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Page 1: PP7400 8700 FP Configuration and Testing Guide

Passport 7400, 8700

Function ProcessorConfiguration and TestingGuide

241-5701-610

Page 2: PP7400 8700 FP Configuration and Testing Guide
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Passport 7400, 8700

Function Processor Configuration andTesting Guide

Publication: 241-5701-610Document status: StandardDocument version: 2.0S1Document date: July 2000

Copyright © 2000 Nortel NetworksAll Rights Reserved.

Printed in Canada

NORTEL, NORTEL NETWORKS, the globemark design, the NORTEL NETWORKS corporatelogo, DPN, DPN-100 and PASSPORT are trademarks of Nortel Networks.

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Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1

Publication history

July 20002.0S1 StandardGeneral availability. Contains information on Passport 7400, 8700 for thePCR 2.0 GA release.

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Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1

Contents

About this document 25Who should read this document and why 25How this document is organized 25What’s new in this document 26

Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs 26Integration of Packet Voice Gateway to Passport 7400 26

Text conventions 27Related documents 28How to get more help 28

Chapter 1Basic process for configuring a function

processor 29Prerequisites for configuring a function processor 29Configuring a function processor 30Configuring a spare function processor 37Configuring line protection on optical interfaces 38

Chapter 2Port Testing 41Types of port tests 42

Card loopback test 42Local loopback test 43Manual tests 43Remote loopback test 46Remote loopthistrib test 47V.54 remote loopback test 47

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PN127 remote loopback test 49Testing ports and port components 49

Testing a port 49Testing a tributary port 52Testing a channel 55Setting up a loopback 57

Port testing of optical interfaces with line APS 59Testing a port 60Setting up a loopback 62

Port test results and their meaning 64

Chapter 3Card Testing 69Changing the card test setup 70Testing a card 73Displaying card test results 74Interpreting card test results 75

Chapter 4V.11 function processor 79V.11 FP configuration parameters 79V.11 FP diagnostic tests 79Provisionable V.11 FP components and attributes 82V.11 FP OSI states 83V.11 FP pinouts for physical loopbacks 84

Chapter 5V.35 function processor 85V.35 FP configuration parameters 85V.35 FP diagnostic tests 85Provisionable V.35 FP components and attributes 87V.35 FP OSI states 88V.35 FP pinouts for physical loopbacks 89

Chapter 6Four-port DS1 function processor 91Four-port DS1 FP configuration parameters 91

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Four-port DS1 FP diagnostic tests 92Provisionable four-port DS1 FP components and attributes 94Four-port DS1 FP OSI states 95Four-port DS1 FP pinouts for physical loopbacks 96

Chapter 7Four-port E1 function processor 99Four-port E1 FP configuration parameters 99Four-port E1 FP diagnostic tests 100Provisionable four-port E1 FP components and attributes 101Four-port E1 FP OSI states 101Four-port E1 FP pinouts for physical loopbacks 103

Chapter 8Eight-port DS1 function processor 105Eight-port DS1 FP configuration parameters 105Eight-port DS1 FP diagnostic tests 106Provisionable eight-port DS1 FP components and attributes 108Eight-port DS1 FP OSI states 109Eight-port DS1 FP pinouts for physical loopbacks 110

Chapter 9DS1C function processor 113DS1C FP configuration parameters 113DS1C FP diagnostic tests 114

DS1C FP in a fractional T1 network configuration 115Provisionable DS1C components and attributes 118DS1C OSI states 119DS1C FP pinouts for physical loopbacks 121

Chapter 10E1C function processor 123E1C FP configuration parameters 123E1C FP diagnostic tests 124

V.54 and PN127 remote loopback tests 125Provisionable E1C FP components and attributes 126E1C FP OSI states 127

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E1C FP pinouts for physical loopbacks 129

Chapter 11DS3 function processor 131DS3 FP configuration parameters 131DS3 FP diagnostic tests 131Provisionable DS3 FP components and attributes 133DS3 FP OSI states 133

Chapter 12E3 function processor 137E3 configuration parameters 137E3 diagnostic tests 137Provisionable E3 components and attributes 139E3 OSI states 140

Chapter 13DS3C function processor 143DS3C FP configuration parameters 143DS3C FP diagnostic tests 144Provisionable DS3C FP components and attributes 145DS3C FP OSI states 146

Chapter 14HSSI function processor 149HSSI FP configuration parameters 149HSSI FP diagnostic tests 149

HSSI local loopback test 150Provisionable HSSI FP components and attributes 151HSSI FP OSI states 152

Chapter 15Three-port DS1 ATM function processor 155Three-port DS1 ATM FP configuration parameters 155Three-port DS1 ATM FP diagnostic tests 156Provisionable three-port DS1 ATM FP components and

attributes 157Three-port DS1 ATM FP OSI states 158

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Chapter 16Three-port E1 ATM function processor 161Three-port E1 ATM FP configuration parameters 161Three-port E1 ATM FP diagnostic tests 162Provisionable three-port E1 ATM FP components and attributes 163Three-port E1 ATM FP OSI states 164

Chapter 17Eight-port DS1 ATM function processor 167Eight-port DS1 ATM FP configuration parameters 167Eight-port DS1 ATM FP diagnostic tests 168Provisionable eight-port DS1 ATM FP components and

attributes 169Eight-port DS1 ATM FP OSI states 170

Chapter 18Eight-port E1 ATM function processor 173Eight-port E1 ATM FP configuration parameters 173Eight-port E1 ATM FP diagnostic tests 174Provisionable eight-port E1 ATM FP components and attributes 175Eight-port E1 ATM FP OSI states 176

Chapter 19JT2 ATM function processor 179JT2 ATM FP configuration parameters 179JT2 ATM FP diagnostic tests 180Provisionable JT2 ATM FP components and attributes 181JT2 ATM FP OSI states 182

Chapter 20DS3 ATM function processor 185DS3 ATM FP configuration parameters 185DS3 ATM FP diagnostic tests 186Provisionable DS3 ATM FP components and attributes 188DS3 ATM FP OSI states 189

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Chapter 21E3 ATM function processor 191E3 ATM FP configuration parameters 191E3 ATM FP diagnostic tests 192Provisionable E3 ATM FP components and attributes 194E3 ATM FP OSI states 195

Chapter 22OC-3 ATM function processor 197OC-3 ATM FP configuration parameters 197OC-3 ATM FP diagnostic tests 198Provisionable OC-3 ATM FP components and attributes 200OC-3 ATM FP OSI states 201

Chapter 23DS3 ATM IP function processor for

Passport 7400 205DS3 ATM IP configuration parameters 205DS3 ATM IP diagnostic tests 206Provisionable DS3 ATM IP components and attributes 208DS3 ATM IP OSI states 209

Chapter 24E3 ATM IP function processor for

Passport 7400 211E3 ATM IP configuration parameters 211E3 ATM IP diagnostic tests 212Provisionable E3 ATM IP components and attributes 214E3 G.832 trail trace 215E3 ATM IP OSI states 215

Chapter 25OC-3 ATM IP function processor for

Passport 7400 219OC-3 ATM IP configuration parameters 219OC-3 ATM IP diagnostic tests 220

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Provisionable OC-3 ATM IP components and attributes 222OC-3 ATM IP OSI states 223

Chapter 26DS1 AAL1 function processor 227DS1 AAL1 FP configuration parameters 227DS1 AAL1 FP diagnostic tests 228Provisionable DS1 AAL1 FP components and attributes 228DS1 AAL1 FP OSI states 229

Chapter 27E1 AAL1 function processor 231E1 AAL1 FP configuration parameters 231E1 AAL1 FP diagnostic tests 232Provisionable E1 AAL1 FP components and attributes 232E1 AAL1 FP OSI states 234

Chapter 28DS1 MSA32 function processor for

Passport 7400 237DS1 MSA32 FP configuration parameters 237DS1 MSA32 FP diagnostic tests 238

Clock synchronization 239Test setup and result attributes 239Interpreting test results 240

Provisionable DS1 MSA32 FP components and attributes 240DS1 MSA32 FP OSI states 242Maintenance monitor for DS1 MSA32 function processor 243

Provisioning the maintenance monitor 244Starting the maintenance monitor 246Stopping the maintenance monitor 246

Chapter 29E1 MSA32 function processor for

Passport 7400 247E1 MSA32 FP configuration parameters 247E1 MSA32 FP diagnostic tests 248

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Clock synchronization 249Test setup and result attributes 249Interpreting test results 250

Provisionable E1 MSA32 FP components and attributes 251E1 MSA32 FP OSI states 252Maintenance monitor for E1 MSA32 function processor 253

Provisioning the maintenance monitor 255Starting the maintenance monitor 256Stopping the maintenance monitor 256

Chapter 30DS1 voice function processor for

Passport 7400 259DS1 voice FP configuration parameters 259DS1 voice FP diagnostic tests 260Provisionable DS1 voice FP components and attributes 261DS1 voice FP OSI states 262DS1 voice FP pinouts for physical loopbacks 264

Chapter 31E1 voice function processor for

Passport 7400 265E1 voice FP configuration parameters 265E1 voice FP diagnostic tests 266Provisionable E1 voice FP components and attributes 267E1 voice FP OSI states 268E1 voice FP pinouts for physical loopbacks 270

Chapter 32J2MV function processor for

Passport 7400 271J2MV FP configuration parameters 271J2MV FP diagnostic tests 272Provisionable J2MV FP components and attributes 274J2MV FP OSI states 275J2MV pinouts for physical loopbacks 277

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Chapter 33DS1 MVP/MVP-E function processor for

Passport 7400 279DS1 MVP/MVP-E FP configuration parameters 279DS1 MVP/MVP-E FP diagnostic tests 280Provisionable DS1 MVP/MVP-E FP components and attributes 282DS1 MVP/MVP-E FP OSI states. 283DS1 MVP/MVP-E FP pinouts for physical loopbacks 284

Chapter 34E1 MVP/MVP-E function processor for

Passport 7400 287E1 MVP/MVP-E FP configuration parameters 287E1 MVP/MVP-E FP diagnostic tests 288Provisionable E1 MVP/MVP-E FP components and attributes 290E1 MVP/MVP-E FP OSI states 291E1 MVP/MVP-E FP pinouts for physical loopbacks 293

Chapter 35TTC2M MVP/MVP-E function processor for

Passport 7400 295TTC2M MVP/MVP-E FP configuration parameters 295TTC2M MVP/MVP-E FP diagnostic tests 296Provisionable TTC2M MVP/MVP-E FP components and

attributes 298TTC2M MVP/MVP-E FP OSI states 299TTC2M MVP/MVP-E FP pinouts for physical loopbacks 301

Chapter 36Ethernet function processor 303Ethernet FP configuration parameters 303Provisionable Ethernet FP components and attributes 304Ethernet FP OSI states 305

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Chapter 37100BaseT Ethernet function processor 307100BaseT Ethernet FP configuration parameters 307Provisionable 100BaseT Ethernet FP components and attributes 309100BaseT Ethernet FP OSI states 310

Chapter 38DS3C AAL function processor 311DS3C AAL FP configuration parameters 311DS1 tributary ports 312DS3C AAL FP diagnostic tests 312Provisionable DS3C AAL FP components and attributes 313DS3C AAL FP OSI states 315

Chapter 3932-port E1 AAL function processor 31932-port E1 AAL FP configuration parameters 31932-port E1 AAL FP diagnostic tests 320Provisionable 32-port E1 AAL FP components and attributes 32132-port E1 AAL FP OSI states 323

Chapter 40Voice services function processor 325Voice services FP configuration parameters 325Configuring a voice services function processor 326Sparing the Voice services FP 328Voice services FP diagnostic testing 329Provisionable voice services FP components and attributes 330Voice services FP OSI states 330

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List of figures

Figure 1 V.54 remote loopback test on a channelized DS1FP 48

Figure 2 Remote loopback tests on a channelized E1 FP 48Figure 3 Data paths for V.11 FP port tests and loopbacks 81Figure 4 Provisionable V.11 FP components and attributes 82Figure 5 Data paths for V.35 port tests and loopbacks 87Figure 6 Provisionable V.35 FP components and attributes 88Figure 7 Data paths for four-port DS1 FP port tests and

loopbacks 93Figure 8 Provisionable DS1 FP components and attributes 94Figure 9 Data paths for four-port E1 FP port tests and

loopbacks 100Figure 10 Provisionable E1 FP components and attributes 101Figure 11 Data paths for eight-port DS1 FP port tests and

loopbacks 107Figure 12 Provisionable DS1 FP components and attributes 108Figure 13 Data paths for DS1C FP port tests and loopbacks 115Figure 14 DS1C to a fractional T1 network configuration 117Figure 15 DS1C to a DDS network configuration 118Figure 16 Provisionable DS1C FP components and

attributes 119Figure 17 Data paths for E1C FP port tests and loopbacks 125Figure 18 V.54 and PN127 E1C test configuration 126Figure 19 Provisionable E1C FP components and attributes 127Figure 20 Data paths for DS3 FP port tests and loopbacks 132Figure 21 Provisionable DS3 FP components and attributes 133Figure 22 Data paths for E3 FP port tests and loopbacks 138Figure 23 Provisionable E3 components and attributes 139Figure 24 Data paths for DS3C FP port tests and loopbacks 144Figure 25 Provisionable DS3C FP components and

attributes 145Figure 26 Data paths for HSSI FP port tests and loopbacks 150Figure 27 Provisionable HSSI FP components and attributes 152Figure 28 Data paths for DS1 ATM FP port tests and

loopbacks 157Figure 29 Provisionable three-port DS1 ATM FP components and

attributes 158Figure 30 Data paths for three-port E1 ATM FP port tests and

loopbacks 163

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Figure 31 Provisionable three-port E1 ATM FP components andattributes 164

Figure 32 Provisionable eight-port DS1 ATM FP components andattributes 169

Figure 33 Provisionable eight-port E1 ATM FP components andattributes 175

Figure 34 Data paths for JT2 ATM FP port tests andloopbacks 180

Figure 35 Provisionable JT2 ATM FP components andattributes 181

Figure 36 Data paths for DS3 ATM port tests and loopbacks 187Figure 37 Provisionable DS3 ATM FP components and

attributes 188Figure 38 Data paths for E3 ATM FP port tests and

loopbacks 193Figure 39 Provisionable E3 ATM FP components and

attributes 194Figure 40 Data paths for OC-3 ATM FP port tests and

loopbacks 199Figure 41 Provisionable OC-3 ATM FP components and

attributes 200Figure 42 Data paths for DS3 ATM IP port tests and

loopbacks 207Figure 43 Provisionable DS3 ATM IP components and

attributes 208Figure 44 Data paths for E3 ATM IP port tests and loopbacks 213Figure 45 Provisionable E3 ATM IP components and

attributes 214Figure 46 Data paths for OC-3 ATM IP port tests and

loopbacks 221Figure 47 Provisionable OC-3 ATM IP components and

attributes 222Figure 48 Provisionable DS1 AAL1 FP components and

attributes 228Figure 49 Provisionable E1 AAL1 FP components and

attributes 233Figure 50 Provisionable DS1 MSA32 FP components and

attributes 241Figure 51 Provisionable maintenance monitor components and

attributes 244

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Figure 52 Provisionable E1 MSA32 FP components andattributes 251

Figure 53 Provisionable maintenance monitor components andattributes 254

Figure 54 Provisionable DS1 voice FP components andattributes 261

Figure 55 Provisionable E1 voice FP components andattributes 267

Figure 56 Data paths for J2MV port tests and loopbacks 273Figure 57 Provisionable J2MV FP components and

attributes 274Figure 58 Data paths for DS1 MVP/MVP-E port tests and

loopbacks 281Figure 59 Provisionable DS1 MVP/MVP-E FP components and

attributes 282Figure 60 Data paths for E1 MVP/MVP-E FP port tests and

loopbacks 289Figure 61 Provisionable E1 MVP/MVP-E FP components and

attributes 290Figure 62 Data paths for TTC2M MVP/MVP-E FP tests and

loopbacks 297Figure 63 Provisionable TTC2M MVP/MVP-E FP components and

attributes 298Figure 64 Provisionable Ethernet FP components and

attributes 304Figure 65 Provisionable 100BaseT Ethernet FP components and

attributes 309Figure 66 Provisionable DS3C AAL FP components and

attributes 314Figure 67 Provisionable DS3C AAL FP components and attributes

(continued) 315Figure 68 Provisionable 32-port E1 AAL FP components and

attributes 322Figure 69 Provisionable voice services FP components and

attributes 330

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List of tables

Table 1 Port test result attributes and uses 64Table 2 Interpreting port test results 65Table 3 Card test result attributes and uses 75Table 4 Interpreting card test results 76Table 5 X21 component state combination 83Table 6 V.11 Test component state combination 83Table 7 Faceplate connector pinouts for a V.11 FP 84Table 8 V35 component state combination 88Table 9 V.35 Test component state combination 89Table 10 Faceplate connector pinouts for a V.35 FP 90Table 11 DS1 component state combination 95Table 12 DS1 Channel (Chan) component state combination 95Table 13 DS1 Test component state combination 96Table 14 Faceplate connector pinouts for a four-port DS1 FP 97Table 15 Termination panel connector pinouts for a four-port DS1

FP 97Table 16 E1 component state combination 102Table 17 E1 Channel (Chan) component state combination 102Table 18 E1 Test component state combination 103Table 19 Faceplate connector pinouts for a four-port E1 FP 104Table 20 Termination panel connector pinouts for a four-port E1

FP 104Table 21 DS1 component state combination 109Table 22 DS1 Channel (Chan) component state

combination 109Table 23 DS1 Test component state combination 110Table 24 Faceplate connector pinouts for an eight-port DS1

FP 111Table 25 Termination panel connector pinouts for an eight-port

DS1 FP 111Table 26 Summary of V.54 supported and unsupported

items 116Table 27 DS1 component state combination 120Table 28 DS1 Channel (Chan) component state

combination 120Table 29 DS1 Test component state combination 121Table 30 Faceplate connector pinouts for a DS1C FP 122Table 31 Termination panel connector pinouts for a DS1C

FP 122

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Table 32 E1 component state combination 128Table 33 E1 Channel (Chan) component state combination 129Table 34 E1 Test component state combination 129Table 35 Faceplate connector pinouts for an E1C FP 130Table 36 Termination panel connector pinouts for an E1C

FP 130Table 37 DS3 component state combination 134Table 38 DS3 Test component state combination 135Table 39 E3 component state combination 140Table 40 E3 Test component state combination 141Table 41 DS3 component state combination 146Table 42 DS3 Test component state combination 147Table 43 HSSI component state combination 153Table 44 HSSI Test component state combination 154Table 45 DS1 component state combination 159Table 46 DS1 ATM Channel (Chan) component state

combination 160Table 47 DS1 ATM Test component state combination 160Table 48 E1 component state combination 165Table 49 E1 ATM Channel (Chan) component state

combination 166Table 50 E1 ATM Test component state combination 166Table 51 DS1 component state combination 170Table 52 DS1 ATM Channel (Chan) component state

combination 171Table 53 DS1 ATM Test component state combination 171Table 54 E1 component state combination 176Table 55 E1 ATM Channel (Chan) component state

combination 177Table 56 E1 ATM Test component state combination 177Table 57 JT2 component state combination 182Table 58 JT2 ATM Test component state combination 183Table 59 DS3 component state combination 189Table 60 DS3 ATM Test component state combination 190Table 61 E3 component state combination 195Table 62 E3 ATM Test component state combination 196Table 63 OC-3 Sonet/Sdh component state combination 201Table 64 OC-3 Test component state combination 202Table 65 OC-3 Path component state combination 202Table 66 DS3 component state combination 209Table 67 DS3 ATM Test component state combination 210

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Table 68 E3 component state combination 216Table 69 E3 ATM Test component state combination 217Table 70 OC-3 Sonet/Sdh component state combination 223Table 71 OC-3 Test component state combination 224Table 72 OC-3 Path component state combination 224Table 73 DS1 component state combination 229Table 74 DS1 Channel (Chan) component state

combination 229Table 75 E1 component state combination 234Table 76 E1 Channel (Chan) component state combination 235Table 77 E1 Test component state combination 235Table 78 Port and channel test types supported on DS1 MSA32

FP 238Table 79 DS1 component state combination 242Table 80 DS1 Channel (Chan) component state

combination 242Table 81 Port and channel test types supported on MSA32 E1

FPs 248Table 82 E1 component state combination 252Table 83 E1 Channel (Chan) component state combination 253Table 84 E1 Test component state combination 253Table 85 DS1 component state combination 262Table 86 DS1 Channel (Chan) component state

combination 262Table 87 DS1 Test component state combination 263Table 88 DS1 voice Framer component state combination 263Table 89 Faceplace connector pinouts for a DS1 voice FP 264Table 90 Termination panel connector pinouts for a DS1 voice

FP 264Table 91 E1 component state combination 268Table 92 E1 Channel (Chan) component state combination 268Table 93 E1 Test component state combination 269Table 94 E1 voice Framer component state combination 269Table 95 Faceplate connector pinouts for an E1 voice FP 270Table 96 Termination panel connector pinouts for a DS1 voice

FP 270Table 97 J2MV E1 component state combination 275Table 98 J2MV Channel (Chan) component state combination

275Table 99 J2MV Test component state combination 276Table 100 Faceplate connector pinouts for a J2MV FP 277

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Table 101 DS1 component state combination 283Table 102 DS1 Channel (Chan) component state

combination 283Table 103 DS1 Test component state combination 284Table 104 Faceplate connector pinouts for a DS1 MVP/MVP-E

FP 284Table 105 Termination panel connector pinouts for a DS1 MVP/

MVP-E FP 285Table 106 E1 component state combination 291Table 107 E1 Channel (Chan) component state combination 292Table 108 E1 Test component state combination 292Table 109 Faceplate connector pinouts for an E1 MVP/MVP-E

FP 293Table 110 Termination panel connector pinouts for an E1 MVP/

MVP-E FP 293Table 111 E1 component state combination 299Table 112 E1 Channel (Chan) component state combination 300Table 113 E1 Test component state combination 300Table 114 Faceplate connector pinouts for a TTC2M MVP/MVP-E

FP 301Table 115 Termination panel connector pinouts for a TTC2M MVP/

MVP-E FP 301Table 116 Ethernet (En) component state combination 305Table 117 100BaseT Ethernet (En) component state combination

310Table 118 DS1 component state combination 316Table 119 DS1 Channel (Chan) component state

combination 316Table 120 DS1 Test component state combination 317Table 121 DS3 component state combination 317Table 122 DS3 Test component state combination 318Table 123 E1 component state combination 323Table 124 E1 Channel (Chan) component state combination 324Table 125 E1 Test component state combination 324Table 126 Settings for PModule components 326Table 127 Vsp component state combination 330Table 128 PModule component state combination 331

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Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1

About this document

This guide contains information about function processor provisioning andtesting. To use this guide effectively, see the following sections:

• “Who should read this document and why” on page 25

• “How this document is organized” on page 25

• “What’s new in this document” on page 26

• “Text conventions” on page 27

• “Related documents” on page 28

• “How to get more help” on page 28

Who should read this document and whyThis guide is intended for anyone who is responsible for provisioning andtesting function processors (FP). Users should be familiar with Passportprovisioning procedures.

How this document is organizedThis guide contains generic and specific sections that you use together. Thefirst three chapters contain generic procedures for configuring an FP, testingan FP, and testing a port.

The sections that follow contain specific information about each FP. Specificinformation includes the values you need to configure an FP, such as the porttype, the number of ports, and the number of channels (if applicable). Thesesections also specify the types of port tests supported by that FP,provisionable components and attributes, and OSI state information.

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Most FPs use the generic procedures. If a unique procedure applies, you canfind it in the section specific to that FP.

What’s new in this documentInformation about protection switching was restructured in the followingsection: “Port testing of optical interfaces with line APS” (page 59).

The following features were added to this document:

• "Maintenance monitor for DS1 MSA32 and E1 MSA32 FPs" on page 26

• “Integration of Packet Voice Gateway to Passport 7400” (page 26)

Maintenance monitor for DS1 MSA32 and E1 MSA32 FPsThe DS1 MSA32 FP and the E1 MSA32 FP allow you to monitor the ingressdata flow of a single channel on a port and direct it as an AAL1 CES datastream to a remote receiver. The purpose is to provide a system that, onceprovisioned, may be activated remotely by operations staff to add a non-intrusive monitor onto a channel.

The following sections were added to this document:

• “Maintenance monitor for DS1 MSA32 function processor” (page 243)

• “Maintenance monitor for E1 MSA32 function processor” (page 253)

Integration of Packet Voice Gateway to Passport 7400This project allows the Packet Voice Gateway functionality to be available forPassport 7400 as well as Passport 8700.

The following sections were updated in this document:

• “DS3C AAL function processor” (page 311)

• “32-port E1 AAL function processor” (page 319)

• “Voice services function processor” (page 325)

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Passport 7400, 8700 Function Processor Configuration and Testing Guide 2.0S1

Text conventionsThis document uses the following text conventions:

• nonproportional spaced plain type

Nonproportional spaced plain type represents system generated text ortext that appears on your screen.

• nonproportional spaced bold type

Nonproportional spaced bold type represents words that you should typeor that you should select on the screen.

• italics

Statements that appear in italics in a procedure explain the results of aparticular step and appear immediately following the step.

Words that appear in italics in text are for naming.

• [optional_parameter ]

Words in square brackets represent optional parameters. The commandcan be entered with or without the words in the square brackets.

• <general_term >

Words in angle brackets represent variables which are to be replaced withspecific values.

• UPPERCASE,lowercase

Passport commands are not case-sensitive and do not have to matchcommands and parameters exactly as shown in this document, with theexception of string options values (for example, file and directory names)and string attribute values.

• |

This symbol separates items from which you may select one; forexample, ON|OFF indicates that you may specify ON or OFF. If you donot make a choice, a default ON is assumed.

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• ...

Three dots in a command indicate that the parameter may be repeatedmore than once in succession.

The term absolute pathname refers to the full specification of a path startingfrom the root directory. Absolute pathnames always begin with the slash ( / )symbol. A relative pathname takes the current directory as its starting point,and starts with any alphanumeric character (other than /).

Related documentsFor information about provisioning Passport and Passport components andattributes, see the following information sources:

• 241-5701-605Passport 7400, 8700, 15000 Operations and MaintenanceGuide

• 241-5701-600Passport 7400, 8700, 15000 Operations and MaintenanceFundamentals

• 241-5701-420Passport 7400, 8700, 15000 Trunking Guide

• 241-5701-050Passport 7400, 8700, 15000 Commands

• 241-5701-060Passport 7400, 8700, 15000 Components

How to get more helpFor information on training, problem reporting, and technical support, see the“Nortel Networks support services” section in the product overviewdocument.

