kinetic lattice monte carlo simulations of dopant diffusion/clustering in silicon

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Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon Zudian Qin and Scott T. Dunham Department of Electrical Engineering University of Washington SRC Review February 25-26,2002

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Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon. Zudian Qin and Scott T. Dunham Department of Electrical Engineering University of Washington SRC Review February 25-26,2002. Outline. Introduction to KLMC Simulations High Concentration Arsenic Diffusion - PowerPoint PPT Presentation

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Page 1: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Zudian Qin and Scott T. Dunham

Department of Electrical Engineering

University of Washington

SRC Review

February 25-26,2002

Page 2: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Outline

Introduction to KLMC Simulations High Concentration Arsenic Diffusion Acceleration of KLMC Simulations Fermi Energy Level Modeling in Atomistic Scale Random dopant fluctuations (initial results) Summary

Page 3: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Set up a silicon lattice structure (10-50nm)3

Defects (dopant and point defects) initialized

- based on equilibrium value

- or imported from implant simulation

- or user-defined

Kinetic Lattice Monte Carlo SimulationsKinetic Lattice Monte Carlo Simulations

Page 4: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

V

Vacancy Mechanism Interstitial Mechanism

Si

Dopant

Fundamental processes are point defect hop/exchanges.

Kinetic Lattice Monte Carlo SimulationsKinetic Lattice Monte Carlo Simulations

Vacancy must move to at least 3NN distance from the dopant to complete one step of dopant diffusion in a diamond structure.

Page 5: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Tk

EE

B

fi

2exp0

Simulations include B, As, I, V, Bi, Asi and interactions between them.

Hop/exchange rate determined by change of system energy due to the event.

Energy depends on configuration and interactions between defects with numbers from ab-initio calculation (interactions up to 9NN).

Kinetic Lattice Monte Carlo SimulationsKinetic Lattice Monte Carlo Simulations

Page 6: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Kinetic Lattice Monte Carlo SimulationsKinetic Lattice Monte Carlo Simulations

1

1

4

1

N

m jmjt

Calculate rates of all possible processes.

At each step, Choose a process at random, weighted by relative rates.

Increment time by the inverse sum of the rates.

Perform the chosen process and recalculate rates if necessary.

Repeat until conditions satisfied.

Page 7: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Experiments found strong enhancement of diffusivity above 1020 cm-3.

High Concentration Arsenic DiffusionHigh Concentration Arsenic Diffusion

Dunham/Wu found strong D increase using KLMC simulations.

t

xD

6

2

Page 8: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

High Concentration Arsenic DiffusionHigh Concentration Arsenic Diffusion

List et al. found reduced D in long term of simulations with fixed number of Vs in system.

The reason for the discrepancy is the formation of AsnV clusters during the simulation---number of free V drops.

Si

As V

Dunham/Wu did a relatively short simulation before clusters can form. ---Possible transient effects.

Solution: Long term simulations tracking free V concentration.

Problem: Computationally demanding for good statistics.

Page 9: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Once a cluster is formed, the system can spend a long time just making transitions within a small group of states.

state0

state1

state2

state3

~ eV

r01

r10

r23

r12

r21

r32

Acceleration of KLMC SimulationsAcceleration of KLMC Simulations

Page 10: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

state0

state1

state2

state3

~eV

r0k

rk0

rk3

r12

r21

r3k

state K

The solution is to consider the group of states as a single effective state.

States inside the group are near local equilibrium.

kBkB

kBk

kk

TkETkE

jkTkEEjkpj

/exp[

)(/][exp)()(

Acceleration of KLMC SimulationsAcceleration of KLMC Simulations

Page 11: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Comparison of time that a vacancy is free as a function of doping concentration via simulations and analytic function

Both simulations with/without acceleration mechanism agree with the analytic prediction, but acceleration saves orders of magnitude in CPU time.

