making the most of your infiniium 80000 series...

Making the Most of Your Infiniium 80000Series Scope’s Acquisition Memory

Application Note 1568

Introduction

Agilent Technologies Infiniium80000A Series oscilloscopesprovide industry-leading signal integrity and probing in conjunction with the industry’s widest variety ofapplication-specific softwarepackages. These advantages makethe 80000A Series the superiorchoice for many applications.

Some applications requiredeep-memory acquisitions froman oscilloscope to achieve thedesired measurements. Thisapplication note explainstechniques that will help youmaximize the measurementcapabilities of your Infiniium80000A Series scope’s acquisitionmemory. Using these techniques,you can use the 80000A Series to make a wide array ofdeep-memory measurements. Youwill see how the signal integrity,probing and application softwareof the Agilent system let youmake more accurate andrepeatable deep-memorymeasurements, so you cancharacterize your high-speeddesigns with confidence.

Table of Contents

Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

Advantages of Using an Infiniium 80000 Series Scope . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Making the Most of Your Acquisition Memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4Measurement techniques using the 2-Mpoint high-speed memory (up to 40 GSa/s) . . . . . . . . . . 4

Basics: Number of UIs, amount of time capture, PRBS size . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4

Example 1: Characterizing the spread spectrum clock of a 3-Gbs SATA system . . . . . . . . . . . . 4

Example 2: Low-frequency jitter components . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Measurement techniques using the 64-Mpoint lower-speed memory (≤ 4 GSa/s) . . . . . . . . . . . . 6

Basics: Amount of time capture, cycles of a 100-MHz ref clock, etc. . . . . . . . . . . . . . . . . . . . . . . 6

Example 3: Phase jitter measurements for reference clocks . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6

Example 4: Noise measurement on power supplies . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8

Example 5: Viewing compliance and training patterns on high-speed serial signals . . . . . . . . . 8

Measurement techniques using repetitive acquisitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Basics: Repetitive vs. single acquisitions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Example 6: Low-frequency jitter measurements . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9

Example 7: Bounded uncorrelated jitter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 10

Example 8: EZJIT Plus arbitrary data mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11

Measurement techniques using segmented memory . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Basics: How segmented memory works . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12

Example 9: Thirty two 2-Mpoint segments at 40 GSa/s sample rate . . . . . . . . . . . . . . . . . . . . . 12

Example 10: Four thousand 10-kpoint segments at 4 GSa/s sample rate . . . . . . . . . . . . . . . . . 12

Conclusion . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13

Support, Services, and Assistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15

2

Advantages of Using an Infiniium 80000 Series Scope

The advanced signal integrity,probing and application softwareselection of Agilent’s Infiniium80000A Series and InfiniiMax IIprobing system can help youmake better measurements andincrease your design margins.

Signal integrity: To help youmake accurate and repeatablemeasurements, the Infiniium80000A Series scopes andInfiniiMax II probing systemprovide a variety of signalintegrity advantages, includingthe industry’s lowest noise floor,(see figure 2) lowest jittermeasurement floor, lowest triggerjitter less than 500 fs rms and

Figure 1. The Infiniium 80000A Series low noise, low jitter, lowtrigger jitter and flat frequency response produce the industry’smost accurate eye diagrams for a real-time scopes.

Figure 2. Example of making a noise floor measurement and usingthe noise reduction capability. Here, we see 1.8 mV rms noise at100 mV/div and 6 GHz bandwidth, representing the industry’slowest noise floor.

flattest frequency response 0.7 psrms TIE. These foundationalcapabilities are crucial forachieving accurate and repeatable measurements.Superior signal integritymaximizes your design margins,because you are not wasting anymeasurement accuracy due topoor noise, jitter or frequencyresponse of the scope or probing system.

