g200 master document

User Guide NANO Indenter G200the markets most powerful, flexible tool for exploring nanomechanics

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COPYRIGHTCOPYRIGHT INFORMATION 2007 MTS Systems Corporation. All rights reserved. TRADEMARK INFORMATION MTS is a registered trademark and Nano Indenter is a trademark of MTS Systems Corporation. PROPRIETARY INFORMATION This manual, and the software it describes, are both copyrighted, with all rights reserved. Under the copyright laws, neither this manual nor the software may be copied, in whole or part, without written consent of MTS Systems Corporation, except in the normal use of the software or to make a backup copy of the software. The same proprietary and copyright notices must be affixed to any permitted copies as are made for others, whether or not sold, but all of the material purchased (with all backup copies) may be sold, given, or loaned to another person. Under the law, copying includes translating into another language or format. This software may be used on any computer, but extra copies cannot be made for that purpose. PUBLICATION INFORMATIONDOCUMENT NO. G2A-13192-0 RELEASE DATE April 2007

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PREFACEThe main body of this work is structured with the chapters outlined in the Table of Contents section that follows. After browsing through the Introduction, you can immediately begin using the G200 system by working through the Quick Start Guide. Once you gain a comfort level and proficiency of the basics of the system through that section, you can begin to have a broader understanding of the details involved by referring to the Instrument Reference and TestWorks 4 chapters. The Theory chapter will help you understand the basic fundamental concepts behind this powerful technology.

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TABLE OF CONTENTS

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INTRODUCTION ................................................................................................................1-1 1.1 1.2 Your System ..................................................................................................................1-1 MTS and Nano Instruments...........................................................................................1-2

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QUICK START GUIDE ........................................................................................................2-1 2.1 2.2 2.3 2.4 2.5 2.6 2.7 2.8 2.9 Introduction ....................................................................................................................2-1 Specifications of the Nano Indenter G200 System .................................................................................................................2-4 Power Up the System ....................................................................................................2-4 Launch TestWorks 4......................................................................................................2-6 Preparing a Sample for Testing .....................................................................................2-8 Install the Sample Disk into the Sample Tray..............................................................................................................................2-12 Install the Sample Tray into the Indenter .....................................................................2-14 Adjust the Height of the Samples ................................................................................2-16 Methods and Batches in TestWorks ............................................................................2-22

2.10 Performing a Test ........................................................................................................2-22 2.11 Congratulations!...........................................................................................................2-44 3 INSTRUMENT REFERENCE ..............................................................................................3-1 3.1 3.2 3.3 3.4 3.5 3.6 3.7 3.8 Allen Wrench Set ...........................................................................................................3-1 Aperture Levers .............................................................................................................3-1 Computer/Central Processing Unit (CPU).............................................................................................................................3-2 Crystalbond Hot Melt .....................................................................................................3-2 Gantry Assembly ...........................................................................................................3-3 Head Assembly..............................................................................................................3-4 Indenter..........................................................................................................................3-5 Isolation Cabinet ............................................................................................................3-5

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3.9

Locking Pins ..................................................................................................................3-6

3.10 Microscope ....................................................................................................................3-8 3.11 Motion System ...............................................................................................................3-8 3.12 Mounting Specimens ...................................................................................................3-10 3.13 NanoSwift ....................................................................................................................3-10 3.14 Objectives ....................................................................................................................3-11 3.15 Sample Disks...............................................................................................................3-12 3.16 Sample Mount System.................................................................................................3-13 3.17 Sample Tray ................................................................................................................3-13 3.18 Single-Crystal Aluminum Sample ................................................................................3-14 3.19 Specimen.....................................................................................................................3-15 3.20 Standard Reference Materials .....................................................................................3-15 3.21 Temperature Probe......................................................................................................3-17 3.22 Tip-Change Tool ..........................................................................................................3-17 3.23 Tip-Retaining Nut.........................................................................................................3-18 3.24 Vibration Isolation Table ..............................................................................................3-18 4 TESTWORKS 4 ...................................................................................................................4-1 4.1 4.2 4.3 4.4 4.5 4.6 4.7 4.8 4.9 The Test Page ...............................................................................................................4-1 File Menu .......................................................................................................................4-2 Method Menu.................................................................................................................4-9 Edit Menu (Define Page Only) .....................................................................................4-12 View Menu ...................................................................................................................4-12 Test Menu (Test and Review Pages Only) ............................................................................................................................4-15 Configure Menu (Test and Review Pages Only) .................................................................................................................4-16 Tools Menu ..................................................................................................................4-21 User Menu ...................................................................................................................4-23

4.10 Tip Menu......................................................................................................................4-25 4.11 Export Menu ................................................................................................................4-28 4.12 Mode Menu..................................................................................................................4-28 4.13 System Menu (Test Page Only)...................................................................................4-28 4.14 Help Menu ...................................................................................................................4-28 4.15 Toolbar.........................................................................................................................4-30

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4.16 Status Bar ....................................................................................................................4-32 4.17 Test Page ....................................................................................................................4-33 4.18 Review Page................................................................................................................4-48 4.19 Define Page .................................................................................................................4-67 4.20 Simulation Mode ..........................................................................................................4-67 5 ANALYST ............................................................................................................................5-1 5.1 5.2 5.3 5.4 5.5 5.6 6 Overview of Analyst .......................................................................................................5-1 The Menu Bar ................................................................................................................5-5 Toolbar.........................................................................................................................5-14 Sample View Pane ......................................................................................................5-14 View Pane....................................................................................................................5-17 Messages Pane ...........................................................................................................5-17

COMMONLY USED PROCEDURES ..................................................................................6-1 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 Using TestWorks System Agent ....................................................................................6-1 Defining a General Batch...............................................................................................6-7 Executing a General Batch ..........................................................................................6-12 Changing the Indenter .................................................................................................6-15 Determining Machine Compliance...............................................................................6-21 Determining the Indenter Area Function......................................................................6-33 Cleaning the Tip...........................................................................................................6-44 Setting the Surface Marker ..........................................................................................6-45 Editing Input Values.....................................................................................................6-47

6.10 Comparing Samples in Analyst....................................................................................6-48 6.11 Adjusting the Vibration Isolation Table ........................................................................6-52 7 THEORY ..............................................................................................................................7-1 7.1 7.2 7.3 7.4 7.5 Introduction ....................................................................................................................7-1 Determining the Contact Stiffness and Contact Area..................................................................................................................7-4 Determining Contact Stiffness Dynamically ...................................................................................................................7-5 Best Experimental Practice............................................................................................7-6 Calculation of Displacement into Surface and Load on Sample from Raw Displacement and Load Data ................................................................................7-7

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7.6 8

Physics of Instrumentation.............................................................................................7-9

INDEX ..................................................................................................................................8-1

A CONTINUOUS STIFFNESS MEASUREMENT (CSM) ......................................................... A-1 A.1 A.2 A.3 A.4 A.5 A.6 Introduction ................................................................................................................... A-1 Quick Start Guide ......................................................................................................... A-2 Instrument Reference ................................................................................................... A-4 Software Reference ...................................................................................................... A-5 Commonly Used Procedures........................................................................................ A-6 Theory........................................................................................................................... A-7

B DYNAMIC CONTACT MODULE (DCM) ............................................................................... B-1 B.1 B.2 B.3 B.4 B.5 Introduction ................................................................................................................... B-1 Quick Start Guide ......................................................................................................... B-1 Instrument Reference ................................................................................................... B-7 Software Reference ...................................................................................................... B-7 Commonly Used Procedures........................................................................................ B-8

