAN ( Alternate )

SHRI M. G. PANSARE Bhabha Atomic Research Centre, BombaySHRI S. N. PATKI ( Alternate )

SHRI R. M. PATHARKAR Piece Electronics and Electricals Ltd, BombaySHRI A. S. RAJPUT The Scientific Instrument Co Ltd, Allahabad

SHRI K. P. DHAWAD ( Alternate )SHRI K. P. RAMASWAMY Directorate General of Doordarshan, Delhi

SHRI P. K. CHAUDHURY ( Alternate )DR C. S. R. RAO All India Radio, New Delhi

SHRI K. M. PAUL ( Alternate )SHRI S. SAMBANDAN Electronics & Business Machines Pvt Ltd,

MadrasSHRI M. D. SANTHANAM Indian Telephone Industries Ltd, Bangalore

KUMARI K. R. JAYA ( Alternate )SHRI SASI KUMAR Kerala State Electronics Development

Corporation, TrivandrumSHRI C. RAJUKANNU ( Alternate )

SHRI T. SOMASUNDARAN Electronic Test & Development Centre, MadrasSHRI L. ARUMUGAN ( Alternate )

SHRI C. G. SUBRAMANYAN Electronics Trade & Technology DevelopmentCorporation Ltd, New Delhi

SHRI ISHWAR DUTT ( Alternate )SHRI V. S. SUNDARARAJAN Gujarat Communications & Electronics Ltd,

VadodaraSHRI K. THANGARAJ Motwane Mfg Co Pvt Ltd, Nasik

SHRI R. VENKITESWARAN ( Alternate )SHRI M. A. VACHASPATHI Bharat Electronics Ltd, Bangalore

SHRI K. R. SURESH ( Alternate )SHRI H. C. VERMA Associated Instrument Manufacturers (India) Pvt

Ltd, New DelhiSHRI N. GANESAN ( Alternate )

SHRI N. SRINIVASAN,Director (Electronics)

Director General, ISI ( Ex-officio Member )

Secretary

SHRI Y. S. ARYADeputy Director (Electronics), ISI

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IS : 10656 - 1983

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0. F O R E W O R D

0.1 This Indian Standard was adopted by the Indian StandardsInstitution on 29 August 1983, after the draft finalized by theElectronic Measuring Equipment Sectional Committee had beenapproved by the Electronics and Telecommunication Division Council.0.2 The electronic insulation resistance tester is a very convenient toolfor the measurement of insulation resistance quickly and accurately.The manufacture of such testers in the country is increasing to meetthe heavy demand. The preparation of this standard has beenundertaken to serve as a guide for the production of such instrumentsconforming to certain minimum requirements.0.3 This standard does not cover magneto generator type insulationresistance testers ( see IS : 2992-1980* ).0.4 It is recognized that for insulation resistance testers certainadditional provisions concerning environmental testing may benecessary. It is recommended that in such cases, these requirementsshould be a subject of agreement between the purchaser and themanufacturer.0.5 This edition 1.1 incorporates Amendment No. 1 (March 1999). Sidebar indicates modification of the text as the result of incorporation ofthe amendment.0.6 For the purpose of deciding whether a particular requirement of thisstandard is complied with, the final value, observed or calculated,expressing the result of a test, shall be rounded off in accordance withIS : 2-1960. The number of significant places retained in the rounded offvalue should be the same as that of the specified value in this standard.

1. SCOPE

1.1 This standard covers direct reading portable electronic insulationtester enclosing in the same case a dc to dc converter.

*Specification for insulation resistance testers (magneto generator type) ( firstrevision ).

Rules for rounding off numerical values ( revised ).

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IS : 10656 - 1983

4

2. TERMINOLOGY

2.0 For the purpose of this standard, the following definitions shallapply.

2.1 Rated Voltage The open circuit voltage of the tester betweentest terminals.

2.2 Rated Resistance The resistance indicated by the testercorresponding to the scale mark nearest to the scale mark of infinity.

2.3 Central Scale Mark The scale mark corresponding to 1/50 ofthe rated resistance with the scale values of 1, 2, 5 or an integralpower of 10 or multiples thereof.

2.4 Effective Range of Measurement That part of the scalewhere measurement can be made with the stated frequency.

2.4.1 The range of resistance value from 1/1 000 up to 1/10 of the ratedresistance value is termed as first effective range and the range ofresistance from 1/10 of the rated resistance to the rated resistancevalue is termed as the second effective range.

