1 the b a b ar silicon vertex trackerdouglas roberts, ucsb vertex ‘97, mangaratiba, brazil the b a...
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
The BABAR Silicon Vertex Tracker
Douglas Roberts
University of California, Santa Barbara
BABAR Collaboration
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Outline
BABAR and PEP-II Design and Physics Goals Silicon Vertex Tracker (SVT) Design
Considerations SVT Description
– Layout
– Silicon Wafers
– Upilex Fanouts
– Readout Electronics» Front End IC (AToM Chip)
» Hybrid and Tails
– Mechanical Support Assembly and Testing Prelim. Results From Recent System Test and
Beam Test Project Status
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
BABAR SVT Collaborators
Italy– INFN, Ferrara
– INFN, Milano
– INFN, Pavia
– INFN, Pisa
– INFN, Torino
– INFN, Trieste
U.S.A.– U.C., San Diego
– U.C., Santa Barbara
– U.C., Santa Cruz
– Lawrence Berkeley National Laboratory
– Stanford University
– U of Wisconsin
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
BABAR Physics Goals
International collaboration of ~530 physicists and engineers from 10 countries
Primary physics goal of the BABAR experiment is the systematic study of CP asymmetries in the decays of B0 and B0 mesons.– Reconstruct one of the B0 mesons in an exclusive
CP-study final state
– Tag the flavor of the other B meson in the event
– Measure the relative decay time of the two B mesons.
e+e- (4s), = 0.56
B0,zCP B0,
ztag
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
BABAR Physics Goals (cont.)
Standard Model predicts a time-dependent CP asymmetry:
Time integral of Af(t) = 0 at (4s), which makes a measurement of the time dependence essential– Reason for asymmetric collider
– Good vertex determination extremely important
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
PEP-II at SLAC
Asymmetric e+e- collider– E- = 9.000GeV, E+ = 3.109GeV
L = 3.0 x 1033 cm-2 s-1 , ultimately 1034.– ~30M BB/107s
Time between beam crossings = 4.2ns 0 crossing angle
– Final focus dipoles ~20cm from IP
– Very little space for SVT readout electronics
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
SVT Design Considerations
Vertexing Requirements– Mean vertex separation of 250m want single vertex
resolution better than ~80m.
– Readily achieved with silicon strip detectors Acceptance
– Want as close to 4 as possible
– Magnets at 17.2, both forward and backward
– Boost makes forward region very important» Move most manifolds and flanges to the rear
– Coverage from 20 < < 150.» In center-of-mass, 0.84 > coscm >-0.95
– All electronics outside of active tracking volume Stand-alone tracking
– Drift chamber begins at 22.5cm, so need to reconstruct particles with pt < 100MeV in SVT alone.
Radiation Tolerance– Layer 1 averages ~33 krad/yr
» Non-uniform in » Local max of 240 krad/yr for ~6
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
SVT Layout
5 Layers of double sided AC coupled silicon microstrip detectors
Inner 3 layers have six modules arranged azimuthally around the beampipe
Outer 2 layers have 16 and 18 modules, respectively.
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
SVT Layout (cont.)
Each layer has strips oriented parallel ( strips) and perpendicular (z strips) to the beam line
Total of 340 silicon wafers of 6 different types
About 0.94m2 of silicon ~150,000 readout channels
350mr30
Kevlar/Carbon Fiber Support Structure
Carbon Fiber Support Cone
Hybrid
Silicon
Beam Pipe(~1% X0)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
SVT Layout (cont.)
End View of BaBar Silicon Vertex Detector
LayerRadius (mm)
Modules / Layer
Wafers / Module
Phi Pitch (um)
Z Pitch (um)
1 32 6 4 50 1002 40 6 4 55 1003 54 6 6 55 1004a 124 8 7 100 2104b 127 8 7 100 2105a 140 9 8 100 2105b 144 9 8 100 210
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Silicon Wafers
6 different wafer models Wafers manufactured by Micron Made of 300m thick high resistivity
silicon with a [111] orientation
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Silicon Wafers:Mechanical Specifications
Wafer Type I II III IV V VI (wedge)Dimensions (mm)
z 42.40 45.40 43.90 67.55 53.90 67.97 41.30 49.42 71.47 52.50 52.50 52.80 -> 43.30
Readout Pitch (um)z 100 100 100 210 210 210 50 55 55 100 100 100 -> 82
Number of Stripsz 411 441 426 316 251 318 799 874 1275 512 512 512
Phys. Strip Pitch (um)z 50 50 50 105 105 105 50 55 55 50 50 50 -> 41
‘Physical Strip Pitch’ includes floating strip (strips not connected to readout electronics)
Models I, II and III have strips on the side; Models IV, V and VI have strips on the J side
strips on wedge detector vary such that the ratio between width and pitch is a constant
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Model II Wafer, -Side ()
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Model II Wafer, J-Side (z)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Model VI Wafer (wedge),J-Side ()
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Summary of Measured Wafer Parameters
Quantity
Rbias
Vdepl
Ibias
CIS
CAC
Cback
Rs (implant)
Rs (metal)
Radiation Damage
Value
~5 M (varies)
15-40 V
<100nA/cm2
1 pF/cm
20-40 pF/cm *
0.2, 0.4 pF/cm *
27, 55 k/cm *
7, 13 /cm
~ 300 nA/cm2/Mrad
* Depends on model number
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Upilex Fanouts
Provide an electrical connection between the metal strips on the silicon wafers and the front-end chip
Gang together z strips on outer 2 layers (2 strips read out by same electronics channel)
Testing area allows for testing before readout electronics are attached
Layer 2 FanoutsZ Fanout
Fanout
Testing Area
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Upilex Details
50m thick Upilex ™ substrate– UBE Industries Ltd, Japan.