You can easily observe the lownoise floor of the 80000A Seriesby disconnecting any signals fromthe scope and turning on infinite

persistence to view the magnitudeof the intrinsic scope noise overtime. To quantify the magnitudeof the noise, use the verticalhistogram capability and look at the standard deviation of thehistogram for a measurement ofthe noise in rms volts. You needto use the standard deviationmeasurement because thepeak-to-peak noise may appearlarger on higher-throughputoscilloscopes, even though theiractual noise floor is lower thanthat of other oscilloscopes.

3

Higher levels of intrinsic scope noise lead to increasedmeasurement errors on everymeasurement. The primarysource of jitter measurementerror is voltage noise in themeasurement system. Agilent’sunique noise reduction capabilityreduces intrinsic scope noise evenfurther by reducing the scope’sbandwidth to the requiredmeasurement bandwidth.

The InfiniiMax II Series probeoffers you several advantages, as well, including the low noiseand flat frequency responsementioned above, which areimportant for making accurate,repeatable measurements. TheInfiniiMax II Series also offers the

Advantages of Using an Infiniium 80000 Series Scope (continued)

industry’s widest selection ofprobe amplifier bandwidths(currently six) and the industry’swidest variety of different probehead types (currently nine) sothat you can match the probesystem to your required usemodels and budget. InfiniiMax IIis also the only probing system tooffer the full 13 GHz bandwidthfor the differential-solder-in,differential-browsing anddifferential-SMA use models. Sinceits inception, the award-winningInfiniiMax probe system hasprovided maximum performancewith unmatched usability so thatyou can be certain that you aremeasuring your circuit and notyour scope probe.

The application software for theInfiniium 80000A Series is theindustry’s largest – you can choosefrom 22 application packages thathelp you tailor the capabilities ofthe oscilloscope to your specificmeasurement requirements.Application-specific softwaresolutions include compliance testpackages for industry standardssuch as PCI Express, DDR, FBD,SATA, SAS, FC, DVI, HDMI, USB,FW and Ethernet, as well as moregeneral-purpose jitter and serialdata analysis packages. Agilent isalso the industry's only vendor tooffer innovative packages forultra-wideband vector signalanalysis and noise reduction.

Application software package

E2681A EZJIT jitter analysis (option 002)

N5400A EZJIT Plus jitter analysis (option 004)

E2690B Amherst oscilloscope tools

E2688A SDA high-speed serial data analysis(option 003)

N5391A I2C/SPI serial data analysis (option 021)

N5402A CAN serial data analysis

N5392A Ethernet compliance (updated)

N5393A PCI Express compliance

N5394A DVI compliance

N5399A HDMI compliance

N5409A Fully buffered DIMM compliance

N5410A Fibre Channel compliance

N5411A SATA I/II compliance

N5412A SAS compliance

N5413A DDR2 clock characterization

N5416A USB compliance (updated)

Fire-Wire compliance (Quantum Parametrics)

89601A Vector signal analysis

N5403A Noise reduction (option 005)

E2625A Communications mask test kit

E2699A My Infiniium integration package(option 006)

E2682A Voice control option

Figure 4. Infiniium 80000A Seriesapplication software packages as ofNovember 2005. Additional applicationpackages are being added on a regular basis.

Figure . An InfiniiMax probe amplifiershown with its nine different probe heads

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Making the Most of Your Acquisition MemoryMeasurement techniques using the 2-Mpoint high-speed memory (up to 40 GSa/s)

Measurement techniques usingthe 2-Mpoint high-speed memory(up to 40 GSa/s)

Basics: Number of UIs, amount of time capture, PRBS sizeThe Infiniium 80000A Seriesoffers a maximum memory depthof 2 Mpoints for sample rates up to 40 GSa/s. This results in atime capture window of 50 µs for40 GSa/s acquisitions and 100 µsfor 20 GSa/s acquisitions. This isa significant amount of time forhigh-speed electronic systems.This time capture window willacquire 250,000 unit intervals of a 5 Gbs signal sampled at40 GSa/s and 250,000 unitintervals of a 2.5 Gbs signalsamples at 20 GSa/s. This is anentire 217-1 PRBS sequence in asingle acquisition. You can easilyacquire millions of unit intervalswith a few repetitive acquisitions.

