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Inter-Laboratory Comparison Study Using Modular

Instrumentation and Lessons Learned

Author: Dimaries Nieves – National Instruments

Senior Metrology Engineer

Speaker: Jorge Martins – National InstrumentsPrincipal Metrology Engineer

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Learning Objectives• How can we demonstrate performance and competence of modular instrumentation as part of metrology and accreditation process?

• Propose a process to perform an Inter-laboratory Comparison using a modular instruments.

• Standard Documents for ILC evaluation.

• Review some of the results and lessons learned.

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• Inter-laboratory Comparison (ILC) is a key criterion for laboratory accreditation

• ILC is an important asset in:• Measurement Reliability• Measurement Assurance• Calibration Process Confidence• Measurement Method• Technician Proficiency

• There is no commercial proficiency testing available for Modular Instrumentation.

For the last two years, National Instruments performed an interlaboratory comparison using Modular Instrumentation as the primary standard

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Modular Instruments

• Gradually taking an important role in test and measurement

• Enable more cost effective and flexible measurements

• Used in Research, Calibration, Validation and Production test

In metrology and laboratory accreditation process • Need to demonstrate performance

and competence performing regular calibration services.

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NI Inter-Laboratory Comparison Proposal

• The ILC was designed based on:• NCSLI’s RP-15 • ASTM E691-13

• Unit was monitored using the petal or flower model

• NI Certified Calibration Centers were selected to participate

• NIC Metrology Laboratory serves as the pivot Laboratory

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ILC Equipment Bias and Stability

• Stability of the reference unit was determined by the pivot Laboratory before starting the ILC process.

• No significant bias was found within the pivot measurements.

• The pivot laboratory monitor the performance of the unit to ensure that any unexpected changes in the traveling standard are promptly detected.

• Comparison of the pivot lab data showed that the unit remained in control throughout the all ILC.

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ILC Reference Value

• Reference values were determined using the pivot lab measurements.

• All pivot runs were included in the analysis• Statistical Analysis of the data was performed

• Uncertainties reported by the pivot laboratory include ILC process bias and deviations.

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First ILC Run

• NI PXI-4072 Flex DMM and LCR Meter (6 ½ digits DMM)

• NI Published Calibration Procedure

• “Verify Mode Only” procedure using NI’s calibration software, Calibration Executive

• Participants use their own chassis, standards, and cables to perform the measurements

•Report only one measurement result per point with an expanded uncertainty at 95% of confidence (k=2).

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For Evaluation

An En value was calculated for each

measurement provided for each laboratory

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Resistance Measurement Verification in 2-wire mode First ILC (2011)

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Resistance Measurement Verification in 4-wire mode

First ILC (2011)

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Second ILC Run• NI PXI-4072 FlexDMM and LCR Meter (6 ½ digits DMM) , Chassis and Cables (entire Setup).

• NI Published Calibration Procedure

• “Verify Mode Only” procedure using NI’s calibration software, Calibration Executive

• Performed three runs on the unit, doing a manual “Self Calibration” before each run

• Verify that the board temperature was stable at 35 ºC ± 2 ºC before performing the verification

•Report measurement result with an expanded uncertainty at 95% of confidence (k=2).

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Resistance Measurement Verification in 2-wire mode Second ILC (2012)

Pivot

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Resistance Measurement Verification in four-wire mode Second ILC (2012)

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Additional Analysis

• Consistency Evaluation• Within the laboratory

• S = Standard Deviation for one laboratory• Sr = Repeatability standard deviation of the equipment

• p = Number of laboratories participating in the ILC

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Additional Analysis

• Consistency Evaluation• Between Laboratory

• Where, = Lab average minus the average of the lab averages

• Where, Sx = Standard deviation of the lab averages

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Within-laboratory consistency (k) for DC Voltage measurement Second ILC (2012)

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Between-laboratory consistency (h) for DC Voltage measurement

Second ILC (2012)

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Conclusion

• Modular Instruments meet the published measurement specifications, regardless of the combination of chassis, controller and measurement I/O.

• However, for an ILC the higher requirements for repeatability and reproducibility make it advantageous to provide, not just the instrument but, the entire measurement system.

• Including the entire system in the ILC reduces differences between participants, improving the correlation of data.

• Several statistical tools are needed

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Questions?