References 1. A. Gondhalekar, E. Holzhauer, and N. R. Heekenherg, Phys. Lett.

A: 46, 229 (1973). 2. A. Gondhalekar, N. R. Heckenberg, and E. Holzhaur, IEEE J.

Quantum Electron. QE-11,103 (1975). 3. J. L. Lachamhre, P. Lavigne, M. Verreault, and G. Otis, IEEE J.

Quantum Electron. QE-14 170 (1978). 4. A. Girard, Opt. Commun. 11,346 (1974). 5. P. W. Smith, T. d. Bridges, E. G. Rurkhardt, and 0. R. Wood, Appl.

Phyr. I.ett. 21,470 (1972).

Computer Security Initiative Sem., NBS, Gaithershurg D. Bronstad, N B S , A-265 Tech. Bldg., Wash., D.C. 20234

Carbon Dioxide Lasers course, Wash., D.C. Laser Inst. Am., PO. Box 9000, Wac", Ter . 76710

Monostatic heterodyne lidar performance: the effect of the turbulent atmosphere; correction

Steven F. Clifford and Stephen Wandzura Films & Coatings for Technology course, Los Angeles

Cont. Ed. Inst., 10889 Wilshire Blvd ,Suite 1031, Los Angeles, Cali/. 90024

i s with University of Colorado, Cooperative Institute for Research in Environmental Sciences, Boulder, Colorado 80303. Received 27 February 1981.

Inversion Methods in Remote Sensing course, Alexandria, Va. N Reynolds, IFAORS, P O Box P , Hampton, Va 23666

The curves plotted in Fig. 1 of our recent paper' are Fnl(1 + P ) (solid curves) a n d Fl!(l + 02) (dashed curves); n o t Fn a n d Fi a s s ta ted in t h e paper.

Color Control for Cost & Quality Sem., Rochester V. Johnson, RIT-GARC, 1 Lomb Memorcol Dr., Roeh- ester,N.Y. 14623

Reference 1. S. F. Clifford and S. Wandzura, Appl. Opt. 20,514 (1981).

Computer Networking Symp., NBS, Gaithersburg B Parker, N B S , A-215 Admins. Rldg., Wash., D.C. 20234

Meetings Calendar June

? Am. Astronomical Soc, Mtg., Calgary L. W . Frederick, Box 3818, IJniuersity Station, Charlottrsuille, Vo. 22903

Electron Microscopy in the Biological Sciences course, Woods Hole, Mass. Marine Aiologieol Lab., Woods Hole, Mass. 02.543

Laser 81-5th Int. Cong. & Int. Exhibition, Munich Kallman Assoc., 30 Journal Sq. , Jersey City, N J . 07306 Gradient Index Optical Imaging Systems, OSA

Topical Mtg., Honolulu OSA, 1816 Jefferson P1. N. W. , Wash., D.C. 20036

Quality Control for Photographic Processing, Rochester V. Johnson, RIT-GARC, 1 Lomb Memorial Dr., Rochester, N. Y 14623 Laser Applications in Materials Processing course, Wash.,

D.C. Laser Inst. Am., PO. Box 9000, Wnco, Ter . 76710

5th Rare Earth-Cobalt Magnet Workshop, Roanoke, Va. K. S t m u t , Magnetics Lab. KL-365, 11. Dayton, Ohio 45469 Laser-Optics 3, Andover, Mass. M. Fournier, 11. Lowell,

Cont. Ed., 1 1Jniver.sity Aue., Lowell, Mass. 01854

34th SPSE Ann. Conf., N.Y. R. Wood, SPSE, Central P O . Boz 28327, Wash., D.C. 20005

Int. Conf. Fourier Transform Infrared Spectroscopy, S. Carolina U. H. Sakai,Astro. Res. Facility, U Moss., Amherst, Mass. 01003

2nd Int. Conf. Precision Measurement and Fundamental Constants, NBS, Gaithershurg B. Taylor, NUS, A- 258, Metrology Rldg., Wash., D.C. 20234

Integrated Optics Fabrication-31st ECC, Atlanta A. Naumaan, Dept. ECE, 8.98 Rhodes Hall, Loc. #30, U. Cincinnati, Ohio 45221

lSth Int. Symp. Remote Sensing of Environment, Ann Arbor Remote Sensing Ctr., Enuironmental Res. Inst. Mich., P.O. Box 8618, Ann Arbor, Mich 48107 continued onpagr 1,510

1502 APPLIED OPTICS ! Vol.20. No. 9 / 1 May 1981