Example 1: Characterizing the spread spectrum clock of a 3-GbsSATA systemThis example shows theacquisition and measurements on a full spread spectrum clockcycle of a 3-Gbs SATA signal.Automated Infiniiummeasurements precisely measurethe SSC modulation frequency(33.1 kHz) and the modulationdepth (14.3 Mb/s). The SATA SSC modulation frequency of33 kHz is representative of the SSC frequencies found inmany standards. Statisticalmeasurement information can beautomatically collected over manyacquisition cycles for profilinghundreds of SSC cycles. Forsystems with high levels of jitter,you also can use cursor-basedmeasurements.

Figure 6. Spread spectrum clock measurements for a 3-GbsSATA system

Required Number of UI captured Max PRBS sequence Bit rate sample rate with 2 Mpts with 2 Mpts

1 Gbs 10 GSa/s 200,000 217-1

2.5 Gbs 20 GSa/s 250,000 217-1

3 Gbs 20 GSa/s 300,000 218-1

5 Gbs 40 GSa/s 250,000 217-1

6 Gbs 40 GSa/s 300,000 218-1

8.5 Gbs 40 GSa/s 425,000 218-1

Figure 5. Number of unit intervals captured in a single acquisition as a function of the bit rate

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Making the Most of Your Acquisition Memory (continued)

Measurement techniques using the 2-Mpoint high-speed memory (up to 40 GSa/s)

Example 2: Low-frequency jittercomponentsFrequently, engineers want deep memory so they can seelow-frequency jitter components.However, PLL clock recoverytechniques used in high-speedserial receiver designs rejectlow-frequency jitter.

For example, the chart shows the jitter transfer function of a first-order PLL with a loop bandwidth of 1.5 MHz.High-frequency jitter is nottracked by the recovered clock andis passed to the measurement.Low-frequency jitter is tracked bythe PLL and is removed from thejitter measurement. At 1.5 MHz,the jitter is attenuated 3 dB. At

33 kHz, the jitter is attenuated13 dB. Deep memory is notrequired in these measurementsbecause low-frequency jitter is attenuated.

Software clock recoverytechniques require some time for the clock to lock to the data.Since the clock is not maintainedin hardware, each acquisitionrequires the clock recovery tosync with the data. Agilent usesfive time constants to insure thatthe clock is locked to the data. So the amount of time it takes for the clock to lock is 5/loopbandwidth. For example, with a1.5 MHz loop bandwidth, 3.3 µs arerequired. No jitter measurements

are taken during this portion ofthe acquisition. At 20 GSa samplerate, this will consume 66,666points. This is a small fraction of the 1 M available, leaving most of the acquisition availablefor measurement.

If you want to pass all jitter, bothlow and high frequency, to thejitter measurement, you should useconstant-frequency clock recovery.With constant-frequency clockrecovery, all jitter is passed. Withthe 2 M memory that the 80000ASeries offers at 40 GSa, one cycleof 20 kHz jitter may be observed.This is below the 33 kHzmodulation frequently used forspread spectrum modulation.

Jitt

er M

easu

red/

idea

l (D

b)

0

-5

-10

-15

-20

-25

1.00E+05 1.00E+06 1.00E+07

Frequency (log Hz)

Jitter Transfer FunctionFirst Order PLL, 1.5 MHz Loop BW

54855 Measured PLL Response Ideal PLL Response

Figure 7. Jitter transfer function of a first-order PLL

6


Measurement techniques using the 64-Mpoint lower-speed memory (≤ 4 GSa/s)

Measurement techniques usingthe 64-Mpoint lower-speedmemory (≤ 4 GSa/s)

Basics: Amount of time capture,cycles of a 100-MHz ref clock, etc.The Infiniium 80000A Seriesoffers a maximum memory depthof 64 Mpoints for sample rates upto 4 GSa/s. This results in a timecapture window of 16 ms for4 GSa/s acquisitions. This is avery large amount of time formid-speed electronic systems.This time capture window willacquire 1,600,000 cycles of a100-MHz reference clock sampledat 4 GSa/s and provide frequencyresolution to 62.5 Hz.