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Chapter 1Basic process for configuring a functionprocessor

The same basic steps apply to configuring all function processors (FP). Youmust, however, refer to the FP-specific sections for detailed information aboutyour specific function processor. These sections include component hierarchydiagrams, notes about provisioning that FP, and attribute values.

For information about configuring a function processor, see the followingsections:

• “Prerequisites for configuring a function processor” on page 29

• “Configuring a function processor” on page 30

• “Configuring a spare function processor” on page 37

• “Configuring line protection on optical interfaces” on page 38

Prerequisites for configuring a function processorBefore you provision a function processor, you must complete the followingactivities:

• Install all hardware (see 241-5701-210Passport 7400, 8700 HardwareInstallation Guide).

• Perform startup procedures (see 241-5701-270Passport 7400, 8700,15000 Software Installation Guide).

• Install your software (see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide).

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• Provision the node (see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide).

Before you perform the procedures in this chapter, you must be familiar withthe provisioning fundamentals explained in 241-5701-600Passport 7400,8700, 15000 Operations and Maintenance Fundamentals.

You must enter provisioning mode to perform the steps in these procedures.See 241-5701-605Passport 7400, 8700, 15000 Operations and MaintenanceGuide for information about how to enter and exit provisioning mode. Forinformation about the components and attributes used while provisioningprocessor cards, see 241-5701-060Passport 7400, 8700, 15000 Components.

Except where noted, the descriptions and procedures assume that operatorsare working with Passport through a VT-100 terminal or terminal emulator.For information about Nortel Networks’s proprietary network managementsystem NMS, see 241-6001-023NMS Architect for Passport User Guide.

Configuring a function processor

These procedures outline the basic steps to provision a function processorusing a text interface device:

• “Configuring a new function processor (FP)” on page 31

• “Provisioning a new logical processor (LP)” on page 32 (optional,depending on whether a suitable LPT already exists)

• “Configuring a spare function processor” on page 37 (optional)

• “Adding a port to the LP” on page 33

• “Adding a channel to a port” on page 34 (optional, depending onwhether or not the FP is channelized)

• “Setting provisionable attributes” on page 34

CAUTIONRisk of data lossBefore you lock a port, lock any services (for example,frame relay) or Passport trunks running on the port.Otherwise, a loss of data can occur.

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• “Activating configuration changes” on page 35

• “Configuring line protection on optical interfaces” on page 38

• See “Port Testing” on page 41, for information about testing ports.

Procedure 1Configuring a new function processor (FP)

Before you add a new function processor (FP) to a shelf, check to see if theCard component for that FP exists. If the Card component does not exist, usethis procedure to add it, and set the appropriate cardType attribute.

1 Enter provisioning mode.

start prov

2 See which Card components are currently configured.

display shelf card/*

3 If the Card component does not already exist, add it to the shelf.

add shelf card/<n>

where:<n> is the slot number and can be between 1 and 15 for functionprocessors

4 Specify the type of function processor you are adding by setting thecardType attribute.

set shelf card/<n> cardType <cardtype>

where:<n> is the slot number and can be between 1 and 15 for functionprocessors (depending on the number of slots in the shelf)<cardtype> is the value for the new function processor

See the FP-specific sections for the appropriate cardtype values for yourfunction processor.

5 If a suitable logical processor (LP) does not exist, create one using theprocedure “Provisioning a new logical processor (LP)” on page 32.

or

Add a port to the LP using the procedure “Adding a port to the LP” onpage 33.

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Procedure 2Provisioning a new logical processor (LP)

1 To display existing logical processor types (LPTs) and their features usethe command:

display Sw Lpt/* featureList

If a suitable LPT does not exist, you must create one. For moreinformation, see 241-5701-605 Passport 7400, 8700, 15000 Operationsand Maintenance Guide.

If a suitable LPT exists, you must provision a new LP to run the selectedlogical processor type software on the FP.

2 Add a Logical Processor component.

add lp/<n>

where:<n> is any number between 1 and 15

3 Set the logicalProcessorType attribute to use the feature set defined by<lpt name>.

set lp/<n> logicalProcessorType Sw Lpt/<lpt name>

where:<lpt name> can contain up to 25 alphanumeric characters (see theservice guides for additional information)

Note: You can provision more than one service on some FPs. You mustspecify features in order of priority. For example, <feature1> is the featurefor which you want the best performance. See the Release Notes forinformation about which services you can run concurrently on each FP.

4 If this is a spare function processor, use the procedure “Configuring aspare function processor” on page 37. If this is a main function processor,set the mainCard attribute using the following command.

set lp/<n> mainCard Shelf Card/<m>

where:<m> is the number of the slot on the shelf. For example, to link the FP inshelf slot number 1, enter 1 as the value for <m>.

5 Add a port to the LP using the procedure “Adding a port to the LP” onpage 33.

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Procedure 3Adding a port to the LP

1 To determine an FPs possible port types, enter

help lp

The listed subcomponents are the possible port types.

2 Add a port depending on the type of interface required.

add lp/<n> <port>/<m>

where:<n> is the LP number<port> is the port type<m> is the port number

See the FP-specific sections for valid values for <port> and <m>.

3 If the FP supports tributary ports beneath the port you added in step 2,add a tributary port.

add lp/<n> <port>/<m> <tributary port>/<q>

where:<n> is the LP number<port> is the port type<m> is the port number<tributary port> is the tributary port type<q> is the tributary port number

See the FP-specific sections for valid values for <tributary port> and <q>.

4 If this is a channelized function processor, see the procedure “Adding achannel to a port” on page 34. Otherwise, proceed to the next step.

5 Set provisionable attributes using the procedure “Setting provisionableattributes” on page 34

To provision a channelized function processor, you must

• Add a Channel component to the port (step 1).

• Assign timeslots to the Channel component (step 2).

• Assign a data rate for the timeslots on the Channel component (step 3).

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Procedure 4Adding a channel to a port

1 Add a Channel component to the port. The Passport softwareautomatically adds Channel 0 when you add a port.

add lp/<n> <port>/<m> chan/<p>

See the FP-specific sections for valid values for <p>.

2 Assign timeslots to the Channel component.

set lp/<n> <port>/<m> chan/<p> timeslots <timeslots>

See the FP-specific sections for valid values for <timeslots>.

3 For some ports, you must assign a data rate for the timeslots within eachchannel. See the FP-specific sections for exact provisioning data.

set lp/<n> <port>/<m> chan/<p> timeslotDataRate <rate>

where:<rate> is the timeslot data rate

4 Repeat this procedure for each channel.

5 Set provisionable attributes using the procedure “Setting provisionableattributes” on page 34.

Procedure 5Setting provisionable attributes

1 Enter provisioning mode.

start prov

2 Set provisionable attributes.

set lp/<n> <port>/<m> <attribute> <attributevalue>

See the FP-specific sections for attribute values of specific FPs.

Regular provisioning activities typically involve entering a small set ofchanges for activation at the next scheduled activation session. Duringthe period between one activation session and the next, there can bemultiple sets of changes, entered by multiple operators. Changesaccumulate until the next activation session.

Note: Some FPs, for example, the Voice Services FP, must be linked toan application before you can activate provisioning changes. See the FP-specific sections for more information.

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3 If you want to activate your changes immediately, see “Activatingconfiguration changes” on page 35.

Otherwise, continue to the next step to save your changes and activatethem later.

4 When all changes and additions are complete, perform a semantic checkof the changes made.

check -changed prov

The -changed parameter asks the system to do a semantic check on onlythose components that are in the edit view and are new or changed fromthe current view. As a result, the semantic check is faster than a full check.

5 Optionally, store the edit view as a saved view.

save [-file(<filename>)] prov

where:<filename> is an optional user-supplied designation for the saved view

The -file parameter is optional. You only need to use it if the new savedview needs a unique filename. The system automatically resets thesequence number to 001.

6 Optionally, end the provisioning session.

end prov

Procedure 6Activating configuration changes

1 Perform a full semantic check of the edit view.

check prov

Provisioning errors are reported on-screen. You must correct all errorsbefore moving on to the next step.

During a full semantic check, the system issues warnings for componentsaffected by critical provisioning data changes. These are changes thatcan require components to be out of service before the change isactivated.

2 Optionally, store the edit view as a saved view.

save [-file(<filename>)] prov

where:<filename> is an optional user-supplied designation for the saved view

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The -file parameter is optional. You only need to use it if the new savedview needs a unique filename. The system automatically resets thesequence number to 001.

3 Activate the view.

activate prov

This command copies provisioning data from the edit view into the currentview. When the activation is complete, the current view and the edit vieware identical.

Note: An activate command can cause the system to reload. If a reloadoccurs, wait until the node comes back up, then log on and reenterprovisioning mode.

4 Confirm the view.

confirm prov

The confirm command verifies that the newly activated edit view allowsproper access to the node. Confirm the view within 20 minutes after theactivation is complete, otherwise the node automatically restarts using thecommitted view. You can only save one committed view to disk. You canissue the confirm command even if you are not in provisioning mode.

5 Save the current view.

save -current prov

6 Commit the current view.

commit prov

This command creates a special saved view of all configurationinformation in the current view. This committed current view id now theview that the node uses whenever undergoing a reload, restart, orswitchover.

Note: If a new current view is not committed at this time, the node usesthe last committed view in the event of a reload, restart, or switchover.

7 End the provisioning session.

end prov

8 Now that the provisionable attributes have been set for the port, you canadd applications and link to the port using specific procedures outlined inthe service guides.

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Configuring a spare function processorMost FPs support one-for-one sparing where one spare FP supports one mainFP. In a one-for-n sparing configuration, wheren can have a value betweentwo and four, you must configuren logical processors to point to the samespare FP.

Before setting up sparing between processor cards, check the productequipment codes (PECs) of the active and spare cards. For functionprocessors, the first six digits (four letters and two numbers) must match.

Note:See 241-5701-200Passport 7400, 8700 Hardware Descriptionforequivalent PECs. Except where noted, processor cards with equivalentPECs can be used as spares for each other.

Procedure 7Configuring a spare function processor

1 Set the spareCard attribute for each logical processor to point to the samespare FP.

set lp/<n> spareCard sh ca/<m>

where:<n> is the instance value of the logical processor<m> is the slot in which the spare FP sits

2 If you are using one-for-n sparing, specify which FP you have attached toeach connector on the sparing panel by setting the sparingConnectionattribute. Specify the connection for all of the main FPs and the spare FP.

set sh ca/<n> sparingConnection <m>

where:<n> is the slot in which the FP sits<m> is the connector on the sparing panel. For the spare FP, the value of<m> is spare. For the main FPs, possible values for <m> are mainA,mainB, mainC, and mainD.

3 Verify that the provisioning changes are acceptable.

check prov

4 Activate the changes you have provisioned.

activate prov

5 Confirm the provisioning view.

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confirm prov

6 Save the provisioning view.

save prov

7 Commit the provisioning view.

commit prov

Configuring line protection on optical interfacesLine automatic protection switching (line APS) is configured on opticalcards. Both ports must be configured as Sonet or Sdh: Line APS does notsupport a mix of Sonet and Sdh ports. To configure a pair of lines to worktogether under line APS, one line must be designated as working, the otherline designated as protection. Follow the instructions below to provision lineAPS on an optical function processor card.

If you are provisioning a new card see “Configuring a new function processor(FP)” on page 31 before proceeding with line APS.

Procedure 8Configuring line automatic protection switching

1 Enter the provisioning mode.

start Prov

2 Provision the line APS feature.

set sw lpt/aps featurelist aps

3 Link the logical processor to the line APS application.

set lp/<n> lpt sw lpt/aps

where:<n> is the instance of the logical processor linked to the line APSapplication.lp/<n> is provisioned as the main card

4 Add an APS component, and link it to the two ports on the Lp.

add aps/<m>

set aps/<m> workingLine lp/<n> <porttype>/0 path/0

set aps/<m> protectionLine lp/<n> <porttype>/1 path/0

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where:<m> is the instance number of the APS component. Possible valuesrange from 0 to 255.<n> is the logical processor number.<porttype> is either sonet or sdh.

5 Set the protection mode (optional). Unidirectional is the default.

For bidirectional mode:

set aps/<m> mode bidirectional

For unidirectional mode:

set aps/<m> mode unidirectional

where:<m> is the instance number of the APS component. Possible valuesrange from 0 to 255.

6 Set the switching scheme (optional). Non-revertive is the default.

For non-revertive switching:

set aps/<m> revertive no

For revertive switching:

set aps/<m> revertive yes

where:<m> is the instance number of the APS component. Possible valuesrange from 0 to 255.

7 Check, activate, and confirm provisioning changes.

For more information on the operation and use of line APS, see 241-5701-605Passport 7400, 8700, 15000 Operations and Maintenance Guide.

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Chapter 2Port Testing

Passport supports two types of diagnostic port tests: initial and maintenance.Initial tests ensure that ports are fault-free when they initialize. The systemruns initial diagnostic tests on a port during its initial start up and wheneverthe port state changes to the unlocked state from the locked state. Initialdiagnostic tests are fully automated and do not require operator intervention.

Maintenance port tests help you detect and isolate a problem area with a portand its related facilities. Port tests verify that data is being properlytransmitted and received along known segments of a link. Port tests calculatethe number of frames transmitted and received, and calculate a bit error rate.

Most port tests that test a line or facility set up their own loopbacks. Themanual test, however, requires you to insert a loopback at some point. Aloopback loops received data back to the FP being tested. You can set up aphysical loopback using a cable to cross-connect transmit and receive pins.Or, you can have an operator at the far-end set up a software loopback.Loopbacks do not produce test results for the local node because they loopreceived information back to the node being tested.

Line automatic protection switching (line APS), a form of line-protection foroptical cards, has atestcomponent that is dynamically created when theAPScomponent is provisioned. Thetest component under line APS replaces theSonet or Sdh test component to which it is linked.

You can set up both tests and loopbacks by setting the type attribute under theTest component.

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See the following sections for information about maintenance tests on portsand related components:

• “Types of port tests” on page 42

• "Testing ports and port components" on page 49

• “Port testing of optical interfaces with line APS” (page 59)

• "Port test results and their meaning" on page 64

Types of port testsPassport supports the following port tests:

• "Card loopback test" on page 42

• "Local loopback test" on page 43

• "Manual tests" on page 43

• "Remote loopback test" on page 46

• "Remote loopthistrib test" on page 47

• “V.54 remote loopback test” on page 47

• “PN127 remote loopback test” on page 49

Different FPs support different tests. For a list of the tests an FP supports, seethe specific section for that FP.

Card loopback testThe card loopback test verifies the internal working of the FP. This testtransmits a test pattern through the internal circuits and processors of the FP.Data is transmitted back from the link interface of the port. The test comparesthe pattern received to the pattern transmitted and calculates a bit error rate.

To set up the card test, set thetypeattribute under theTestcomponent to card.See the procedure “Testing a port” (page 49).

If you are using a DS1 MSA32 FP or an E1 MSA32 FP to do the cardloopback test, see also “DS1 MSA32 FP diagnostic tests” (page 238) or “E1MSA32 FP diagnostic tests” (page 248).

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Local loopback testThe local loopback test loops test data through the local CSU or modem. Thistest verifies the line interface up to but not including the facility. The localloopback test is supported on X21 component and HSSI components.

When you start this test, the system sends a request to the local modem to loopback to the port being tested. The test then transmits a test pattern to the localmodem as test data. At the end of the test, the system sends a request to thelocal modem to take down the loopback.

To set up the local loopback test, set thetype attribute under theTestcomponent to localLoop. See the procedure “Testing a port” (page 49).

Manual testsThe manual test requires you to arrange for a loopback to be inserted at somepoint along the connection. This loopback can either be a physical loopbackconfigured in the target card using a cable or a software loopbackimplemented in another far-end node. The test compares the transmitted testpattern to the received test pattern and calculates a bit error rate. Use themanual test to verify:

• the local interface, by using a physical loopback (such as a connector orcable). See “Manual test using a physical loopback” (page 43).

• the line and far-end interface, by having an external loopbackprovisioned in software in the far-end equipment that verifies thetransmission of frames. See "Manual test using an external loopback" onpage 44.

• the line and far-end interface, by having a payload loopback provisionedin software in the far-end equipment that removes data from theincoming frames and places the data on new outgoing frames. See"Manual test using a payload loopback" on page 45.

If you are using a DS1 MSA32 FP or an E1 MSA32 FP to do manual tests,see also “DS1 MSA32 FP diagnostic tests” (page 238) or “E1 MSA32 FPdiagnostic tests” (page 248).

Manual test using a physical loopbackYou can set up a physical loopback by inserting loopback equipment (such asa cable or connector) at any point on the link.

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For some FPs, the loopback cable cross-connects the transmit and receivepins. See the FP-specific sections for information about pin connections.

To set up the local node for this manual loopback test, set thetype attributeunder theTest component to manual. See “Testing ports and portcomponents” (page 49).

Manual test using an external loopbackThe external loopback test (also called line loopback test or line testing) setsup a loopback on a far-end node to test ports on the local node or target card.The local node or target card is the location where the manual test is beingperformed. The far-end card is the location where the software loopback isset-up.

Test frames are transmitted from the target card to the far-end card and aretransmitted back to the target card without modifying the data frames. Sincethe bit stream does not stop, the data does not leave the frame for processing.The external loopback produces test results at the local node only. Theexternal loopback occurs at the following places:

• For theChannel component, the external loopback is established at thechannel device. If you are testing a channel, the test frames only loopover the timeslots associated with that particular channel. Other timeslotson otherChannel components do not loop.

• For theDS1, E1, DS3, E3, Sonet, Sdh, Sts,and Aps components, theexternal loopback is established at the line interface circuitry.

To set up the local node or target card for this manual loopback test,

• set thetype attribute under theTest component to manual. See “Testingports and port components” (page 49).

• ensure the duration of the manual test in this target card runs for a shorterperiod of time than the external loopback does in the far-end card. See“Testing ports and port components” (page 49).

• ensure the manual test starts after the loopback starts. See “Testing portsand port components” (page 49).

To set up an external loopback in the far-end card,

• set thetype attribute under theTest component to externalLoop.

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• ensure the duration of the external loopback is longer in this far-end cardthan the manual loopback test in the target card. See the procedure“Setting up a loopback” (page 57).

• ensure the external loopback starts before the manual loopback. See theprocedure “Setting up a loopback” (page 57).

Manual test using a payload loopbackThe payload loopback sets up a loopback on a far-end node to test ports onthe local node or target card. The local node or target card is the locationwhere the manual test is being performed. The far-end card is the locationwhere the software loopback is set-up.

The payload loopback terminates the incoming frames, removes the data fromthe incoming frames, and places the data on new outgoing frames, which itsends back to the node being tested. The payload loopback produces testresults at the local node only.

To set up the local node or target card for this manual loopback test,

• set thetype attribute under theTest component to manual. See “Testingports and port components” (page 49).

• ensure the duration of the manual test in this target card runs for a shorterperiod of time than the payload loopback does in the far-end card. See“Testing ports and port components” (page 49).

• ensure the manual test starts after the loopback starts. See “Testing portsand port components” (page 49).

To set up a payload loopback in the far-end card,

• set thetype attribute under theTest component to payloadLoop.

• ensure the duration of the payload loopback is longer in this far-end cardthan the manual loopback test in the target card. See the procedure“Setting up a loopback” (page 57).

• ensure the payload loopback starts before the manual loopback. See theprocedure “Setting up a loopback” (page 57).

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Remote loopback testYou can use the remote loopback test to test the full length of the facility.There are three types of remote loopback tests:

• "DS1 remote loopback test" on page 46

• "DS3 remote loopback test" on page 46

• "X21 remote loopback test" on page 46

To set up the remote loopback test, set the type attribute under the Testcomponent to remoteLoop. See the procedure “Testing a port” on page 49.

If you are using a DS1 MSA32 FP to do the remote loopback test, see also“DS1 MSA32 FP diagnostic tests” (page 238).

DS1 remote loopback testOn the DS1 port, a repeated bit pattern (00001) is sent out of the link torequest the far-end CSU to set up a remote loopback. Then the specified testpattern is transmitted to the remote CSU as test data. At the end of the test,the Test component automatically requests the remote loop to be taken downby sending another repeated bit pattern (001).

DS3 remote loopback testOn the DS3 port, the local node sends a line loopback activate signal (carriedover C-bits) over the link to force the remote DS3 port to loop the signal. Theloopback remains in effect until the local node sends a line loopbackdeactivate signal over the link. The DS3 remote loop test is supported onlywhen using the DS3 C-bit parity framing mode (the DS3 cbitParity attributemust be set to on). With this attribute setting, the DS3 component alsoresponds to a remote test request.

X21 remote loopback testThe X21 remote loop test requests the remote modem to loop frames back tothe port. The system then transmits a specified test pattern to the remotemodem as test data. At the end of the test, the test component automaticallyrequests the remote loop to be taken down. The X21 component must beconfigured as DTE for the remote loop test to run properly.

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Remote loopthistrib testYou can use the remote loopthistrib test to test the full length of the facility.This test enables you to test tributary DS1 ports beneath a DS3.

On the DS3 port, a DS1 line loopback activate signal (carried over C-bits)travels over the DS3 link and forces a remote DS1 component to loop the DS1signal. The loopback stays until the system sends a DS1 line loopbackdeactivate signal. This test is supported only when using DS3 C-bit parityframing mode (the DS3 cbitParity attribute must be set to on).

To set up the remote loopthistrib test, set thetype attribute under theTestcomponent to remoteLoopThisTrib. See the procedure “Testing a port”(page 49).

V.54 remote loopback testYou can use the V.54 remote loopback test to test the full length of the facility.The V.54 test enables you to test a single channel on a DS1 or E1 port. Youcan test a single channel on a port without affecting the traffic on any otherchannels.

There are two types of V.54 remote loopback tests:

• “V.54 remote loopback testing on a channelized DS1 FP” on page 47

• “V.54 remote loopback testing on a channelized E1 FP” on page 48

To set up the V.54 remote loopback test, set thetype attribute under theTestcomponent to v54RemoteLoop. See the procedure “Testing a port” (page 49).

V.54 remote loopback testing on a channelized DS1 FPTo test a channel on a DSI FP, the connection to the CSU/DSU must be up andrunning as shown in the figure “V.54 remote loopback test on a channelizedDS1 FP”. Individual FPs support the V.54 remote loopback test differently.See the FP-specific sections for information about supported configurations.

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Figure 1V.54 remote loopback test on a channelized DS1 FP

V.54 remote loopback testing on a channelized E1 FPTo test a channel on an E1 FP, the connections to the NTU must be up andrunning as shown in the figure “Remote loopback tests on a channelized E1FP” on page 48. Individual FPs support the V.54 remote loopback testdifferently. See the FP-specific sections for information about supportedconfigurations.

Figure 2Remote loopback tests on a channelized E1 FP

PPT 1080 000 AA

Function processorFar-endCSU or

DSU

Remote loopback test(Channel only)

Far-endNTU

Function processor

Remote loopback test(Channel only)

PPT 1080 002 AA

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PN127 remote loopback testYou can use the PN127 remote loopback test to test the full length of thefacility. The PN127 test enables you to test a single channel on an E1 port.Therefore, you can test a channel on a port without affecting the traffic on anyother channels. As well, the E1 MSA32 FP can run the PN127 test on multiplechannels and multiple timeslots simultaneously.

Note:To run the PN127 test, the connection to the NTU must be up andrunning as shown in the figure “Remote loopback tests on a channelizedE1 FP” on page 48 and must support PN127.

Individual FPs support the PN127 remote loopback test differently. See theFP-specific sections for information about supported configurations.

If you are using an E1 MSA32 FP to do the PN127 test, see also “E1 MSA32FP diagnostic tests” (page 248).

Testing ports and port componentsFor instructions on testing a port or related component, refer to the FP-specific section to check for special instructions, then use the appropriateprocedure:

• “Testing a port” (page 49)

• “Testing a tributary port” (page 52)

• “Testing a channel” (page 55)

• “Setting up a loopback” (page 57)

Testing a port1 Lock the port you want to test:

lock Lp/<n> <port>/<p>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

2 Specify the test you want to run:

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set Lp/<n> <port>/<p> Test type <testtype>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<testtype> is the type of test. For information on possible values, usethe help command for the port type or refer to 241-5701-060 Passport7400, 8700, 15000 Components.

See “Types of port tests” (page 42) to determine which type of test to run.

3 Specify the number of minutes you want to run the test:

set Lp/<n> <port>/<p> Test duration <limit>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.

Note: If you are performing a manual test with an external or payloadloopback, ensure the external or payload loopback runs for a longerduration than the manual test.

4 If you want to specify other characteristics of the port test, set the testattributes under the operational group Setup appropriately:

set Lp/<n> <port>/<p> Test <attribute><attributevalue>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<attribute> is the name of the attribute.

<attributevalue> is the value for the attribute.

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For information on test attributes and possible values, use the helpcommand for the port type or refer to 241-5701-060 Passport 7400, 8700,15000 Components.

5 If you specified the manual test in step 2, insert a physical loopback orarrange for a provisioned loopback at the far end. See the procedure“Setting up a loopback” (page 57).

6 Start the port test:

start Lp/<n> <port>/<p> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

7 If you want to see interim results while the test is running, display teststatistics:

display Lp/<n> <port>/<p> Test results

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

See “Port test results and their meaning” (page 64), for information aboutthe test statistics that you have displayed.

8 If you want the test to run for the full duration, wait for the test timer toexpire.

If you do not want the test to continue running, stop the test:

stop Lp/<n> <port>/<p> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

The system automatically displays the test results if you stop a test orwhen the test ends. See “Port test results and their meaning” (page 64),for an analysis of the diagnostic test results.

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9 If you ran the manual test, arrange to remove the loopback you set up instep 5.

10 Restore service to the port.

unlock Lp/<n> <port>/<p>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

Testing a tributary port1 Lock the tributary port you want to test:

lock Lp/<n> <port>/<p> <trib_port>/<q>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

2 Specify the tributary port test:

set Lp/<n> <port>/<p> <trib_port>/<q> Test typeloopthistrib

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

3 Specify the number of minutes you want to run the test:

set Lp/<n> <port>/<p> <trib_port>/<q> Test duration<limit>

where:

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<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.

4 If you want to specify other characteristics of the tributary port test, set thetest attributes appropriately:

set Lp/<n> <port>/<p> <trib_port>/<q> Test <attribute><attributevalue>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

<attribute> is the name of the attribute.

<attributevalue> is the value for the attribute.

