polarizing microscope i (a, b1, b2) b3
TRANSCRIPT
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
A.
B.
C.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Zn-
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Professor Razeghi
SiC
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
polarizer
analyzer
add.
analyzer
O3
O1: micropipe O2, O3: no double refraction points
A
B
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
polarizer
analyzer
add.
analyzer
O3
X' : longbar fastwave
Z' : shortbar slowwave
O1: micropipe O2, O3: no double refraction points
Slip Plane
dislocation line
compressiontension
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
A.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
B.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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Indicatrix �
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Crossed polars �
Retardation�
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P21,21 �
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Compensation�
Test plate�
Indicatrix �
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Biot fresnel's law�
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B.
B-1
B-1
B-2
B-3
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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c-axis
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B-1
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Web
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Web
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
a b
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
CaCO3;
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B''
O E
O E a b
A'
A
A''
a
B'
A
B''
b
O E
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
CaCO3;
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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Sample
B-2
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
B-2
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Retardation -3 R (retard) Retardation
R d n2 n1
R
R = nλ (n=0, 1, 2R = n λ
R = d(n2-n1)
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
460 nmR = 230 0 nm
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
530nm
760 nmμ
300 nm
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
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nm �
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Na D 589.3 nm 1/4 R R=147.3 nm Na D 1/4 test plate -2 X' Z' 1/4
X' Z' X' Z'
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Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Quartz wedge R
R R
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
6 longation, Zone character �
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Z.C. Z.C.
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
6 (optical orientation) elongation, Zone character �
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Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
Polarizing Microscope I (A, B1, B2)
Nagoya Institute of Technology
c Z
Y
X
B-3.