Example 3: Phase jitter measurementsfor reference clocksIn this example, we are using the oscilloscope to perform ameasurement trend analysis of the period of a PCI Expressreference clock running at100 MHz. In performing a phasejitter measurement of thereference clock, it is important tonote that a capacitive referenceload of 2 pf is applied to the clock.This load creates a first-orderlow-pass filter with a corner

frequency of 1.33 GHz. This filterattenuates high-frequency energyabove the Nyquist frequency of 2 GHz, enabling accuratemeasurements with a 4 GSa/ssample rate. Assuming the PLLinput of the reference clockreceiver has similar responsecharacteristics to the complianceload, we are able to measure the clock using this reducedsample rate.

Using a sample rate of 4 GSa/shas significant advantages for measuring phase jitter. In PCI Express, for example, it isnecessary to measure eye closuredue to phase jitter on thereference clock between 1.5 and22 MHz. The spectral energyrepresented by this band of jitteris very close to the noise floor of typical real-time oscilloscopeinstrumentation. The Agilent DSO80000 Series scopes have thelowest noise floor in the industryand when you use only as muchsample rate as you need to makethe phase jitter measurement, youare able to make more accuratemeasurements compared to usinga faster (and noisier) sample rate.

7



Figure 8. 13 Mpoint sample of a PCI Express reference clock witha measurement trend of the clock period.

Figure 9. Reference clock measurement as required in thePCI Express reference clock specification

In the example below, we havetaken a 13 Mpoint sample of areference clock giving us a 3 msmeasurement window of the clockperiod trend. By taking an FFT ofthe measurement trend and thenapplying the appropriate filterwithin the frequency domain, weare able to measure the amount ofeye closure of the reference clockwithin the critical 1.5-22 MHzband. For the Agilent PCI Expresscompliance test software (N5393A)this measurement is performedwith software provided by thePCI-SIG. No industry standardcompliance test (such as PCIExpress, fully buffered DIMM,DDR, SATA, SAS, FC, HDMI, DVI,USB, FW and Ethernet) requiresgreater memory depth than thatoffered by the 80000A Series.

Original clock signal

Measurement trendof the clock period

FFT of original clockperiod measurementtrend

After application ofband-pass filter

8



Example 4: Noise measurement onpower suppliesIn this example, we are lookingfor noise on a 3.3-V power supply.Power supply noise is typicallyless than 2 GHz, and thereforeyou do not need more than4 GSa/s sample rate to capture it.(If you want, you can verify thatthere are no higher-frequencycomponents using an FFT at40 GSa/s). Using a 16.8 Mpointcapture of the signal, we use an FFT to easily identify theswitching supply frequency at 135.7 kHz with a resolution of 238 Hz.

Example 5: Viewing compliance andtraining patterns on high-speed serial signalsThis example shows theacquisition of a 2.5 Gb/s PCIExpress compliance pattern.Using a sample rate of 4 GSa/s,we are able to capture more than2 ms of the signal. The 4 GSa/s issufficient sample rate to displaythe decoded compliance patternsymbols (logic level sampling).You can use logic level samplingto capture very long lengths ofbinary serial data patterns. Thehigher 40-GSa/s sample rate canbe used for signal integrity andparametric measurements.

Figure 10. Identifying a 135.7 kHz switching supply frequency

Figure 11. Logic level sampling of a 2.5 Gbs PCI Express signal

9


Measurement techniques using repetitive acquisitions

Measurement techniques usingrepetitive acquisitions

Basics: Repetitive vs. singleacquisitionsYou can use repetitiveacquisitions to make manymeasurements that you mightthink would require deepermemory. A single, contiguousacquisition is rarely required. Ifyou have a measurement that youbelieve requires a single longacquisition, consider if themeasurement could be mademore effectively using multipleshorter acquisitions. Mostdeep-memory measurements areinherently statistical in nature;they are made on events thatoccur many times within theacquisition memory record. In these cases, repetitiveacquisitions can quickly generatemillions of measurements on the event of interest and themeasurement will be asstatistically valid as if it wastaken in a single contiguousacquisition record. Lower-noiseoscilloscope and probing systemssuch as Agilent’s 80000A Seriesand InfiniiMax probes willactually provide superiormeasurement results for suchstatistical measurements.