2.5 Error in Indication It is the difference between the indicatedvalue and the true value of the quantity being measured. The error ispositive if the indicated value is greater and negative if it is smallerthan the true value.

2.6 Ripple Factor The ratio of the ripple magnitude to thearithmetic mean voltage.

2.6.1 Ripple The periodic deviation from the arithmetic mean value.The magnitude of the ripple is defined as half the difference betweenthe maximum and minimum values.

2.7 Scale Length The length of the arc through the tips of theshortest scale mark. In case of multiscale instrument the scale lengthshall correspond to the longest of all scales.

2.8 Type Tests Tests carried out to prove conformity with therequirements of this specification. These are intended to prove thegeneral qualities and design of a given type of tester.

2.9 Acceptance Tests Tests carried out on samples taken from alot for the purpose of acceptance of the lot.

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IS : 10656 - 1983

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2.10 Rutine Tests Tests carried out on each tester to checkrequirements likely to vary during production.

3 RATINGS

3.1 The rated resistance and rated voltage of the insulation resistancetester may be selected from the values shown in Table 1.

3.1.1 The multi-range tester may be of the following two types:

3.1.2 The multi-range testers may be provided with a selector switchto change the range.

3.1.3 The tester shall not weigh more than 2 kg.

4. CONSTRUCTION

4.1 General The tester shall be sufficiently robust to withstandmechanical vibrations and shocks. Its working parts shall be housed ina case which shall be dustproof and of sufficient strength to affordadequate protection against external damage.

4.2 Terminals The tester shall be equipped with guard ring aroundthe line terminal. A guard terminal shall also be provided andelectrically connected to the guard ring in case of testers having ratedresistance of 1 000 M and more. The line terminal, guard ring andguard terminal shall be connected to the negative side and the eachterminal to the positive side of the converter. The line terminal, guardterminal and earth terminal shall be suitably marked, preferably as L,G and E respectively to distinguish them.

4.3 Infinity Adjustment Testers having rated resistance1 000 M and more shall be provided with a suitable device accessiblefrom outside, for adjusting the pointer to the infinity mark.

4.4 Pointer The pointer shall have a knife-edge tip and be longenough to reach at least one third of the small scale marks.

TABLE 1 RATINGS OF INSULATION RESISTANCE TESTERS

( Clause 3.1 )

RATED VOLTAGE(dc volts)

100 250 500 1 000

Rated Resistance(M)

10 20 25 50 50 100 100 200

NOTE The insulation resistance tester may be single-range or multi-range.

a) Single rated voltage with multi-rated resistance ranges; andb) Multi-voltage with multi-rated resistance ranges.

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IS : 10656 - 1983

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4.5 Central Scale Mark The central scale mark shall be locatedapproximately in the centre of the total effective range.

5. EFFECTIVE RANGE OF TESTER

5.1 The effective range of the tester shall be from the rated resistancedown to one-thousandth of the rated resistance.

6. POWER SUPPLY

6.1 The tester shall work either on dry leclanche cells or onrechangeable cells.

7. GENERAL REQUIREMENTS

7.1 Operation of the Tester

7.1.1 The output voltage shall develop only on pressing a PRESS TOTEST push switch. This push switch may be of locking type.

7.1.2 A control may be provided to adjust the test voltage so that thepower supply cells are usable till they are discharged to 80 percentcapacity.

7.1.3 The degree of damping of the moving system of the tester, that is,the time elapsed till the pointer has been brought to standstill, when aresistance of the value corresponding to the central scale mark isinserted between the measuring terminals under the normalconditions of use, shall not exceed three seconds.

8. SAFETY REQUIREMENTS

8.1 The insulation resistance tester shall conform to the applicablesafety requirements according to IS : 9858-1981*.

9. LIMITS OF ERROR

9.1 Resistance The deviation of the pointer from the true valuemarked shall be within 5 percent in the first effective range and 10percent in the second effective range. At 1/10 of the rated resistancethe deviation of the pointer shall be within 5 percent. The deviation ofthe pointer at the infinity and zero or minimum value marked shallnot exceed 0.7 percent of the scale length.

*Safety requirements for electronic measuring apparatus.

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IS : 10656 - 1983

7

9.2 Terminal Voltage The terminal voltage shall be:

10. MARKING

10.1 The following particulars shall be indelibly and clearly marked onthe tester in a visible position :

10.2 The product may also be marked with Standard Mark.

10.3 The use of the Standard Mark is governed by the provisions ofBureau of Indian Standards Act, 1986 and the Rules and Regulationsmade thereunder. The details of conditions under which the licence forthe use of Standard Mark may be granted to manufacturers orproducers may be obtained from the Bureau of Indian Standards.