For information on test attributes and possible values, use the helpcommand for the port type or refer to 241-5701-060 Passport 7400, 8700,15000 Components.

5 Start the tributary port test:

start Lp/<n> <port>/<p> <trib_port>/<q> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

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6 If you want to see interim results while the test is running, display teststatistics:

display Lp/<n> <port>/<p> <trib_port>/<q> Test results

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

See “Port test results and their meaning” (page 64), for information aboutthe test statistics that you have displayed.

7 If you want the test to run for the full duration, wait for the test timer toexpire.

If you do not want the test to continue running, stop the test:

stop Lp/<n> <port>/<p> <trib_port>/<q> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

<q> is the tributary port number.

The system automatically displays the test results if you stop a test orwhen the test ends. See “Port test results and their meaning” (page 64),for an analysis of the diagnostic test results.

8 Restore service to the tributary port.

unlock Lp/<n> <port>/<p> <trib_port>/<q>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<trib_port> is the tributary port type.

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<q> is the tributary port number.

Testing a channel1 Lock the channel you want to test:

lock Lp/<n> <port>/<p> Chan/<r>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

2 Specify the test you want to run:

set Lp/<n> <port>/<p> Chan/<r> Test type <testtype>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

<testtype> is card, manual, remoteLoop. See “Types of port tests”(page 42) to determine which type of test to run.

3 Specify the number of minutes you want to run the test:

set Lp/<n> <port>/<p> Chan/<r> Test duration <limit>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.

4 If you want to specify other characteristics of the test, set the testattributes appropriately:

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set Lp/<n> <port>/<p> Chan/<r> Test <attribute><attributevalue>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

<attribute> is the name of the attribute.

<attributevalue> is the value for the attribute.

For information on test attributes and possible values, use the helpcommand for the port type or refer to 241-5701-060 Passport 7400, 8700,15000 Components.

5 If you specified the manual test in step 2, insert a physical loopback orarrange for a provisioned loopback at the far end. See the procedure“Setting up a loopback” (page 57).

6 Start the channel test:

start Lp/<n> <port>/<p> Chan/<r> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

7 If you want to see interim results while the test is running, display teststatistics:

display Lp/<n> <port>/<p> Chan/<r> Test results

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

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See “Port test results and their meaning” (page 64), for information aboutthe test statistics that you have displayed.

8 If you want the test to run for the full duration, wait for the test timer toexpire.

If you do not want the test to continue running, stop the test:

stop Lp/<n> <port>/<p> Chan/<r> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

The system automatically displays the test results if you stop a test orwhen the test ends. See “Port test results and their meaning” (page 64),for an analysis of the diagnostic test results.

9 If you ran the manual test, arrange to remove the loopback you set up instep 5.

10 Restore service to the channel:

unlock Lp/<n> <port>/<p> Chan/<r>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<r> is the channel number.

Setting up a loopbackA software loopback must be in place at all times during manual loopbacktests involving an external or payload loopback. Ensure the payload orexternal loopback on the far-end node

• starts before the manual test starts on the target node.

• lasts for a longer duration than the manual test on the target node.

1 Verify that the port is either receiving a clock source from the line orproviding its own clock source:

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display Lp/<n> <port>/<p> clockingSource

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

2 Lock the port on the LP that you are using for the loopback:

lock Lp/<n> <port>/<p>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

3 Specify the type of loopback you want to run:

set Lp/<n> <port>/<p> Test type <type>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<type> is externalLoop or payloadLoop.

4 Specify the number of minutes you want the loopback to run:

set Lp/<n> <port>/<p> Test duration <limit>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.

Note: Ensure the external or payload loopback runs for a longer durationthan the manual loopback test.

5 Start the loopback:

start Lp/<n> <port>/<p> Test

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where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

Note: Ensure you start the external or payload loopback before themanual loopback test.

6 Wait until the operator at the far end indicates that testing is complete.

7 If you want the loopback to run for the full duration, wait for the test timerto expire.

If you do not want the loopback to continue running, stop the test:

stop Lp/<n> <port>/<p> Test

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

8 Unlock the port on the LP that you used for the loopback:

unlock Lp/<n> <port>/<p>

where:

<n> is the instance number of the logical processor linked to the port.

<port> is the port type.

<p> is the port number.

Port testing of optical interfaces with line APSLine automatic protection switching (line APS) is a form of line-protectionfor optical cards. Under line APS, one line is designated as working and asecond line is designated as protection. Only one line can be active at a time.The inactive line functions as a backup. Signal failure, signal degradation oroperator commands can cause the active channel to switch from one line tothe other.

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The line APStestcomponent is dynamically created when line APS is linkedto a Sonet or Sdh port. Ports linked to line APS cannot be individually tested.Port tests are handled by theAPS component using thetest subcomponent.Testing involves only the currently active near and far-end channels.

During testing, line APS is fully functional, and supports automatic andmanual switches between the working and the protection line. Unidirectionalmode is automatic during testing, regardless of the configured mode setting.

To test line APS ports, refer to the following procedures:

• “Testing a port” (page 60)

• “Setting up a loopback” (page 62)

Testing a port1 Lock the Aps component to be tested:

lock Aps/<a>

where:

<a> is the instance number of the Aps component.

2 Specify the test you want to run:

set Aps/<a> Test type <testtype>

where:

<a> is the instance number of the Aps component.

<testtype> is card or manual.

3 Specify the number of minutes you want to run the test:

set Aps/<a> Test duration <limit>

where:

<a> is the instance number of the Aps component.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.00.

Note: If you are performing a manual test with an external or payloadloopback, ensure the external or payload loopback runs for a longerduration than the manual test.

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4 If you want to specify other characteristics of the test, set the attributesappropriately:

set Aps/<a> Test <attribute> <attributevalue>

where:

<a> is the instance number of the Aps component.

<attribute> is the name of the attribute.

<attributevalue> is the value for the attribute.

For information on test attributes and possible values, use the helpcommand for the Aps component or refer to 241-5701-060 Passport7400, 8700, 15000 Components.

5 If you specified the manual test in step 2, insert a physical loopback orarrange for a provisioned loopback at the far end. See the procedure“Setting up a loopback” (page 62).

6 Start the test:

start Aps/<a> Test

where:

<a> is the instance number of the Aps component.

7 If you want to see interim results while the test is running, display teststatistics:

display Aps/<a> Test results

where:

<a> is the instance number of the Aps component.

See “Port test results and their meaning” (page 64), for information aboutthe test statistics that you have displayed.

8 If you want the test to run for the full duration, wait for the test timer toexpire.

If you do not want the test to continue running, stop the test:

stop Aps/<a> Test

where:

<n> is the instance number of the Aps component.

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The system automatically displays the test results if you stop a test orwhen the test ends. See “Port test results and their meaning” (page 64),for an analysis of the diagnostic test results.

9 If you ran the manual test, arrange to remove the loopback you set up instep 5.

10 Restore service to the Aps component:

unlock Aps/<a>

where:

<a> is the instance number of the Aps component.

11 Unlock the APS component.

unlock aps/<n>

Setting up a loopbackA software loopback must be in place at all times during manual loopbacktests involving an external or payload loopback. Ensure the payload orexternal loopback on the far-end node

• starts before the manual test starts on the target node.

• lasts for a longer duration than the manual test on the target node.

1 Verify that the Aps component is either receiving a clock source from theline or providing its own clock source:

display Aps/<a> clockingSource

where:

<a> is the instance number of the Aps component.

2 Lock the Aps component:

lock Aps/<a>

where:

<a> is the instance number of the Aps component.

3 Specify the type of loopback you want to run:

set Aps/<a> Test type <type>

where:

<a> is the instance number of the Aps component.

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<type> is externalLoop or payloadLoop.

4 Specify the number of minutes you want the loopback to run:

set Aps/<a> Test duration <limit>

where:

<a> is the instance number of the Aps component.

<limit> specifies the maximum length of time (in minutes) that the testcan run. The default value is 1.00.

Note: Ensure the external or payload loopback runs for a longer durationthan the manual loopback test.

5 Start the loopback:

start Aps/<a> Test

where:

<a> is the instance number of the Aps component.

Note: Ensure you start the external or payload loopback before themanual loopback test.

6 Wait until the operator at the far end indicates that testing is complete.

7 If you want the loopback to run for the full duration, wait for the test timerto expire.

If you do not want the loopback to continue running, stop the test:

stop Aps/<a> Test

where:

<a> is the instance number of the Aps component.

8 Unlock the port on the LP that you used for the loopback:

unlock Aps/<a>

where:

<a> is the instance number of the Aps component.

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Port test results and their meaningThe table “Port test result attributes and uses” defines each test attribute. Thetable “Interpreting port test results” on page 65 explains how to interpret porttest results. For each test, there are a number of actions suggested to correctany problems. You can rerun the test after you complete each remedial action,or after you complete a set of remedial actions.

Table 1Port test result attributes and uses

Attribute Use

bitErrorRate Displays the calculated bit error rate on the link

bitsRx Displays the total number of bits received during thetest period

bitsTx Displays the total number of bits sent during the testperiod

bytesRx Displays the total number of bytes received duringthe test period

bytesTx Displays the total number of bytes sent during thetest period

causeOfTermination Displays the reason the port test ended. Can be oneof

• neverStarted: the port test has not been started

• testRunning: the port test is currently running

• testTimeExpired: the port test ran for thespecified duration

• stoppedByOperator: a Stop command wasissued

elapseTime Displays the length of time (in minutes) that the porttest has been running

erroredFrmRx Displays the total number of errored framesreceived during the test period

frmRx Displays the total number of frames received duringthe test period

(Sheet 1 of 2)

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frmTx Displays the total number of frames sent during thetest period

timeRemaining Displays the maximum length of time (in minutes)that the port test will continue to run before stopping

Table 2Interpreting port test results

Test type Problem Solution

Card test No frames arereceived or erroredframes are received

1) Replace the function processor.2) Rerun the card test.

Manual test No frames arereceived or erroredframes are received

1) Check the far-end loop.2) Check the cabling.3) Ensure that both ends of the connection areprovisioned properly.4) Ensure that a clock source is available.5) Remove devices that may be creating a noisyenvironment.6) Run the card test.7) Replace the function processor.8) Rerun the manual test.

Local test No frames arereceived or erroredframes are received

1) Check the modem and modem connections.2) Check the cabling.3) Check the far-end loop.4) Remove devices that may be creating a noisyenvironment.5) Run the card test.6) Run the manual loop test.7) Replace the function processor.8) Rerun the local test.9) If applicable, check far-end DCE OSI state.

(Sheet 1 of 3)

Table 1 (continued)Port test result attributes and uses

Attribute Use

(Sheet 2 of 2)

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Remote test No frames arereceived or erroredframes are received

1) Check the CSU, its settings (whether the CSUsupports inband remote loop), and its connections forthe function processor.2) If the function processor uses a modem, check themodem and modem connections.3) Check the cabling.4) Check the far-end loop.5) Remove devices that may be creating a noisyenvironment.6) Run the card test.7) Run the manual loop test.8) Replace the function processor.9) Rerun the remote test.

Table 2 (continued)Interpreting port test results

Test type Problem Solution

(Sheet 2 of 3)

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V54 remote loop testor PN127 remoteloop test

frmRx attribute notincreasing afterstarting the test

It takes about six seconds to actually see the test datalooped back for the CSU/DSU or NTU to respond tothe loop-up pattern from the Passport node. If aftersix seconds, the frmRx counter is still notincrementing, the CSU/DSU or NTU is not triggeredto loop back. Check if there is a connection problemwith the CSU/DSU or NTU.

Verification ofloopback removalupon test completion

Since there is no acknowledgment for the loop-downpattern, it is hard to tell when the CSU/DSU or NTU isout of loopback mode. To make sure that the CSU/DSU or NTU is out of loopback mode, performanother manual loop from the Passport node. If theloop is not down, then the frmTx and frmRx countersboth increase. If the loop is down, then the frmRxcounter does not increase.

Errored framesreceived at thebeginning of the test

Some of the CSU/DSU or NTU equipment takeslonger to respond to the loop-up pattern. On thePassport node, you only have to wait for six secondsfor the CSU/DSU to go into loopback mode and startsending the real test data. Meanwhile, the CSU/DSUor NUT responds to the loop-up pattern by sendingthe acknowledge pattern. If the reception of theacknowledge pattern finishes after the six secondperiod, there are error frames.

To avoid this condition, set the dataStartDelayattribute inside the test component to a value otherthan 0. The real test data starts after this specifiedtime (in seconds).

Random erroredframes receivedduring the test

A non-terminated V.35 cable connected to the CSU/DSU or NTU can cause random error frames. A non-terminated cable can pick up noise that disrupts thenormal test data and results in error frames. Checkthe cabling to make sure that this is not the problem.

Table 2 (continued)Interpreting port test results

Test type Problem Solution

(Sheet 3 of 3)

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Chapter 3Card Testing

The card test allows you to stress test new or existing function processors (FP)under controlled conditions. The test circulates frames over the Passport7400, 8700 bus between the FP you are testing and a target FP, exercising bothcards and consuming bus bandwidth. The test frames follow the same routeto their destination as normal frames. If the Passport 7400, 8700 node is indual-bus mode, each test consumes bandwidth from both 800 Mbit/s buses inequal amounts. If the module is in single-bus mode, the test runs only the busin service.

The function processor being tested generates test frames and groups theminto the following streams:

• The loading frame stream rapidly circulates a set of loading framesbetween the function processor being tested and the target processor.This stream verifies the operation of the cards and the Passport 7400,8700 bus under a controlled load.

• The verification stream transmits a series of verification frames from thefunction processor being tested to the target processor. As each framereturns, its contents are verified and the next verification frame in theseries is transmitted. This stream verifies that frames are not corruptedduring the transfer between function processors.

You can configure the card test to send frames from one or both streams. Youcan also control the priority, size, and content of the test frames.

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Each function processor can run the card test independently. You can run thecard test on any subset of the FPs simultaneously and can specify differenttest frame configurations for each test. It is also possible for an FP to act asthe target for more than one FP being tested, or while it is itself being tested.

This section includes the following procedures:

• “Changing the card test setup” on page 70

• “Testing a card” on page 73

• “Displaying card test results” on page 74

• “Interpreting card test results” on page 75

Changing the card test setupThe following procedure explains how to change the attributes that control thebehavior of the card test. These attributes are

• targetCard

• frmTypes

• frmPriorities

• frmSize

• frmPatternType

• customizedPattern

• duration

Procedure 9Changing the card test setup

1 Set the target card to which the frames transmit during the test.

set shelf card/<n> test targetCard <targetNum>

where:<n> is the instance number of the test card<targetNum> is the instance number of the target card

The card test does not operate when its own card is the target card. If<targetNum> is equal to <n> you cannot start the test. This is the defaulttarget selection.

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Note: A card test will fail if the card you are testing and the card youspecify as the target card have different processing capabilities.Therefore, you must target a PM1 card when you test a PM1 card. Youmust target a PM2 card when you test a PM2 card. And, you must targetan ATM card when you test an ATM card.

2 Optionally, set the types of frames that transmit during the test. Thedefault is to send both loading and verification frames.

set shelf card/<n> test frmTypes <typeSet>

where:<n> is the instance number of the test card<typeSet> alters the set of frame types and is any combination of

• <type> (adds the specified frame type to the set)

• !<type> (clears the set and adds the specified frame type to the set)

• ~<type> (removes the specified frame type from the set)

<type> is either loading or verification

3 Optionally, set the priorities of frames that transmit during the test. Thedefault is to send low-priority frames only.

set shelf card/<n> test frmPriorities <prioritySet>

where:<n> is the instance number of the card to be tested<prioritySet> alters the set of frame priorities and is any combination of

• <priority> (adds the specified frame priority to the set)

• !<priority> (clears the set and adds the specified frame priority to theset)

• ~<priority> (removes the specified frame priority from the set)

<priority> is either lowPriority or highPriority.

4 Optionally, set the size of frames that transmit during the test.

set shelf card/<n> test frmSize <priority> <size>

where:<n> is the instance number of the test card<priority> is low priority<size> is a value from 16 to 16000 bytes. The default is low-priority framescontaining 8192 bytes. Larger test frames are useful for generating highbus utilization rates. However, they can cause congestion, resulting indata loss.

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5 Optionally, set the pattern for filling frames that transmit during the test.

set shelf card/<n> test frmPatternType <patternType>

where:<n> is the instance number of the test card<patternType> is one of

• ccitt32kBitPattern (a pseudo-random sequence of 32 Kbit is used)

• ccitt8MBitPattern, (a pseudo-random sequence of 8 Mbit is used)

• customizedPattern (the pattern defined by the customizedPatternattribute is used)

The default is a pseudo-random sequence of 32 Kbit.

6 Optionally, set the 32-bit customized pattern for filling frames that aretransmit during the test. The default is a pattern of alternating 0 and 1 bits.

set shelf card/<n> test customizedPattern <pattern>

where:<n> is the instance number of the card to be tested<pattern> is a hexadecimal value from 00000000 to FFFFFFFF

The value of this attribute is ignored if frmPatternType does not have thevalue customizedPattern.

7 Optionally, set the maximum amount of time that the test can run.

set shelf card/<n> test duration <limit_value>

where:<n> is the instance number of the test card<limit_value> specifies the maximum length of time (in minutes) that thecard test can run. The default limit is 60 minutes.

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Testing a cardUse the following procedure to test a card.

Procedure 10Testing a card

1 Ensure that you have set the target card (see “Changing the card testsetup” on page 70

2 Optionally, lock the bus that is not in use in the test. The bus you will usein the test must be unlocked and enabled, otherwise the lock commandwill fail.

lock shelf bus/<b>

where:<b> is the instance value of the bus that is not in use in the test (either Xor Y)

If you run the test with both buses in service, the card uses them equally.

3 Optionally, ensure the card test is properly configured for the desired test.

display shelf card/<n> test setup

where:<n> is the instance number of the card being tested

See "Changing the card test setup" on page 70 for more information onchanging the configuration. You cannot change the card test configurationonce you start the test.

4 Start the card test.

start shelf card/<n> test

where:<n> is the instance number of the card being tested

CAUTIONRisk of data lossThe activation of a card test consumes processor time andbus bandwidth on both the card being tested and the targetcard. Care must be taken when configuring card tests toensure that the test frames generated during the tests donot cause data loss due to congestion.

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The test continues until it reaches the specified time limit. The test stopsautomatically if the target card becomes non-operational.

5 Optionally, you can end the test before it reaches the time limit.

stop shelf card/<n> test

where:<n> is the instance number of the card being tested

6 You can view the results of a test while the test is in progress or after it isterminated.

display shelf card/<n> test results

where:<n> is the instance number of the card being tested

You can display, individually, each attribute describing the results of a test.See "Displaying card test results" on page 74, for more information.

7 Once the test is complete, release the other bus if it was locked during thetest.

unlock shelf bus/<b>

where:<b> is the instance value of the bus that was not used in the test (either Xor Y)

Displaying card test resultsThe following procedure describes how to display the attributes of the cardtest.

Procedure 11Displaying card test results

1 Display the amount of time the test has run.

display shelf card/<n> test <attribute>

where:<n> is the instance number of the test card<attribute> is one of the following: causeOfTermination, elapsedTime,loadingFrmData, timeRemaining, verificationFrmData

See the table “Card test result attributes and uses” on page 75, for moreinformation on results.

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Interpreting card test resultsThe following table explains how to interpret card test results. For each test,there are a number of suggested actions to correct the problems. In each case,you can rerun the test either after each remedial action, or after a number ofremedial actions.

Table 3Card test result attributes and uses

Attribute Use

causeOfTermination Displays the reason the card test ended. Can beone of

• neverStarted: the card test has not been started

• testRunning: the card test is currently running

• testTimeExpired: the card test ran for thespecified duration

• stoppedByOperator: a Stop command wasissued

• targetFailed: the target card became non-operational

elapsedTime Displays the length of time (in minutes) that the cardtest has been running

loadingFrmData Displays the number of loading frames transmittedto the Test component on the target card and thenumber of loading frames not successfully returnedby the Test component on the target card

timeRemaining Displays the maximum length of time (in minutes)that the card test will continue to run before stopping

verificationFrmData Displays the number of verification frames returnedby the Test component on the target card and thenumber of verification frames that had incorrect bitswhen returned

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Table 4Interpreting card test results

Test type Test result Remedial action

Loadingframe stream

The loadingFrmData attribute showsframesSent>0 and framesLost=0.Loading frames are circulating properlybetween the card under test and thetarget card.

No remedial action is required.

The loadingFrmData attribute showsframesSent>0 and framesLost>0.Loading frames are lost as they circulatebetween the card under test and thetarget card.

Frames can be lost due to congestion,mismatched card types, or hardwareproblems. You can reduce congestionby using smaller test frames ordecreasing the amount of data passingthrough the cards. Ensure that the cardyou test and the card you specify as thetarget card have the same processingcapabilities. If the problem persists, tryrunning bus tests to isolate the defectivehardware item.

The loadingFrmData attribute showsframesSent=0 and framesLost=0. Thecard under test was unable to contactthe target card to begin the test.

No remedial action is required if theloading frame stream was not enabledduring the test. Otherwise, try each ofthe following actions in turn. After eachaction, rerun the card test to see if theproblem still exists.1) Verify that both cards are operationaland that the test setup specifies thatloading frames will transmit.2) Reset the target card.3) Reset the card under test.

Note: Actions 2 and 3 cause a serviceoutage on the cards.

(Sheet 1 of 2)

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Verificationframe stream

The verificationFrmData attribute showsframesTested>0 and framesBad=0.Verification frames are circulatingproperly between the card under testand the target card.

No remedial action is required.

The verificationFrmData attribute showsframesTested>0 and framesBad>0.Verification frames are being corruptedas they circulate between the card undertest and the target card.

Rerun the card test using a differenttarget card. If the problem disappears,replace the original target card. If theproblem persists, replace the card undertest. Rerun the original test.

If the problem persists after you replaceboth the test card and the target card,contact Nortel Networks.

The verificationFrmData attribute showsframesTested=0 and framesBad=0. Thecard under test is unable to contact thetarget card in order to begin the test ORthe verification frames are lost due tocongestion or due to hardwareproblems.

No remedial action is required if theverification frame stream was notenabled during the test. Otherwise tryeach of the following actions in turn.After each action, rerun the card test tosee if the problem still exists:1) Verify that both cards are operationaland that the test setup specifies thatverification frames will transmit.2) Rerun the test with the loading framestream enabled and use the results ofthat test to isolate the cause of theproblem.

Table 4 (continued)Interpreting card test results

Test type Test result Remedial action

(Sheet 2 of 2)

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Chapter 4V.11 function processor

See the following sections for information about configuring and testing aV.11 function processor (FP):

• “V.11 FP configuration parameters” on page 79

• “V.11 FP diagnostic tests” on page 79

• “Provisionable V.11 FP components and attributes” on page 82

• “V.11 FP OSI states” on page 83

• “V.11 FP pinouts for physical loopbacks” on page 84

V.11 FP configuration parametersWhen configuring a V.11 FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: V11

• Ports <port>: X21

• Port numbers <m>: 0–7

V.11 FP diagnostic testsThe V.11 FP supports the following port tests and loopbacks. The figure “Datapaths for V.11 FP port tests and loopbacks” on page 81 shows the data pathfor each test and loopback.

• “Card loopback test” (page 42)

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• “Local loopback test” (page 43). To run a local tests on ports associatedwith an X21 component, you must configure the component as DTE. TheX21 component does not respond to a local test request from the far end.

• “Manual tests” (page 43). The test depends on whether the port isconfigured for DTE mode or for DCE mode.

Ports configured as DTE do not support physical loopbacks inserted atthe termination panel. You can only run a manual test where either testequipment or another Passport provides a loopback point. The equipmentthat provides the loopback must also provide the clock source.

If thedteDataClockSourceattribute for the port is set to fromDce, you donot need to physically loop the clock.

If you need to insert a clock loopback at the termination panel, enterprovisioning mode and change the value for the dteDataClockSource tofromDte. When the test is completed, change the clock source back tofromDce.

If you want to insert a physical loopback, you must cross-connect thetransmit pins to the receive pins. For port configured as DCE, you canonly insert the loopback at the termination panel.

— “Manual test using a physical loopback” (page 43).If thedteDataClockSource for the port is set to fromDte, you canphysically loop the clock. See “V.11 FP pinouts for physicalloopbacks” (page 84). Alternately, you can use external testequipment or another Passport node that has an external loopbackset up at the loopback point.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the link controller.

• “Remote loopback test” (page 46). This test is only supported on theX.21 component.

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Figure 3Data paths for V.11 FP port tests and loopbacks

PPT 0042 001 AB

Function processor

Externaland Payloadloopbacks

Linkcontroller

Lineinterface

Far-endCSU ormodem

CSU ormodem

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

Localloopbacktest

Remoteloopbacktest

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Provisionable V.11 FP components and attributesThis figure shows provisionable V.11 FP components and attributes.

Figure 4Provisionable V.11 FP components and attributes

PPT 2920 017 AA

Root

Lp

X21

Channel (Chan)

Provisioned (Prov)linkModereadyLineStatedataTransferLineStatedataStatusTimeOutlineSpeedclockingSourcedteDataClockSourcelineTerminationRequiredapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

vendorcommentText

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V.11 FP OSI statesThese tables contain information about V.11 FP OSI states.

Table 5X21 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The X21 interface is inoperable. Bad line state and excessiveline state changes are possible causes. Lack of clocks will alsodisable the port.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is good. Clocks are available.

Unlocked, Enabled, Busy The X21 component is in use. The X21 component services onlyone user (a Framer component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle Some hardware test failed or the X21 component is in the lockedstate.

A lock operator command is in effect.

Table 6V.11 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, CHAN,DS3, or E3 component creates a Test component. The testcomponent services only the component that created it. A teststops either when the prescribed timer expires or you issue astop test command.

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V.11 FP pinouts for physical loopbacksTo make hardware modifications for a physical loopback on a V.11 port, youmust cross-connect the transmit and receive pins. You can only insert theloopback at the termination panel. Pin cross-connections for the clock sourceare optional (pins 6, 7, 13, and 14 for V11 ports).

Table 7Faceplate connector pinouts for a V.11 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

2 TA 4 RA

9 TB 11 RB

6 SA 7 XA

13 SB 14 XB

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Chapter 5V.35 function processor

See the following sections for information about configuring and testing aV.35 function processor (FP):

• “V.35 FP configuration parameters” on page 85

• “V.35 FP diagnostic tests” on page 85

• “Provisionable V.35 FP components and attributes” on page 87

• “V.35 FP OSI states” on page 88

• “V.35 FP pinouts for physical loopbacks” on page 89

V.35 FP configuration parametersWhen configuring a V.35 FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: V35

• Ports <port>: V35

• Port numbers <m>: 0–7

V.35 FP diagnostic testsThe V.35 FP supports the following port tests and loopbacks. The figure “Datapaths for V.35 port tests and loopbacks” on page 87 shows the data path foreach test and loopback.