Example 6: Low-frequency jittermeasurementsJitter is always measured relativeto a specific time reference that isdetermined by the clock recovery(CR) method chosen for themeasurement. Constantfrequency clock recovery, forexample, measures jitter relativeto the oscilloscope’s internal timebase reference. The CR method isacceptable for short to moderatewaveform acquisition recordlengths, but is not acceptable forlong waveform record lengthsbecause the long-term phaseinstability of the transmitter’sclock reference or oscilloscope’sinternal time base can corruptthe measurement results. You can eliminate long-term phaseinstability errors using one of thevarious software phase-lockedloop (PLL) clock recoverymethods provided in the EZJITPlus jitter analysis application.PLL clock recovery is commonlyused because it exhibits ahigh-pass filtering effect on themeasured jitter, duplicating thehigh-pass filtering effect of the

physical CR circuit designed toreceive the data signal under test.

Sometimes, however it is desirableto measure the very-low-frequencyjitter caused by power supplynoise or clock phase instabilitythat would be filtered out by theconstant-frequency or PLL clockrecovery methods. Figure 12shows a low-frequency jittermeasurement using the EZJITPlus explicit clock recoverymethod. The explicit clockrecovery method measures thejitter between two input signals.In this case, one is a known stablereference clock and the other isthe 1.0625 GHz clock signal undertest. In this example, we usedEZJIT Plus software to measureknown injected 60-Hz sinusoidalperiodic jitter (PJdd) of 23.81 pson the clock signal under testusing multiple acquisitions. Themultiple acquisitions allow thescope to capture various sectionsof the very low frequency jitterovertime.

Figure 12. Low frequency jitter measurement using EZJIT Plus

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Example 7: Bounded uncorrelatedjitterBounded-uncorrelated jitter(BUJ) is a type of jitter that is not correlated to the transmitteddata pattern, nor is it periodic intime. However, its probabilitydensity function (histogram) isnon-Gaussian and bounded inwidth. BUJ events commonlyoccur infrequently in time. Forthese reasons, this type of jitter is difficult to measure using anyjitter measurement method thatextrapolates total jitter from asmall sample of the waveformunder test. The EZJIT Plusmeasurement algorithm wasspecifically designed to includethe contributions of infrequentBUJ in its measurement results. Unlike competing jittermeasurement algorithms, EZJITPlus’s ability to measure BUJ islimited only by the accumulatednumber of waveform transitionsit analyzes. It is not limited by the number of waveformtransitions contained in eachindividual acquisition.

Figures13 and 14 show two BERbathtub measurements of thesame 3.125 Gb/s PRBS signal,which contains about 37 ps ofBUJ. Both graphs were measuredusing the same configuration ofEZJIT Plus. However the first onewas calculated from a singlewaveform acquisition and thesecond one was allowed toaccumulate the jitter informationfrom multiple acquisitions. EZJITPlus represents the directlymeasured portion of the graphwith a blue trace and representsthe extrapolated portion of thegraph with a white trace. Notethat the BUJ is not recognized by the analysis of a singleacquisition, causing the TJ (total jitter) results to be grosslyunderestimated. The analysis ofmultiple acquisitions however,exposes the BUJ and provides a much more accuratemeasurement of TJ.