11. TESTS

11.0 General Tests shall be carried out unless otherwise specifiedat the standard temperature of 272C and relative humidity of 655percent.

11.1 Type Tests The following shall constitute the type tests andshall be carried out in the sequence given below on the sameinstrument:

a) within 25 percent of rated voltage corresponding to the ratedresistance, and

b) not less than 75 percent of rated voltage for the central scale mark.

a) A reference to this Indian Standard, for example, Ref IS : 10656;b) Serial number and model number of the tester;c) Rated voltage and rated resistance;d) Manufacturers name and/or trade-mark;e) Country of manufacture; andf) Brief instructions for using the tester and precaution to be taken

at the time of using the instrument, and at the time of storing.

a) High voltage test (11.5),b) Insulation resistance test (11.4),c) Tests for limits of error (11.6),d) Dust test (11.7),e) Vibration test (11.8),f) Bump test (11.9),g) Dry heat test (11.10),h) Dry cold test (11.11), andj) Damp heat (cyclic) test (11.12).

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IS : 10656 - 1983

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11.2 Acceptance Tests The following shall constitute theacceptance tests :

11.2.1 Sampling Plan The recommended sampling plan and criteriafor acceptance of lot are given in Appendix B.

11.3 Routine Tests The following shall constitute the routinetests:

11.4 Insulation Resistance Test The insulation resistance of thetester across all the external terminals connected together and thecontaining case, when measured by applying 500 V dc, shall not be lessthan the values given below:

The voltage shall be applied for a duration long enough to get asteady reading of the insulation resistance.

11.5 High Voltage Test No breakdown arcing or sparking shalloccur when an rms voltage of 2 000 volts is applied between all theexternal terminals connected together and the case for a period of1 minute.

NOTE The value of 2 000 volts shall be applicable provided the maximum steadystate output current does not exceed 5 mA ac and 10 mA dc or the mixed current10 mA peak. In all other cases the test shall be conducted at rated voltage (but notless than 2 000 volts).

11.6 Test for Limits of Error

11.6.0 Tests shall be done to prove conformity to the provision laiddown in 9.1 and 9.2 and those given below.

11.6.1 Error Due to Variation of Level A change of 5 degrees in thelevel of the tester, in any direction, shall not result in the deviation ofthe pointer from its initial position exceeding 0.5 mm.

11.6.2 Error Due to Variation of Ambient Temperature Thedeviation of the indication of the tester shall not exceed 5 percent nearthe central scale mark for the ambient temperature change by 20Cfrom 27C.

a) Insulation resistance test (11.4),b) High voltage test (11.5), andc) Tests for limits of error (11.6).

a) High voltage test (11.5), andb) Insulation resistance test (11.4),

a) For rated voltage up to and including 250 V 25 M , andb) For rated voltage above 250 V 50 M.

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IS : 10656 - 1983

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11.6.3 Error Due to Excessive Humidity The error of the tester shallnot exceed the limits specified in 9 before and after recovery after anexposure of 24 hours to a relative humidity of 90 percent and at atemperature of 27C.11.6.4 Ripple at Measuring Terminal The ripple factor at themeasuring terminal shall not exceed 10 percent.11.7 Dust Test11.7.1 The chamber for this test shall be capable of maintaining in anyregion inside it, where the tester may be placed, temperature of402C and a relative humidity of not more than 80 percent.11.7.2 The atmosphere within the chamber shall be agitated so as tokeep it loaded with dust particles of such a size as to enable them topass through a wire mesh IS sieve 150 micron with an aperture of0.15 mm [ see IS : 460 (Part 1)-1978* ]. The bulk of the material of thedust shall consist of free silica. The concentration of dust shall bedetermined by means of the device described in Appendix A where therequirement of dust concentration is also specified.11.7.3 The tester shall be placed in the test chamber for four hourswith the atmosphere stirred and the dust shall then be allowed tosettle for two hours. The tester shall then be removed from thechamber and shall satisfy the requirements given in 9.11.8 Vibration Test11.8.1 The vibration test shall be carried out in accordance with IS : 9000(Part 8)-1981. The vibration severities shall be as given below:

*Specification for test sieves : Part 1 Wire cloth test sieves ( second revision ).