C HIGH LOAD .......................................................................................................................... C-1 C.1 Introduction ................................................................................................................... C-1 C.2 Quick Start Guide ......................................................................................................... C-1 C.3 Instrument Reference ................................................................................................... C-3 C.4 Software Reference ...................................................................................................... C-4 D TESTWORKS EXPLORER................................................................................................... D-1 D.1 Introduction ................................................................................................................... D-1 D.2 Software Reference ...................................................................................................... D-1 D.3 Tutorial........................................................................................................................ D-35 E LATERAL FORCE MEASUREMENT (LFM) ........................................................................ E-1 E.1 E.2 E.3 E.4 E.5 Introduction ................................................................................................................... E-1 Quick Start Guide ......................................................................................................... E-1 Instrument Reference ................................................................................................... E-3 Software Reference ...................................................................................................... E-3 Theory........................................................................................................................... E-3

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F SCRATCH TESTING..............................................................................................................F-1 F.1 F.2 F.3 F.4 Introduction ....................................................................................................................F-1 Quick Start Guide ..........................................................................................................F-1 Software Reference .......................................................................................................F-5 Theory............................................................................................................................F-8

G TRAINING EXCERCISES..................................................................................................... G-1 G.1 Setting Up a New User in TestWorks ........................................................................... G-1 G.2 Investigate an Unfamiliar TestWorks Method.......................................................................................................................... G-6

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1INTRODUCTIONCongratulations on the purchase of your Nano Indenter G200 system, the ultimate microprobe for testing mechanical properties. This system, equipped with TestWorks 4 Professional software, provides the highest quality data and an ease of use unmatched by any other system. As the features and capabilities of the system are unveiled, your understanding of its automation and flexibility will generate a wealth of useful information without complicating your life! Not only is it the latest in instrumented indentation testing and nanoscratch technology, but the system is backed by the reliability and commitment of MTS Nano Instruments. With a diverse scientific staff in Oak Ridge, Tennessee, and a worldwide network of service and support professionals, this system is backed by a responsive and highly qualified team to meet your needs.

1.1 Your SystemThe Nano Indenter G200 is not an ordinary black box indenter. This platform for instrumented indentation testing is designed to deliver the highest expected performance levels as a base unit, yet it is also flexible to fit the most customized tests with optional configurations. The G200 universal testing system represents a great stride in materials testing. Use of this system provides you with indispensable convenience in data collection and enables the advancement and application of new materials and technologies. The G200 system has been designed to be a universal testing system. Users can unlock vast potential in this machine. MTS Nano Instruments is open to partnering with researchers who wish to develop tests and hardware specific to their custom needs. Contact our Applications Department for more information with regard to ideas, needs, or concerns (see Contact MTS Nano Instruments below).

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MTS Nano Instruments Introduction Options currently available for the G200 system include: Continuous stiffness measurement (CSM) Lateral force measurement (LFM) 350C heating stage NanoVision NIDAQ Channel Manager Load application up to 1 kg with the high-load option For a complete list of the options specific to your machine, please refer to your order acknowledgement or the packing list provided with the shipment.

1.2 MTS and Nano Instruments1.2.1 A Word About Us MTS Nano Instruments was founded in 1966 to develop mechanical testing systems for characterizing the mechanical properties of materials and components. Material testing is our heritage and remains the core of our business. MTS has installed systems in 64 countries and has over 1,700 employees worldwide. MTS is the worlds largest testing and simulation company and is a recognized leader in development, manufacture, and servicing of mechanical-property test systems. 1.2.2 MTS Nano Instruments Innovation Center MTS Nano Instruments had its beginnings as Nano Instruments, Inc., founded in 1983 to develop technologies for materials-testing microprobes. MTS acquired Nano Instruments in 1998. With its line of mechanical-properties microprobes used in materials testing, MTS Nano Instruments sets the standard for excellence. 1.2.3 Contacting MTS Nano Instruments For questions concerning integration between TestWorks 4 and your G200 system, problems with your instrument, new developmental ideas that require the help of the Applications Department, or any other concerns, contact Nano Technical Support. This is our customer service and support channel for all existing customers. The function of Nano Technical Support is to receive all customer concerns in regards to the instrument and direct those concerns to the appropriate people and departments to address them. These concerns include applications support, custom work, technical support, service, and training. For any questions concerning

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MTS Nano Instruments Introduction interest in new products, options, or instrumentation, you please contact your MTS sales representative. 1.2.3.1 What You Will Need Before You Call If you are calling for TestWorks integration support, we recommend that your system is running when you call. Phone support is limited to solving system concerns. It should not be used to train new operators or modify or enhance software. 1.2.3.2 A Note to Our Overseas Customers Overseas customers should contact their local MTS representative for details concerning technical support. The best way for overseas customers to get in touch with Nano Instruments directly is by sending your concerns to [email protected]. 1.2.3.3 Training Classes MTS offers a variety of training options. Advanced training includes TestWorks Explorer Training and Instrumented Indentation Training (IIT). TestWorks Explorer Training is free with purchase of the TestWorks Explorer option. This training does not include travel or accommodation. Please check our Web site or call your service and support contact for more information (in North America, call MTS Nano Instruments). 1.2.3.4 General Contact Information Web Site http://www.mtsnano.com Mailing Address 701 Scarboro Road Suite 100 Oak Ridge, TN 37830 Telephone 865-481-8451 1.2.3.5 Sales Support and Training Telephone 1-865-481-8451 (ask for the Applications Department)

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MTS Nano Instruments Introduction Email [email protected] 1.2.3.6 Technical Support Telephone 865-425-0056 or toll-free: 866-581-0857 Fax: 865-425-0584 Email [email protected]

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2QUICK START GUIDE2.1 IntroductionIn this tutorial, you will use your Nano Indenter G200 to perform several tests. This quick start guide is intended to convey basic information on running the instrument and looking at data. It is not intended to convey all of the information that you need to get the most out of your instrument. This quick start guide introduces you to the general functions of the instrument. You should also refer to the Quick Start Guide in the Users Manual for Compliance with ISO 14577 for a quick introduction to running tests that are compliant with the ISO standard for instrumented indentation testing. 2.1.1 An Overview of the System Hardware The Nano Indenter G200 is a complete, turnkey system consisting of the major components shown in Figure 2-1. Due to the extreme sensitivity of the system, environmental isolation is provided through a combination of the minus k vibration isolation table, and the thermal/sound insulated vibration isolation cabinet. The system includes: Nano Indenter G200 Minus k Vibration Isolation Table Vibration Isolation Cabinet Computer Monitor and Keyboard CSM Controller NanoSwift Controller (Data-Acquisition and Control Unit) Printer

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MTS Nano Instruments Quick Start Guide

Figure 2-1 The Standard G200 System, Complete

2.1.2 An Overview of the Software Interface 2.1.2.1 TestWorks 4

TestWorks 4 is a flexible and easy-to-use software that provides extensive capabilities for collecting and analyzing data using the Nano Indenter G200. Some basic features and terminology include system administration, method, test, sample, and batch. The initial window in TestWorks displays the Test page. Some common terms related to this initial view are shown in Figure 2-2.

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Figure 2-2 The Startup Screen

System Administration TestWorks 4 is designed with full administrative capabilities in mind. The laboratory administrator can configure TestWorks so that users and privileges can be defined. This enables you to customize functionality for the needs of individual users. For example, the laboratory administrator may set up the system so that technicians can concentrate on the basic performance of standard tests, although advanced users can customize test procedure and analysis. For more on system administration, see User Menu in the TestWorks 4 chapter. Method A method is a set of instructions that the system uses in performing tests and analysis data. TestWorks is delivered complete with a standard set of methods, which can be used in a variety of indentation tests. For more detailed information about customizing methods, see Appendix D, TestWorks Explorer. Test A test is a single cycle through a TestWorks method. For indentation testing, this is a single indentation test at one location. Sample A sample is a collection of comparable tests. For indentation testing, a sample might consist of ten tests on a particular material.

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MTS Nano Instruments Quick Start Guide Batch A batch is a collection of samples. A batch specifies when, where, and how many times the procedure described by a particular method is performed. For example, a batch may specify the following: Beginning at 2:00 a.m., the procedure described by method A should be performed ten times on each of two samples. Online Help An online help system can be accessed from the File menu.