Jitter measurements areinherently statistical in nature.No amount of deep memory willbe able to directly measure jitterto 10e-12 bit error rate (BER).Only a bit error rate tester(BERT) can accomplish this.Real-time scopes can measure the quantity of jitter in theacquisitions they can gather.Real-time scopes can alsoestimate jitter at low BER byexamining the nature of the jitterand applying these to industryrecognized BER projectionmodels. The more transitions you can measure, the higher yourconfidence will be in the accuracyof the jitter measurements. This is true either for directmeasurement or for jitterestimation. Because jittermeasurements are statistical, the rate of transitions you canmeasure is important, not thememory depth.

Figure 13. BER bathtub projection using only a single acquisition Figure 14. BER bathtub projection with improved accuracy usingmultiple acquisitions

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Example 8: EZJIT Plus arbitrary data modeThe EZJIT Plus jitter analysisapplication provides two differentmethods with which to analyzejitter on clock or data signals:periodic data mode and arbitrarydata mode. Periodic data modecomputes the measurementresults very quickly, but requiresthe input signal’s data pattern tobe periodic. Periodic data mode islimited to analyzing data patternsthat repeat at least 32 timeswithin a single waveformacquisition record. Arbitrary data mode analyzes jitter on allsignals, whether the data patternis periodic or not. Arbitrary data mode enables jittermeasurements on “live”transmission data or periodic test patterns that have patternlengths that exceed the periodicmode requirement of 32 patternsper acquisition. Both the periodicdata mode and the arbitrary data mode accumulate jitterinformation from multipleacquisitions, so the jitter resultswill contain contributions fromall positions within very longdata patterns.

Figure 15. EZJIT Plus jitter measurement performed on a 2^31-1PRBS data pattern using arbitrary data mode

Figure 15 shows the results of anEZJIT Plus jitter measurementperformed on a 231-1 PRBS datapattern using arbitrary datamode. EZJIT Plus arbitrary datamode uses a linear regressiontechnique to determine how theISI jitter at each bit transition isaffected by the bit transitionsthat surround it (ISI filter).

12


Measurement techniques using segmented memory

Measurement techniques usingsegmented memory

Basics: How segmented memory worksThe segmented memory modeallows the user to divide theacquisition memory into a certainnumber of segments at a givenmemory depth. In addition, forthe Infiniium 80000A Seriesscopes, the segmented memorymode allows acquisitionscaptured in the 2-M high-speedmemory to be quickly transferredto the 64-M low-speed memorywith minimal dead time betweenacquisitions. Segmented memoryis ideal for bursty data signals.Segmented memory can be usedto acquire signal regions ofinterest while ignoringuninteresting regions.

Example 9: Thirty two 2-Mpointsegments at 40 GSa/s sample rateIn this example, we have acquired2-M segments at 40 GSa/s in thehigh-speed acquisition memoryand transferred them withrelatively low dead time (4 ms as shown below) to the 64 M oflow-speed acquisition memory.Hence 32 segments can becaptured in a rapid fashion.Segmented memory is notintended for use with jitteranalysis – multiple acquisitionscan be used instead as noted in a previous example. Segmentedmemory is intended for systemswith bursts of signal activity. You can perform functions andmeasurements on the segments,and the segments can be playedrepetitively and saved to memory.

Example 10: Four thousand 10-kpointsegments at 4 GSa/s sample rateIn this example, smaller signalsegments (10 kpts) are saveddirectly to the lower-speedacquisition memory. Twothousand segments are stored fora total capture of 20 Mpts. Thedelay time between segmentcapture is 22 µs in this exampledue to the smaller signal segments.The ability to individually setsample rate, segment depth andnumber of segments provides a great deal of flexibility inconfiguring the scope acquisitionfor a variety of systems withbursts of signal activity.

