near-field imaging

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Near-field imaging Tip-sample distance was maintained about 5nm while the tip scans the surface topography Transmitted light from the Nano-LED is measured by a photon counter Topographic and optical resolution were measured to be approximately 50nm and 500n Conclusions We fabricated nano-scale light source on the tip of a MEMS silicon probe The probe successfully traced nano-scale topography of the sample. Transmitted light through sample was recorded as the probe scan the sample References [1] A.P. Alivisatos J Phys Chem 100, 13226 (1996) [2] R. A. M. Hikmeta, D. V. Talapin and H. Weller, J. Appl. Phys. 93 3509 (2003) [3] G.T. Dagani, J.R. Fakhoury, W.G. Shin, J.C. Sisson and X.J. Zhang, proc Micro-TAS 1411(2006) [4] W.S. Chang, J. Kim, S.H. Cho and K.H. Whang, Jpn. J. Appl. Phys. 45 2083 (2006) [5] K. Karraia and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995). Publications [1] K. Hoshino, L.Rozanski, D. VandenBout and X.J. Zhang, Proc. IEEE MEMS 2007 [2] K. Hoshino, L.Rozanski, D. VandenBout and X.J. Zhang, Journal of Microelectro mechanical systems (accepted) [3] K. Hoshino, A. Gopal. D. Ostrowski, L.Rozanski, A. Heitsch , R. Patel, B Korgel, D. VandenBout and X.J. Zhang, Proc. IEEE MEMS 2008 (accepted) Introduction We have built a nanoscale light emitting diode (LED) on a silicon MEMS probe for near-field scanning optical microsopy (NSOM) The LED was made of semiconductor nano- particles (CdSe/ZnS core-shell nanoparticles [1,2]) The probe is suitable for nano-scale imaging and patterning of functional biomaterials [3,4]. Light source characteristics LED fabricated on the probe tip emitted light Clear diode properties were measured for current-voltage and lignt intensity-voltage relationship Several emission wavelengths have been achieved EPDT: INTEGRATION OF LIGHT EMITTING NANO-PARTICLES ON SCANNING PROBE FOR NEAR FIELD IMAGING AND NANOPATTERNING OF BIOMATERIALS Kazunori Hoshino 1,3,4 , Lynn Rozanski 2,4 , David A. Vanden Bout 2,4 and Xiaojing Zhang 1,3,4 1 Department of Biomedical Engineering, 2 Department of Chemistry and Biochemistry Microelectronics Research Center 3 and Center for Nano and Molecular Materials Science and Technology 4 , The University of Texas at Austin, USA

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Trapped Nano-particles. CdSe nanoparticle. EPDT: INTEGRATION OF LIGHT EMITTING NANO-PARTICLES ON SCANNING PROBE FOR NEAR FIELD IMAGING AND NANOPATTERNING OF BIOMATERIALS. Kazunori Hoshino 1 ,3,4 , Lynn Rozanski 2 ,4 , David A. Vanden Bout 2 ,4 and Xiaojing Zhang 1 ,3,4 - PowerPoint PPT Presentation

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Page 1: Near-field imaging

Near-field imaging• Tip-sample distance was maintained about 5nm while the tip scans the surface

topography

• Transmitted light from the Nano-LED is measured by a photon counter

• Topographic and optical resolution were measured to be approximately 50nm and 500n

Conclusions• We fabricated nano-scale light source on the tip of a MEMS silicon probe

• The probe successfully traced nano-scale topography of the sample.• Transmitted light through sample was recorded as the probe scan the sample

References[1] A.P. Alivisatos J Phys Chem 100, 13226 (1996)

[2] R. A. M. Hikmeta, D. V. Talapin and H. Weller, J. Appl. Phys. 93 3509 (2003)

[3] G.T. Dagani, J.R. Fakhoury, W.G. Shin, J.C. Sisson and X.J. Zhang, proc Micro-TAS 1411(2006)

[4] W.S. Chang, J. Kim, S.H. Cho and K.H. Whang, Jpn. J. Appl. Phys. 45 2083 (2006)

[5] K. Karraia and R. D. Grober, Appl. Phys. Lett. 66, 1842 (1995).

Publications[1] K. Hoshino, L.Rozanski, D. VandenBout and X.J. Zhang, Proc. IEEE MEMS 2007

[2] K. Hoshino, L.Rozanski, D. VandenBout and X.J. Zhang, Journal of Microelectro mechanical systems (accepted)

[3] K. Hoshino, A. Gopal. D. Ostrowski, L.Rozanski, A. Heitsch , R. Patel, B Korgel, D. VandenBout and X.J. Zhang, Proc. IEEE MEMS 2008 (accepted)

Introduction• We have built a nanoscale light emitting diode (LED) on a silicon MEMS

probe for near-field scanning optical microsopy (NSOM)

• The LED was made of semiconductor nano- particles (CdSe/ZnS core-shell nanoparticles [1,2])

• The probe is suitable for nano-scale imaging and patterning of functional biomaterials [3,4].

Light source characteristics• LED fabricated on the probe tip emitted light Clear diode properties were

measured for current-voltage and lignt intensity-voltage relationship

• Several emission wavelengths have been achieved

EPDT: INTEGRATION OF LIGHT EMITTING NANO-PARTICLES ON SCANNING PROBE FOR NEAR FIELD IMAGING AND NANOPATTERNING OF BIOMATERIALS

Kazunori Hoshino1,3,4, Lynn Rozanski2,4, David A. Vanden Bout2,4 and Xiaojing Zhang1,3,4 1Department of Biomedical Engineering, 2Department of Chemistry and Biochemistry

Microelectronics Research Center3 and Center for Nano and Molecular Materials Science and Technology4, The University of Texas at Austin, USA

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Optical imaging Topographic imaging

Light intensity I-V characteristics Light intensity and current

Figure 1. Nano-scale light source on a silicon probe

Figure 3. light-source characteristics

Figure 4. Experimental NSOM set up

Figure 5. Obtained topographic and optical images

Optical image

2µm

Violet RedYellowGreenTurqoizBlue

Nano-LEDs with different emission wavelengths

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Photosensor

Silicon probe

z-control(topography)

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x-y scan(stage)

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Force sensingtuning fork

Nano LED

CdSe nanoparticle

Figure 2. CdSe nanoparticles were trapped at the tip

Polarization measurement

Topographical image

SEM image

Distance measurement