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Page 1: © h.a.l.m. elektronik gmbh 2017 ·  © h.a.l.m. elektronik gmbh 2017 Al-contamination metallized crack defect below busbar edge isolation

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Average stabilized efficiency values for Si solar cells (156x156mm²)IT

RP

V 2

01

7

17%

18%

19%

20%

21%

22%

23%

24%

25%

26%

27%

2016 2017 2019 2021 2024 2027

sta

bil

ize

d c

ell

eff

icie

nc

y

BSF cells p-type mc-Si BSF cells p-type mono-Si

PERC/PERT cells p-type mc-Si PERC/PERT cells p-type mono-Si

PERC, PERT or PERL cells n-type mono-Si Silicon heterojunction (SHJ) cells n-type mono-Si

back contact cells n-type mono-Si

Recombination current densities

ITR

PV

201

7

0

50

100

150

200

250

2016 2017 2019 2021 2024 2027

Reco

mb

inati

on

cu

rren

t [f

A/c

m2]

J0 bulk p-type multi J0 bulk p-type mono

J0 front p-type material J0 rear p-type material

J0 bulk n-type mono SHJ or back contact J0 front/rear n-type mono SHJ or back contact

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t = D D

D D t

D D

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D

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D

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Al-contamination edge isolation metallized crack defect below busbar

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