2.2 Specifications of the Nano Indenter G200 SystemTable 2-1 shows the specifications of your Nano Indenter G200.Table 2-1 Specifications of the G200 Standard Indentation Head Assembly Displacement Resolution Total Indenter Travel Maximum Indentation Depth Load Application Displacement Measurement Loading Capability Maximum Load (Standard) Maximum Load with DCM Option Maximum Load with High-Load Option Load Resolution Contact Force Load Frame Stiffness Indentation Placement Useable Sample Area Position Control Positional Accuracy Microscope Video Screen Objective

500 m Coil/Magnet Assembly Capacitance Gauge 500 mN 10 mN 10 N 50 nN >XP Load, Disp, and Time from the Filename dropdown menu, as shown in Figure 2-9. Click the OK button.

Figure 2-9 The Open Method Dialog Box

4. Click the OK button.

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MTS Nano Instruments Quick Start Guide NOTE: The method that you just loaded will serve to illustrate the most basic operations of the instrument. At their most basic level, Nano Indenters impose a force on a surface and measure the resulting penetration. This method contains the following instructions for each test: The indenter shall approach the surface at a rate of 25 nm/sec. Once the indenter is in contact with the surface, the Load On Sample shall be increased to Maximum Load within the time span Time to Load (you may specify both Maximum Load and Time to Load). At the Maximum Load, the Load On Sample shall be held constant for 10 seconds. Finally, the indenter shall be withdrawn from the sample at a rate that is twice as fast as the loading rate.

2.5 Preparing a Sample for TestingBefore you test a sample, you must prepare it by mounting it on a sample disk. NOTE: The following procedures are for mounting a single sample on a sample disk. However, you can mount many samples on a single sample disk. For samples that are not sensitive to heat, follow these steps: 1. Locate a sample disk and place it on a heating element (hot plate), as shown in Figure 2-10.

Figure 2-10 Heating a Sample Disk on a Heating Element

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MTS Nano Instruments Quick Start Guide 2. Turn the heating element on medium-low heat and wait for the disk to heat for about 5 minutes (or until it is hot enough to melt crystalbond). 3. When the disk is warm, spread a small amount of crystalbond onto the surface of the disk, as shown in Figure 2-11.

Figure 2-11 Spreading Crystalbond onto the Surface of a Sample Disk

4. Locate your sample. Avoid touching the sample with your fingers (use tweezers if necessary). 5. Place the sample on the sample disk, as shown in Figure 2-12.

Figure 2-12 Placing the Sample on the Sample Disk

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MTS Nano Instruments Quick Start Guide 6. Using wooden contacts (such as toothpicks), press down on the sample so that it seats in the crystalbond, as shown in Figure 2-13.

Figure 2-13 Seating the Sample into the Crystalbond

7. Use pliers to remove the sample disk from the heating element and allow the disk to cool to room temperature. 8. Turn the heating element off. For samples that are sensitive to heat, follow these steps: 1. Locate a sample disk and place it on a heating element. 2. Turn the heating element on medium-low heat and wait for the disk to heat for about 5 minutes. 3. When the disk is warm, spread a small amount of crystalbond onto the surface of the disk. 4. Place a microscope slide onto the surface of the sample disk and press down on the slide with wooden contacts so that the slide seats in the crystalbond, as shown in Figure 2-14. Move the slide around with the wooden contacts until there are no bubbles between the slide and the sample disk.

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Figure 2-14 Seating the Slide into the Crystalbond

5. Use pliers to remove the sample disk from the heating element and allow the disk to cool to room temperature. 6. Turn the heating element off. 7. Mix a small amount of five-minute epoxy. 8. Using a wooden stick, place a small amount of epoxy on the slide, as shown in Figure 2-15.

Figure 2-15 Placing Epoxy on the Slide

9. Locate your sample. Avoid touching the sample with your fingers (use tweezers if necessary).

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MTS Nano Instruments Quick Start Guide 10. Place the sample on the microscope slide and press down on the sample with wooden contacts so that it seats in the epoxy, as shown in Figure 2-16.

Figure 2-16 Seating the Sample into the Epoxy

11. Allow the epoxy to fully cure. NOTE: To remove the sample or microscope slide from the sample disk and reuse the sample disk for subsequent testing, heat the sample disk on a heating element and remove the sample after the crystalbond has melted. You can leave the remaining crystalbond on the sample disk for the next sample.

2.6 Install the Sample Disk into the Sample Tray1. Familiarize yourself with the sample tray shown in Figure 2-17. 2. Unscrew the brass thumbscrew next to the rear-left sample-disk hole about 1/4 of a turn (or enough to enable the disk to easily fit into the hole), as shown in Figure 2-18.

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Figure 2-17 The Sample Tray

Figure 2-18 Unscrewing the Brass Thumbscrew 1/4 Turn

3. Install the disk into the hole such that the sample is level or slightly above the surface of the sample tray, as shown in Figure 2-19.

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Figure 2-19 Sample Installed Flush with Surface of Sample Tray

4. Turn the thumbscrew just enough to secure the disk in the hole but not so tight that the disk cannot travel vertically in the sample tray. NOTE: Each brass thumbscrew contains a spring-loaded ball plunger that applies pressure to the disk. Do not fully tighten the thumbscrew at this stage because the disk will need to be adjusted vertically during a subsequent stage. NOTE: If you are going to mount more than one sample in the sample tray, start in the sample-disk hole at the rear-left and continue clockwise.

2.7 Install the Sample Tray into the Indenter1. Loosen the sample-tray locking screw in the right sample-tray retaining rail at the top of the motion system, as shown in Figure 2-20, so that the retaining rails accept the sample tray.

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Figure 2-20 The Sample-Tray Locking Screw

2. Slide the sample tray between the rails at the top of the motion system all the way to the end stop, as shown in Figure 2-21.

Figure 2-21 Sliding the Sample Tray into the Motion System

3. Tighten the locking screw in the right sample-tray retaining rail.

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2.8 Adjust the Height of the SamplesCAUTION: The height of the sample in the center of the sample tray has been set by the technician who installed the instrument. The center sample will be the reference height for all other samples. The following procedure assumes that the height of the sample in the center of the sample tray has not been changed. Adjusting the height of the center sample requires MTS Nano Instruments technical support. 1. The levers for adjusting the microscope apertures are located on the front of the machine. Adjust the aperture levers to their widest (top-most) settings, as shown in Figure 2-22.

Figure 2-22 Microscope Aperture Levers Adjusted to Their Top-Most Settings

2. Make sure that the Nano Video HandSet mode shows the video image (not the schematic template of the sample tray). If the schematic template is shown in the handset area, rightclick in the area and select Nano Video HandSet from the resulting popup menu. Adjust the brightness control under the handset area in TestWorks (shown in Figure 2-23) all the way to the brightest setting. NOTE: When system is idle for a while, the light bulb icon in the brightness control will dim and deactivate. To activate the control, click on it.

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Figure 2-23 Brightness Control for Nano Video HandSet

3. Beginning with center sample (reference sample), position the sample under the microscope, which is accomplished in TestWorks. In TestWorks, click the Test tab, shown in Figure 2-24.

Figure 2-24 The Test Tab

4. In handset area in the left pane, right-click and select Nano HandSet from the resulting popup menu, as shown in Figure 2-25.

Figure 2-25 The Nano HandSet Selection

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MTS Nano Instruments Quick Start Guide 5. Click on the center circle in the schematic map shown in Figure 2-26, which corresponds to the center (reference) sample in the sample tray.

Figure 2-26 The Nano Handset Schematic Map

6. Right-click anywhere on the schematic map and select Move to Target from the resulting popup menu, as shown in Figure 2-27.