• “Card loopback test” on page 42

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• “Manual tests” (page 43). The test depends on whether the port isconfigured for DTE mode or for DCE mode.

Ports configured as DTE do not support physical loopbacks inserted atthe termination panel. You can only run a manual test where either testequipment or another Passport provides a loopback point. The equipmentthat provides the loopback must also provide the clock source.

If the dteDataClockSource attribute for the port is set to Dce, you do notneed to physically loop the clock.

If you need to insert a clock loopback at the termination panel, enterprovisioning mode and change the value for the dteDataClockSource tofromDte. When the test is completed, change the clock source back tofromDce.

If you want to insert a physical loopback, you must cross-connect thetransmit pins to the receive pins. For port configured as DCE, you canonly insert the loopback at the termination panel.

— “Manual test using a physical loopback” (page 43). If thedteDataClockSource for the port is set to fromDte, you canphysically loop the clock. See “Faceplate connector pinouts for aV.35 FP” on page 90. Alternately, you can use external testequipment or another Passport node that has an external loopbackset up at the loopback point.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the link controller.

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Figure 5Data paths for V.35 port tests and loopbacks

Provisionable V.35 FP components and attributesThis figure shows the provisionable V.35 FP components and attributes.

PPT 0042 002 AA

Function processor

Externalloopback

Linkcontroller

Lineinterface

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

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Figure 6Provisionable V.35 FP components and attributes

V.35 FP OSI statesThese tables contain information about V.35 FP OSI states.

Table 8V35 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The V.35 port is inoperable. Bad line state and excessive linestate changes are possible causes. Lack of clocks will alsodisable the port.

Unlocked, Enabled, Idle The component is not in use. Waiting for a binding to a Framercomponent is a possible cause. The line input is good. Clocksare available.

(Sheet 1 of 2)

PPT 2920 018 AA

Root

Lp

V35

Channel (Chan)

Provisioned (Prov)linkModereadyLineStatedataTransferLineStatedataStatusTimeOutlineSpeedclockingSourcedteDataClockSourcelineTerminationRequiredapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

vendorcommentText

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V.35 FP pinouts for physical loopbacksTo make hardware modifications for a physical loopback on a V.35 port, youmust cross-connect the transmit pins to the receive pins. You can only insertthe loopback at the termination panel. Pin cross-connections for the clocksource are optional (pins 6, 7, 13, and 14 for V35 ports).

Unlocked, Enabled, Busy The V35 component is in use. The V35 component services onlyone user (a FRAMER component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle Some hardware test failed or the V35 component is in the lockedstate.

A lock operator command is in effect.

Table 9V.35 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, CHAN,DS3, or E3 component creates a Test component. The Testcomponent services only the component that created it. A teststops either when the prescribed timer expires or you issue astop test command.

Table 8 (continued)V35 component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Table 10Faceplate connector pinouts for a V.35 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

2 TXDS 4 RXDA

9 TXDB 11 RXDB

6 TSET (DTE) B 7 RSETB

13 TEST (dte) A 14 RSETA

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Chapter 6Four-port DS1 function processor

See the following sections for information about configuring and testing afour-port DS1 function processor (FP).

• “Four-port DS1 FP configuration parameters” on page 91

• “Four-port DS1 FP diagnostic tests” on page 92

• “Provisionable four-port DS1 FP components and attributes” on page 94

• “Four-port DS1 FP OSI states” on page 95

• “Four-port DS1 FP pinouts for physical loopbacks” on page 96

Four-port DS1 FP configuration parametersWhen configuring a DS1 FP, use the following values to help you setcomponent attributes.

• Card type <cardtype>: DS1

• Ports <port>: DS1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 1–3. You can add up to 4 channels on ports 1and 3 if the other two ports are disabled.

• Timeslots <timeslots>: 1–24. You can assign a set of timeslots to achannel. For example, you can set <timeslots> to “4 6 8 10 14 22.”

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• Timeslot data rate <rate>: doNotOverride or 56K. If you selectdoNotOverride, the card type and zeroCoding attribute value determinesthe data rate. If you set the zeroCoding attribute to AMI, set the date rateto 56K. Otherwise, your channel can experience data errors.

• Clocking source: If you install a DS1 trunk between two Passport nodes,you must set the clockingSource attributes to one of the followingcombinations: local at one end and line at the other, module at one endand line at the other, or module at both ends.

Four-port DS1 FP diagnostic testsThe four-port DS1 FP supports the following port tests and loopbacks. Thefigure “Data paths for four-port DS1 FP port tests and loopbacks” on page 93shows the data path for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 45). Make sure theloop lengths are within the required range and the lineLengthattribute is properly set. If the looped signal is not reamplified, theround-trip loop length for DS1 cannot exceed 223 m (655 ft). See“Four-port DS1 FP pinouts for physical loopbacks” on page 96.

— “Manual test using an external loopback” (page 46). The externalloopback is established at the line interface circuitry.

• “Remote loopback test” (page 46).

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Figure 7Data paths for four-port DS1 FP port tests and loopbacks

PPT 0040 001 AB

Function processor

Externalloopback

Linkcontroller

LineinterfaceCSU

Cardtest

Remoteloopbacktest

Manualloopbacktest in conjunctionwith physical loopback

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Provisionable four-port DS1 FP components and attributesThis figure shows the provisionable DS1 FP components and attributes.

Figure 8Provisionable DS1 FP components and attributes

PPT 2920 015 AA

Root

Lp

DS1

Channel (Chan)

Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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Four-port DS1 FP OSI statesThese tables contain information about DS1 FP OSI states.

Table 11DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 12DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Four-port DS1 FP pinouts for physical loopbacksThe four-port DS1 FP has two connectors on the faceplate. Each connectorsupports two ports. In the table “Faceplate connector pinouts for a four-portDS1 FP” on page 97, port x refers to the first port, and port y refers to thesecond port on the same connector. The pinout configurations are identical forall connectors and ports on the faceplate. Transmit and receive pins match upby polarity.

The table “Termination panel connector pinouts for a four-port DS1 FP” onpage 97contains the pinouts for the termination panel connectors.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 13DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 12 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Table 14Faceplate connector pinouts for a four-port DS1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 Port x, transmit + 7 Port x, receive +

15 Port x, transmit - 14 Port x, receive -

1 Port y, transmit + 2 Port y, receive +

9 Port y, transmit - 10 Port y, receive -

Table 15Termination panel connector pinouts for a four-port DS1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 7Four-port E1 function processor

See the following sections for information about configuring and testing afour-port E1 function processor (FP):

• “Four-port E1 FP configuration parameters” on page 99

• “Four-port E1 FP diagnostic tests” on page 100

• “Provisionable four-port E1 FP components and attributes” on page 101

• “Four-port E1 FP OSI states” on page 101

• “Four-port E1 FP pinouts for physical loopbacks” on page 103

Four-port E1 FP configuration parametersWhen configuring an E1 FP, use the following values to set componentattributes:

• Card type <cardtype>: E1

• Ports <port>: E1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 1–3. You can add up to four channels on ports1 and 3 if the other two ports are disabled.

• Timeslots <timeslots>: 1–31. You can assign a set of timeslots to achannel. For example, you can set <timeslots> to “4 6 8 10 14 22.” If youset the E1 lineType attribute to CAS (channel associated signalling), youcannot use timeslot 16.

• Timeslot data rate <rate>: doNotOverride or 56K.

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• Clocking source: If you install an E1 trunk between two Passports nodes,you must set the clockingSource attributes to one of the followingcombinations: local at one end and line at the other, module at one endand line at the other, or module at both ends.

Four-port E1 FP diagnostic testsThe four-port E1 FP supports the following port tests and loopbacks. Thefigure “Data paths for four-port E1 FP port tests and loopbacks” on page 100shows the data path for each test and loopback.

• “Card loopback test” on page 42

• “Manual tests” on page 43

— “Manual test using a physical loopback” (page 43). See “Four-portE1 FP pinouts for physical loopbacks” on page 103.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

Figure 9Data paths for four-port E1 FP port tests and loopbacks

PPT 0040 002 AA

Function processor

Externalloopback

Linkcontroller

Lineinterface

CSU

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

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Provisionable four-port E1 FP components and attributesThis figure shows provisionable E1 FP components and attributes.

Figure 10Provisionable E1 FP components and attributes

Four-port E1 FP OSI statesThese tables contain information about E1 FP OSI states.

PPT 2920 015 AA

Root

Lp

E1

Channel (Chan)

Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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Table 16E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

Table 17E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Four-port E1 FP pinouts for physical loopbacksThe faceplate of the four-port E1 FP has two connectors. Each connectorsupports two ports. In the table “Faceplate connector pinouts for a four-portE1 FP” on page 104, port x refers to the first port, and port y refers to thesecond port on the same connector. The pinout configurations are identical forall connectors and ports on the faceplate. The transmit and receive pins mustmatch up by polarity.

The table “Termination panel connector pinouts for a four-port E1 FP” onpage 104 contains the pinouts for the termination panel connectors.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 18E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 17 (continued)E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Table 19Faceplate connector pinouts for a four-port E1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 Port x, transmit + 7 Port x, receive +

15 Port x, transmit - 14 Port x, receive -

1 Port y, transmit + 2 Port y, receive +

9 Port y, transmit - 10 Port y, receive -

Table 20Termination panel connector pinouts for a four-port E1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 8Eight-port DS1 function processor

See the following sections for information about configuring and testing aneight-port DS1 function processor (FP):

• “Eight-port DS1 FP configuration parameters” on page 105

• “Eight-port DS1 FP diagnostic tests” on page 106

• “Provisionable eight-port DS1 FP components and attributes” onpage 108

• “Eight-port DS1 FP OSI states” on page 109

• “Eight-port DS1 FP pinouts for physical loopbacks” on page 110

Eight-port DS1 FP configuration parametersWhen configuring an eight-port DS1 FP, use the following values to help youset component attributes:

• Card type <cardtype>: 8pDS1

• Ports <port>: DS1

• Port numbers <m>: 0–7

• Number of channels <p> : 1–7. You can add up to four channels on ports1 and 5 with the other six ports disabled. When you add a port, the systemautomatically adds the component chan/0 below the DS1 component. Onthe IMA FP, the system also adds a chan/0 cell component beneath theDS1 component.

• Timeslots <timeslots>: 1–24. You can assign a set of timeslots to achannel. For example, you can set< timeslots> to “4 6 8 10 14 22.”

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• Clocking source: If you install a DS1 trunk between two Passport nodes,you must set the clockingSource attributes to one of the followingcombinations: local at one end and line at the other, module at one endand line at the other, or module at both ends.

Eight-port DS1 FP diagnostic testsThe eight-port DS1 FP supports the following tests and loopbacks. The figure“Data paths for eight-port DS1 FP port tests and loopbacks” on page 107shows the data path for each test and loopback.

• “Card loopback test” on page 42

• “Manual tests” on page 43. Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not reamplified, the round-trip loop length for DS1cannot exceed 223 m (655 ft).

— “Manual test using a physical loopback” on page 43. See “Eight-port DS1 FP pinouts for physical loopbacks” on page 110.

— “Manual test using an external loopback” (page 44). Externalloopback is established at the line interface circuitry.

• “Remote loopback test” (page 46).

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Figure 11Data paths for eight-port DS1 FP port tests and loopbacks

PPT 0040 001 AB

Function processor

Externalloopback

Linkcontroller

LineinterfaceCSU

Cardtest

Remoteloopbacktest

Manualloopbacktest in conjunctionwith physical loopback

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Provisionable eight-port DS1 FP components andattributes

This figure shows provisionable DS1 FP components and attributes.

Figure 12Provisionable DS1 FP components and attributes

PPT 2920 013 AA

Root

Lp

DS1

Channel (Chan)

Provisioned (Prov) lineType zeroCoding clockingSource raiAlarm lineLengthCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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Eight-port DS1 FP OSI statesThese tables contain information about DS1 FP OSI states.

Table 21DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 22DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Eight-port DS1 FP pinouts for physical loopbacksThe faceplate of an eight-port DS1 FP has four connectors. Each connectorsupports two ports. In the table “Faceplate connector pinouts for an eight-portDS1 FP” on page 111, port x refers to the first port, and port y refers to thesecond port on the same connector. The pinout configurations are identical forall connectors and ports on the faceplate. The transmit and receive pins mustmatch up by polarity.

The table “Termination panel connector pinouts for an eight-port DS1 FP” onpage 111, contains the pinouts for the termination panel connectors.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 23DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 22 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Table 24Faceplate connector pinouts for an eight-port DS1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 Port x, transmit + 7 Port x, receive +

15 Port x, transmit - 14 Port x, receive -

1 Port y, transmit + 2 Port y, receive +

9 Port y, transmit - 10 Port y, receive -

Table 25Termination panel connector pinouts for an eight-port DS1 FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 9DS1C function processor

See the following sections for information about configuring and testing aDS1C function processor (FP):

• “DS1C FP configuration parameters” on page 113

• “DS1C FP diagnostic tests” on page 114

• “Provisionable DS1C components and attributes” on page 118

• “DS1C OSI states” on page 119

• “DS1C FP pinouts for physical loopbacks” on page 121

DS1C FP configuration parametersWhen configuring a DS1C FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: DS1C

• Ports <port>: DS1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 1—23. The system automatically addsChannel 0.

• Timeslots <timeslots>: 1—24. You can assign a set of timeslots to achannel. For example, you can set< timeslots> to “4 6 8 10 14 22.”

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If you are setting up a DS1C line between two Passport nodes that are co-located, you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends.

DS1C FP diagnostic testsThe DS1C FP supports the following port tests and loopbacks. The figure“Data paths for DS1C FP port tests and loopbacks” on page 115 shows thedata path for each port test and loopback.

• “Card loopback test” (page 42). You can only test one channelcomponent at a time.

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the line Length attribute is properly set. If the loopedsignal is not re amplified, the round-trip loop length for DS1 cannotexceed 223 m (655 ft.).

— “Manual test using a physical loopback” (page 43). See “DS1C FPpinouts for physical loopbacks” on page 121.

— “Manual test using an external loopback” (page 44). Externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

• “V.54 remote loopback test” (page 47). The DS1C FP supports V.54remote loopback for 64 kbps and 56 kbps timeslot data rates, dependingon the network configuration. Before you run a test, make sure the FP isprovisioned to support the timeslot data rate expected by the far-endcircuit termination equipment. See “DS1C FP in a fractional T1 networkconfiguration” on page 115 for more information about supportedconfigurations.

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Figure 13Data paths for DS1C FP port tests and loopbacks

DS1C FP in a fractional T1 network configurationThe table "Summary of V.54 supported and unsupported items" on page 116describes how a DS1C FP supports the V.54 remote loopback test.The figures“DS1C to a fractional T1 network configuration” on page 117 and "DS1C toa DDS network configuration" on page 118 show network configurationssupported by the DS1C FP. The DS1C FP does not respond to loop up andloop down requests from the far end.

PPT 2567 001 AA

Function processor

External and payloadloopbacks

Linkcontroller

LineinterfaceCSU

Cardtest

V.54 remoteloopbacktest (channelonly)

Manualloopbacktest in conjunctionwith physical loopback

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Table 26Summary of V.54 supported and unsupported items

Networkconfiguration

Supported Unsupported

DS1C to a FractionalT1 network

(see “DS1C to afractional T1 networkconfiguration” onpage 117)

One nx64 kbps (n = 1 to 24) Chancomponent with B8ZS line codingand ESF framing format running oneV.54 test on each port

One nx64 kbps (n = 1 to 24) Chancomponent with AMI line codingand ESF or D4 framing format

One nx56 kbps (N = 1 to 24) Chancomponent with B8ZS/AMI linecoding and ESF/D4 framing formatrunning one V.54 test on each port

V.54 loopback test can be initiatedfrom one Chan component on eachDS1C port without affecting traffic onother channels off the same port

DS1C to a DDSnetwork

(see “DS1C to a DDSnetworkconfiguration” onpage 118)

DDS customer primary channel datarate of 64 kbps (clear channel), 72.0kbps OCU/loop data rate, aDS1configuration of B8ZS linecoding, and ESF framing format

DS1C does not respond to ortransport DDS network controlcodes

DS1C to a DDSnetwork

(see “DS1C to a DDSnetworkconfiguration” onpage 118)

DDS customer primary channel datarate of 56 kbps, 56 kbps OCU/loopdata rate, a DS1 configuration ofB8ZS line coding and ESF framingformat

DDS secondary channel signallingeither standard or proprietary

Supports only 56 kbps and 64 kbpscustomer primary channel data rate

Applicable to a DS1Cto a Fractional T1network and DS1C toa DDS network

DS1C sends V.54 loop-up and loop-down patterns to remote DSI as partof one V.54 test cycle

DS1C does not respond to V.54loop-up and loop-down patternsthat are generated externally

(Sheet 1 of 2)

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Figure 14DS1C to a fractional T1 network configuration

Maximum one V.54 test per DS1Cport at a time

DS1C ignores V.54acknowledgement signalling

Maximum four simultaneous V.54tests on each DS1C card so there isone V.54 test running on each port

Table 26 (continued)Summary of V.54 supported and unsupported items

Networkconfiguration

Supported Unsupported

(Sheet 2 of 2)

PPT 1097 001 AA

Passport node

DS1 level connectionDS0 level connectionV35 connection

DS1C

DSU/CSU

DSU/CSU

DSU/CSU

DTE

DTE

DTE

•••

FractionalT1 network

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Figure 15DS1C to a DDS network configuration

Provisionable DS1C components and attributesThis figure shows provisionable DS1C FP components and attributes.

PPT 1098 001 AB

DDS DSU

DDS DSU

DDS DSU

DTE

DTE

DTE

DDSnetwork

DS1C

Passport node

DS1 level connectionDS0 level connectionV35 connection

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Figure 16Provisionable DS1C FP components and attributes

DS1C OSI statesThese tables contain information about DS1C FP OSI states.

PPT 2920 013 AA

Root

Lp

DS1

Channel (Chan)

Provisioned (Prov) lineType zeroCoding clockingSource raiAlarm lineLengthCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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Table 27DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 28DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

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DS1C FP pinouts for physical loopbacksThe faceplate of a DS1C FP has two connectors. Each connector supports twoports. In the table, “Faceplate connector pinouts for a DS1C FP” on page 122port x refers to the first port, and port y refers to the second port on the sameconnector. The pinout configurations are identical for all connectors and portson the faceplate. The transmit and receive pins must match up by polarity.

The table “Termination panel connector pinouts for a DS1C FP” on page 122contains the pinouts for the termination panel connectors.

Table 29DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Table 30Faceplate connector pinouts for a DS1C FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 Port x, transmit + 7 Port x, receive +

15 Port x, transmit - 14 Port x, receive -

1 Port y, transmit + 2 Port y, receive +

9 Port y, transmit - 10 Port y, receive -

Table 31Termination panel connector pinouts for a DS1C FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 10E1C function processor

See the following sections for information about configuring and testing anE1C function processor (FP):

• “E1C FP configuration parameters” on page 123

• “E1C FP diagnostic tests” on page 124

• “Provisionable E1C FP components and attributes” on page 126

• “E1C FP OSI states” on page 127

• “E1C FP pinouts for physical loopbacks” on page 129

E1C FP configuration parametersWhen configuring an E1C FP, use the following values to set componentattributes:

• Card type <cardtype>: E1C

• Ports <port>: E1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 1–31. The system automatically adds channel0.

• Timeslots <timeslots>: 1–31. You can assign a set of timeslots to achannel. For example, you can set <timeslots> to “4 6 8 10 14 22.” If youset the E1 lineType attribute to CAS (channel associated signalling), youcannot use timeslot 16.

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• Clocking source: If you install an E1C trunk between two Passportnodes, you must set the clockingSource attributes to one of the followingcombinations: local at one end and line at the other, module at one endand line at the other, or module at both ends.

E1C FP diagnostic testsThe E1C FP supports the following port tests and loopbacks. The figure “Datapaths for E1C FP port tests and loopbacks” on page 125 shows the data pathfor each test and loopback.

• “Card loopback test” on page 42. You can only test one channel at a time.

• “Manual tests” on page 43

— “Manual test using a physical loopback” (page 43). See “E1C FPpinouts for physical loopbacks” on page 129.

— “Manual test using an external loopback” (page 44). Externalloopback is established at the line interface circuitry.

Note:The external loopback must be established before the manualloopback is started. Incoming frames to the port may not beacknowledged if the external loopback is applied after the manualloopback has begun.

• “V.54 remote loopback test” on page 47. See “V.54 and PN127 remoteloopback tests” on page 125.

• “PN127 remote loopback test” on page 49. See “V.54 and PN127 remoteloopback tests” on page 125.

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Figure 17Data paths for E1C FP port tests and loopbacks

V.54 and PN127 remote loopback testsThe E1C FP supports the V.54 and PN127 remote loopback tests for nx64kbps timeslot data rates using CCS framing. These test do not support datarates lower than 64kbps. You can run up to four V.54 or PN127 remoteloopback tests (one test on each port) simultaneously.

Before you run the test, make sure the FP is provisioned to support thetimeslot data rate expected by the far-end circuit termination equipment. Thefigure “V.54 and PN127 E1C test configuration” on page 126 shows anexample of a supported test configuration.

PPT 2572 001 AA

Function processor

Externalloopback

Linkcontroller

Lineinterface

Cardtest

V.54 and PNI27remote loopbacktests (channelonly)

Manualloopbacktest in conjunctionwith physical loopback

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Figure 18V.54 and PN127 E1C test configuration

Provisionable E1C FP components and attributesThis figure shows provisionable E1C FP components and attributes.

PPT 1097 002 AA

Passport node

E1 level connection

V35 connection

E1C

NTU DTE

DTE

DTE

•••

FractionalE1 network

NTU

NTU

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Figure 19Provisionable E1C FP components and attributes

E1C FP OSI statesThese tables contain information about E1C FP OSI states.

PPT 2920 012 AA

Root

Lp

E1

Channel (Chan)

Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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Table 32E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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E1C FP pinouts for physical loopbacksThe faceplate of an E1C FP has two connectors. Each connector supports twoports. In the table “Faceplate connector pinouts for an E1C FP” on page 130,port x refers to the first port, and port y refers to the second port on the sameconnector. The pinout configurations are identical for all connectors andports. The transmit and receive pins must match up by polarity.

Table 33E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 34E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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The table “Termination panel connector pinouts for an E1C FP” on page 130contains pinouts for the termination panel connectors.

Table 35Faceplate connector pinouts for an E1C FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 Port x, transmit + 7 Port x, receive +

15 Port x, transmit - 14 Port x, receive -

1 Port y, transmit + 2 Port y, receive +

9 Port y, transmit - 10 Port y, receive -

Table 36Termination panel connector pinouts for an E1C FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 11DS3 function processor

See the following sections for information about configuring and testing aDS3 function processor (FP):

• “DS3 FP configuration parameters” on page 131

• “DS3 FP diagnostic tests” on page 131

• “Provisionable DS3 FP components and attributes” on page 133

• “DS3 FP OSI states” on page 133

DS3 FP configuration parametersWhen configuring a DS3 FP, use the following values to set componentattributes;

• Card type <cardtype>: DS3

• Ports <port>: DS3

• Port numbers <m>: 0, 1, 2

DS3 FP diagnostic testsThe DS3 FP supports the following port tests and loopbacks. The figure “Datapaths for DS3 FP port tests and loopbacks” on page 132 shows the data pathfor each test and loopbacks.

• “Card loopback test” on page 42

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• “Manual tests” on page 43. Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is be properlyset. If the looped signal is not re amplified, the round-trip loop length forDS3 cannot exceed 153 m (450 ft.).

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

• “DS3 remote loopback test” on page 46. On the DS3 port, a lineloopback activate signal (carried over C-bits) is sent over the link to forcethe remote DS3 port to loop the signal. The loopback is held until the lineloopback deactivate signal is sent out of the link.

The DS3 remote loop test is supported only when using DS3 C-bit parityframing mode (the DS3 CbitParity attribute is set to ON). With theattribute setting, the DS3 component also responds to a remote testrequest.

Figure 20Data paths for DS3 FP port tests and loopbacks

PPT 0041 001 AB

Function processor

Externalloopback

Payloadloopback

Linkcontroller

Lineinterface

Far-endCSU or DSU

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

Remoteloopbacktest

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Provisionable DS3 FP components and attributesThis figure shows provisionable DS3 FP components and attributes.

Figure 21Provisionable DS3 FP components and attributes

DS3 FP OSI statesThese tables contain information about DS3 FP OSI states.

PPT 2920 011 AA

Root

Lp

Provisioned (Prov)

DS3

cbitParitylineLengthclockingSourceapplicationFramerName

CustomerIdentifierData (CidData)

AdminInfocustomerIdentifier

vendorcommentText

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Table 37DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

or the far end DS3 interface is requesting the local interface toloop back the incoming signal.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The DS3 component is in use. The DS3 component servicesonly one user (for example a Framer component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle A hardware test failed and the DS3 component is put in thelocked state.

A lock/lock operator command is in effect.

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Table 38DS3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, CHAN,DS3, or E3 component creates the Test component. The Testcomponent services only that particular component. A test stopseither when the prescribed timer expires or you issue a stop testcommand.

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Chapter 12E3 function processor

See the following sections for information about configuring and testing anE3 function processor (FP):

• “E3 configuration parameters” on page 137

• “E3 diagnostic tests” on page 137

• “Provisionable E3 components and attributes” on page 139

• “E3 OSI states” on page 140

E3 configuration parametersWhen configuring an E3 FP, use the following values to set componentattributes:

• Card type <cardtype>: E3

• Ports <port>: E3

• Port numbers <m>: 0, 1, 2

E3 diagnostic testsThe E3 FP supports the following port tests and loopbacks. The figure “Datapaths for E3 FP port tests and loopbacks” on page 138 shows the data path foreach test and loopback.

• “Card loopback test” on page 42

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• “Manual tests” on page 43. Make sure the loop lengths are within therequired range and thelineLengthprovisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for E3cannot exceed 300 m (880 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

Figure 22Data paths for E3 FP port tests and loopbacks

PPT 0041 002 AA

Function processor

Externalloopback

Payloadloopback

Linkcontroller

Lineinterface

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

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Provisionable E3 components and attributesThis figure shows provisionable E3 components and attributes.

