O. Siegmund, UCB, SSL 1

• Incom substrates, 33mm diameter, no notches

• 20µm pores, 8 deg bias, 60:1 L/D, 65% OAR

• ANL processed for resistive and emissive layer application + electrode• MCP #112—Resistive coating Chemistry 1— SEE Al2O3—Needs electrode coating

• MCP #114—NiCr electrode from Photonis-- 100MΩ in air,

112 MΩ vacuum, Resistive coating1 Chemistry 2—SEE Al2O3

• MCP #116—NiCr electrode from Photonis--

Resistive coating2 Chemistry 2—SEE Al2O3

Single 20µm MCPs from ANL

O. Siegmund, UCB, SSL 2

MCPs packed in fluoroware type containers with single Big chip in MCP 112, no electrode. Don’tSpider, rattle around inside, pickup dust and abrasion. propose to electrode due to chip HV breakdown

Need to use better containers and handling procedures. probability.

ANL processed MCPs, INCOM 20µmFrom ANL in August 2010

O. Siegmund, UCB, SSL 3

Images of dust specs on ANL MCPs. Most likely due to handling issues and packaging.Obtained with tangential illumination.

Even under magnification, more particulates can bee seen.

We used a wet cleaning, and removed most of the debris.

ANL processed MCPs, INCOM 20µmFrom ANL in August 2010

O. Siegmund, UCB, SSL 4

ANL processed MCPs, INCOM 20µm

All MCPs have straight line delineations across the Multifibers due to pore stacking issues. There are quite a few random blocked pores. Also fusion squashing closeto the multifiber boundaries and triple points.

O. Siegmund, UCB, SSL 5

ANL processed MCPs, INCOM 20µm

There are quite a few random blocked pores. Also fusion squashing closeto the multifiber boundaries and triple points. However there are not the large number of blocked pores near the multifiber boundary that were seen with the notched substrates on MCPs 91, 92, 93, 94.

O. Siegmund, UCB, SSL 6

ANL / Incom MCP 20µm SubstratesPhosphor Tests on MCP #114

Pore crushing near the multifiber boundaries causes a lowering of the gain. The gain depression is less severe when increasing the applied voltage, which then improves the image uniformity. Lots of “BRIGHT SPOTS” visible, these have enhanced response and are probably dust particles on the MCP.

1000v MCP 1200v MCP

O. Siegmund, UCB, SSL 7

• There are straight line image features within multifibers, stacking of different fibers??• The triple point voids, and distorted channels at the multifiber boundaries, cause gain reductions.• Some blocked pores • Lots of particulates, need to improve handling and packaging (steel containers).• Particulates in/on the ALD coating cause image “bright spots”, we need to examine event counting in MCP pairs to see if these are hotspots too.• One image dark spot.

ANL Processed Incom 20µm SubstratesObservations

O. Siegmund, UCB, SSL 8

AAO Synkera Substrates ANL Processed

Unfortunately shipping

Problems damaged

the MCPs. There are

also stain marks and

scuffs on 4372

4371

4372

O. Siegmund, UCB, SSL 9

AAO Synkera Substrates ANL Processed

Tested the MCPs with very bright halogen fiberlamp, no transmission on either, probably all holesblocked. Given situation tests likely to be negative.

O. Siegmund, UCB, SSL 10

20 cm INCOM SubstratesHave received two from Argonne1 broken in half, 1 complete, as shippedhave not done detailed inspections - BUT

1” crack at middle of one side