Figure 2-27 The Move to Target Command

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MTS Nano Instruments Quick Start Guide 7. Visually confirm that the microscope is over the center sample disc in the sample tray (the microscope does not have to be directly over the sample at this point). 8. The microscope projects light onto its target. Move the microscope directly over the center sample by noting the relative position of the microscope (indicated by the light from the microscope), clicking on the schematic map in the direction where you want the microscope to travel, and then right-clicking anywhere on the schematic map and selecting Move to Target from the resulting popup menu. Repeat this step until the microscope light shines directly on the center sample. 9. Right-click anywhere on the schematic map and select Nano Video HandSet from the resulting popup menu, as shown in Figure 2-28. The video image in TestWorks will be overexposed (white) at this point.

Figure 2-28 The Nano Video Handset Selection

10. Lower the left aperture lever until you see some change in the image (some parts of the image will become darker). 11. Lower the right aperture lever until the image becomes gray (an average medium brightness). 12. As shown in Figure 2-46, use the microscope brightness control and coarse/fine focus controls to lighten the image and bring it into focus.

Figure 2-29 Microscope Brightness and Focus Controls

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MTS Nano Instruments Quick Start Guide CAUTION: Do not touch the focus controls in TestWorks from this point forward until the samples in the four corners of the sample tray have been set to their proper heights, described next. Doing so could damage the indenter tip. 13. Beginning with the rear-left sample, position the sample under the microscope, which is accomplished. 14. In handset area in the left pane, right-click and select Nano HandSet from the resulting popup menu. 15. Click on the top-left circle in the schematic map, which corresponds to the rear-left sample in the sample tray. 16. Right-click anywhere on the schematic map and select Move to Target from the resulting popup menu. 17. Visually confirm that the microscope is over the rear-left sample disc in the sample tray (the microscope does not have to be directly over the sample at this point). Adjust the sample position until the light from the microscope shines directly on the sample. 18. Locate the height-adjustment thumbwheel for the rear-left sample disk in the sample tray. Figure 2-30 shows the thumbwheel, which is not visible from the front of the instrument. To access the thumbwheel, you will have to reach behind the sample tray.

Figure 2-30 Height-Adjustment Thumbwheel for Rear-Left Sample Disk

19. Turn the thumbwheel from left to right to lower the sample disk as far as it will go down but not lower than the surface of the sample tray. 20. Turn the brass thumbscrew just enough to secure the disk in the hole but not so tight that the disk cannot travel vertically in the sample tray.

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MTS Nano Instruments Quick Start Guide NOTE: Each brass thumbscrew contains a spring-loaded ball plunger that applies pressure to the disk. Do not tighten the thumbscrew at this stage because the disk will need to be adjusted vertically during a subsequent stage. 21. Right-click anywhere on the schematic map and select Nano Video Handset from the resulting popup menu. The image will probably be out of focus at this point. 22. While watching the handset area in TestWorks, turn the height-adjustment thumbwheel for the rear-left sample disk from the right to the left to raise the sample disk in the sample tray. Simultaneously lower the right aperture lever to maintain a medium-brightness image in the handset area. Continue to adjust the height-adjustment thumbwheel and the right aperture lever until the surface of the sample comes into focus. When the sample height is properly adjusted, the outline of the camera aperture (five-sided iris) can be clearly seen, as shown in Figure 2-31.

Figure 2-31 Camera Aperture Visible in Video HandSet

NOTE: If you overshoot the height adjustment (that is, you adjust the height past the point of focus), then start the height-adjustment procedure over. Height adjustment should always proceed by moving the sample upward.

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MTS Nano Instruments Quick Start Guide 23. Securely lock the sample into the sample tray by fully tightening the brass thumbscrew next to the rear-left sample-disk hole. 24. Repeat this procedure for other samples, going clockwise in the sample tray.

2.9 Methods and Batches in TestWorksIn TestWorks, a method contains all of the instructions for performing a single experiment and analyzing the resulting data. A batch specifies where, when, and how many times the procedure described in a particular method is performed. For example, a batch may specify the following: beginning at 2:00 a.m., the procedure described by Method A should be performed ten times on each of two samples. When you launch TestWorks, both a default method and batch are automatically loaded. For the first part of this quick start guide, you will not use either the default batch or the default method. For the second part of this quick start guide, you will use both the default batch and the default method.

2.10 Performing a Test2.10.1 Your First Batch 1. Make sure that the fused silica sample provided with your instrument is properly loaded in the center hole in the sample tray. 2. Click the Test tab to reveal the Test page, as shown in Figure 2-32.

Figure 2-32 The Test Tab

3. While on the Test page, click the icon for Batch Mode, as shown in Figure 2-33.

Figure 2-33 The Icon for Batch Mode

4. Click the Define tab, Figure 2-3.

Figure 2-34 The Define Tab

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MTS Nano Instruments Quick Start Guide 5. The wizard on the left-hand side of the screen will assist you in defining your first batch. As you move through the batch setup, read the text that appears immediately under the Next Step button, shown in Figure 2-35.

Figure 2-35 The Next Step Button

6. Click the Next Step button twice. 7. In the resulting screen in the right pane, verify that the Start a New Batch radio button is selected. 8. Click the Next Step button. 9. In the resulting screen in the right pane, select the options as shown in Figure 2-36.

Figure 2-36 Select Options as Shown

NOTE: The settings in Figure 2-36 are options for the batch. The first two options are useful only if you will be saving the batch for later use (which you will be doing). Many people find the last option useful, especially if the instrument sits in a laboratory that is noisy during the day but relatively quiet at night. You will not use this option right now. 2-23

MTS Nano Instruments Quick Start Guide 10. Click the Next Step button twice. 11. In the resulting screen in the right pane, type in Fused silica in the text box under Sample Name, as shown in Figure 2-37. Do not modify the method name.

Figure 2-37 Sample Name

12. Click the Next Step button. Do not modify any of the settings in the resulting screen in the right pane, as shown in Figure 2-38.

Figure 2-38 Options for Surface Find and Allowable Drift Rate

NOTE: Regarding the settings in Figure 2-38: The G200 uses a practice indent to determine the elevation of the sample surface before beginning the first real indent prescribed by the batch. The first two text boxes tell the instrument where to put this practice indent relative to the first prescribed indent. The Allowable Drift Rate sets the thermal stability criteria for initiating testing. While the indenter is in contact with the test surface under a small constant force, the time rate of change in the displacement must be less than this value. The lower the value, the longer the instrument will wait before initiating testing on a sample.

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MTS Nano Instruments Quick Start Guide 13. Click the Next Step button. Do not modify any of the settings in the resulting screen in the right pane, as shown in Figure 2-39.

Figure 2-39 Options for the Indenter Approach

NOTE: Regarding the settings in Figure 2-39: The indenter begins looking for the surface at a distance above the surface (as determined by the practice indentation) set by Surface Approach Distance. The rate at which the indenter approaches the surface is given by Surface Approach Velocity. The Surface Approach Sensitivity sets the criteria that the indenter uses to decide whether it has contacted the test surface. A lower value causes more sensitive surface detection but increases the likelihood of false detection (and vice versa). 14. Click the Next Step button. 15. In the resulting screen in the right pane, edit the Time to Load to be 25 seconds, as shown in Figure 2-40.

Figure 2-40 Required Inputs

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MTS Nano Instruments Quick Start Guide 16. Click the Next Step button. 17. On the resulting video image, right-click anywhere in the handset area and select Nano HandSet from the resulting popup menu, as shown in Figure 2-41.

Figure 2-41 Nano Handset Selection

18. Using the schematic map shown in Figure 2-42, click on the center circle.

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Figure 2-42 Schematic Map

19. Right-click and select Move to Target from the resulting popup menu, as shown in Figure 2-43.

Figure 2-43 The Move to Target Command

20. You should hear the X/Y positioning table move to the proper location under the microscope, and the red cone on the schematic map should move toward the target. Once the cone reaches the target, it turns green. Look at the actual sample in the cabinet to make sure that the 2-27

MTS Nano Instruments Quick Start Guide sample is sitting under the microscope. If not, right-click anywhere on the schematic map and select Initialize from the resulting popup menu, as shown in Figure 2-44. Using the schematic map, click on the center circle. Right-click and select Move to Target from the resulting popup menu.