Figure 23Provisionable E3 components and attributes

PPT 2920 010 AA

EM

Lp

Provisioned (Prov)

E3

lineLengthclockingSourceapplicationFramerNamelinkAlarmActivationThresholdlinkAlarmScanInterval

CustomerIdentifierData (CidData)

AdminInfocustomerIdentifier

vendorcommentText

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E3 OSI statesThese tables contain information about E3 OSI states.

Table 39E3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm,

or the far-end E3 interface requests the local interface to loopback the incoming signal.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The E3 component is in use. The E3 component services onlyone user (for example, a Framer component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle Some hardware test failed and the E3 component is in thelocked state by the operator.

A lock/lock operator command is in effect.

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Table 40E3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. The system will reject Start testrequests.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, CHAN,DS3, or E3 component creates a Test component. The Testcomponent services only that particular component. A test stopseither when the prescribed timer expires or you issue a stop testcommand

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Chapter 13DS3C function processor

See the following sections for information about configuring and testing aDS3C function processor (FP):

• “DS3C FP configuration parameters” on page 143

• “DS3C FP diagnostic tests” on page 144

• “Provisionable DS3C FP components and attributes” on page 145

• “DS3C FP OSI states” on page 146

DS3C FP configuration parametersWhen configuring a DS3C FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: 1pDS3C

• Ports <port>: DS3, DS1 (tributary ports beneath a DS3 port). When youadd a DS3 component, the system automatically creates DS1/1.

• Port numbers <m>: 0

• Tributary DS1 port numbers <q>: 1–28

• Number of channels <p>: 1. When you add a DS1 component, the systemautomatically adds a Channel 0 component that contains 24 provisionedtimeslots.

• Timeslots <timeslots>: 1–24. You can assign a set of timeslots to achannel. For example, you can set <timeslots> to “4 6 8 10 14 22.”

• Timeslot data rate for DS1 port <rate>: doNotOverride or 56K

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• Clocking source: You must set the clockingSource attributes for DS1components to one of the following combinations: local at one end andline at the other, or module at one end and line at the other. You cannotmix local and module DS1 clocking sources on a DS3C FP. The onlyvalid clocking source for the DS3 component is local.

DS3C FP diagnostic testsThe DS3C FP supports the following port tests and loopbacks. The figure“Data paths for DS3C FP port tests and loopbacks” on page 144 shows thedata path for some tests and loopbacks.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44)

• “Remote loopthistrib test” (page 47). The test is supported only on theDS1 component of a DS3C FP and only when using DS3 Cbit parityframing mode (the DS3 CbitParity attribute is set to on).

Figure 24Data paths for DS3C FP port tests and loopbacks

PPT 2573 001 AA

Function processor

Externalloopback

Linkcontroller

Lineinterface

Far-endCSU or DSU

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

Remoteloopthistribtest(DSI only)

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Provisionable DS3C FP components and attributesThis figure shows provisionable DS3C FP components and attributes.

Figure 25Provisionable DS3C FP components and attributes

PPT 2920 019 AA

RootLp

DS3

DS1

Channel (chan)

Provisioned (Prov) cbit mapping lineLength clockingSource applicationFramerName (null)CustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) lineType zeroCoding clockingSourceCustomerIndentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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DS3C FP OSI statesThese tables contain information about DS3C FP OSI states.

Table 41DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

or the far end DS3 interface is requesting the local interface toloop back the incoming signal.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The DS3 component is in use. The DS3 component servicesonly one user (for example a Framer component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle Some hardware test failed and the DS3 component is put in thelocked state.

A lock/lock operator command is in effect.

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Table 42DS3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, Chan, DS3,or E3 component creates the Test component. The Testcomponent services only that particular component. A test stopseither when the prescribed timer expires or you issue a stop testcommand.

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Chapter 14HSSI function processor

See the following sections for information about configuring and testing aHSSI function processor (FP):

• “HSSI FP configuration parameters” on page 149

• “HSSI FP diagnostic tests” on page 149

• “Provisionable HSSI FP components and attributes” on page 151

• “HSSI FP OSI states” on page 152

HSSI FP configuration parametersWhen configuring a HSSI FP, use the following values to set componentattributes:

• Card type <cardtype>: HSSI

• Ports <port>: HSSI

• Port numbers <m>: 0

HSSI FP diagnostic testsThe HSSI FP supports the following port tests and loopbacks. The figure“Data paths for HSSI FP port tests and loopbacks” on page 150 shows thedata paths for each test and loopback.

• “Card loopback test” (page 42)

• “Local loopback test” (page 43). This test is also called the HSSI LAloopback-type or the HSSI Local Digital Loopback (loop A). See “HSSIlocal loopback test” on page 150.

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• “Manual tests” (page 43). For a manual test on HSSI components, aphysical loopback through hardware manipulation is not possible. If youstart a manual test, you must set up an external loopback on the far-endnode.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the link controller.

Figure 26Data paths for HSSI FP port tests and loopbacks

HSSI local loopback testYou can use the HSSI local loopback test (also called HSSI local digitalloopback or loop A) to test the link between a DTE and a DCE. Start the teston the DTE side of the connection. The system handles the loopback set upand test in this way:

• On the DTE side, the HSSI local loop test asserts the LA and LBloopback control leads. The test then sends out a test pattern to the otherend DCE for a preset time after a dataStartDelay period. The HSSI DTEmust be unlocked.

PPT 0042 003 AA

Function processor

Externalloopback

Linkcontroller

Lineinterface

CSU ormodem

Cardtest

Manualloopbacktest in conjunctionwith physical loopback

Remoteloopbacktest

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• On the DCE side, the FP detects the ON state of the LA and LB loopbackcontrol leads. The FP issues an alarm to warn the operator that it hasreceived the loopback request and suspended the service on the portwhile the test is in progress. The OSI state at the DCE changes to reflectthis condition.

• The DCE implements the loopback at the link controller and the entireport is looped back. The DCE then asserts the TM signal toward the DTE.

• When the test is completed, the DTE turns off the LA and LB loopbackcontrol leads.

• On the DCE side, the FP detects the OFF state of the LA and LBloopback control leads and takes down the loopback.

• The DCE clears the alarm to let the operator know that service willresume at this port, and sets the OSI state back to the previous state. TheDCE then turns off the TM signal.

Provisionable HSSI FP components and attributesThis figure shows provisionable HSSI FP components and attributes.

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Figure 27Provisionable HSSI FP components and attributes

HSSI FP OSI statesThese tables contain information about HSSI FP OSI states.

PPT 2920 020 AA

Root

Lp

Provisioned (Prov)

HSSI

linkModereadyLineStatedataTransferLineStatelineSpeedapplicationFramerName

CustomerIdentifierData (CidData)

AdminInfocustomerIdentifier

vendorcommentText

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Table 43HSSI component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The HSSI port is inoperable due to at least one of the followingalarms:

• alarms related to actualLinkMode

• incorrect link cable

• input modem signal does not meet expected.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input has been recognized asgood. Clocks are available.

Unlocked, Enabled, Busy The HSSI component is in use. The HSSI component servicesonly one user (a Framer component) at a time.

Locked, Enabled, Idle A lock operator command is in effect and the HSSI componentis operating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• A hardware test failed. (availabilityStatus: failed)

If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 44HSSI Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. The system will reject Start testrequests.

Unlocked, Enabled, Busy The Test component is in use. A HSSI component creates aTest component. The Test component services only thatparticular component. A test stops either when the prescribedtimer expires or you issue a stop test command.

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Chapter 15Three-port DS1 ATM function processor

See the following sections for information about configuring and testing athree-port DS1 ATM function processor (FP):

• “Three-port DS1 ATM FP configuration parameters” on page 155

• “Three-port DS1 ATM FP diagnostic tests” on page 156

• “Provisionable three-port DS1 ATM FP components and attributes” onpage 157

• “Three-port DS1 ATM FP OSI states” on page 158

Three-port DS1 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring a three-port DS1 ATM FP, usethe following values to help you set component attributes.

• Card type <cardtype>: 3pDS1Atm

• Ports <port>: DS1

• Port numbers <m>: 0, 1, 2

• Number of channels <p>: 1–3. When you add a DS1 port, the systemautomatically creates subcomponents chan/0, chan/0 cell, and Test.

• Timeslots <timeslots>: 1–24. You must use the full number of timeslots.

• DS1 ATM function processors support only ESF linetype.

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• Clocking source: All of the ports on a DS1 ATM FP must have the sameclock source. See description of clocking and synchronization in241-5701-200Passport 7400, 8700 Hardware Description.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

Three-port DS1 ATM FP diagnostic testsYou can perform the following diagnostic tests on the three-port DS1 ATMFP. The test configurations are illustrated in the figure “Data paths for DS1ATM FP port tests and loopbacks” on page 157.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS1cannot exceed 223 m (655 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). This testoperates with the clockingSource attribute set to module or local.

• “DS1 remote loopback test” (page 46). On the DS1 port, a repeated bitpattern (00001) is sent out of the link to request the far-end CSU to setup a remote loopback. Then the specified test pattern is transmitted to theremote CSU as test data. At the end of the test, the Test componentautomatically takes down the remote loop by sending another repeatedbit pattern (001).

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Figure 28Data paths for DS1 ATM FP port tests and loopbacks

Provisionable three-port DS1 ATM FP components andattributes

This figure shows provisionable three-port DS1 ATM FP components andattributes.

PPT 0774 001 AB

Externalloop

Payloadloop

Manualloop

Remoteloop

Far-end

A

Cardloop

DS1ATx/Rx

DS1Framer

B CATMCellMux/

Demux

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Figure 29Provisionable three-port DS1 ATM FP components and attributes

Three-port DS1 ATM FP OSI statesThese tables contain information about DS1 ATM FP OSI states.

PPT 2920 021 AA

Root

Lp

DS1

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineTypezeroCodingclockingSourceraiAlarmTypelineLength

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)

Channel (Chan)

vendorcommentText

scrambleCellPayloadalarmActDelay

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Table 45DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 interface is inoperable due at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

or the far-end DS1 interface has requested the local end to loopback the incoming signal.

Unlocked, Enabled, Idle The DS1 component is not in use. The line input is recognizedas good. Clocks are available.

Unlocked, Enabled, Busy The DS1 component is in use. The DS1 component has aChannel subcomponent.

ShuttingDown, Enabled, Busy A lock command is in effect against the DS1 component, but theChannel subcomponent is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect and the DS1 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors will cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 46DS1 ATM Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Chan component is inoperable because of DS1, E1 orlcdAlarm alarms. The associated port component is locked.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Unlocked, Enabled, Idle The Chan component is not in use. The component is waiting forbinding to an AtmIf component.

ShuttingDown, Enabled, Busy A lock operator command is in effect. The system is waiting fora bound application to suspend.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 47DS1 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, or E1 componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Chapter 16Three-port E1 ATM function processor

See the following sections for information about configuring and testing anE1 ATM function processor (FP):

• “Three-port E1 ATM FP configuration parameters” on page 161

• “Three-port E1 ATM FP diagnostic tests” on page 162

• “Provisionable three-port E1 ATM FP components and attributes” onpage 163

• “Three-port E1 ATM FP OSI states” on page 164

Three-port E1 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an E1 ATM FP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 3pE1Atm

• Ports <port>: E1

• Port numbers <m>: 0, 1, 2

• Number of channels <p>: 1–3. When you add an E1 port, the systemautomatically creates the subcomponents chan/0, chan/0 cell, and Test.

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• Timeslots <timeslots>: 1–15 for E1A CAS linetype; 17–31 for E1A CCSlinetype. You must use all timeslots.

The attribute lineType defines the framing mode used on E1 ports. Validvalues are:

— CAS (channel associated signalling) indicates that timeslot 16within the E1 frame is reserved for multi frame signalling, and that30 timeslots are available for data.

— CCS (common channel signalling) indicates that timeslots 1 to 15and 17 to 31 are all available for data.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

Three-port E1 ATM FP diagnostic testsThe three-port E1 ATM FP supports the following port tests and loopbacks.The figure “Data paths for three-port E1 ATM FP port tests and loopbacks”on page 163 shows the data path for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” on page 44. The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). This testoperates with the clockingSource attribute set to module or local.During the test, the DS3 frames (physical level) stop and the payloaddata loops over the link controller device.

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Figure 30Data paths for three-port E1 ATM FP port tests and loopbacks

Provisionable three-port E1 ATM FP components andattributes

This figure shows provisionable three-port E1 ATM FP components andattributes.

PPT 0774 002 AA

Externalloop

Payloadloop

Manualloop

A

Cardloop

E1ATx/Rx

E1Framer

B CATMCellMux/

Demux

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Figure 31Provisionable three-port E1 ATM FP components and attributes

Three-port E1 ATM FP OSI statesThese tables contain information about E1 ATM FP OSI states.

PPT 2920 022 AA

Root

Lp

E1

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineTypeclockingSourcecrc4ModesendRaiOnAis

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)

Channel (Chan)

vendorcommentText

scrambleCellPayloadalarmActDelay

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Table 48E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 interface is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

Unlocked, Enabled, Idle The E1 component is not in use. The line input is as good.Clocks are available.

Unlocked, Enabled, Busy The E1 component is in use. The E1 component has a Channelsubcomponent.

ShuttingDown, Enabled, Busy A lock command is in effect against the E1 component, but theChannel subcomponent is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect and the E1 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors will cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 49E1 ATM Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Chan component is inoperable because of DS1, E1 orlcdAlarm alarms. The associated port component is locked.

Unlocked, Enabled, Idle Not in use. Provisioning or binding processes are possiblecauses.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Unlocked, Enabled, Idle The Chan component is not in use. The Chan component iswaiting for binding to an ATmIf component.

ShuttingDown, Enabled, Busy A lock operator command is in effect. The system is waiting fora bound application to suspend.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 50E1 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, or E1 componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Chapter 17Eight-port DS1 ATM function processor

See the following sections for information about configuring and testing aneight-port DS1 ATM function processor (FP):

• “Eight-port DS1 ATM FP configuration parameters” on page 167

• “Eight-port DS1 ATM FP diagnostic tests” on page 168

• “Provisionable eight-port DS1 ATM FP components and attributes” onpage 169

• “Eight-port DS1 ATM FP OSI states” on page 170

Eight-port DS1 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an eight-port DS1 ATM FP, usethe following values to set component attributes.

• Card type <cardtype>: 8pDS1Atm

• Ports <port>: DS1

• Port numbers <m>: 0–7. If traffic shaping (per-VC queueing) is enabled,you can only use port instances 0 to 3 for independent ATM links. ForIMA link groups, you can use any port.

• Number of channels <p>: 1. When you add a DS1 port, the systemautomatically creates the subcomponents chan/0, chan/0 cell. Only onechannel can be activated under one DS1 component. Chan/0 must bedeleted before adding another Chan/<1-23>.

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• Timeslots <timeslots>: 1–24. You must use all timeslots.

DS1 ATM function processors support only ESF linetype.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

Eight-port DS1 ATM FP diagnostic testsEight-port DS1 ATM FPs support card, manual and remote loopback testsonly if the port has a provisioned link to an AtmIf component. Ports linkeddirectly to AtmIf components are independent links, as opposed to ports thatare part of an IMA link group. For information about the difference betweenIMA links and independent links, see 241-5701-730Passport 7400, 8700,15000 Inverse Multiplexing for ATM Guide.

The eight-port DS1 ATM FP supports the following port tests and loopbacks.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS1cannot exceed 223 m (655 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). This testoperates with the clockingSource attribute set to module or local.

• “Remote loopback test” (page 46).

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Provisionable eight-port DS1 ATM FP components andattributes

This figure shows provisionable eight-port DS1 ATM FP components andattributes.

Figure 32Provisionable eight-port DS1 ATM FP components and attributes

PPT 2920 024 AA

Root

Lp

DS1

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineTypeclockingSourcecrc4ModesendRaiOnAis

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)

Channel (Chan)

vendorcommentText

scrambleCellPayloadalarmActDelay

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Eight-port DS1 ATM FP OSI statesThese tables contain information about eight-port DS1 ATM FP OSI states.

Table 51DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

or the far-end DS1 interface has requested the local end to loopback the incoming signal.

Unlocked, Enabled, Idle The DS1 component is not in use. The line input is recognizedas good. Clocks are available.

Unlocked, Enabled, Busy The DS1 component is in use. The DS1 component has aChannel subcomponent.

ShuttingDown, Enabled, Busy A lock command is in effect against the DS1 component, but theChannel subcomponent is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect and the DS1 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 52DS1 ATM Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Chan component is inoperable because of DS1 or lcdAlarmalarms. The associated port component is locked.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Unlocked, Enabled, Idle The Chan component is not in use. The Chan component iswaiting for binding to an AtmIf component.

ShuttingDown, Enabled, Busy A lock operator command is in effect. The system is waiting fora bound application to suspend.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 53DS1 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A Chan or DS1 componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Chapter 18Eight-port E1 ATM function processor

See the following sections for information about configuring and testing aneight-port E1 ATM function processor (FP):

• “Eight-port E1 ATM FP configuration parameters” on page 173

• “Eight-port E1 ATM FP diagnostic tests” on page 174

• “Provisionable eight-port E1 ATM FP components and attributes” onpage 175

• “Eight-port E1 ATM FP OSI states” on page 176

Eight-port E1 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an eight-port E1 ATM FP, usethe following values to set component attributes:

• Card type <cardtype>: 8pE1Atm

• Ports <port>: E1

• Port numbers <m>: 0–7. If traffic shaping (per-VC queueing) is enabled,you can only use ports 0 —3 for independent ATM links. For IMA linkgroups, you can use any port.

• Number of channels <p>: 1. When you add a port, the systemautomatically adds the subcomponents chan/0 and chan/0 cell. Only onechannel can be activated under one DS1 component. Chan/0 can bedeleted to add another Chan/<1-23>.

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• Timeslots <timeslots>: 1–15 and 17–31. You must use all timeslots.

The attribute lineType defines the framing mode used on E1 ports. CCS(common channel signalling) is the only valid value. It indicates thattimeslots 1–15 and 17–31 are all available for data.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

Eight-port E1 ATM FP diagnostic testsEight-port E1 ATM FPs support card, manual and remote loop tests only ifthe port has a provisioned link to an AtmIf component. Ports linked directlyto AtmIf components are independent links, as opposed to ports that are partof an IMA link group. For information about the difference between IMAlinks and independent links, see 241-5701-730Passport 7400, 8700, 15000Inverse Multiplexing for ATM Guide.

The eight-port E1 ATM FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re-amplified, the round-trip loop length forDS1 cannot exceed 223 m (655 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). This testoperates with the clockingSource attribute set to module or local.

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Provisionable eight-port E1 ATM FP components andattributes

This figure shows provisionable eight-port E1 ATM FP components andattributes.

Figure 33Provisionable eight-port E1 ATM FP components and attributes

PPT 2920 022 AA

Root

Lp

E1

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineTypeclockingSourcecrc4ModesendRaiOnAis

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)

Channel (Chan)

vendorcommentText

scrambleCellPayloadalarmActDelay

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Eight-port E1 ATM FP OSI statesThese tables contain information about E1 ATM FP OSI states.

Table 54E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 interface is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm.

Unlocked, Enabled, Idle The E1 component is not in use. The line input is recognized asgood. Clocks are available.

Unlocked, Enabled, Busy The E1 component is in use. The E1 component has a Channelsubcomponent.

ShuttingDown, Enabled, Busy A lock command is in effect against the E1 component, but theChannel subcomponent is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect and the E1 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 55E1 ATM Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Chan component is inoperable due to E1 alarms or anlcdAlarm The associated port component is locked.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Unlocked, Enabled, Idle The Chan component is not in use. The Chan component iswaiting for binding to an AtmIf component.

ShuttingDown, Enabled, Busy A lock operator command is in effect. The system is waiting fora bound application to suspend.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 56E1 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A Chan or E1 component createsa Test component. The Test component services only thatparticular component. A test stops either when the prescribedtimer expires or you issue a stop test command.

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Chapter 19JT2 ATM function processor

See the following sections for information about configuring and testing a JT2ATM function processor (FP):

• “JT2 ATM FP configuration parameters” on page 179

• “JT2 ATM FP diagnostic tests” on page 180

• “Provisionable JT2 ATM FP components and attributes” on page 181

• “JT2 ATM FP OSI states” on page 182

JT2 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring a JT2 ATM FP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 2pJ6mAtm

• Ports <port>: JT2. When you add a port, the system automatically createsan ATMCell subcomponent.

• Port numbers <m>: 0, 1

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

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JT2 ATM FP diagnostic testsThe JT2 ATM FP supports the following port tests and loopbacks. The figure“Data paths for JT2 ATM FP port tests and loopbacks” on page 180 shows thedata paths for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using an external loopback” (page 44)

— “Manual test using a payload loopback” (page 45)

Figure 34Data paths for JT2 ATM FP port tests and loopbacks

SUNI-PDH

PayloadLoop

ExternalLoop

CardLoop

ManualLoop

JT2Framer

A

JT2LineI/F

ATMCellMux/

Demux

PPT 0775 001 AA

C D

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Provisionable JT2 ATM FP components and attributesThis figure shows provisionable JT2 ATM FP components and attributes.

Figure 35Provisionable JT2 ATM FP components and attributes

PPT 2920 025 AA

Root

Lp

JT2

Provisioned (Prov)

AtmCell

Provisioned (Prov)

clockingSourcelineLengthapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

alarmActDelayscrambleCellPayload

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JT2 ATM FP OSI statesThese tables contain information about JT2 ATM FP OSI states.

Table 57JT2 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The JT2 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisPhysicalAlarm

• rxAisPayloadAlarm

• rxRaiAlarm

• lcdAlarm.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The JT2 component is in use. The JT2 component services onlyone user (an ATM interface component) at a time.

ShuttingDown, Enabled, Busy A lock command is in effect against the JT2 component. The JT2component is waiting for the ATM interface component to go intoa disabled mode before it completes the lock sequence andshuts down.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect. The JT2 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect. The component is in oneof the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

Table 58JT2 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A JT2 component creates a Testcomponent. The Test component services only that particularcomponent. A teststops either when the prescribed timer expiresor you issue a stop test command.

Table 57 (continued)JT2 component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 20DS3 ATM function processor

See the following sections for information about configuring and testing aDS3 ATM function processor (FP):

• “DS3 ATM FP configuration parameters” on page 185

• “DS3 ATM FP diagnostic tests” on page 186

• “Provisionable DS3 ATM FP components and attributes” on page 188

• “DS3 ATM FP OSI states” on page 189

DS3 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring a DS3 ATM FP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 3pDS3Atm

• Ports <port>: DS3

• Port numbers <m>: 0, 1, 2. When you add a port, the systemautomatically creates an ATMCell subcomponent. The system alsoautomatically provisions C-Bit Parity mode.

If you do not want to use C-Bit Parity mode, use the command

set lp/<n> DS3/<m> cBitParity off

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Cells are directly mapped into the DS3 payloads by default for the three-portATM-based DS3 FPs. You can use plcp cell mapping instead of the defaultdirect mapping for a port on a DS3. Use the command

set lp/<n> DS3/<m> mapping plcp

The mapping affects the reference source used when line clocking source isselected. For direct mapping, the received DS3 bitstream at 44.736 MHz or34.368 MHz determines the clock. For plcp mapping, the received PLCPframing at 8 kHz determines the clock.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

DS3 ATM FP diagnostic testsThe DS3 ATM FP supports the following port tests and loopbacks. The figure“Data paths for DS3 ATM port tests and loopbacks” on page 187 shows thedata paths for each port test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS3cannot exceed 137m (450 ft.).

— “Manual test using an external loopback” on page 44. The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). During the test,the DS3 frames (physical level) stops and the payload data loopsover the link controller device.

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• “DS3 remote loopback test” on page 46. On the DS3 port, a lineloopback activate signal (carried over C-bits) travels over the link to forcethe remote DS3 port to loop the signal. The loopback stays there until theline loopback deactivate signal is sent out of the link.

The DS3 remote loop test is supported only when using DS3 C-bit parityframing mode (the DS3 CbitParity attribute is set to on). With theattribute setting, the DS3 component also responds to a remote testrequest.

Figure 36Data paths for DS3 ATM port tests and loopbacks

PPT 0773 001 AA

Externalloop

Payloadloop

Manualloop

Remoteloop

Far-end

A

Cardloop

DS3ATx/Rx

SUNI-PDH

B C ATMCellMux/

Demux

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Provisionable DS3 ATM FP components and attributesThis figure shows provisionable DS3 ATM FP components and attributes.

Figure 37Provisionable DS3 ATM FP components and attributes

PPT 2920 026 AA

Root

Lp

DS3

Provisioned (Prov)

AtmCell

Provisioned (Prov)

cbitParitymappinglineLengthclockingSourceapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

scrambleCellPayloadalarmActDelay

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DS3 ATM FP OSI statesThese tables contain information about DS3 ATM FP OSI states.

Table 59DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

• lcdAlarm

• rxIdle.

Or the far-end DS3 interface sends a request to the local end toloop back the incoming signal.

When the PLCP option is turned on, PLCP lofAlarm and PLCPrxRaiAlarm also disable the component.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The DS3 component is in use. The DS3 component servicesonly one user (an ATM interface component) at a time.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the DS3 component. TheDS3 component is waiting for the ATM interface component togo into a disabled mode before it completes the lock sequenceand shuts down.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect. The DS3 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect. The component is in oneof the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

Table 60DS3 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

Table 59 (continued)DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 21E3 ATM function processor

See the following sections for information about configuring and testing anE3 ATM function processor (FP):

• “E3 ATM FP configuration parameters” on page 191

• “E3 ATM FP diagnostic tests” on page 192

• “Provisionable E3 ATM FP components and attributes” on page 194

• “E3 ATM FP OSI states” on page 195

E3 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an E3 ATM FP, use thefollowing values to set component attributes:

• Card type <cardtype>: 3pE3Atm

• Ports <port>: E3

• Port numbers <m>: 0, 1, 2. When you add a port, the systemautomatically creates subcomponents ATMCell and G832.

The system directly maps cells into the E3 payloads by default.You can useplcp cell mapping instead of the default direct mapping for a port on a E3. Usethe command

set lp/<n> E3/<m> mapping plcp

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The mapping affects the reference source when you select the line clockingsource. For direct mapping, the received E3 bitstream at 44.736 MHz or34.368 MHz determines the clock. For plcp mapping, the received PLCPframing at 8 kHz determines the clock.

E3 ATM FPs use the framing format defined by ITU-T G.832 by default,although the older format defined by ITU-T G.751 is still available. If the portis an E3 port, and you want to use the older framing format defined in ITU-TG.751, use the command

set lp/<n> E3/<m> framing g751

After setting the framing format to G751, delete the G832 component(automatically generated when the VCC is created).

