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Conditioning and Test Protocols Jose Alberto Rodriguez

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Page 1: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Conditioning and Test Protocols

Jose Alberto Rodriguez

Page 2: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Describe how we currently characterize structures at CTF3

Describe how we want to improve the characterization

Learn from your suggestions and comments

Objectives of this presentation

6/19/2007

1The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Page 3: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Description of the 30 GHz test stand Before the test starts Typical testing history After the test is finished

Contents

6/19/2007

2The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Page 4: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Description of the test stand

e- gun linac linac

PETS Beam dump

Accelerating

Structure

PINC coupler

PTRANS coupler

FaradayCup

CTF3

CTF3 control room

CTF2

Variable attenuator

Analog electronicsDigitizers

Klystron gallery

Control software

User interfac

e

User interface

CCC

Data logging

6/19/2007

3The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Page 5: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Description of the test stand

6/19/2007

4The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Page 6: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Description of the test stand

PINC coupler

CalibrationData acq.

and Control software

6/19/2007

5The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Variable attenuator

Downmix to 1.5 GHz

Scope in control room

I-Q Demodulator

Digitizer I Digitizer Q

User Interface

Data Logging

Data acq. software

User Interface

Data Logging

Calibration

e- gun

Variable attenuator

Page 7: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Cold rf measurements Metrology Cleaning Surface treatment Inspection with an optical microscope Inspection with SEM Final assembly Cold rf measurements

Before the test starts

6/19/2007

6The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Page 8: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Typical Testing history

6/19/2007

7The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

DESCRIPTIONESTIMATED TIME (days)

NEW STRUCTURE INSTALLATION

1Opening CTF2Removing cover plate of the previous structure

1

2Low level RF measurements of previous structureInstalling new structure in the cover plateLow level RF measurements of new structure

1

3Installing cover plate with new structure in the tankInstalling all the other RF componentsLeak checking

2

4 Pumping down to ~ 10-7 - 10-8 torr 2

TOTAL TIME 7

Page 9: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Typical Testing history

6/19/2007

8The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

DESCRIPTION ESTIMATED TIME (days)

CONDITIONING THE STRUCTURE

5 Implementing and checking calibrations 0.25

6 Conditioning of a Cu like structure 7.25

TOTAL TIME (assuming 75% machine uptime)

10

INTERMEDIATE STRUCTURE CHARACTERIZATION

7 Searching working conditions 0.5

8 BDR ~ 10-3, T = 70 ns, f = 10 Hz, N = 100 0.125

9 BDR ~ 10-4, T = 70 ns, f = 10 Hz, N = 100 1.25

10 BDR ~ 10-5, T = 70 ns, f = 25 Hz, N = 25 1.25

11 BDR ~ 10-4, T = 70 ns, f = 10 Hz, N = 100 1.25

12 BDR ~ 10-3, T = 70 ns, f = 10 Hz, N = 100 0.125

TOTAL TIME (assuming 75% machine uptime)

6

Page 10: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Typical Testing history

6/19/2007

9The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

DESCRIPTION ESTIMATED TIME (days)

FINAL STRUCTURE CHARACTERIZATION

13 BDR @ 70 ns (as in intermediate characterization) 4.5

14 BDR @ 40 ns (as in intermediate characterization) 4.5

15 Dedicated pulse length dependence measurements 1

16 Dark current and ion current measurements 1

17 Calibration checking 0.5

18Investigation of structure transmission properties: nonlinearity and effect of temperature (repetition rate)

1.5

19 BDR as a function of repetition rate 2

20 Vacuum related experiments 0

TOTAL TIME (assuming 75% machine uptime)

20

Page 11: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Conditioning of the structure

6/19/2007

10The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

We can capture, analyze and log information about every rf pulse (tested up to 25 Hz)

We can define:-Target final values for T and P- Speed to approach target final values- Intermediate T and P values- Interlock on Faraday cup currents, reflected power, missing energy, vacuum pressures…

We will implement feedback loops to improve stability of the rf pulses in the near future

Page 12: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Conditioning of the structure

6/19/2007

11The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Circular π/2 Cu

Page 13: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Conditioning of the structure

6/19/2007

12The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

HDS11 Ti

Page 14: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Conditioning of the structure

6/19/2007

12The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

HDS11 Ti

Problems with the stability of the power source

Page 15: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Breakdown rate vs. gradient

6/19/2007

13The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Circular π/2 Cu

Page 16: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Pulse length dependences

6/19/2007

14The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

HDS60 Cu Large

Page 17: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Dark current measurements

6/19/2007

15The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Dark currents to determine β at different conditioning states will soon be available

Circular 2π/3 Cu

Circular π/2 Cu

Positive ion currents were occasionally measuredIt will be done systematically in the future

Page 18: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Calibration discrepancies & non-linear effects

6/19/2007

16The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Losses in the structure are measured using high power to detect discrepancies in the calibration and non-linear effects (maybe due to dark current capture)

HDS11 Ti Large

HDS11 Mo Large

Page 19: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Cold rf measurements

6/19/2007

17The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Main rf properties of the structures are measured after every high power test

HDS11 Ti Large

Page 20: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

Visual inspection

6/19/2007

18The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

HDS60 Large HDS60 Small

The whole structure is inspected using an optical microscope

HDS11 Ti Large

Generally one quadrant in inspected using a Scanning Electron Microscope (SEM)

Page 21: Jose Alberto Rodriguez.  Describe how we currently characterize structures at CTF3  Describe how we want to improve the characterization  Learn from

6/19/2007

2The X-Band Accelerating Structure Design and Test-Program Workshop

Jose Alberto Rodriguez

Thank you for your attention.

Questions? Comments?