Figure 2-44 The Initialize Command

21. Right-click and select Nano Video HandSet from the resulting popup menu, as shown in Figure 2-45.

Figure 2-45 Nano Video HandSet Selection

22. The video screen will appear in the Nano Video HandSet area. As shown in Figure 2-46, use the microscope brightness control and fine focus controls to bring the image into focus. When the image is in focus, it should appear as shown in Figure 2-47.

Figure 2-46 Microscope Brightness and Focus Controls

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Figure 2-47 Image in Focus

23. Scan around the surface and find a clear location for testing (one without specs or dust). To do this, place the cursor over the red crosshairs in the center of the video image, click, and slowly drag the cursor in the direction of the area you want to view. 24. When you are satisfied with the test area, click the Define Array of Tests Beginning at this Location button, as shown in Figure 2-48.

Figure 2-48 Click the Define Array of Tests Beginning at this Location Button

25. The resulting dialog box is shown in Figure 2-49.

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Figure 2-49 Dialog Box for Defining a Test Array

26. Create a 2 x 2 array where sequential tests are separated by 50 microns by making the entries shown in Figure 2-49. Click the OK button. NOTE: If you are using a DCM, use a separation distance of 20 microns rather than 50. 27. Click the Next Step button in the left pane. In the resulting dialog box shown in Figure 2-50, click the No button.

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Figure 2-50 Click No

28. Click the Test tab in the left pane to reveal the Test page. Place the pointer over the Data pane on the right-hand side of the screen. Right-click and select Save Batch from the resulting popup menu, as shown in Figure 2-51.

Figure 2-51 Saving the Batch

29. In the Save Batch File dialog box shown in Figure 2-52, type in My LDT Batch next to File name and click the Save button.

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Figure 2-52 Naming the Batch File

NOTE: This action saves all the specifications for the batch so that you can recall and use the batch again later. 30. Begin the test by clicking the green Go arrow in the left pane, as shown in Figure 2-53.

Figure 2-53 Starting a Test

NOTE: You can abort a test at any time by clicking the red stop button directly below the green arrow. You have the option of aborting a single test or aborting an entire batch. Make your selection and then click the OK button.

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MTS Nano Instruments Quick Start Guide 31. In the resulting Review Sample Names dialog box, you can modify the Sample Name or leave the name as is. In either case, click the OK button to continue. 32. In the Review the first test location of Sample dialog box, as shown in Figure 2-54, verify that the microscope is in the correct location and then click the OK button to continue.

Figure 2-54 Review the First Test Location of the Sample Dialog Box

NOTE: Leave the cabinet door open so that you may watch as testing proceeds. Normally, the isolation cabinet should be closed during testing, but for this part of the tutorial, you may leave it open. NOTE: Periodically, TestWorks will display the message shown in Figure 2-55. This is normal because the indenter has not yet touched the surface of the sample.

Figure 2-55 The Invalid Message

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MTS Nano Instruments Quick Start Guide NOTE: While the test is running, TestWorks displays the numerical readouts at the bottom of the screen, the real-time graph on the right side of the screen (as shown in Figure 2-56), and the text below the real-time graph. The real-time graph displays data as the test is running. It should take about ten minutes to complete the batch.

Figure 2-56 Load-Displacement Curve

NOTE: When the batch is complete, the real-time graph is replaced by a table, and the residual indentation impressions should be visible in the handset area, as shown in Figure 2-57. If you are using a DCM, residual impressions may not be visible.

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Figure 2-57 Residual Indentation Impressions

2.10.1.1 Reviewing Data from Your First Batch You have just completed your first batch in which you performed a series of four tests on fused silica. Now, review the results. 1. Click the Review tab, as shown in Figure 2-58.

Figure 2-58 The Review Tab

2. In the left-most window, right-click and select Select All Tests from the popup menu, as shown in Figure 2-59.

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Figure 2-59 The Select All Tests Command

3. The Review Graph area displays the results from all four tests. Again, in the left-most window, right-click and select Deselect All Tests from the resulting popup menu. 4. In the Legend pane, check the box next to the first test (as shown in Figure 2-60) so that the Review Graph will display only results from that test.

Figure 2-60 Display Results of First Test

5. Look at the load-displacement curve for the first test. It should be similar to the one shown in Figure 2-61. The origin of this plot is the point at which the indenter first came into contact with the test surface. The approximate depth of the residual impression left by this test is the intersection of the unloading (right-most) curve and the X axis. In the example shown, the depth of the residual impression is 1050 nm.

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Figure 2-61 Review the Load-Displacement Curve

6. Use the cursor to zoom in on the apex of the load-displacement curve. Click and drag to zoom in on the desired area, as shown in Figure 2-62.

Figure 2-62 Apex of Load-Displacement Curve

7. To view the entire curve, right-click anywhere in the graph and select Reset from the resulting popup menu, as shown in Figure 2-63.

Figure 2-63 The Reset Command

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MTS Nano Instruments Quick Start Guide 8. Right-click anywhere on the graph and select X-Axis Channel>>Time (s) from the resulting popup menu, as shown in Figure 2-64.

Figure 2-64 Time for the X-Axis Channel

9. Review the resulting graph, which should be similar to the graph shown in Figure 2-65. You can determine how long the indenter looked for the surface by noting where the beginning of the curve intersects the X axis. In the example graph, the indenter looked for the surface for 57 seconds. You can verify that 1) loading took place in 25 seconds, 2) there was a 10second dwell at peak load, and 3) the unloading rate was twice as fast as the loading rate.

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Figure 2-65 Time Graph

10. The Statistics panel at the bottom of the screen displays results from each test. The statistics should be similar to those shown in Figure 2-66. (The specific results to be displayed are determined by instructions in the method.) Take a few minutes to review the results for each test.

Figure 2-66 The Statistics Panel

2.10.2 Your Second Batch For this part of the tutorial, you will use a default method and batch to perform a series of tests on fused silica. The default method prescribes a test that returns the Youngs modulus and hardness at a series of discrete loads. The default batch prescribes a 2 x 5 array of these tests on a single sample. For more information on the fundamental analysis used to derive Youngs modulus and hardness from indentation data, consult the Theory chapter. 1. Click the Test tab.

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MTS Nano Instruments Quick Start Guide 2. Click the icon for the Batch Mode. The default batch for the instrument will automatically be loaded in the right pane. 3. Begin the test by clicking the green Go arrow. 4. In the resulting Review Sample Names dialog box, type in fused silica 2 for the sample name. Click the OK button to continue. 5. In the Review the first test location of Sample dialog box, move the sample to the correct location under the microscope. Right-click anywhere in the video screen in the dialog box and select Nano HandSet from the resulting popup menu. 6. Using the schematic map, click on the location where the fused silica sits in the sample tray (click on one of the circles). 7. Right-click on the marked circle and select Move to Target from the resulting popup menu. 8. Right-click anywhere on the schematic map and select Nano Video Handset from the resulting popup menu. 9. Click and drag the on the sample image in the video screen to move the sample under the fixed microscope to find a clear location for testing (one without specs or dust). Click the OK button. 10. In the Start Time dialog box, click the OK button. 11. In the Delay before Running Batch dialog box, click the Resume button. 12. Close the machine cabinet. 13. Again, while the batch is running, note the numerical readouts, the real-time graph, and the text below the real time graph. It should take about thirty minutes to complete the batch. 14. When the batch is complete, the real-time graph is replaced by a table, and the residual indentation impressions should be visible on the video display. NOTE: If you are using a DCM, residual impressions may not be visible. 2.10.2.1 Reviewing Data from Your Second Batch You have just completed your second batch in which you performed a series of ten tests on fused silica. Now, review the results. 1. Click the Review tab. 2. In the Legend pane, right-click and select Select All Tests from the resulting popup menu. This causes the Review Graph to display results from all ten tests. The Review Graph now displays the calculated Youngs modulus at the discrete peak displacements for each loading cycle. 3. Right-click on the Review Graph and select X-Axis Channel>>>Load On Sample (mN) from the resulting popup menu, as shown in Figure 2-67.