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

E3 ATM FP diagnostic testsThe E3 ATM FP supports the following port tests and loopbacks. The figure“Data paths for E3 ATM FP port tests and loopbacks” on page 193 shows thedata paths for each port test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for E3cannot exceed 300 m (880 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

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Figure 38Data paths for E3 ATM FP port tests and loopbacks

PPT 0773 002 AA

Externalloop

Payloadloop

Manualloop

A

Cardloop

E3ATx/Rx

SUNI-PDH

B C ATMCellMux/

Demux

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Provisionable E3 ATM FP components and attributesThis figure shows provisionable E3 ATM FP components and attributes.

Figure 39Provisionable E3 ATM FP components and attributes

PPT 2920 027 AA

Root

Lp

E3

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineLengthmappingframingclockingSourceapplicationFramerNamelinkAlarmActivationThresholdlinkAlarmScanInterval

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

scrambleCellPayloadalarmActDelay

G832

Provisioned (Prov)trailTraceTransmittedtrailTraceExpected

Note: G832 component is only applicable if framing attributeis set G832

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E3 ATM FP OSI statesThese tables contain information about E3 ATM FP OSI states.

Table 61E3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

• lcdAlarm

When the PLCP option is turned on, PLCP lofAlarm and PLCPrxRaiAlarm also disable the component.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The E3 component is in use. The E3 component services onlyone user (an ATM Interface component) at a time.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the E3 component. The E3component is waiting for the ATM interface component to go intoa disabled mode before it completes the lock sequence andshuts down.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect and the E3 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• A hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

Table 62E3 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

Table 61 (continued)E3 component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 22OC-3 ATM function processor

See the following sections for information about configuring and testing anOC-3 ATM function processor (FP):

• “OC-3 ATM FP configuration parameters” on page 197

• “OC-3 ATM FP diagnostic tests” on page 198

• “Provisionable OC-3 ATM FP components and attributes” on page 200

• “OC-3 ATM FP OSI states” on page 201

OC-3 ATM FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an OC-3 FP, use the followingvalues to help you set component attributes:

• Card type <cardtype>: 3pOC3MmAtm, 3pOC3SmAtm

• Ports <port>: SONET, SDH

• Port numbers <m>: 0, 1, 2. When you add an OC-3 port, the systemautomatically creates a Path subcomponent. The system also creates anATMCell component beneath the Path component.

You must set three types of attributes:

— Set the Sonet or Sdh provisionable attributes using the genericprocess.

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— Set the Sonet or Sdh Path component attributes using the command

set lp/<n> <port>/<m> path/0 <attribute><attributevalue>

— Set the Sonet or Sdh Path AtmCell component attributes using thecommand

set lp/<n> <port>/<m> path/0 cell <attribute><attributevalue>

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

OC-3 ATM FP diagnostic testsThe OC-3 ATM FP supports the following port test and loopbacks. The figure“Data paths for OC-3 ATM FP port tests and loopbacks” on page 199 displaysthe data path for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44)

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Figure 40Data paths for OC-3 ATM FP port tests and loopbacks

SUNI-LITE

CardLoop

ExternalLoop

ManualLoop

OpticalI/F

ATMCellMux/

Demux

PPT 0776 001 AA

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Provisionable OC-3 ATM FP components and attributesThis figure shows provisionable OC-3 ATM FP components and attributes.

Figure 41Provisionable OC-3 ATM FP components and attributes

PPT 2920 028 AA

Root

Lp

Sonet

Sdh

Provisioned (Prov)

Provisioned (Prov)

CustomerIdentifieData (CidData)

AdminInfo

Path

customerIdentifier

clockingSource

vendorcommentText

Provisioned (Prov)

CustomerIdentifieData (CidData)

AdminInfocustomerIdentifier

clockingSource

vendorcommentText

Provisioned (Prov)

CustomerIdentifieData (CidData)

AtmCellcustomerIdentifier

clockingSource

alarmActDelayscrambleCellPayload

Provisioned (Prov)

Path

Provisioned (Prov)

CustomerIdentifieData (CidData)

AtmCellcustomerIdentifier

applicationFramerName

alarmActDelayscrambleCellPayload

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OC-3 ATM FP OSI statesThese tables contain information about OC-3 ATM FP OSI states.

Table 63OC-3 Sonet/Sdh component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Sonet/Sdh interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRfiAlarm

• lcdAlarm.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The Sonet/Sdh component is in use. The Sonet/Sdh componenthas one Path component under it.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the Sonet/Sdh componentbut the Path component under it is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect. The Sonet/Sdh componentis operating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect. The component is in oneof the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 64OC-3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

Table 65OC-3 Path component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Path component is inoperable due to at least one of thefollowing alarms:

• lopAlarm

• rxAisAlarm

• rxRfiAlarm

• signalLabelMismatch

Either a bad path state or the Sonet/Sdh is disabled. If the Sonet/Sdh is disabled either Sonet/Sdh is locked or there is a badSonet/Sdh signal.

Unlocked, Enabled, Idle The component is not in use. The component is waiting for abinding to an ATM interface component.

Unlocked, Enabled, Busy The Path component is in use. The Path component servicesonly one user (an ATM interface component) at a time.

(Sheet 1 of 2)

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Unlocked, Enabled,Shutting Down

A lock command is in effect against the Path component. ThePath component is waiting for the ATM interface component togo into a disabled mode before it completes the lock sequenceand shuts down.

Locked, Disabled, Idle A lock operator command is in effect.

Table 65 (continued)OC-3 Path component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 23DS3 ATM IP function processor forPassport 7400

See the following sections for information about configuring and testing aDS3 second generation ATM function processor (FP):

• “DS3 ATM IP configuration parameters” on page 205

• “DS3 ATM IP diagnostic tests” on page 206

• “Provisionable DS3 ATM IP components and attributes” on page 208

• “DS3 ATM IP OSI states” on page 209

DS3 ATM IP configuration parametersFor all ATM IPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring a DS3 ATM IP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 3pDS3Atm2

• Ports <port>: DS3

• Port numbers <m>: 0, 1, 2. When you add a port, the systemautomatically creates an ATMCell subcomponent. The system alsoautomatically provisions C-Bit Parity mode.

If you do not want to use C-Bit Parity mode, use the command

set lp/<n> DS3/<m> cBitParity off

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Cells are directly mapped into the DS3 payloads by default for the three-portATM-based DS3 FPs. You can use plcp cell mapping instead of the defaultdirect mapping for a port on a DS3. Use the command

set lp/<n> DS3/<m> mapping plcp

The mapping affects the reference source used when line clocking source isselected. For direct mapping, the received DS3 bitstream at 44.736 MHz or34.368 MHz determines the clock. For plcp mapping, the received PLCPframing at 8 kHz determines the clock.

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

DS3 ATM IP diagnostic testsThe DS3 ATM IP supports the following port tests and loopbacks. The figure“Data paths for DS3 ATM IP port tests and loopbacks” on page 207 shows thedata paths for each port test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS3cannot exceed 274 m (900 ft.).

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45). During the test,the DS3 frames (physical level) stops and the payload data loopsover the link controller device.

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• “DS3 remote loopback test” (page 46). On the DS3 port, a line loopbackactivate signal (carried over C-bits) travels over the link to force theremote DS3 port to loop the signal. The loopback stays there until the lineloopback deactivate signal is sent out of the link.

The DS3 remote loop test is supported only when using DS3 C-bit parityframing mode (the DS3 CbitParity attribute is set to on). With theattribute setting, the DS3 component also responds to a remote testrequest.

Figure 42Data paths for DS3 ATM IP port tests and loopbacks

PPT 0773 001 AA

Externalloop

Payloadloop

Manualloop

Remoteloop

Far-end

A

Cardloop

DS3ATx/Rx

Framer/cell processor

B C ATMCellMux/

Demux

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Provisionable DS3 ATM IP components and attributesThis figure shows provisionable DS3 ATM IP components and attributes.

Figure 43Provisionable DS3 ATM IP components and attributes

PPT 2920 026 AA

Root

Lp

DS3

Provisioned (Prov)

AtmCell

Provisioned (Prov)

cbitParitymappinglineLengthclockingSourceapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

scrambleCellPayloadalarmActDelay

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DS3 ATM IP OSI statesThese tables contain information about DS3 ATM IP OSI states.

Table 66DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

• lcdAlarm

• rxIdle.

Or the far-end DS3 interface sends a request to the local end toloop back the incoming signal.

When the PLCP option is turned on, PLCP lofAlarm and PLCPrxRaiAlarm also disable the component.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The DS3 component is in use. The DS3 component servicesonly one user (an ATM interface component) at a time.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the DS3 component. TheDS3 component is waiting for the ATM interface component togo into a disabled mode before it completes the lock sequenceand shuts down.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect. The DS3 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect. The component is in oneof the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

Table 67DS3 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

Table 66 (continued)DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 24E3 ATM IP function processor forPassport 7400

See the following sections for information about configuring and testing anE3 ATM IP function processor (FP):

• “E3 ATM IP configuration parameters” on page 211

• “E3 ATM IP diagnostic tests” on page 212

• “Provisionable E3 ATM IP components and attributes” on page 214

• “E3 G.832 trail trace” on page 215

E3 ATM IP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an E3 ATM IP, use thefollowing values to set component attributes:

• Card type <cardtype>: 3pE3Atm2

• Ports <port>: E3

• Port numbers <m>: 0, 1, 2. When you add a port, the systemautomatically creates subcomponents ATMCell and G832.

The system directly maps cells into the E3 payloads by default.You can useplcp cell mapping instead of the default direct mapping for a port on a E3. Usethe command

set lp/<n> E3/<m> mapping plcp

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The mapping affects the reference source when you select the line clockingsource. For direct mapping, the received E3 bitstream at 44.736 MHz or34.368 MHz determines the clock. For plcp mapping, the received PLCPframing at 8 kHz determines the clock.

E3 ATM FPs use the framing format defined by ITU-T G.832 by default,although the older format defined by ITU-T G.751 is still available. If the portis an E3 port, and you want to use the older framing format defined in ITU-TG.751, use the command

set lp/<n> E3/<m> framing g751

After setting the framing format to G751, delete the G832 component(automatically generated when the VCC is created).

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. You can turn cell payload scrambling off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is a possibility of false cell header delineationerrors.

E3 ATM IP diagnostic testsThe E3 ATM IP supports the following port tests and loopbacks. The figure“Data paths for E3 ATM IP port tests and loopbacks” on page 213 shows thedata paths for each port test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for E3cannot exceed 300 m (880 ft.).

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

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Figure 44Data paths for E3 ATM IP port tests and loopbacks

Externalloop

Cardloop

Payloadloop

TE

Manualloop

Framer/Cell ProcessorRelay

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Provisionable E3 ATM IP components and attributesThis figure shows provisionable E3 ATM IP components and attributes.

Figure 45Provisionable E3 ATM IP components and attributes

PPT 2920 027 AA

Root

Lp

E3

Provisioned (Prov)

AtmCell

Provisioned (Prov)

lineLengthmappingframingclockingSourceapplicationFramerNamelinkAlarmActivationThresholdlinkAlarmScanInterval

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

scrambleCellPayloadalarmActDelay

G832

Provisioned (Prov)trailTraceTransmittedtrailTraceExpected

Note: G832 component is only applicable if framing attributeis set G832

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E3 G.832 trail traceOn E3 interfaces using G.832 framing, the trail trace feature can be used toverify the continued connection of the E3 port to intended far end port. If thereceived trail trace string differs from the provisionedtrailTraceTransmittedstring,a trail trace mismatch (TTM) is reported, resulting in the setting of aTTM alarm.

Unlike Passport, many E3 equipment vendors do not support the trail tracefeature of G.832 framing. Frequently, an obscure hard coded string is sentinstead of the trail trace string expected by Passport. The resulting mismatchcan cause TTM alarms to be set. To determine if received trail trace stringsare causing G.832 trail trace mismatch alarms, use the following command todisplay a received string:

> d lp/6 e3/0 g832 trailTraceReceived

When the received string is known, the cause of the alarm can be determinedto be either

• the result of an E3 misconnection, or

• the result of receiving an obscure, hard coded string. In this case, theG832strailTraceExpectedstring needs to be provisioned to match thevalue received.

E3 ATM IP OSI statesThese tables contain information about E3 ATM IP OSI states.

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Table 68E3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E3 interface is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

• lcdAlarm

When the PLCP option is turned on, PLCP lofAlarm and PLCPrxRaiAlarm also disable the component.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The E3 component is in use. The E3 component services onlyone user (an ATM Interface component) at a time.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the E3 component. The E3component is waiting for the ATM interface component to go intoa disabled mode before it completes the lock sequence andshuts down.

Locked, Enabled, Idle A lock operator command is in effect and the E3 component isoperating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect and the component is inone of the following conditions:

• Left offline. (availabilityStatus: offline)

• A hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 69E3 ATM Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

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Chapter 25OC-3 ATM IP function processor forPassport 7400

See the following sections for information about configuring and testing anOC-3 ATM IP function processor (FP):

• “OC-3 ATM IP configuration parameters” on page 219

• “OC-3 ATM IP diagnostic tests” on page 220

• “Provisionable OC-3 ATM IP components and attributes” on page 222

• “OC-3 ATM IP OSI states” on page 223

OC-3 ATM IP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an OC-3 ATM IP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 2pOC3MmAtm2, 2pOC3SmAtm2

• Ports <port>: SONET, SDH

• Port numbers <m>: 0, 1. When you add an OC-3 port, the systemautomatically creates a Path subcomponent. The system also creates anATMCell component beneath the Path component.

You must set three types of attributes:

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— Set theSonet or Sdh provisionable attributes using the genericprocess (see “Configuring a function processor” on page 30)

— Set theSonetor Sdh Path component attributes using the command

set lp/<n> <port>/<m> path/0 <attribute><attributevalue>

— Set theSonet or Sdh Path AtmCell component attributes using thecommand

set lp/<n> <port>/<m> path/0 cell <attribute><attributevalue>

Note:The cell payload is scrambled by default, according to ITU-TRecommendation I.432. Cell payload scrambling can be turned off for aport on an ATM card. However, when cell payload scrambling is turnedoff for ATM ports, there is an increased risk of false cell headerdelineation errors.

• Automatic protection switching:aps. When an APS component iscreated, thetestcomponent is automatically created for it, replacing theport test component under Sonet/Sdh.

• APS attributesworkingLine andprotectionLine must be linked to theSonet (or Sdh) ports that will function as such. To configure APS, see“Configuring line protection on optical interfaces” on page 38. For moreinformation on working with APS, see 241-5701-605Passport 7400,8700, 15000 Operations and Maintenance Guide.

OC-3 ATM IP diagnostic testsThe OC-3 ATM IP supports the following port test and loopbacks. The figure“Data paths for OC-3 ATM IP port tests and loopbacks” on page 221 displaysthe data path for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43)

— “Manual test using an external loopback” (page 44)

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Figure 46Data paths for OC-3 ATM IP port tests and loopbacks

PPT 2826 002 AA

Externalloop

Cardloop

Manual loop(can be implemented

over any OC-3equipment or cables)

TE Framer/Cell Processor

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Provisionable OC-3 ATM IP components and attributesThis figure shows provisionable OC-3 ATM IP components and attributes.

Figure 47Provisionable OC-3 ATM IP components and attributes

PPT 2920 031 AA

Root

Lp

Sonet (or alternatively Sdh)

Provisioned (Prov)

Provisioned (Prov)

Path

clockingSourceCustomerIdentifierData (CidData)

customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

Provisioned (Prov)applicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

alarmActDelayscrambleCellPayload

AtmCell

customerIdProvschememodeholdOffTimewaitToRestoreworkingLineprotectionLineapplicationFramerName

AtmCell

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OC-3 ATM IP OSI statesThese tables contain information about OC-3 ATM IP OSI states.

Table 70OC-3 Sonet/Sdh component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Sonet/Sdh interface is inoperable through due to at leastone of the following alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRfiAlarm

• lcdAlarm.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The Sonet/Sdh component is in use. The Sonet/Sdh componenthas one Path component under it.

Unlocked, Enabled,Shutting Down

A lock command is in effect against the Sonet/Sdh componentbut the Path component under it is not yet suspended.

Locked, Enabled, Idle A lock operator command is in effect. The Sonet/Sdh componentis operating in test mode (availabilityStatus: inTest).

Locked, Disabled, Idle A lock operator command is in effect. The component is in oneof the following conditions:

• Left offline. (availabilityStatus: offline)

• Some hardware test failed. (availabilityStatus: failed)

• If running in test mode external factors cause errors(availabilityStatus: inTest). Bad line state and excessive linestate changes are possible causes.

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Table 71OC-3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Idle The hardware component is locked. You can perform a port andline test.

Unlocked, Enabled, Busy The Test component is in use. A Chan, DS1, E1, DS3, E3, V35,X21, Sonet, or Sdh component creates a Test component. TheTest component services only that particular component. A teststops either when the prescribed timer expires or you issue astop test command.

Table 72OC-3 Path component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Path component is inoperable due to at least one of thefollowing alarms:

• lopAlarm

• rxAisAlarm

• rxRfiAlarm

• signalLabelMismatch

Either a bad path state or the Sonet/Sdh is disabled. If the Sonet/Sdh is disabled either Sonet/Sdh is locked or there is a badSonet/Sdh signal.

Unlocked, Enabled, Idle The component is not in use. The component is waiting for abinding to an ATM interface component.

Unlocked, Enabled, Busy The Path component is in use. The Path component servicesonly one user (an ATM interface component) at a time.

(Sheet 1 of 2)

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Unlocked, Enabled,Shutting Down

A lock command is in effect against the Path component. ThePath component is waiting for the ATM interface component togo into a disabled mode before it completes the lock sequenceand shuts down.

Locked, Disabled, Idle A lock operator command is in effect.

Table 72 (continued)OC-3 Path component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 26DS1 AAL1 function processor

See the following sections for information about configuring and testing aDS1 AAL1 function processor (FP):

• “DS1 AAL1 FP configuration parameters” on page 227

• “DS1 AAL1 FP diagnostic tests” on page 228

• “Provisionable DS1 AAL1 FP components and attributes” on page 228

• “DS1 AAL1 FP OSI states” on page 229

DS1 AAL1 FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring a DS1 AAL1 FP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 4pDS1Aal1

• Ports <port>: DS1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 0 –23. When you add a port, the systemautomatically creates a Channel 0 component.

• Timeslots <timeslots>: 1–24. For unstructured services, you mustprovision all timeslots.

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DS1 AAL1 FP diagnostic testsThe DS1 AAL1 FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual test using an external loopback” (page 44).

• “Remote loopback test” (page 46)

Provisionable DS1 AAL1 FP components and attributesThis figure shows provisionable DS1 AAL1 FP components and attributes.

Figure 48Provisionable DS1 AAL1 FP components and attributes

PPT 2920 032 AA

Root

Lp

DS1 AAL1

Channel (Chan) component

TrunkConditioning

Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLengthCustomerIdentifierData (CidData) vendor commonText

Provisioned (Prov) group timeslots (ts) timeslotDataRate applicationFramerName

replacementDatasignalOneDurationsignalOnesignalTwo

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DS1 AAL1 FP OSI statesThese tables contain information about DS1 AAL1 FP OSI states.

Table 73DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 74DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 74 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Chapter 27E1 AAL1 function processor

See the following sections for information about configuring and testing anE1 AAL1 function processor (FP):

• “E1 AAL1 FP configuration parameters” on page 231

• “E1 AAL1 FP diagnostic tests” on page 232

• “Provisionable E1 AAL1 FP components and attributes” on page 232

• “E1 AAL1 FP OSI states” on page 234

E1 AAL1 FP configuration parametersFor all ATM FPs, you must link the ports to an ATM interface before they canprovide any service. For more information, see the section on provisioningthe AtmInterface component in 241-5701-710Passport 7400, 8700, 15000ATM Configuration Guide. When configuring an E1 AAL1 FP, use thefollowing values to help you set component attributes:

• Card type <cardtype>: 4pE1Aal1

• Ports <port>: E1

• Port numbers <m>: 0, 1, 2, 3

• Number of channels <p>: 0–30. When you add a port, the systemautomatically creates a Channel 0 component.

• Timeslots <timeslots>: 1–31. For unstructured services, you mustprovision all timeslots.

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E1 AAL1 FP diagnostic testsThe E1 AAL1 FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual test using an external loopback” (page 44)

• “PN127 remote loopback test” (page 49).

The E1 AAL1 FP supports this test only when the E1 signal is structured.If a channel contains more than one timeslot, each timeslot is tested insequence. You can run only one PN127 on an E1 AAL1 FP at a time.

Provisionable E1 AAL1 FP components and attributesThis figure shows provisionable E1 AAL1 FP components and attributes.

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Figure 49Provisionable E1 AAL1 FP components and attributes

PPT 2920 033 AA

Root

Lp

E1 AAL1

Channel (Chan) component

TrunkConditioning

Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) vendor commonText

Provisioned (Prov) group timeslots (ts) timeslotDataRate applicationFramerName

replacementDatasignalOneDurationsignalOnesignalTwo

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E1 AAL1 FP OSI statesThese tables contain information about E1 AAL1 FP OSI states.

Table 75E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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Table 76E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 77E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Chapter 28DS1 MSA32 function processor forPassport 7400

See the following sections for information about configuring and testing a 32-port DS1 for multi-service access (MSA32) function processor (FP):

• “DS1 MSA32 FP configuration parameters” on page 237

• “DS1 MSA32 FP diagnostic tests” on page 238

• “Provisionable DS1 MSA32 FP components and attributes” on page 240

• “DS1 MSA32 FP OSI states” on page 242

• “Maintenance monitor for DS1 MSA32 function processor” (page 243)

DS1 MSA32 FP configuration parametersWhen configuring a DS1 MSA32 FP, use the following values to help you setcomponent attributes:

• Port numbers <m>: 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16,17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31

Note:Only ports 0-29 can be used for ATM UNI. Ports 30 and 31 cannotbe used for ATM UNI except as part of an IMA link group. All 32 portscan be used for non-ATM services.

• Number of channels <p>: 0 –23. When you add a port, the systemautomatically creates a Channel 0 component.

• Timeslots <timeslots>: 1–24. For unstructured services, you mustprovision all timeslots.

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DS1 MSA32 FP diagnostic testsThe DS1 MSA32 FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using an external loopback” (page 44)

— “Manual test using a payload loopback” (page 45)

• “Remote loopback test” (page 46)

The DS1 MSA32 function processor uses hardware to generate a continuousconstant bit rate (CBR) pattern instead of using a software-generated series offrames to test error bit rates on the line. The CBR pattern can be customizedor a standard pseudo-random bit sequence or pattern (PRBS). Hardware-generated CBR patterns allow complete testing of the line because thefunction processor can then detect all bit errors. With software-generated testpatterns, the function processor only detects bit errors if they occur within theframe containing the PRBS pattern.

For framed line types, the function processor generates the continuous CBRpattern within the framing on the line. For unframed line types, the functionprocessor generates the CBR pattern over the full port bandwidth.

The DS1 MSA32 function processor also uses hardware to evaluate the bittest stream that is returned.

Table 78Port and channel test types supported on DS1 MSA32 FP

Test type Supported on port Supported on channel Performs pattern test

card yes no yes

manual yes yes yes

externalLoop yes no no

payloadLoop no yes no

remoteLoop yes no yes

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Because of these particularities, the DS1 MSA32 function processor hassome unique behaviors for port testing, as explained in the following sections:

• “Clock synchronization” (page 239)

• “Test setup and result attributes” (page 239)

• “Interpreting test results” (page 240)

Clock synchronizationThe PRBS patterns used by the DS1 MSA32 function processor are subjectto the same constraints as framed traffic on the access ports. This means thatto prevent frame slips from occurring, you must configure theclockingSourceattribute to module when doing port tests on framed line types on the DS1MSA32 function processor. This sets the active CP’s clock as the source ofthe transmit clock for the DS1 line and ensures that the received data andtransmitted data have the same clock as the DS1 MSA32 function processor.

Because of the nature of PRBS, if a frame slip occurs and patternsynchronization is lost, the DS1 MSA32 function processor cannotresynchronize to the pattern and a patternSynchLost condition is declared.See “Interpreting test results” (page 240) if this happens.

For unframed line types, you can configure a local, line or module clockingsource.

Test setup and result attributesBecause the DS1 MSA32 function processors does not use software-generated frames:

• thefrmsize attribute of the test setup component is redundant

• thefrmTx, frmRx anderroredFrmRx attributes of the test resultcomponent are redundant

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Interpreting test resultsOn the DS1 MSA32 function processor, Passport terminates a test on framedline types as a patternSynchLost condition when the received bit errors rise toa level of greater than 1%. A patternSynchLost condition is declared,terminating the test, if either of the two following situations occur:

• A line is error-free but a configuration error causes frame slips. Thefunction processor is unable to re-synchronize after a frame slip, causingthe test to terminate. In this situation, the test results show a bit error rateof zero and the termination cause as patternSynchLost, indicating that thelast sample had a bit error rate of greater than 1% due to the frame slip.

• A line has bit error rates of less than 1% but rises to greater than 1% atsome points, possibly due to electrical problems in a cable. In thissituation, the test results show a bit error rate of less than 1% but thetermination cause is shown as patternSynchLost because the last samplehad a bit error rate of greater than 1%.

To avoid these types of situations when running framed line types, ensure thatyou have configured your clocking source correctly. For information onclocking source, see "Clock synchronization" on page 239.

Provisionable DS1 MSA32 FP components and attributesThe figure "Provisionable DS1 MSA32 FP components and attributes" onpage 241, shows provisionable DS1 MSA32 FP components and attributes.

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Figure 50Provisionable DS1 MSA32 FP components and attributes

PPT 2920 034 AA

Root

Lp

DS1

Channel (Chan)

AtmCell(Cell)

TrunkConditioning (TC)

Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLengthCustomerIdentifierData (CidData) group CustomerIndentifier (Cid)AdminInfo (AdminInfo) group vendor commonText

Provisioned (Prov) group timeslots (ts) timeslotDataRate (dataRate) applicationFramerName

Provisioned (Prov) group replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo)

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DS1 MSA32 FP OSI statesThese tables contain information about DS1 MSA32 FP OSI states.

Table 79DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Note: With unstructured CES, only lossOfSignal will causethis OSI state.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 80DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Maintenance monitor for DS1 MSA32 function processorThe DS1 MSA32 FP allows you to monitor the ingress data flow of a singlechannel on a port and direct it as an AAL1 CES data stream to a remotereceiver. The purpose is to provide a system that, once provisioned, may beactivated remotely by operations staff to add a non-intrusive monitor onto achannel.