Acceleration of KLMC SimulationsAcceleration of KLMC Simulations

Page 12: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Equilibrium vacancy concentration increased significantly since the formation energy is lowered due to presence of multiple arsenic atoms.

At high concentration, vacancy likely interacts with multiple dopant atoms. The barrier is lowered due to attraction of nearby dopant atoms.

1

10

100

1000

10000

100000

1E+16 1E+17 1E+18 1E+19

Ar seni c Concent r at i on ( cm- 3)

Norm

aliz

ed V

acan

cy C

once

ntra

tion

(Cv

/Cv0

)

High Concentration Arsenic DiffusionHigh Concentration Arsenic Diffusion

Page 13: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

High Concentration Arsenic Diffusion --- KLMC Results

High Concentration Arsenic Diffusion --- KLMC Results

As seen experimentally, simulations show arsenic diffusivity has strong increase with doping level: polynomial or exponential form.

Effect stronger at lower T, critical for As modeling (Pavel Fastenko).

Page 14: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Fermi Energy Level ModelingFermi Energy Level Modeling

Tk

EE

n

nC

B

FF

ix

iexp

Dopant atoms are ionized (e.g. As+, B-) and exposed to the field.

n

n

q

TkE B

The concentration of charged point defect is a function of Fermi level.

Page 15: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Continuous models derive Fermi level from dopant profiles.

22 4)()(5.0)( iADAD nNNNNxn

At atomistic scale, dopant atoms are discrete. Each donor (acceptor) contributes an electron (hole) cloud around itself.

110 -7 210 -7 310 -7 410 -7

210 19

41019

610 19

810 19

11020

1.2 10 20

5.0

0

3

)(

)/( Length, Debye

8

)/exp()(

pnq

qTkkl

l

lxxn

BSiD

D

D

Fermi Energy Level ModelingFermi Energy Level Modeling

Page 16: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Contributions of all charged dopants and defects add to give the total electron density.

Simulation of in a nonuniform background.

Residence time follows electron density, as predicted by continuous model.

0

1E+20

2E+20

3E+20

4E+20

5E+20

6E+20

7E+20

8E+20

9E+20

1E+21

Depth

Elec

tron

Den

sity

(cm

-3)

0

10000

20000

30000

40000

50000

60000

70000

Resi

denc

e Ti

me(r

elat

ive

valu

es)

El ect ron Densi ty Resi dent Ti me

Fermi Energy Level ModelingFermi Energy Level Modeling

i

totBF

Njjtot n

xn

q

TkxExnxn

i

D

)(ln)( ,)()(

-V

Page 17: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Fermi Energy Level ModelingFermi Energy Level Modeling

Example of KLMC simulations with incorporated field effect.

Fi el d Eff ect on Dopant Di ff usi on ( KLMC Si mul at i ons)

1E+19

1E+20

1E+21

1E+22

0 10 20 30 40 50 60 70 80 90

Depth ( Uni t=5. 43A)

Dopant Conc. (cm-3)

As i ni t i al

B i ni t i al B af t er KLMC

As af t er KLMC

Page 18: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Random Dopant FluctuationsRandom Dopant Fluctuations

Initial simulations show like dopant atoms tend to repel each other, resulting in a more uniform potential.

Dopant Fl uctuati on Si mul ati ons

0

10000

20000

30000

40000

50000

60000

0. 5 0. 51 0. 52 0. 53 0. 54 0. 55 0. 56 0. 57 0. 58

Fermi Energy Level (eV)

Sampling Points Random Af t er KLMC

Page 19: Kinetic Lattice Monte Carlo Simulations of Dopant Diffusion/Clustering in Silicon

Summary

• As diffusion at high concentrations shows a strong increase with doping level that is consistent with experimental measurements.

• Acceleration mechanism improves simulation efficiency, significantly reducing CPU time.

• Developed a Fermi level model and incorporated into LAMOCA KLMC simulation code.

• Initial dopant fluctuation simulations give more uniform Fermi level than random distribution (dopant/dopant repulsion).