4.5m Cu layer deposited on an adhesive 150nm Cr layer
Cu and Cr are etched to create circuit 150nm of Cr followed by 1m Au
(for wire bonding) are then electrolithically deposited
Trace resistance is typ. 2/cm Inter-trace capacitance = 0.52pF/cm
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Front-end IC(AToM Chip)
Must amplify, shape and digitize input in parallel for all channels
Buffer for duration of Level 1 trigger latency Sparsify data for readout High rates and small time between beam crossings
(4.2ns) implies data acquisition, digitization, buffering and readout must occur simultaneously
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Photo of Rad-Soft AToM
128 channels
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Shaper Output
Shaping time set to 100ns (setable to 100, 200, 300 or 400ns)
Charge injected via on-chip calibration circuitry
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Time-Over-Threshold Output
Comparison of analog ToT measured at comparator output and digitized ToT
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Expected Noise Performance
LayerShaping
Time (ns) Side ENC (e-)
1 100 Z 600 880
2 100 Z 660 810
3 200 Z 730 940
5 400 Z 910 1310
Based on full SPICE simulation– Front-end circuit
– Detector network based on measured detector parameters
– Upilex fanout
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Test Bench ResultsLayer 2 Module
Test bench consists of prototype of full SVT readout system:– Silicon + Upilex
– Rad-Soft AToM chip and Hybrid
– Prototype data transmission and DAQ
Decreasing Threshold
# F
irin
gs/(
50 e
vent
s)#
Fir
ings
/(50
eve
nts)
Threshold (DAC cnts)
Threshold (DAC cnts)
Threshold Scan
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Test Bench ResultsLayer 2 Module
Measured Offsets and Gains for 2 ICs
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Test Bench ResultsLayer 2 Module
Noise (in DAC counts) Measured from Threshold Scan
SideENC1070 e-
(calc = 880 e-)
J SideENC860 e-
(calc = 600 e-)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Hybrid
Double sided, multi-layer, thick-film circuit fabricated on 1.2mm thick AlN
3 Different Models– H1 (Layers 1 and 2) has 7 ICs/side
– H2 (Layer 3) has 10 ICs/side
– H3 (Layers 4 and 5) has 4 ICs on side, 5 on z side
Connects to power and data transmission system via flexible multi-layer kapton/copper tail (2 per hybrid)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Hybrid Pictures
Component Layout of H1 (Layers 1 and 2) with 7 ICs per side
Photograph of H3 prototype (Layers 4 and 5)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Mechanical Support:Ribs and ‘Foot’
Kevlar / Carbon Fiber Support Rib
Molded Carbon Fiber Endpieces
Layer 2 Rib and Endpiece Assembly
Exploded View of ‘Foot’ Region
Kevlar/CF Ribs
CF Endpiece
Cooling RingSilicon Upilex
FanoutsAlN Hybrid
AToM IC
Berg connector and tails
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Mechanical Support
Modules mounted on brass cooling rings, which are mounted on carbon fiber support cones
Forward and Backward cones held together with carbon fiber space frame
Entire assembly mounted on B1 magnets (final focus RE dipoles)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Finished Space Frame
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Module Assembly and Testing
Layer 2 Half-Module in ‘Ringframe’ fixture.
Upilex testing area still attached.
Side
z Side
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Testing Probe
Automated probe for testing modules before readout IC is attached
Uses 256-pin probe array to contact testing area on Upilex fanout
Connects to pA meter / Voltage source, LCR meter, single channel Q-amp
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Attachment of Hybrid
Upilex testing area is removed Hybrid is attached to Upilex Still utilizes same ringframe fixture
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Module Stiffening
Gluing carbon fiber / Kevlar ribs to a Layer 2 Module
Finished Module after rib attachment(upside-down)
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Arch Module Assembly
Module is assembled flat– Wafer-to-wafer gluing (except at bend)
– Upilex fanout glued to silicon
– Wirebonding and testing
– Attachment to hybrid
Bend angles vary from 21 to 28
Bending operation done on three fixtures that simulate the positions of the support cone mounting buttons– Defines rotation angle and axis
Stiffening ribs attached after bending is complete.
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
PRELIM
PRELIM
Prelim. Testbeam Results
CERN testbeam run with prototype layer 2 and layer 5 modules
Just finished data taking Monday, Aug. 25 All results are VERY PRELIMINARY
– Chip calibration not done.
– No alignment corrections made
Correlation between projected track position and hits in the SVT module
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
PRELIM
PRELIM
Prelim. Testbeam Results
Position correlation vs. angle of incident track.
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The BABAR Silicon Vertex Tracker Douglas Roberts, UCSB
Vertex ‘97, Mangaratiba, Brazil
Project Status
Many mechanical parts fabricated: support cones, space frame, ribs, endpieces...
Silicon wafer production underway; all 6 models perform as expected– ~60% of wafers already delivered from Micron
System test has verified a working readout system with reasonable noise performance
Final version of AToM IC has been submitted for rad-hard fabrication; expect chips in Dec.
First Layer 2 and Layer 5 modules have been constructed
Goal for installation: End of 1998