Frequency Amplitude Duration Endurance ProcedureRange

Hz h10 to 150 0.15 mm

(2g)6 Endurance at resonance frequency in

most unfavourable directionIf direction is not known, vibration

shall be applied for 2 h in each ofthe three mutually perpendiculardirections. If no resonance isobserved, the equipment shall besubjected to vibration at each of thefrequencies 25, 50, 100 and 150 Hzfor h, that is, total duration

shall not exceed 6 h

Basic environmental testing procedures for electronic and electrical items : Part 8Vibration test.

112---

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IS : 10656 - 1983

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11.8.2 The following other requirements shall also be applicable:

11.8.3 After this test, the tester shall satisfy the requirements given in 9.11.9 Bump Test The bump test shall be carried out in accordancewith IS : 9000 (Part 7/Sec 2 )-1979*. The meter shall be subjected to4 000 bumps at an acceleration of 100 m/s2 with a pulse duration of6 ms, after which the error shall not exceed the values specified in 9.11.10 Dry Heat Test This test shall be carried out in accordancewith IS : 9000 ( Part 3/Sec 2 )-1977. The meter shall be subjected to atemperature of 553C for a period of 16 hours. After a recovery periodof 24 hours, the error shall be within the limits specified in 9.11.11 Cold Test This test shall be carried out in accordance withIS : 9000 ( Part 2/Sec 2 )-1977. The meter shall be subjected to atemperature of 103C for a period of 16 hours. After a recovery periodof 24 hours the limits of error shall not exceed the values specified in 9.11.12 Damp Heat (Cyclic) Test The test shall be carried out inaccordance with IS : 9000 ( Part 5/Sec 2 )-1981. The number of cyclesshall be 2 and after a recovery period of 24 hours, the error shall notexceed the limits specified in 9.

a) Axis of vibration : Three mutually perpendicular axesb) Magnetic interference : As less as possiblec) Method of mounting : Normal operational attitude with

antivibration mountings if providedd) Functional check : Need not be functioninge) Resonance search : The resonance frequency shall be found

by sweeping the frequency over therange selected from the table above.After resonance search, theinstruments shall comply withrequirements given in 9

f) Endurance : The instrument shall be subjected tothe endurance as specified in thetable above. After completion of theendurance, the instrument shall bechecked to comply with the require-ments given in 9.

Basic environmental testing procedures for electronic and electrical items:*Part 7 Impact test, Section 2 Bump.Part 3 Dry heat test, Section 2 Dry heat test for non-heat dissipating items with

sudden change of temperature.Part 2 Cold test, Section 2 Cold test for non-heat dissipating items with sudden

change of temperature.Part 5 Damp heat (cyclic) test, Section 2 12+12 h cycle.

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IS : 10656 - 1983

A P(

DUST CHAMBER AND ACO

A-1. DUST CHAMBERA-1.1 A schematic layout of the dust cycle is shown in Freproducible distribution ofand does not become conge(low pressure, high volume P where the dust is picked The air velocity decreases inback into the hopper H fromis fed back into the fan throuof the hopper tube are so pdust pressure may be, the duct. Consequently, the air amount of dust from a pile w

A-1.2 The arrangement desto result in a flow of dust lovertex. For this purpose, foconfiguration.

FIG. 1 SCHEMATIC LAYOUT11

P E N D I X AClause 11.7.2 )

PPARATUS FOR MEASURING DUST NCENTRATION

a typical chamber recommended for use forig. 1. It is designed to ensure uniform and dust. The system is completely enclosedsted during operation. A circulating fan Fventilating pattern) below air over the pileup and carried along into the chamber C. the chamber so that much of the dust falls where it returns to the pile, while the airgh the top of the chamber. The dimensions

roportioned that whatever the head of thepile P never completely fills the main airflow carried away, more or less, a constanthich eats replenished all the time.

cribed under A-1.1 may be modified so asaded air which takes the shape of a risingur dust jets may be used in a symmetrical

OF APPARATUS USED FOR THE DUST CYCLE

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IS : 10656 - 1983

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A-1.3 Few more important details of a typical dust chamber are givenbelow:

A-2. APPARATUS FOR MEASURING DUST CONCENTRATIONA-2.1 A simple measuring device is shown in Fig. 2. Dust enters the boxthrough the five circular holes and collects at the bottom of thedetachable cover. For measuring dust concentration, the device is placedin any representative position within the dust chamber. The air iscirculated for five minutes and the dust is then allowed to settle down.The amount of dust which collects on the detachable cover during thetotal test period is weighed and shall be 23 5 g.

a) Internal size of chamber 91.5 cm cubeb) Heater rating 750 wattsc) Fan rating 7 100 litres/min at a pressure

of 3.8 cm H2O, 250-watt,3 000 rev/min motor

d) Inside diameter of hopper pipe 2.54 cme) Inside diameter of circulating dust 12.7 cm

All dimensions in millimeters.