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Figure 2-67 The Load On Sample Command

4. Now the Review Graph displays the sample information as a function of load rather than displacement. 5. Right-click on the Review Graph and select Y-Axis Channel>>Hardness (GPa) from the resulting popup menu, as shown in Figure 2-68.

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Figure 2-68 The Hardness Command

6. Now the Review Graph displays hardness as a function of load. NOTE: Any channel may be plotted on the X or Y axis by right-clicking on the Review Graph and selecting the channel. 7. The Statistics panel at the bottom of the screen displays results from each test, such as the results shown in Figure 2-69. (The specific results to be displayed are determined by the instructions in the method.) Take a few minutes to look at the results for each test. NOTE: The first test in this particular sample failed as evidenced by the warning message and the invalid results (****) in the first row in the results table. When a test fails, a warning message is issued to describe the reason for the failure.

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Figure 2-69 The Statistics Panel

2.10.2.2 Understanding the Printed Report Most of the TestWorks methods supplied with the instrument automatically produce a printed report. Both the format and the content of the automated report are prescribed within the method. NOTE: If your report did not print, you can display the report on your screen by selecting Print Preview>>Sample from the File menu, as shown in Figure 2-70.

Figure 2-70 The Print Preview Command

1. From the printer, retrieve the printed report. 2. Look at the table of test results. This is a tabulation of important results for each test. (Exactly which results are displayed is prescribed by the method). At the bottom of the table, you will see statistics compiled for all the tests on the sample. 3. Look at the first graph. This is a plot of Modulus vs. Displacement Into Surface for all tests performed on the sample.

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MTS Nano Instruments Quick Start Guide 4. Look at the second graph. This is a plot of Hardness vs. Displacement Into Surface for all tests performed on the sample. 5. Look at the table titled Tip Information. This table displays the Tip Name that references the specific area function that was used in the calculations. It also displays the first few terms of that function. 6. Look at the table titled Calculation Inputs. This table displays important inputs that were used in the calculations. 7. Look at the table titled Test Inputs. This table displays important inputs that were used to determine how the test was performed. 2.10.3 Your Third Batch 1. While still on the Test page, reload the specifications for the first batch. To do this, rightclick in the table on the right-hand side of the screen and select Load Batch from the resulting popup menu. 2. In the Retrieve Batch File dialog box, select MyLDTBatch.bch and click the Open button. 3. Initiate testing by clicking the green Go arrow. 4. Follow the on-screen prompts for naming the sample and selecting the first test site. The instrument will now repeat the first batch that you ran.

2.11 Congratulations!You have finished the tutorial! Remember that when using the instrument, you can: Define your own batch as you did in the first part of the tutorial. This allows you to specify the test method, as well as when and where the method is used. Use the default batch and default method as we did in the second part of the tutorial. Reload and use a saved batch, as we did in the third part of the tutorial.

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3INSTRUMENT REFERENCEThis section details the configuration of the hardware that makes up the Nano Indenter G200. Items are arranged alphabetically.

A3.1 Allen Wrench SetThe Allen wrench set provided with the instrument is required for the completion of a number of common procedures.

Figure 3-1 The Allen Wrench Set Provided with the G200

3.2 Aperture LeversThe aperture levers are used to adjust the view of the sample surface. The left aperture lever adjusts the iris diaphragm, which affects the field of view and contrast. Adjustments in contrast will be more evident with higher-power objectives. The right aperture lever adjusts the amount of light picked up by the camera.

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MTS Nano Instruments Instrument Reference

Figure 3-2 The Aperture Levers

Adjusting the iris diaphragm is sometimes useful in finding the surface of very smooth or translucent specimens. By partially closing the iris and then focusing on the iris itself, you can get a very good estimate of the focal point on the sample.

B3.3 Computer/Central Processing Unit (CPU)The CPU provided with the Nano Indenter G200 serves as the host computer for the TestWorks control software. All collected data are stored on the hard drive of your G200 computer. Electronic cards integrated into your computer manage the communication between the software and the external electronics. The CPU is used to run the TestWorks control software and to manage the communication between TestWorks and the external electronics. The major components of the computer are hard drive, expansion bay, CD-R drive, printer port, monitor port, keyboard port, and mouse port.

3.4 Crystalbond Hot MeltCrystalbond hot melt is a thermoplastic polymer that can be used to mount specimens to the aluminum sample disks provided with your G200. Crystalbond softens at 71C and flows at 135C. Viscosity is 6000 cps at the flow point. Crystalbond is soluble in Acetone.

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Figure 3-3 Crystalbond Hot Melt

Crystalbond is very rigid, and its thermoplastic properties allow for the removal of adhered specimens. Alcohol will not rapidly dissolve crystalbond and can therefore be used to clean mounted specimens. Acetone will quickly dissolve Crystalbond and can therefore be used to remove specimens without the application of heat. For more information about applying Crystalbond, consult the Preparing a Sample for Testing section of the Quick Start Guide. To order crystalbond, contact your MTS Nano Instruments service representative.

G3.5 Gantry AssemblyAs shown in Figure 3-4, the Nano Indenter G200 gantry is used to support the indentation system, optics system, and motion system, as well as optional hardware. The gantry is manufactured to be extremely rigid, providing the system with a very high load frame stiffness (LFS). All of the electronic connectors necessary to run the instrument are panel-mounted on the gantry. Finally, aperture levers used to adjust the microscope are extended through the front of the gantry.

Figure 3-4 The G200 Gantry

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H3.6 Head AssemblyThe G200 head assembly, shown in Figure 3-5, contains the actuator and sensors that make up the critical measurement portion of your G200. The head assembly is sometimes called the NMAT, which stands for nano-mechanical actuator and transducer. The indenter head is the heart of the Nano Indenter G200. All of the other subsystems can be considered support systems for the indenter head. While the body of the indenter head is enclosed within the gantry, the indenter tip is exposed during operation of the instrument or when no power is supplied to the indenters loading system (but only if the locking pins are inserted).

Figure 3-5 The G200 Head Assembly

While operation of the indenter is achieved entirely through the TestWorks software interface, there are some occasions when you will work directly with the indenter head itself, most notably when you change the tip. When working directly with the indenter head, you should exercise caution. Any time that you are working near or with the diamond tip, you should be careful not to accidentally strike or move the indenter because it is possible to damage the indentation system. Also, you should avoid applying lateral forces to the indenter shaft because this is the most likely way to damage the displacement-sensing system. If you suspect that the indenter head has been damaged or is not functioning correctly, contact your MTS Nano Instruments service representative.

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I3.7 IndenterThe most common geometry for the diamond tip used with the indentation head is the Berkovich indenter. Shown in Figure 3-6, the Berkovich indenter is a three-sided pyramid with the same aspect ratio as the Vickers indenter. Any diamond indenter geometry that is desired can be used with the indenter head, provided that the diamond mount is configured to fit into the indenter shaft. Available tip geometries include conical, Knoop, Vickers, and wedge. Contact MTS Nano Instruments for more information about alternative diamond-tip geometries. Also, see Changing the Indenter in the Commonly Used Procedures chapter.