The maintenance monitor can operate on the following types of channels:

• ATM

• frame relay

• structured AAL1 CES

The output AAL1 CES data stream can be directed to a local port, or to aremote port anywhere in the network, that supports CES.

The following figure shows provisionable components and attributesassociated with the maintenance monitor.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 80 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Figure 51Provisionable maintenance monitor components and attributes

The procedures associated with the maintenance monitor are:

• “Provisioning the maintenance monitor” (page 244)

• “Starting the maintenance monitor” (page 246)

• “Stopping the maintenance monitor” (page 246)

Provisioning the maintenance monitorBefore provisioning the maintenance monitor, make sure

• that the channel to be monitored is provisioned and operating with eitheran ATM, frame relay or AAL1 CES service. For provisioning details ofthese services, see

— 241-5701-710Passport 7400, 8700, 15000 ATM ConfigurationGuide

— 241-5701-900Passport 7400, 8700, 15000 Frame Relay UNI Guide

PPT 2920 035 AA

Root

MaintenanceMonitorTX (MmTx)

Aal1NailedUpAdaptionPoint (Nap)

Provisioned (Prov) group linkToLogicalProcessor (IpName) monitoredDirection (direction )* serviceType (serType)* partialFill (partFill)* idleSuppression (idleSup)*Operational (Oper) group connectionStatus (connStatus)* chanToMonitor (chan)

Provisioned (Prov) group atmConnection (ac)

*read-only attribute

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— 241-5701-720Passport 7400, 8700, 15000 AAL1 Circuit EmulationGuide

• that an ATM virtual channel connection with an nailed-up end point hasbeen set up to the port where the remote receiver is connected

Perform the following steps in provisioning mode. For information onworking in provisioning mode, see 241-5701-605Passport 7400, 8700,15000 Operations and Maintenance Guide.

1 Add a MaintenanceMonitorTx component

add Mmtx/<n>

where:<n> is the instance number of the MaintenanceMonitorTx component

2 Link the MaintenanceMonitorTx component to the LP containing thechannel to be monitored

set Mmtx/<n> lpName Lp/<lp>

where:<n> is the instance number of the MaintenanceMonitorTx component<lp> is the LP containing the channel to be monitored

A separate instance of the MaintenanceMonitorTx component is requiredfor each monitored channel. Only one instance of theMaintenanceMonitorTx component can be linked to a particular LP.

3 Add a Aal1NailedUpAdaptationPoint subcomponent to theMaintenanceMonitorTx component

add Mmtx/<n> Nap

where:<n> is the instance number of the MaintenanceMonitorTx component

4 Link the Aal1NailedUpAdaptationPoint subcomponent to the ATM virtualchannel connection to the port where the remote receiver is connected.

add Mmtx/<n> Nap atmConnection AtmIf/<m> Vcc/<vpi>.<vci> Nep

where:<n> is the instance number of the MaintenanceMonitorTx component<m> is the ATM interface with the port where the remote receiver isconnected

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<vpi>.<vci> identifies the virtual channel connection to the port wherethe remote received is connected

5 Activate and confirm the provisioning changes.

activate provconfirm prov

Starting the maintenance monitorPerform the following steps in operating mode. For information on workingin operating mode, see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide.

1 Use the maintenance monitor’s chanToMonitor attribute to specify whichLP, port and channel to monitor.

set Mmtx/<n> chan Lp/<lp> DS1/<x> Chan/<y>

where:<n> is the instance number of the MaintenanceMonitorTx component<lp> is the LP containing the channel to be monitored<x> is the port containing the channel to be monitored<y> is the channel to be monitored

The value of <lp> must be the same as the one specified in “Provisioningthe maintenance monitor” (page 244). The specified channel must belinked by provisioning to an ATM interface, a frame relay interface, or astructured AAL1 CES interface.

Stopping the maintenance monitorPerform the following steps in operating mode. For information on workingin operating mode, see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide.

1 Clear the maintenance monitor’s chanToMonitor attribute.

set Mmtx/<n> chan !

where:<n> is the instance number of the MaintenanceMonitorTx component

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Chapter 29E1 MSA32 function processor forPassport 7400

See the following sections for information about configuring and testing an32-port E1 for multi-service access (MSA32) function processor (FP):

• “E1 MSA32 FP configuration parameters” on page 247

• “E1 MSA32 FP diagnostic tests” on page 248

• “Provisionable E1 MSA32 FP components and attributes” on page 251

• “E1 MSA32 FP OSI states” on page 252

E1 MSA32 FP configuration parametersWhen configuring an E1 MSA32 FP, use the following values to help you setcomponent attributes:

• Port numbers <m>: 0, 1, 2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16,17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31

Note:Only ports 0-29 can be used for ATM UNI. Ports 30 and 31 cannotbe used for ATM UNI except as part of an IMA link group. All 32 portscan be used for non-ATM services.

• Number of channels <p>: 0–30.

• Timeslots <timeslots>: 1–31. For unstructured services, you mustprovision all timeslots.

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E1 MSA32 FP diagnostic testsThe E1 MSA32 FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using an external loopback” (page 44).

— “Manual test using a payload loopback” (page 45)

• “Remote loopback test” (page 46)

• “PN127 remote loopback test” (page 49)

The E1 MSA32 function processor uses hardware to generate a continuousconstant bit rate (CBR) pattern instead of using a software-generated series offrames to test error bit rates on the line. The CBR pattern can be customizedor a standard pseudo-random bit sequence or pattern (PRBS). Hardware-generated CBR patterns allow complete testing of the line because thefunction processor can then detect all bit errors. With software-generated testpatterns, the function processor only detects bit errors if they occur within theframe containing the PRBS pattern.

For framed line types, the function processor generates the continuous CBRpattern within the framing on the line. For unframed line types, the functionprocessor generates the CBR pattern over the full port bandwidth.

Table 81Port and channel test types supported on MSA32 E1 FPs

Test type Supported on port Supported on channel Performs pattern test

card yes no yes

manual yes yes yes

externalLoop yes no no

payloadLoop no yes no

remoteLoop yes no yes

pn127RemoteLoop no yes yes

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The E1 MSA32 function processor also uses hardware to evaluate the bit teststream that is returned.

Because of these particularities, the E1 MSA32 function processor has someunique behaviors for port testing, as explained in the following sections:

• “Clock synchronization” (page 249)

• “Test setup and result attributes” (page 249)

• “Interpreting test results” (page 250)

Clock synchronizationThe PRBS patterns used by the E1 MSA32 function processor are subject tothe same constraints as framed traffic on the access ports. This means that toprevent frame slips from occurring, you must configure theclockingSourceattribute to module when doing port tests on framed line types on the E1MSA32 function processor. This sets the active CP’s clock as the source ofthe transmit clock for the DS1 line and ensures that the received data andtransmitted data have the same clock as the E1 MSA32 function processor.

Because of the nature of PRBS, if a frame slip occurs and patternsynchronization is lost, the E1 MSA32 function processor cannotresynchronize to the pattern and a patternSynchLost condition is declared.See “Interpreting test results” (page 250) if this happens.

For unframed line types, you can configure a local, line or module clockingsource.

Test setup and result attributesBecause the E1 MSA32 function processors does not use software-generatedframes:

• thefrmsize attribute of the test setup component is redundant

• thefrmTx, frmRx anderroredFrmRx attributes of the test resultcomponent are redundant

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Interpreting test resultsOn the E1 MSA32 function processor, Passport terminates a test on framedline types as a patternSynchLost condition when the received bit errors rise toa level of greater than 1%. A patternSynchLost condition is declared,terminating the test, if either of the two following situations occur:

• A line is error-free but a configuration error causes frame slips. Thefunction processor is unable to re-synchronize after a frame slip, causingthe test to terminate. In this situation, the test results show a bit error rateof zero and the termination cause as patternSynchLost, indicating that thelast sample had a bit error rate of greater than 1% due to the frame slip.

• A line has bit error rates of less than 1% but rises to greater than 1% atsome points, possibly due to electrical problems in a cable. In thissituation, the test results show a bit error rate of less than 1% but thetermination cause is shown as patternSynchLost because the last samplehad a bit error rate of greater than 1%.

To avoid these types of situations when running framed line types, ensure thatyou have configured your clocking source correctly. For information onclocking source, see “Clock synchronization” (page 249).

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Provisionable E1 MSA32 FP components and attributesThe figure "Provisionable E1 MSA32 FP components and attributes" on page251 shows provisionable E1 MSA32 FP components and attributes.

Figure 52Provisionable E1 MSA32 FP components and attributes

PPT 2920 036 AA

Root

Lp

E1

Channel (Chan)

Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAis raiDeclareAlarmTime raiClearAlarmTimeCustomerIdentifierData (CidData) group CustomerIdentifier (Cid)AdminInfo (AdminInfo) group vendor commonText

Provisioned (Prov) group timeslots (ts) timeslotDataRate (dataRate) applicationFramerName

Provisioned (Prov) group replacementData (data) signalOneDuration (duration) signalOne (sigOne) signalTwo (sigTwo)

TrunkConditioning (TC)

AtmCell (Cell)

FrameLinkMontoring (flm)

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E1 MSA32 FP OSI statesThese tables contain information about E1 MSA32 FP OSI states.

Table 82E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

Note: With unstructured CES, only lossOfSignal will cause thisOSI state.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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Maintenance monitor for E1 MSA32 function processorThe E1 MSA32 FP allows you to monitor the ingress data flow of a singlechannel on a port and direct it as an AAL1 CES data stream to a remotereceiver. The purpose is to provide a system that, once provisioned, may beactivated remotely by operations staff to add a non-intrusive monitor onto achannel.

Table 83E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 84E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires, a stop test command is issued, or thereis a failure in loopback continuity.

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The maintenance monitor can operate on the following types of channels:

• ATM

• frame relay

• structured AAL1 CES

The output AAL1 CES data stream can be directed to a local port, or to aremote port anywhere in the network, that supports CES.

The following figure shows provisionable components and attributesassociated with the maintenance monitor.

Figure 53Provisionable maintenance monitor components and attributes

The procedures associated with the maintenance monitor are:

• “Provisioning the maintenance monitor” (page 255)

• “Starting the maintenance monitor” (page 256)

PPT 2920 035 AA

Root

MaintenanceMonitorTX (MmTx)

Aal1NailedUpAdaptionPoint (Nap)

Provisioned (Prov) group linkToLogicalProcessor (IpName) monitoredDirection (direction )* serviceType (serType)* partialFill (partFill)* idleSuppression (idleSup)*Operational (Oper) group connectionStatus (connStatus)* chanToMonitor (chan)

Provisioned (Prov) group atmConnection (ac)

*read-only attribute

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• “Stopping the maintenance monitor” (page 256)

Provisioning the maintenance monitorBefore provisioning the maintenance monitor, make sure

• that the channel to be monitored is provisioned and operating with eitheran ATM, frame relay or AAL1 CES service. For provisioning details ofthese services, see

— 241-5701-710Passport 7400, 8700, 15000 ATM ConfigurationGuide

— 241-5701-900Passport 7400, 8700, 15000 Frame Relay UNI Guide

— 241-5701-720Passport 7400, 8700, 15000 AAL1 Circuit EmulationGuide

• that an ATM virtual channel connection with an nailed-up end point hasbeen set up to the port where the remote receiver is connected

Perform the following steps in provisioning mode. For information onworking in provisioning mode, see 241-5701-605Passport 7400, 8700,15000 Operations and Maintenance Guide.

1 Add a MaintenanceMonitorTx component

add Mmtx/<n>

where:<n> is the instance number of the MaintenanceMonitorTx component

2 Link the MaintenanceMonitorTx component to the LP containing thechannel to be monitored

set Mmtx/<n> lpName Lp/<lp>

where:<n> is the instance number of the MaintenanceMonitorTx component<lp> is the LP containing the channel to be monitored

A separate instance of the MaintenanceMonitorTx component is requiredfor each monitored channel. Only one instance of theMaintenanceMonitorTx component can be linked to a particular LP.

3 Add a Aal1NailedUpAdaptationPoint subcomponent to theMaintenanceMonitorTx component

add Mmtx/<n> Nap

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where:<n> is the instance number of the MaintenanceMonitorTx component

4 Link the Aal1NailedUpAdaptationPoint subcomponent to the ATM virtualchannel connection to the port where the remote receiver is connected.

add Mmtx/<n> Nap atmConnection AtmIf/<m> Vcc/<vpi>.<vci> Nep

where:<n> is the instance number of the MaintenanceMonitorTx component<m> is the ATM interface with the port where the remote receiver isconnected<vpi>.<vci> identifies the virtual channel connection to the port wherethe remote received is connected

5 Activate and confirm the provisioning changes.

activate provconfirm prov

Starting the maintenance monitorPerform the following steps in operating mode. For information on workingin operating mode, see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide.

1 Use the maintenance monitor’s chanToMonitor attribute to specify whichLP, port and channel to monitor.

set Mmtx/<n> chan Lp/<lp> E1/<x> Chan/<y>

where:<n> is the instance number of the MaintenanceMonitorTx component<lp> is the LP containing the channel to be monitored<x> is the port containing the channel to be monitored<y> is the channel to be monitored

The value of <lp> must be the same as the one specified in “Provisioningthe maintenance monitor” (page 255). The specified channel must belinked by provisioning to an ATM interface, a frame relay interface, or astructured AAL1 CES interface.

Stopping the maintenance monitorPerform the following steps in operating mode. For information on workingin operating mode, see 241-5701-605Passport 7400, 8700, 15000Operations and Maintenance Guide.

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1 Clear the maintenance monitor’s chanToMonitor attribute.

set Mmtx/<n> chan !

where:<n> is the instance number of the MaintenanceMonitorTx component

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Chapter 30DS1 voice function processor forPassport 7400

See the following sections for information about configuring and testing aDS1 voice function processor (FP):

• “DS1 voice FP configuration parameters” on page 259

• “DS1 voice FP diagnostic tests” on page 260

• “Provisionable DS1 voice FP components and attributes” on page 261

• “DS1 voice FP OSI states” on page 262

• “DS1 voice FP pinouts for physical loopbacks” on page 264

DS1 voice FP configuration parametersWhen configuring a DS1 voice FP, use the following values to set componentattributes:

• Card type <cardtype>: 1pDS1V

• Ports <port>: DS1

• Port numbers <m>: 0

• Number of channels <p>: 0–23

• Timeslots <timeslots>: 1–24

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If you are setting up a DS1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends

DS1 voice FP diagnostic testsTo run diagnostic tests on a DS1V FP, the frmSize attribute must remain at thedefault setting. The frmPatternType attribute must also remain at the defaultsetting of customizedPattern.

You can perform the following diagnostic tests on the DS1 Voice FP:

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS1cannot exceed 223 m (655 ft).

— “Manual test using a physical loopback” (page 43). See “DS1 voiceFP pinouts for physical loopbacks” on page 264.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

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Provisionable DS1 voice FP components and attributesThis figure shows provisionable DS1 voice FP components and attributes.

Figure 54Provisionable DS1 voice FP components and attributes

PPT 2920 038 AA

Root

Lp

Provisioned (Prov)

DS1

linkModezeroCodingclockingSourceraiAlarmTypelineLength

CustomerIdentifierData (CidData)

AdminInfo (AdminInfo)customerIdentifier

vendorcommentText

Channel (Chan)Provisioned (Prov) timeSlots applicationFramerNameCustomerIdentifierData (CidData) customerIdentifier

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DS1 voice FP OSI statesThese tables contain information about DS1 voice FP OSI states.

Table 85DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 86DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 87DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 88DS1 voice Framer component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle A component that the Framer component depends on is notavailable. A likely cause is that the port component (for example,a DS1 component) is locked for testing.

Unlocked, Enabled, Busy The Framer component is in use. The Framer componentservices only one user (an application component) at a time.

Table 86 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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DS1 voice FP pinouts for physical loopbacksTo make hardware modifications for a physical loopback, you must cross-connect the transmit and receive pins. These tables contain the pinouts for thefaceplate and termination panel connectors.

Table 89Faceplace connector pinouts for a DS1 voice FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 transmit + 7 receive +

15 transmit - 14 receive -

Table 90Termination panel connector pinouts for a DS1 voice FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 31E1 voice function processor for Passport 7400

See the following sections for information about configuring and testing anE1 voice function processor (FP):

• “E1 voice FP configuration parameters” on page 265

• “E1 voice FP diagnostic tests” on page 266

• “Provisionable E1 voice FP components and attributes” on page 267

• “E1 voice FP OSI states” on page 268

• “E1 voice FP pinouts for physical loopbacks” on page 270

E1 voice FP configuration parametersWhen configuring a E1 voice FP, use the following values to set componentattributes:

• Card type <cardtype>: 1pE1V

• Ports <port>: E1

• Port numbers <m>: 0

• Number of channels <p>: 0–30

• Timeslots <timeslots>: 1–31

If you are setting up an E1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

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• module at one end and line at the other

• module at both ends

E1 voice FP diagnostic testsWhen running diagnostic tests on the E1V FP, the frmSize attribute mustremain at the default setting. The frmPatternType attribute must also remainat the default setting of CustomizedPattern.

The E1 voice FP supports the following port tests and loopbacks:

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” on page 43. See “E1 voiceFP pinouts for physical loopbacks” on page 270.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

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Provisionable E1 voice FP components and attributesThis figure shows provisionable E1 voice FP components and attributes.

Figure 55Provisionable E1 voice FP components and attributes

PPT 2920 039 AA

Root

Lp

Provisioned (Prov)

E1

lineTypeclockingSourcecrc4Mode

CustomerIdentifierData (CidData)

AdminInfo (AdminInfo)customerIdentifier

vendorcommentText

Channel (Chan)Provisioned (Prov) timeSlots applicationFramerNameCustomerIdentifierData (CidData) customerIdentifier

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E1 voice FP OSI statesThese tables contain information about E1 voice FP OSI states.

Table 91E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

Table 92E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

(Sheet 1 of 2)

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Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 93E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or CHAN componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 94E1 voice Framer component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle A component that the Framer component depends on is notavailable. A likely cause is that the port component (for example,a V35 component) is locked for testing.

Unlocked, Enabled, Busy The Framer component is in use. The Framer componentservices only one user (an application component) at a time.

Table 92 (continued)E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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E1 voice FP pinouts for physical loopbacksTo insert a physical loopback, you must cross-connect the transmit andreceive pins. These tables contain the pinouts for the faceplate andtermination panel connectors.

Table 95Faceplate connector pinouts for an E1 voice FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 transmit + 7 receive +

15 transmit - 14 receive -

Table 96Termination panel connector pinouts for a DS1 voice FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 32J2MV function processor for Passport 7400

See the following sections for information about configuring and testing aJ2MV function processor (FP):

• “J2MV FP configuration parameters” on page 271

• “Provisionable J2MV FP components and attributes” on page 274

• “J2MV FP diagnostic tests” on page 272

• “J2MV FP OSI states” on page 275

• “J2MV pinouts for physical loopbacks” on page 277

J2MV FP configuration parametersWhen configuring a J2MV FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: J2MV

• Ports <port>: E1

• Port numbers <m>: 0. When you add a J2MV port, the system adds aChannel 0 subcomponent.

• Number of channels <p>: 0–30

• Timeslots <timeslots>: 1–31. Do not use timeslot 16.

A J2MV FP is provisioned to use an E1 port with CAS, A-bit signalling,and CRC4 off. The J2MV function processor converts TTC protocol toE1 and vice versa.

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If you are setting up an E1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends

J2MV FP diagnostic testsWhen running diagnostic tests on the J2MV FP, the frmSize attribute mustremain at the default setting. The frmPatternType attribute must also remainat the default setting of CustomizedPattern.

The J2MV FP supports the following port tests and loopbacks. The figure“Data paths for J2MV port tests and loopbacks” on page 273 shows the datapath for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43). See “J2MVpinouts for physical loopbacks” on page 277.

— “Manual test using an external loopback” (page 44)

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Figure 56Data paths for J2MV port tests and loopbacks

PPT 0040 002 AA

Function processor

Externalloop

Linkcontroller

Lineinterface

CSU

Cardloop

Manualloop

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Provisionable J2MV FP components and attributesThis figure shows provisionable J2MV FP components and attributes.

Figure 57Provisionable J2MV FP components and attributes

PPT 2920 039 AA

Root

Lp

Provisioned (Prov)

E1

lineTypeclockingSourcecrc4Mode

CustomerIdentifierData (CidData)

AdminInfo (AdminInfo)customerIdentifier

vendorcommentText

Channel (Chan)Provisioned (Prov) timeSlots applicationFramerNameCustomerIdentifierData (CidData) customerIdentifier

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J2MV FP OSI statesThese tables contain information about J2MV FP OSI states.

Table 97J2MV E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock -force operator command is in effect. The E1component is otherwise ready to service a user. A test isrunning.

Locked, Disabled, Idle • A hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

Table 98J2MV Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The Chan component is inoperable because of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

(Sheet 1 of 2)

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Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock/lock operator command is in effect. The Chan componentis ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 99J2MV Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, Chan, DS3,or E3 component creates a Test component. The Testcomponent services only that particular component. A test stopseither when the prescribed timer expires or you issue a stop testcommand.

Table 98 (continued)J2MV Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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J2MV pinouts for physical loopbacksTo insert a physical loopback, you must cross-connect the transmit andreceive pins.

Table 100Faceplate connector pinouts for a J2MV FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

4 transmit + 2 receive +

11 transmit - 9 receive -

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Chapter 33DS1 MVP/MVP-E function processor forPassport 7400

See the following sections for information about configuring and testing aDS1 MVP/MVP-E function processor (FP):

• “DS1 MVP/MVP-E FP configuration parameters” on page 279

• “DS1 MVP/MVP-E FP diagnostic tests” on page 280

• “Provisionable DS1 MVP/MVP-E FP components and attributes” onpage 282

• “DS1 MVP/MVP-E FP OSI states.” on page 283

• “DS1 MVP/MVP-E FP pinouts for physical loopbacks” on page 284

DS1 MVP/MVP-E FP configuration parametersWhen configuring a DS1 MVP/MVP-E FP, use the following values to setcomponent attributes:

• Card type <cardtype>: 1pDS1Mvp (for DS1 MVP) or 1pDS1Mvpe (forDS1 MVP-E)

• Ports <port>: DS1

• Port numbers <m>: 0

• Number of channels <p>: 0–23

• Timeslots <timeslots>: 1–24

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If you are setting up a DS1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends

DS1 MVP/MVP-E FP diagnostic testsThe frmSize attribute cannot exceed 1024 when you run diagnostic tests onthe DS1 MVP/MVP-E FP. The DS1 MVP/MVP-E loop tests cannot run on achannel associated with timeslot 25 when the linetype attribute is set to CAS.

The DS1 MVP/MVP-E supports the following port tests and loopbacks. Thefigure “Data paths for DS1 MVP/MVP-E port tests and loopbacks” onpage 281 shows the data path for each port test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43). Make sure the loop lengths are within therequired range and the lineLength provisionable attribute is properly set.If the looped signal is not re amplified, the round-trip loop length for DS1cannot exceed 223 m (655 ft.).

— “Manual test using a physical loopback” (page 43). See “DS1 MVP/MVP-E FP pinouts for physical loopbacks” on page 284.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

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Figure 58Data paths for DS1 MVP/MVP-E port tests and loopbacks

PPT 0040 002 AA

Function processor

Externalloop

Linkcontroller

Lineinterface

CSU

Cardloop

Manualloop

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Provisionable DS1 MVP/MVP-E FP components andattributes

This figure shows provisionable DS1 MVP/MVP-E FP components andattributes.

Figure 59Provisionable DS1 MVP/MVP-E FP components and attributes

PPT 2920 041 AA

Root

Lp

DS1

Channel (Chan)

Provisioned (Prov) group lineType zeroCoding clockingSource raiAlarmType lineLengthCustomerIdentifierData (CidData) CustomerIdentifier (Cid)AdminInfo vendor commonTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (Cid)Data customerIdentifierIfEntryProv ifAdminStatus ifIndex

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DS1 MVP/MVP-E FP OSI states.These tables contain information about DS1 MVP/MVP-E FP OSI states.

Table 101DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 102DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

(Sheet 1 of 2)

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DS1 MVP/MVP-E FP pinouts for physical loopbacksTo insert a physical loopback on a port, you must cross-connect the transmitand receive pins. These tables contain the pinouts for the faceplate andtermination panel connectors.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 103DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 104Faceplate connector pinouts for a DS1 MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 transmit + 7 receive +

15 transmit - 14 receive -

Table 102 (continued)DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Table 105Termination panel connector pinouts for a DS1 MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 34E1 MVP/MVP-E function processor forPassport 7400

See the following sections for information about configuring and testing anE1 MVP/MVP-E function processor (FP):

• “E1 MVP/MVP-E FP configuration parameters” on page 287

• “E1 MVP/MVP-E FP diagnostic tests” on page 288

• “Provisionable E1 MVP/MVP-E FP components and attributes” onpage 290

• “E1 MVP/MVP-E FP OSI states” on page 291

• “E1 MVP/MVP-E FP pinouts for physical loopbacks” on page 293

E1 MVP/MVP-E FP configuration parametersWhen configuring an E1 MVP/MVP-E FP, use the following values to setcomponent attributes:

• Card type <cardtype>: 1pE1Mvp (for E1 MVP) or 1pE1Mvpe (for E1MVP-E)

• Ports <port>: E1

• Port numbers <m>: 0

• Number of channels <p>: 0 –30

• Timeslots <timeslots>: 1–31

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If you are setting up an E1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends

E1 MVP/MVP-E FP diagnostic testsTo run diagnostic tests on an E1 MVP/MVP-E FP, the frmSize attributecannot exceed 1024. The E1 MVP/MVP-E loop tests cannot run on a channelassociated with timeslot 16 when the linetype is CAS.

The E1 MVP/MVP-E FP supports the following port tests and loopbacks. Thefigure “Data paths for E1 MVP/MVP-E FP port tests and loopbacks” onpage 289 shows the data path for each test and loopback.

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

— “Manual test using a physical loopback” (page 43). See “E1 MVP/MVP-E FP pinouts for physical loopbacks” on page 293.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

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Figure 60Data paths for E1 MVP/MVP-E FP port tests and loopbacks

PPT 0040 002 AA

Function processor

Externalloop

Linkcontroller

Lineinterface

CSU

Cardloop

Manualloop

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Provisionable E1 MVP/MVP-E FP components andattributes

This figure shows provisionable E1 MVP/MVP-E FP components andattributes.

