TOOLS & TECHNIQUES UPDATE

October 200352

Variable temperature fridges

Cambridge Magnetic Refrigeration (CMR) has designed

two new refrigeration systems for materials

characterization applications. The mF-VTI (variable

temperature insert) refrigerator has a temperature

range of 1.5-50 K, while the mF-VTS (variable

temperature stage) system allows measurements from

1.5 K to room temperature. Both products offer

precise temperature control when selecting and

holding temperatures or sweeping across a range. The

systems can also be used with CMR’s AC resistivity

and susceptibility measurement options.

A range of magnet options is available, from large-

bore 1 T to 3 T, 6 T, and 9 T magnets. Zero field

compensation windings can be incorporated for

superconducting quantum interference device (SQUID)

measurements. The mF-VTI refrigerator insert can be

moved between two sample magnet regions for

experimental variation. Fittings are interchangeable

across all of CMR’s refrigeration systems.

Contact: www.cmr.uk.com

Compact positioning

The TRITOR 100 SG Compact is a three-axis

nanopositioning system based on piezoelectric

actuators. The device from piezosystem jena is only

40 × 40 × 34 mm in size and can be easily combined

with other mechanical positioning systems. Potential

applications of the nanopositioner include optics and

laser tuning, fiber positioning, and scanning with

atomic force or scanning near field optical

microscopes.

The TRITOR 100 SG Compact offers subnanometer

positioning and resolution, with 80 µm closed loop

motion in all three axes. In addition, the device

can be used for vacuum and low temperature

applications.

Contact: www.piezojena.com

Rotation but no leaks

The MRD series of rotary vacuum feedthroughs from

Thermo Vacuum Generator eliminates a key source of

leaks and contamination in high vacuum applications.

The rotary motion is magnetically coupled from

atmosphere into vacuum through a static metal barrier

without the need for bellows, shaft seals, or

ferrofluids. By making use of the high torque and high

lifetime magnetic coupling, system reliability is

improved, and there is a lower cost of ownership.

Precision positioning and exact rotational speed

control are possible.

Contact: www.thermovacgen.com

Precision tips

A new atomic force microscope (AFM) probe for

precise positioning and high-resolution imaging is

available from NANOSENSORS™. The AdvancedTEC™

sensor has a tetrahedral tip that protrudes from the

apex of the triangular free end of a rectangular

cantilever. This design allows precise positioning of the

probe. It also makes the tip visible through the optical

system of the AFM, even when the probe is slightly

tilted because of its mounting. This is useful for

manipulation on the nanoscale, for example. The tip

shows good performance on samples with small

pattern sizes and steep sidewalls.

Contact: www.nanosensors.com

Improved EBSD camera

DigiView II is an updated version of TSL’s advanced

camera system for electron backscattered diffraction

(EBSD) analysis in the scanning electron microscope.

The new camera has improved speed, sensitivity, and

higher resolution. Designed to give the broad range of

performance required for handling all EBSD

applications, the camera can collect 70 patterns per

second with an indexing accuracy of 99.9%.

Contact: www.edax.com

Software finds its peak

A software package for quantitative

analysis of X-ray diffraction (XRD)

data includes measurement,

extraction, and correction routines.

X’Pert Quantify from PANalytical is

designed for its XRD systems,

including those up to 15 years old.

The software accepts scans, peak-

intensity, and integrated area

measurements as inputs. Analysis is

based on correlation between

intensities of individual reflections

with the concentrations of the

corresponding phases. No

knowledge of the crystal structure

is required. The software provides

access to all currently accepted

analytical models. A broad range of

correction methods is also available

to give the net intensity of a

reflection with high accuracy.

Contact: www.panalytical.com

Spectroscopy finds new SynerJY

Jobin Yvon is releasing SynerJY™, a

software package for spectroscopic

data acquisition and analysis. It

provides control of spectrometers,

detectors, and automated

accessories. It can also read single-

and multi-channel detectors

simultaneously. Processing and

presentation tools are accessed via

a user-friendly interface. Data can

be viewed using three-dimensional

plots, contour maps, or CCD

images. Advanced mathematical

functions can be performed, custom

views created, and data can be

exported in a variety of formats for

further use.

Contact: www.jobinyvon.co.uk

New version of GENESIS

EDAX Inc.’s microanalysis software

for energy dispersive X-ray

spectrometry (EDS) is available in a

new version. GENESIS 3.6 includes

the new features of phase cluster

analysis (PCA), gun shot residue,

and free draw. PCA is a new

statistical analysis method for

spectral mapping data. It can

automatically find phases in the

EDS data and maps can be built

with reference to a phase library.

Free draw is a tool that allows

scanning for a spectrum over an

area selected by drawing free hand

on an image.

Contact: www.edax.com