FIG. 2 DETAILS OF APPARATUS FOR MEASURING DUST CONCENTRATION

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IS : 10656 - 1983

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A P P E N D I X B( Clause 11.2.1. )

SCALE OF SAMPLING AND CRITERIA FOR CONFORMITY

B-1. LOT

B-1.1 In any consignment all the insulation resistance tester of the samerating manufactured from the same material under essentially similarconditions of production shall be grouped together to constitute a lot.

B-2. SCALE OF SAMPLING

B-2.1 For judging the conformity of a lot to the requirements of thespecification, tests shall be done for each lot separately. For thispurpose the number of insulation resistance testers to be selected atrandom from a lot shall be in accordance with col 1 and 2 of Table 2.

B-2.1.1 These tests shall be selected from the lot at random. In orderto ensure the randomness of selection procedures given inIS : 4905-1968* may be followed.

B-3. NUMBER OF TESTS AND CRITERIA FOR CONFORMITY

B-3.1 Each of the insulation resistance testers selected in the sampleshall be subjected to tests for high voltage and insulation resistance. Thelot shall be considered as conforming to the requirements, if the numberof failures in either of the tests is less than or equal to the acceptancenumber given in col 3 of Table 2; otherwise the lot shall be rejected.

TABLE 2 SCALE OF SAMPLING AND ACCEPTANCE NUMBER

( Clauses B-2.1 and B-3.1 )

LOT SIZE SAMPLE SIZE ACCEPTANCE NUMBER

(1) (2) (3)

Up to 50 8 0

51 to 100 13 0

101 to 150 20 0

151 to 300 32 1

301 and above 50 2

*Methods for random sampling.

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Bureau of Indian StandardsBIS is a statutory institution established under the Bureau of Indian Standards Act, 1986 to promoteharmonious development of the activities of standardization, marking and quality certification ofgoods and attending to connected matters in the country.

CopyrightBIS has the copyright of all its publications. No part of these publications may be reproduced in anyform without the prior permission in writing of BIS. This does not preclude the free use, in the courseof implementing the standard, of necessary details, such as symbols and sizes, type or gradedesignations. Enquiries relating to copyright be addressed to the Director (Publications), BIS.

Review of Indian StandardsAmendments are issued to standards as the need arises on the basis of comments. Standards are alsoreviewed periodically; a standard along with amendments is reaffirmed when such review indicatesthat no changes are needed; if the review indicates that changes are needed, it is taken up forrevision. Users of Indian Standards should ascertain that they are in possession of the latestamendments or edition by referring to the latest issue of BIS Catalogue and Standards : MonthlyAdditions.This Indian Standard has been developed by Technical Committee : LTDC 21

Amendments Issued Since Publication

Amend No. Date of IssueAmd. No. 1 March 1999

BUREAU OF INDIAN STANDARDSHeadquarters:

Manak Bhavan, 9 Bahadur Shah Zafar Marg, New Delhi 110002.Telephones: 323 01 31, 323 33 75, 323 94 02

Telegrams: Manaksanstha(Common to all offices)

Regional Offices: Telephone

Central : Manak Bhavan, 9 Bahadur Shah Zafar MargNEW DELHI 110002

323 76 17323 38 41

Eastern : 1/14 C. I. T. Scheme VII M, V. I. P. Road, KankurgachiKOLKATA 700054

337 84 99, 337 85 61337 86 26, 337 91 20

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Branches : AHMEDABAD. BANGALORE. BHOPAL. BHUBANESHWAR. COIMBATORE.FARIDABAD. GHAZIABAD. GUWAHATI. HYDERABAD. JAIPUR. KANPUR. LUCKNOW.NAGPUR. NALAGARH. PATNA. PUNE. RAJKOT. THIRUVANANTHAPURAM.VISHAKHAPATNAM

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Title Page0. Foreword1. Scope2. Terminology3. RatingsTable 1

4. Construction5. Effective Range of Tester6. Power Supply7. General Requirements8. Safety Requirements9. Limits of Error10. Marking11. TestsAppendix AFig. 1Fig. 2

Appendix BTable 2

10656[1]

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