Figure 16. Segmented memory example with thirty-two 2 Mpointsegments and a dead time between segments of 4 ms

Figure 17. Segmented memory example with two thousand10 kpoint segments and a dead time between segments of 22 µs

13

Conclusion

Agilent’s superior signal integrity,probing and extensive applicationsoftware will improve everymeasurement. For measurementsthat require deep acquisitionmemory, this application note hasshown how the Agilent Infiniium80000A Series can make a wide array of deep-memorymeasurements via the describedmeasurement techniques. The key points:

• The Infiniium 80000A Seriesscopes’ 2 Mpoints ofhigh-speed memory (up to40 GSa/s) provides sufficientcapability for the vast majorityof applications. No industrystandard compliance test (suchas PCI Express, fully bufferedDIMM, DDR, SATA, SAS, FC,HDMI, DVI, USB, FW andEthernet) requires greatermemory depth than thatoffered by the 80000A Series.

• The Infiniium 80000A Seriesscopes’ 64 Mpoints oflow-speed memory (≤ 4 GSa/s)can be used for signals up to2 GHz in bandwidth andprovides a time capturewindow of 16 ms at 4 GSa/s.This provides excellentfrequency resolution forsignals such as referenceclocks. In addition, you can use logic level sampling toextend the capabilities of thelow-speed memory mode.

• A single, contiguousacquisition is rarely requiredfor measurements. Repetitiveacquisitions can be used to improve the accuracy of jitter measurements andcharacterization measurementsthat require measurementstatistics. Sixteen 2-Macquisitions taken on alow-noise oscilloscope andprobing system will deliverbetter results than one 32-Macquisition taken on a noisieroscilloscope and probingsystem. You can use repetitiveacquisitions to make manymeasurements that initiallyappear to require deepermemory.

• You can use segmentedmemory to capture the mostcrucial regions of signalactivity without capturing lessinteresting or idle signalregions. As an example,segmented memory can beused to acquire 32 2-Macquisitions at up to 40 GSa/swith very low dead timebetween acquisitions. Thiscapability can be important formeasuring systems with burstsof signal activity.

If you have a measurementproblem that you believe requiresdeeper acquisition memory thanthat offered in the Infiniium80000 Series, please discuss themeasurement with your Agilentapplication engineer. Acquiringmore acquisition memory thanyou need can be expensive and time consuming. Agilentengineers may be able to suggestan alternative measurementtechnique that uses lessacquisition memory that will giveyou the measurement capabilityyou need.

14

Related Literature

Publication Title Publication Type Publication Number

Infiniium 54850 Series Oscilloscopes Data Sheet 5988-7976EN

Infiniium 54830 Series Oscilloscopes Data Sheet 5988-3788EN

N5400 EZJIT Plus Jitter Analysis Software Data Sheet 5989-0109EN

E2681A EZJIT Jitter Analysis Software Data Sheet 5989-0109EN

E2690B Advanced Time Interval & Jitter Data Sheet 5989-3525ENAnalysis Software

E2688A High-Speed Serial Data Data Sheet 5989-0108ENAnalysis Software

N5391A I2C and SPI Analysis Software Data Sheet 5989-1250EN

N5402A CAN Analysis Software Data Sheet 5989-3632EN

89601A Vector Signal Analysis Software Data Sheet 5989-0947EN

N5392A Ethernet Compliance Test Package Data Sheet 5989-1527EN

N5393A PCI-Express Test Package Data Sheet 5989-1240EN

N5394A DVI Compliance Test Software Data Sheet 5989-1526EN

N5399A HDMI Compliance Test Software Data Sheet 5989-3047EN

N5409A FBD Compliance Test Software Data Sheet 5989-4128EN

N5410A Fibre Channel Compliance Data Sheet 5989-4209EN

N5411A SATA Compliance Test Software Data Sheet 5989-3662EN

N5412A SAS Compliance Test Software Data Sheet 5989-4208EN

N5413A DDR2 Clock Characterization Data Sheet 5989-3195EN

N5416A USB Compliance Test Software Data Sheet 5989-4044EN

E2699A My Infiniium Integration Package Data Sheet 5988-9934EN

Using Agilent InfiniiMax Probes with Configuration Guide 5989-1869ENTest Equipment other than Agilent Infiniium Oscilloscopes

Infiniium 54800 Series Oscilloscope Selection Guide 5968-7141EUSProbes, Accessories and Options

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