Figure 3-6 A Diamond Indenter with a Berkovich Geometry

3.8 Isolation CabinetThe G200 isolation cabinet features a laminate exterior and a foam interior. The isolation cabinet is used to retard environmental temperature changes and dampen acoustic disturbances. The closed (and sealed) cabinet provides a stable air mass in which sudden temperature changes are minimized. The foam lining on the interior of the cabinet absorbs acoustic energy and decreases the transmission of such excitation to the instrument. The fixed cable ports provide a degree of decoupling of vibration transmission through the electronic and optical cables. Finally, the cabinet serves as a support for the vibration isolation table.

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Figure 3-7 The G200 Isolation Cabinet

L3.9 Locking PinsThe locking pins, shown in Figure 3-8, fix the indenter shaft so that the head is not damaged during a tip change or other contact with the diamond.

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Figure 3-8 Locking Pins

When not in use, the locking pins should be stored in the tip-change tool, as shown in Figure 3-9.

Figure 3-9 Tip-Change Tool with Locking Pins

See also Changing the Indenter in the Commonly Used Procedures chapter.

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M3.10 MicroscopeThe G200 microscope body is fully contained inside the gantry. The only exposed region is at the base of the microscope, in the working area of the gantry. The objective lens is changed through this portal. There should be no need for the user to access the video camera, microscope alignment screws, or optic focus motor, all of which are housed inside the gantry. For more information, see Aperture Levers and Objectives. Also see the procedure for focusing on the sample surface in the Quick Start Guide.

3.11 Motion SystemThe basic function of the G200 motion system is for positioning the specimens under the microscope and indenter tip. CAUTION: Certain precautions should be taken when operating the system to prevent damage to the G200: Tip Clearance. When using the G200 motion system, always verify that the tip has adequate clearance by parking the head. To do this, select Displacement Control Panel from the System menu, as shown in Figure 3-10. Click the Park Head button, as shown in Figure 3-11. Sample Height Adjustment. Adjust the sample height as described in the Quick Start Guide to ensure that samples do not strike the indenter when the sample tray is moved.

Figure 3-10 Displacement Control Panel Command

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Figure 3-11 The Displacement Control Panel

Control of the motion system is accomplished using TestWorks 4 software routines. The motion system is most commonly used in conjunction with the handsets (see the TestWorks 4 chapter for more information). The software drives the motion system and positions the specimen. Shown in Figure 3-12, the positioning tables are X/Y directional piezo stages. The motors, gearboxes, and encoder that interface with the table are mounted on the gantry. These components should only be accessed by MTS Nano Instruments support technicians.

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Figure 3-12 The Positioning Tables of the G200 Motion System

The tables of the motion system can be driven until a limit switch is tripped. Once a switch is activated, the limit-switch routine will assume control of the positioning tables and move them away from the activated limit switch. This safety precaution is used to prevent locking the tables against the end stops, which could result in damage to the gear motors.

3.12 Mounting SpecimensPlease see the Quick Start Guide for methods of mounting specimens. Also see Crystalbond Hot Melt.

N3.13 NanoSwiftShown in Figure 3-13, the NanoSwift is used to house and power the electronics for acquiring and controlling data.

Figure 3-13 NanoSwift

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O3.14 ObjectivesThe objectives are used to change magnification of the microscope. One of the standard microscope objectives provided with the system is the 10X Objective. The 10X objective is a DIN Achromat standard objective for a 150-mm fixed-tube microscope. The 10X objective is provided as a low-magnification option for the G200 optics system. The instrument also comes with a 40X objective. Other objectives are also available, including 20X, 60X, and 100X. For more information about these objectives, contact your MTS Nano Instruments service representative.

Figure 3-14 The 10X and 40X Objectives Supplied with Your G200

Objective lenses for the Nano Indenter G200 optics system are mounted on precision slides so that they can be interchanged easily. To insert an objective, grasp the objective and slide it into the mounting rails on the microscope until it snaps into place. Make sure that you insert the objective into the microscope such that the word FRONT is facing you, as shown in Figure 3-15. To remove the objective, reverse the procedure. Grasp the objective and slide it out of the mounting rails.

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Figure 3-15 Correct Orientation for Mounting an Objective

Two main characteristics of the objectives are parcentricity and parfocality. Parcentricity refers to the location of the center point of the image of the objective, relative to other objectives used in the same system. For example, if an object at the center of an image formed using the 10X objective is at the center of an image formed using the 40X objective, then the two objectives are parcentric. Parfocality refers to the location of the focal plane of an objective, relative to other objectives used in the same system. When swapping objectives, the focus of the microscope should not require significant adjustment. Parfocality and parcentricity are set at the factory and should not require further adjustment unless directed by an authorized MTS Nano Instruments certified technician.

S3.15 Sample DisksThe sample disks fit within the sample tray and are used to hold samples. Figure 3-16 shows a sample disk with a sample mounted on it.

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Figure 3-16 A Sample Disk

3.16 Sample Mount SystemThe sample mount system consists of a tray-clamping mechanism and a sample tray, shown in Figure 3-17.

Figure 3-17 The Sample Mount System

3.17 Sample TrayFigure 3-18 shows the sample tray provided with your G200. The sample tray holds up to five sample disks.

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Figure 3-18 The G200 Sample Tray

3.18 Single-Crystal Aluminum SampleThe single-crystal aluminum sample provided with the system consists of a polished singlecrystal aluminum specimen mounted within a stainless steel ring, all of which is embedded in an epoxy puck, as shown in Figure 3-19. The puck is 1.25 inches in diameter and 1 inch in height. The primary use of this sample is in the Microscope to Indenter Calibration. The relative softness of the material, coupled with the highly polished surface, allow for the creation of large (and thus easily visible) indentations.

1. Stainless-steel mounting ring 2. Single-crystal aluminum 3. Epoxy metallographic mount

Figure 3-19 The Single-Crystal Aluminum Sample Provided with the G200

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MTS Nano Instruments Instrument Reference The theoretical modulus for single-crystal aluminum is 70.4 GPa. The hardness should be on the order of 0.2 GPa. Note that single-crystal aluminum exhibits passivation at its surface, and thus surface effects are anticipated. Note also that significant pile-up is typical in single-crystal aluminum. The surface of the standard is shipped laboratory grade. The surface is very smooth and free of debris, and it should be maintained in this fashion. Note that cleaning the standard will corrupt it. To avoid this, always use care in handling the disk when removing it from the sample tray and then always place the plastic cap (provided with the puck) back over the standard when it is not in use. After extended use, your single-crystal aluminum sample may require re-polishing. Through proper handling, you may reduce this occurrence, but after extended service and many indentations, re-polishing will be required. When the standard has reached the end of its serviceable life or your standard has been damaged, a new standard may be purchased from MTS Nano Instruments by contacting your MTS service representative. See also Microscope-to-Indenter Calibration in the TestWorks 4 chapter.

3.19 SpecimenSpecimen refers to the material to be tested. See Crystalbond Hot Melt and Sample Mount System.

3.20 Standard Reference MaterialsYour G200 is provided with two standard reference materials: Corning 7980 (fused silica) and Pyrex 7740. These materials include calibration certificates that provide the Youngs modulus and Poissons ratio that were determined by ultrasound (shown in Figure 3-20). Each block is marked with a serial number (shown in Figure 3-21). The replacement calibration certificate can be obtained from MTS Nano Instruments with this serial number. These standard reference materials are used to indirectly verify the instrument according to ISO-14577.

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Figure 3-20 Calibration Certificate for Supplied Standard Reference Material

Figure 3-21 Serial Number on Reference Material

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T3.21 Temperature ProbeThe test methods that comply with ISO 14577 acquire data from the temperature probe inside the G200 cabinet, as shown in Figure 3-22.

Figure 3-22 Temperature Probe Inside the G200 Cabinet

3.22 Tip-Change ToolThe tip-change tool is used for removal or insertion of the diamond tip. The tool is used to grip the diamond tip and the tip-retaining nut.

Figure 3-23 The G200 Tip-Change Tool

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MTS Nano Instruments Instrument Reference See Indenter and Tip-Retaining Nut. Also see Changing the Indenter in the Commonly Used Procedures chapter.