Figure 61Provisionable E1 MVP/MVP-E FP components and attributes

PPT 2920 042 AA

Root

Lp

E1

Channel (Chan)

Provisioned (Prov) group lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) CustomerIdentifier (Cid)AdminInfo vendor commonTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (Cid)Data customerIdentifierIfEntryProv ifAdminStatus ifIndex

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E1 MVP/MVP-E FP OSI statesThese tables contain information about E1 MVP/MVP-E OSI states.

Table 106E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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Table 107E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 108E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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E1 MVP/MVP-E FP pinouts for physical loopbacksTo insert a physical loopback on a port, you must cross-connect the transmitand receive pins. These tables contain the pinouts for the faceplate andtermination panel connectors.

Table 109Faceplate connector pinouts for an E1 MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

8 transmit + 7 receive +

15 transmit - 14 receive -

Table 110Termination panel connector pinouts for an E1 MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 35TTC2M MVP/MVP-E function processor forPassport 7400

See the following sections for information about configuring and testing aTTC2M MVP/MVP-E function processor (FP):

• “TTC2M MVP/MVP-E FP configuration parameters” on page 295

• “TTC2M MVP/MVP-E FP diagnostic tests” on page 296

• “Provisionable TTC2M MVP/MVP-E FP components and attributes” onpage 298

• “TTC2M MVP/MVP-E FP OSI states” on page 299

• “TTC2M MVP/MVP-E FP pinouts for physical loopbacks” on page 301

TTC2M MVP/MVP-E FP configuration parametersWhen configuring a TTC2M MVP/MVP-E FP, use the following values to setcomponent attributes:

• Card type <cardtype>: 1pTTC2mMvp (for TTC2M MVP) or1pTTC2mMvpe (for TTC2M MVP-E)

• Ports <port>: E1

• Port numbers <m>: 0

• Number of channels <p>: 0–30

• Timeslots <timeslots>: 1–31

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If you are setting up an E1 trunk between two Passports that are co-located,you must set the clockingSource attributes as one of the followingcombinations:

• local at one end and line at the other

• module at one end and line at the other

• module at both ends

TTC2M MVP/MVP-E FP diagnostic testsIn order to run diagnostic tests on an E1 MVP/MVP-E FP, the frmSizeattribute cannot exceed 1024. You cannot run a loop test on a channelassociated with timeslot 16 if the linetype attribute is set to CAS.

The TTC2M MVP/MVP-E FP supports the following port tests andloopbacks. The figure “Data paths for TTC2M MVP/MVP-E FP tests andloopbacks” on page 297 shows the data path for each test and loopback.

• “Card loopback test” on page 42

• “Manual tests” on page 43

— “Manual test using a physical loopback” (page 43). See “TTC2MMVP/MVP-E FP pinouts for physical loopbacks” on page 301.

— “Manual test using an external loopback” (page 44). The externalloopback is established at the line interface circuitry.

— “Manual test using a payload loopback” (page 45)

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Figure 62Data paths for TTC2M MVP/MVP-E FP tests and loopbacks

PPT 0040 002 AA

Function processor

Externalloop

Linkcontroller

Lineinterface

CSU

Cardloop

Manualloop

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Provisionable TTC2M MVP/MVP-E FP components andattributes

This graphic illustrates the provisionable TTC2M MVP/MVP-E FPcomponents and attributes.

Figure 63Provisionable TTC2M MVP/MVP-E FP components and attributes

PPT 2920 012 AA

Root

Lp

E1

Channel (Chan)

Provisioned (Prov) lineType clockingSource crc4Mode sendRaiOnAisCustomerIdentifierData (CidData) customerIdentifierAdminInfo vendor commentTextIfEntryProv ifAdminStatus ifIndex

Provisioned (Prov) timeslots (ts) timeslotDataRate applicationFramerNameCustomerIdentifierData (CidData) customerIdentifierIfEntryProv ifAdminStatus ifIndex

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TTC2M MVP/MVP-E FP OSI statesThese tables contain information about TTC2M MVP/MVP-E FP OSI states.

Table 111E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• multifrmLofAlarm

• rxMultifrmRaiAlarm

• txMultifrmRaiAlarm.

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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Table 112E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

Table 113E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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TTC2M MVP/MVP-E FP pinouts for physical loopbacksTo insert a physical loopback on a port, you must cross-connect the transmitand receive pins. These tables contain the pinouts for the faceplate andtermination panel connectors.

Table 114Faceplate connector pinouts for a TTC2M MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

4 transmit + 2 receive +

11 transmit - 9 receive -

Table 115Termination panel connector pinouts for a TTC2M MVP/MVP-E FP

Transmit pins Receive pins

Pin no Pin name Pin no Pin name

3 Transmit + 1 Receive +

11 Transmit - 9 Receive -

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Chapter 36Ethernet function processor

See the following sections for information about configuring an Ethernetfunction processor (FP):

• “Ethernet FP configuration parameters” on page 303

• “Provisionable Ethernet FP components and attributes” on page 304

• “Ethernet FP OSI states” on page 305

Ethernet FP configuration parametersWhen configuring an Ethernet FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: 6pEth10BaseT

• Ports <port>: en

• Port numbers <m>: 0, 1, 2, 3, 4, 5

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Provisionable Ethernet FP components and attributesThis figure shows provisionable Ethernet FP components and attributes.

Figure 64Provisionable Ethernet FP components and attributes

PPT 2920 044 AA

Root

Lp

En

Lt

La

Provisioned (Prov)

CustomerIdentifieData (CidData)

ifEntryProv (ifEntry)customerIdentifier

AdminInfo (AdminInfo)vendorcommentText

DebugProvdefaultTraceLevel

heartbeaPacketapplicationFramerName

IfAdminStatusifIndex (iFI)

CustomerIdentifieData (CidData)

MediaProvisioned (MediaProv)

ifEntryProv (ifEntryProv)linkToProtocolPort

clockingSource (cid)

ifAdminStatusifIndex

Framer

Provisioned (Prov)interfaceName

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Ethernet FP OSI statesThis table contains information about Ethernet FP OSI states.

Table 116Ethernet (En) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The component is disabled due to a broken physicaldisconnection or bad line state, etc.

Unlocked, Enabled, Idle The component is not in use. The component is waiting to bindto the Framer component.

Unlocked, Enabled, Busy The component is in use. This component can only service oneFramer component at a time. No usage states are active.

Shutting Down, Enabled, Busy The component is going from the unlocked to the locked state.The component is breaking the link to the Framer component.

Locked, Enabled, Idle A lock command is in effect. You can test the component.

Locked, Disabled, Idle A hardware test failed or a physical connection was broken whilein the locked state.

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Chapter 37100BaseT Ethernet function processor

See the following sections for information about configuring a 100BaseTEthernet function processor (FP):

• “100BaseT Ethernet FP configuration parameters” on page 307

• “Provisionable 100BaseT Ethernet FP components and attributes” onpage 309

• “100BaseT Ethernet FP OSI states” on page 310

100BaseT Ethernet FP configuration parametersWhen configuring a 100BaseT Ethernet FP, use the following values to setcomponent attributes:

• Card type <cardtype>: Eth100BaseT

• Ports <port>: eth100

• Port numbers <m>: 0, 1

Procedure 12Configuring a 100BaseT Ethernet function processor

1 Follow the procedures in “Basic process for configuring a functionprocessor” on page 29.

2 After you set provisionable attributes for each port, add the Lancomponent.

add la/<m>

where:<m> is an instance value for the Lan component.

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To use hardware switching, only provision one Lan component.Otherwise, provision one Lan component for each port. When you add aLan component, the system automatically adds a Framer subcomponent.

3 Link the Lan application to a port.

set la/<m> framer interfaceName lp/<n> eth100/<p>

where:<m> is the value for a Lan component you added in step 2.<n> is the lp you linked to the FP.<p> is the port number

To use hardware switching, link the same instance of the Lan application(for example, la/0) to both ports on the FP. Otherwise, link a differentinstance of the Lan application to each port.

4 Activate the configuration changes. See the procedure “Activatingconfiguration changes” on page 35.

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Provisionable 100BaseT Ethernet FP components andattributes

This figure shows the provisionable components and attributes for the100BaseT Ethernet FP.

Figure 65Provisionable 100BaseT Ethernet FP components and attributes

PPT 2920 045 AA

Root

Lp

La

Eth100BaseT (Eth100)

CustomerIdentifieData (CidData)

MediaProvisioned (MediaProv)

ifEntryProv (ifEntryProv)linkToProtocolPort

clockingSource (cid)

ifAdminStatusifIndex

interfaceNameFramer

duplexModelineSpeedautoNegotiationapplicationFramerName (framer)

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100BaseT Ethernet FP OSI statesThis table contains information about 100BaseT Ethernet FP OSI states.

Table 117100BaseT Ethernet (En) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The component is disabled due to a broken physicaldisconnection or bad line state. The LP associated with thecomponent is down.

Unlocked, Enabled, Idle The component is not in use. The component is ready to bind tothe LAN application component.

Unlocked, Enabled, Busy The component is in use.

Shutting Down, Enabled, Busy The component is in transition from the unlocked to the lockedstate.

Locked, Enabled, Idle A lock command is in effect. You can test the component.

Locked, Disabled, Idle A hardware test failed or a physical connection broke while thecomponent was locked.

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Chapter 38DS3C AAL function processor

See the following sections for information about configuring and testing aDS3C AAL function processor (FP):

• “DS3C AAL FP configuration parameters” on page 311

• “DS1 tributary ports” on page 312

• “DS3C AAL FP diagnostic tests” on page 312

• “Provisionable DS3C AAL FP components and attributes” on page 313

• “DS3C AAL FP OSI states” on page 315

DS3C AAL FP configuration parametersWhen configuring a DS3C AAL FP, use the following values to help you setcomponent attributes:

• Card type <cardtype>: 2pDS3cAal

• Ports <port>: DS3, DS1 (tributary ports beneath a DS3 port)

• Port numbers <m>: 0, 1

• Tributary DS1 port numbers <q>: 0 –28

• Number of DS1 channels <p>: 1. The system automatically createsChannel 0.

The DS3C AAL function processor supports DS1 tributary ports beneatheach DS3 port. When you add aDS3 component, the system automaticallycreatesDS1/1. You can create up to 28 DS1s for eachDS3 component.

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When you add aDS1 component, the system automatically creates aChannel/0component that contains 24 provisioned timeslots. The systemalso creates aTrunkConditioning (TC) component beneath theChannelcomponent.

DS1 tributary portsThe DS3C function processor supports DS1 tributary ports beneath the DS3ports. Most generic procedures in this guide and the 241-5701-605Passport7400, 8700, 15000 Operations and Maintenance Guide do not showcommands that take into account a hierarchy of ports (DS1 under DS3).Therefore, remember to include the DS1 hierarchy when you issuecommands. For example, to set provisionable DS1 attributes, use thecommand

set lp/<n> DS3/<m> DS1/<q> <attribute><attributevalue>

To display DS1 tributary port information, use the command

display lp/<n> DS3/<m> DS1/<q>

To lock a DS1 tributary port, use the command

lock lp/<n> DS3/<m> DS1/<q>

DS3C AAL FP diagnostic testsThe DS3C AAL FP supports the following diagnostic tests:

• “Manual test using an external loopback” (page 44).

• “Manual test using a payload loopback” (page 45)

The DS3C AAL processor card only supports the payload loopback ontheDS1 components under the DS3 port. Therefore, the DS3 port doesnot support the payload loopback. Set the DS3CbitParityattribute to onto enable theDS3 component to support a remote loop or remotetributary loop test request from the far end. ThelineType attributebeneath theDS1 component must be set to esf or esfCas in order tosupport a remote loopback request.

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Provisionable DS3C AAL FP components and attributesThese figures show provisionable DS3C AAL FP components and attributes.

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Figure 66Provisionable DS3C AAL FP components and attributes

PPT 2920 049 AA

Root

Lp

DS3

Provisioned (Prov)

DS1

cbitParitymappinglineLengthclockingSourceapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

AdminInfovendorcommentText

IfEntryProvifAdminStatusifIndex

Provisioned (Prov)lineTypezeroCodingclockingSource

CustomerIdentifierData (CidData)customerIdentifier

AdminInfo

IfEntryProv

Channel (chan)

vendorcommentText

ifAdminStatusifIndex

...continued

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Figure 67Provisionable DS3C AAL FP components and attributes (continued)

DS3C AAL FP OSI statesThe following tables contain information about DS3C AAL FP OSI states:

• “DS1 component state combination” on page 316

• “DS1 Channel (Chan) component state combination” on page 316

• “DS1 Test component state combination” on page 317

• “DS3 component state combination” on page 317

• “DS3 Test component state combination” on page 318

PPT 2920 050 AA

Channel (chan)

Provisioned (Prov)timeslots (ts)timeslotDataRateapplicationFramerName

CustomerIdentifierData (CidData)

IfEntryProvcustomerIdentifier

ifAdminStatusifIndex

replacementData (data)signalOneDuration (duration)signalOne (sigOne)signalTwo (sigTwo)

TrunkConditioning

Provisioned (Prov)

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Table 118DS1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS1 port is inoperable due to at least one of thefollowing alarms.

• losAlarm

• lofAlarm

• rxAisAlarm.

Unlocked, Enabled, Busy The DS1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The DS1component is ready to service a user. A test is running.

Locked, Disabled, Idle • A hardware test failed.

• The DS1 component is in the locked state.

• External factors render the DS1 port inoperable.

Table 119DS1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of DS1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle Some hardware test failed or the Chan component is in thelocked state.

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Table 120DS1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A DS1 or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

Table 121DS3 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The DS3 interface is inoperable due to at least one of thefollowing alarms:

• losAlarm

• lofAlarm

• rxAisAlarm

• rxRaiAlarm

or the far end DS3 interface is requesting the local interface toloop back the incoming signal.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes. The line input is recognized as good.Clocks are available.

Unlocked, Enabled, Busy The DS3 component is in use. The DS3 component servicesonly one user (for example a Framer component) at a time.

Locked, Enabled, Idle A port and line test is in progress.

Locked, Disabled, Idle A hardware test failed and the DS3 component is put in thelocked state.

A lock/lock operator command is in effect.

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Table 122DS3 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. A V35, X21, DS1, E1, Chan, DS3,or E3 component creates the Test component. The Testcomponent services only that particular component. A test stopseither when the prescribed timer expires or you issue a stop testcommand.

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Chapter 3932-port E1 AAL function processor

See the following sections for information about configuring and testing a32-port E1 AAL function processor (FP):

• “32-port E1 AAL FP configuration parameters” on page 319

• “32-port E1 AAL FP diagnostic tests” on page 320

• “Provisionable 32-port E1 AAL FP components and attributes” onpage 321

• “32-port E1 AAL FP OSI states” on page 323

32-port E1 AAL FP configuration parametersWhen configuring a 32-port E1 AAL FP, use the following values to help youset component attributes:

• Card type <cardtype>: 32pE1Aal

• Ports <port>: E1

• Port numbers <m>: 1–32

• Number of E1 channels <p>: 1. Thesystem automatically createsChannel/0.

When you add anE1 component, the system automatically creates aChannel/0component that contains 31 provisioned timeslots, numbered 1-31.The system also creates aTrunkConditioning (TC) component beneath theChannel component.

The lineType attribute beneath anE1 component must be set to ccs.

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TheclockingSourceattribute beneath anE1component, can be set to local ormodule. You can only set theclockingSource attribute to module if aNetworkSynchronizationcomponent is provisioned. The clocking source forall for all E1 components must be the same.

ThetimeslotDataRateattribute beneath aChannelcomponent must be set todoNotOverride.

32-port E1 AAL FP diagnostic testsThe 32-port E1 AAL FP supports theTest component beneath theE1component, but does not support theTest component beneath theChannelcomponent. The 32-port E1 AAL FP supports the following port tests andloopbacks:

• “Card loopback test” (page 42)

• “Manual tests” (page 43)

• “Manual test using an external loopback” (page 44)

• “Manual test using a payload loopback” (page 45)

Each connector on the faceplate of a 32-port E1 AAL FP is used inconjunction with a multiport aggregate device.

If a connector on the faceplate of the FP, its associated multiport aggregatedevice, or the cable that connects the two fails, Passport generates alarms onthe 16 E1 ports affected. The system does not distinguish between LOS andLOF. If you use a termination panel to spare the FP and a termination panelconnector or its associated cabling fails, Passport also generates alarms on the16 E1 ports affected.

To determine the location of the fault, you can set up a manual loopback onthe ports of the FP. If the problem clears, the fault is either with thetermination panel or the multiport aggregate device. You can then set up amanual loopback on the termination panel to further isolate the problem. Ifthe problem clears, the fault is with the multiport aggregate device.

To determine the location of faults for a single E1 port, you can set up amanual loopback on the multi-port aggregate device. If the problem clears,the problem is either with the cabling or with the far end.

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Provisionable 32-port E1 AAL FP components andattributes

This figure shows provisionable 32-port E1 AAL FP components andattributes.

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Figure 68Provisionable 32-port E1 AAL FP components and attributes

PPT 2920 048 AA

Root

Lp

E1

Provisioned (Prov)

Provisioned (Prov)

Channel (Chan)

lineTypeclockingSource

CustomerIdentifierData (CidData)customerIdentifier

AdminInfovendorcommentText

IfEntryProvifAdminStatusifIndex

Provisioned (Prov)timeslots (ts)timeslotDataRateapplicationFramerName

CustomerIdentifierData (CidData)customerIdentifier

IfEntryProv

TrunkConditioning (TC)

ifAdminStatusinIndex

replacementData (data)signalOneDuration (duration)signalOne (sigOne)signalTwo (sigTwo)

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32-port E1 AAL FP OSI statesThe following tables contain information about 32-port E1 AAL FP OSIstates:

• “E1 component state combination” on page 323

• “E1 Channel (Chan) component state combination” on page 324

• “E1 Test component state combination” on page 324

Table 123E1 component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The E1 port is inoperable due to at least one of the followingalarms:

• losAlarm

• lofAlarm

• rxAisAlarm

Unlocked, Enabled, Busy The E1 component is in use.

Locked, Enabled, Idle A lock/lock operator command is in effect. The E1 component isready to service a user. A test is running.

Locked, Disabled, Idle • Some hardware test failed.

• The E1 component is in the locked state.

• External factors render the E1 port inoperable.

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Table 124E1 Channel (Chan) component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle External factors render the Chan component inoperablebecause of E1 alarms.

Unlocked, Enabled, Idle The component is not in use. Provisioning or binding processesare possible causes.

Unlocked, Enabled, Busy The Chan component is in use. The Chan component can onlyservice one user at a time.

Locked, Enabled, Idle A lock operator command is in effect. The Chan component isotherwise ready to service a user. A test is running.

Locked, Disabled, Idle A hardware test failed or the Chan component is in the lockedstate.

Table 125E1 Test component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle The hardware component is unlocked. No resource is availableto the Test component. Start test requests will be rejected.

Unlocked, Enabled, Busy The Test component is in use. An E1, or Chan componentcreates a Test component. The Test component services onlythat particular component. A test stops either when theprescribed timer expires or you issue a stop test command.

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Chapter 40Voice services function processor

See the following sections for information about configuring and testing avoice services function processor (FP):

• “Voice services FP configuration parameters” on page 325

• “Configuring a voice services function processor” on page 326

• “Sparing the Voice services FP” on page 328

• “Voice services FP diagnostic testing” on page 329

• “Provisionable voice services FP components and attributes” onpage 330

• “Voice services FP OSI states” on page 330

Voice services FP configuration parametersWhen configuring a voice services FP, use the following values to setcomponent attributes:

• Card type <cardtype>: 12mVspAal

• Ports <port>: Vsp

The voice services FP contains two types of processing modules. The voiceprocessing module (VPM) processes voice and voice band data. The signalprocessing module (SPM) processes CAS and CCS information (support forsignaling types depends on the software capabilities).

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Configuring a voice services function processorTo provision a voice services FP, set thecardTypeattribute first and then linkan LP to the slot on the shelf before you add a port. When you add a port, thesystem automatically provisions all of thePModule subcomponents. Thesystem also sets themoduleType attribute for eachPModule component.

The setting for eachmoduleTypeattribute matches the placement of hardwaremodules on the version of the FP that supports 720 timeslots and containsnine VPMs and one SPM. If you are configuring a voice services FP thatcontains fewer VPMs, you must change the configuration to correctly reflectthe number of VPMs and their positions on the FP. The table "Settings forPModule components" on page 326 shows how to configure each version ofthe FP.

Procedure 13Configuring a voice services function processor

1 Follow the steps in the procedures "Configuring a new function processor(FP)" on page 31 and "Provisioning a new logical processor (LP)" on page32.

These steps ensure that you set the cardType attribute first. These stepsalso ensure that you link the LP to a slot on the shelf before you add aport.

2 Activate configuration changes. See the procedure "Activatingconfiguration changes" on page 35.

3 Add a port to the LP.

add lp/<n> Vsp

Table 126Settings for PModule components

moduleTypeattribute setting

PModule components3 VPM version

PModule components6 VPM version

PModule components9 VPM version

none 1, 2, 7-12 1, 2, 10-12 1, 2

spm 3 3 3

vpm 4-6 4-9 4-12

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where:<n> is the LP number you want to associate with the voice services FP.

The system automatically provisions twelve PModule componentsbeneath the Vsp component. The system sets the moduleType attributefor components PModule/1 and PModule/2 to none. The system sets themoduleType attribute for PModule/3 to spm. Components PModule/4through PModule/12 are set to vpm.

Passport dynamically creates one processing block (PBlock component)for each PModule component set to spm. Passport creates two PBlockcomponents for each PModule component set to vpm.

4 Verify the number of VPMs on the FP.

display -o lp/<n> Vsp PModule/*

where:<n> is the LP number associated with the FP

The value of the insertedModuleType attribute for each PModulecomponent specifies the actual hardware on the FP. If the failureCauseattribute is set to mismatch for any of the components, you must changethe setting for each of these PModule components to match the typeindicated by the insertedModuleType attribute. For FPs that contain fewerthan 9 VPMs, you must set the moduleType attribute for all mismatchedcomponents to none.

5 If necessary, set the moduleType attributes for the empty PModulecomponents to none.

set lp/<n> Vsp PModule/<m> moduleType none

where:<n> is the LP number associated with the FP<m> is a PModule component that does not contain a VPM. See the table"Settings for PModule components" on page 326.

6 If you did not set the cardtype attribute before you linked an LP to that sloton the shelf, you must provision the PModule components manually. Thesystem only provisions the component PModule/1 and sets itsmoduleType attribute to none.

add lp/<n> Vsp PModule/<m>

set lp/<n> Vsp PModule/<m> moduleType <type>

where:<n> is the LP number<m> is the instance value of a processing module

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<type> is none, spm, or vpm. See the table "Settings for PModulecomponents" on page 326.

You must provision all PModule components.

7 Add an Nsta component.

add Nsta/<m>

where:<m> is value between 1 and 15999

8 Connect the Nsta component to the voice services FP.

set Nsta/<m> linkToServer lp/<n> Vsp

where:<m> is value between 1 and 15999<n> is the instance value of the LP provisioned in step 3.

9 Activate configuration changes. See the procedure "Activatingconfiguration changes" on page 35.

Sparing the Voice services FPAll versions of the voice services FP support one-for-one sparing. Allversions also have the same card type: 12mVspAal. To spare all of theconnections for a given FP, you must always spare the voice services FP witha version of the FP that contains the same number of VPMs.

To verify that the number of VPMs on the spare FP matches the active FP, youcan display and compare the values for theinsertedModuleType attributes.See "Determining the number of VPMs on a voice services FP" on page 328.

Procedure 14Determining the number of VPMs on a voice services FP

1 Display the operational attributes of the PModule components for eachFP.

display lp/<n> Vsp PModule/*

where:<n> is the LP number associated with the FP

The value of the insertedModuleType attribute for each PModulecomponent specifies the actual hardware on the FP and can be vpm,spm, or none. To ensure successful sparing, the settings for both FPsmust match.

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Voice services FP diagnostic testingYou can test the signal path through every processing module on a voiceservices function processor. The test inserts ATM cells at the CQC and loopsthe cells through all the processing blocks on the FP. The test compares thecells received with the original data and calculates a bit error rate.

Procedure 15Testing a voice services function processor

1 Lock the function processor.

lock Vsp

2 Set the duration of the test.

set Vsp Test duration <m>

where:<m> is the number of minutes you want the test to run

3 Optionally, enter text for record purposes.

set Vsp Test purpose <text>

where:<text> is text you want to record about the test

4 Start the test.

start Vsp test

5 Optionally, display statistics as the test runs.

display Vsp Test Results

6 Optionally, stop the test at any time.

stop Vsp test

7 After the test, view the test results.

display Vsp Test Results

For information about test result attributes, see “Port test results and theirmeaning” on page 64.

8 Unlock the function processor.

unlock Vsp

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Provisionable voice services FP components and attributesThis figure shows the provisionable components and attributes for the voiceservices FP.

Figure 69Provisionable voice services FP components and attributes

Voice services FP OSI statesThese tables contain information about the voice services FP OSI states.

Table 127Vsp component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle There has been a hardware failure on the processor card.

Unlocked, Enabled, Idle This transitional state occurs before the component becomesactive.

Unlocked, Enabled, Active The component is operational. The processor card can carrytraffic.

(Sheet 1 of 2)

PPT 2920 046 AA

EM

Lp

Provisioned (Prov)

VoiceServicesProcessor (Vsp)

Provisioned (Prov)

ProcessingBlock (PBlock)

linkToApplication

moduleType (modType)

ProcessingModule (PModule)

Test

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Locked, Enabled, Idle This transitional state occurs an operator locks the component.This state precedes the Locked, Disabled, Idle state.

Locked, Disabled, Idle The component has been locked by an operator.

Table 128PModule component state combination

Combination (Administrative,Operational, Usage)

Details

Unlocked, Disabled, Idle There has been a hardware failure on the processor card.

Unlocked, Enabled, Idle No services have been allocated to the component.

Unlocked, Enabled, Active At least one service has been allocated to the component.

Locked, Disabled, Idle The component has been locked by an operator.

Table 127 (continued)Vsp component state combination

Combination (Administrative,Operational, Usage)

Details

(Sheet 2 of 2)

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Passport 7400, 8700

Function Processor Configuration andTesting Guide

Release 2.0

Copyright © 2000 Nortel Networks.All Rights Reserved.

NORTEL, NORTEL NETWORKS, the globemark design, theNORTEL NETWORKS corporate logo, DPN, DPN-100 andPASSPORT are trademarks of Nortel Networks.

Publication: 241-5701-610Document status: StandardDocument version: 2.0S1Document date: July 2000Printed in Canada