microscopy@zeiss.com

www.zeiss.com/asb1detector

400 nm4 µm

ZEISS 1-Channel-AsB DetectorResolve Pure Material Contrast from Your Field Emission Scanning Electron Microscope (FE-SEM)

Higher Productivity and Versatility

• Faster image acquisition and through-

put for automated sample runs

• High long term and temperature

stability

• Clear, noise free imaging at low

accelerating voltages

• Expanded range of applications by

selecting the collection of high and

low angle BSE signals

• Detection of Rutherford Back-

scattered Electrons and Electron

Channeling Pattern to caracterize

crystalline samples

Increase productivity and improve the image quality of your FE-SEM by retrofitting

the new 1-Channel Angle selective Backscattered (AsB) Detector. Benefit from

the high speed and increased sensitivity thanks to improved detector and electronics

design. The new detector builds on the proven detection scheme of Angle selective

Backscatter (AsB) Detector and is available for ZEISS SUPRA, ULTRA and 15×× systems.

Ease of Use

• Complete integration into the pole

piece, no need to move in and out

• Plug and play technology

• No alignment to optical axis necessary

• Safe Navigation prevents samples

and stage from damaging detector

• Seamless integration of software

packages (e.g. SmartPI) in the

workflow

Higher Sensitivity and Resolution

• Higher material, topographical and

channeling contrast

• Reduced noise and improved reso-

lution compared to standard Solid

State Backscattered Detector (BSD)

• Increased signal-to-noise ratio

thanks to improved diodes and

electronics

• Better separation of particles from

bulk due to greater sensitivity at

lower accelerating voltagesEN

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