3.23 Tip-Retaining NutShown in Figure 3-24, the tip-retaining nut is used to attach the tip to the indenter shaft.

Figure 3-24 The Tip-Retaining Nut

V3.24 Vibration Isolation TableThe vibration isolation table provided with the instrument is used to isolate the instrument from mechanical vibrations transmitted through the floor. For adjusting the vibration isolation table, refer to Adjusting the Vibration Isolation Table in the Commonly Used Procedures chapter.

Figure 3-25 The Vibration Isolation Table

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4TESTWORKS 4The purpose of this chapter is to give you a general understanding of TestWorks 4, the software for your G200, by describing the menus, panes, tabs, and dialog boxes. The system is designed using three basic pages: the Test page, the Review page, and the Define page. In combination, these pages both drive the test system and provide a fast and simple platform for processing collected data after the test has completed. There are multiple sources of TestWorks help. First, if you pause over most items on the screen, a short description will pop up. Second, online help describes in greater detail many functions of the software and is available through the Help menu.

4.1 The Test PageThe Test page is the initial display window for the TestWorks interface. It consists of a title bar, menu bar, toolbar, handset area, system controls (Go and Stop buttons), Data pane (right pane), and meters, as shown in Figure 4-1. The features of TestWorks are described here starting from the top of the TestWorks window and proceeding downward. The two other interfaces, the Review and Define pages, can be accessed by clicking the their tabs located just above the handset area. The title bar and status bar are common to all three pages. Although the menu bar and toolbar are also common, their contents vary depending on the displayed page (Test, Review, or Define). 4.1.1 Title Bar The title bar displays the currently loaded method, as well as the standard controls used to minimize, maximize, and close active windows. The user cannot customize the title bar. 4.1.2 Menu Bar The menu bar lists the main menus available to the current page (Test, Review, or Define). The menu bars of the Test and Review pages are virtually identical with the exception that all commands may not be available for all applications. Each main menu item in the menu bar contains a list of commands or submenus. Command separators (lines) are used to group similar commands. Many commands have keyboard shortcuts indicated by an underlined letter. These commands can be accessed with the key combination of Alt plus the underlined letter. For example, you can access the File menu by simultaneously pressing the Alt and F keys on your keyboard. Unavailable menu items are dimmed.

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MTS Nano Instruments TestWorks 4

Figure 4-1 The Test Page

4.2 File MenuAs shown in Figure 4-2, the File menu contains sample commands (methods are handled by the Method menu), such as creating, retrieving, archiving, printing, e-mailing, or printing samples. Recent samples are also listed in the bottom section of the File menu for convenient access.

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Figure 4-2 The File Menu

4.2.1 New Sample, Open Sample, Save Sample, Save Sample As, Exit With respect to samples, these File commands behave like their counterparts in other Windows applications. 4.2.2 Memo This command enables you attach a note to a sample. After selecting Memo from the File menu, the Edit Memo dialog box appears, as shown in Figure 4-3. Type in your note and click the OK button to attach the note to the currently open sample. To retrieve a previously recorded memo, simply select Memo from the File menu.

Figure 4-3 A Sample Memo

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MTS Nano Instruments TestWorks 4 4.2.3 Properties The Properties command invokes an information box that provides details about the sample, method, and test. 4.2.4 Print The Print command is used to print tests and samples. For printing batches, use the Batch Print command and then select the files to be used in the batch printing.

Figure 4-4 The Print Command

4.2.5 Print Preview The Print Preview command is used to preview printed pages before they are sent to the printer.

Figure 4-5 The Print Preview Command

4.2.6 Email This command will work only for a system connected to a network. Although the G200 computer is equipped for connectivity, connection to a network is left completely to your 4-4

MTS Nano Instruments TestWorks 4 discretion and disposition. Selecting Method from the Email submenu sends the test method via email, and selecting Sample sends the test data.

Figure 4-6 The Email Command

4.2.7 Export, Export Preview, and Batch Export These options are not used in the nano indentation version of TestWorks. For exporting options, please see the Export main menu item later in this chapter. 4.2.8 Import The Import command is a very powerful feature. The Import>>From Text File option is not used in nano indentation. The Import>>From TestWorks 4 Sample enables you to analyze a previously run sample with a new test method. Of course, there are restrictions that apply to changes that are allowed in the method. For instance, you can certainly add new formulas or calculated channels to a sample. However, you cannot add hardware channels or redefine markers that are only defined during the actual test. Further details on the use of the Import command are presented in Appendix D, TestWorks Explorer.

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Figure 4-7 The Import Command

After selecting the Import...>>From TestWorks 4 Sample... command, the Import from TestWorks 4 Sample dialog box in Figure 4-9 will appear.

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Figure 4-8 The Import from TestWorks 4 Sample Dialog Box

As shown in Figure 4-9, you can choose a sample from the Select Sample dropdown menu.

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Figure 4-9 Selecting the Sample to Be Used

After selecting the sample, use the Shift key on your keyboard to select a range of tests or the Ctrl key to select individual tests. Or, use the Select All, Select Untagged, Select Tagged, or Deselect All button to make selections and de-selections. Clicking the OK button imports the selected tests into the resident sample. These data can now be treated like any other data in that sample.

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4.3 Method MenuThe Method menu, shown in Figure 4-10, is used to manage methods, such as storage and retrieval of methods (samples are handled by the File menu). A list of recently used methods is also provided at the bottom of the Method menu.

Figure 4-10 The Method Menu

4.3.1 Open Method, Save Method, Save Method As With respect to methods, these Method commands behave like the File commands in other Windows applications. 4.3.2 Method Packaging This command is used to compress methods for storage and transmission. Selecting Pack or Unpack from the submenu starts a wizard that will guide you through the packaging process.

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Figure 4-11 The Method Packaging Menu

4.3.3 Edit Method This command is used only with TestWorks Explorer. Its function is explained in more detail during training for that option. 4.3.4 Print Method The Print Method command will print either short or detailed versions of the resident method. The method will automatically be sent to the default printer.

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Figure 4-12 The Print Method Command

4.3.5 Print Preview Method This command is used to preview the printed version of the method. The method will automatically appear in Windows Notepad.

Figure 4-13 The Print Preview Method Command

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4.4 Edit Menu (Define Page Only)The Cut, Copy, Paste, and Delete commands perform the same functions in TestWorks as in other Windows applications.

Figure 4-14 The Edit Menu

4.5 View MenuThe View menu contains a set of commands that are used to configure the appearance of the TestWorks interface. It can be used to: Navigate through the three pages (Test, Review, and Define). Toggle between displaying text or icons for the system controls (the Go and Stop buttons). Toggle between showing small or large toolbar buttons. Restore the appearance of the interface to the saved configuration of the current method. Resets the page appearance (sashes) to its default settings.

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Figure 4-15 The View Menu

When the Review page is displayed, additional commands are available, enabling you to save, delete, or load a configuration for the Review page. Also, recently saved configurations for the Review page are listed in the bottom section of the View menu for convenient access. 4.5.1 Save Current Review Page Configuration (Available in Review Page Only) This command enables you to save a preferred page configuration in TestWorks so that you can recall it when you want to view a sample in a particular way. Arrange the appearance of the Review page to suit your purposes, select this command from the View menu, type in a name for the page configuration in the Save Review page configuration dialog box shown in Figure 4-16, and then click the Save button to save the configuration.

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Figure 4-16 The Save Review Page Configuration Dialog Box

4.5.2 Delete a Saved Review Page Configuration (Available in Review Page Only) This command enables you to delete a previously saved page configuration. Select this command from the View menu, locate the name of the page configuration that you want to delete in the Delete Review page configuration dialog box shown in Figure 4-17, and then click the Delete button to delete the configuration.

Figure 4-17 Delete Review Page Configuration Dialog Box

4.5.3 Load a Saved Review Page Configuration (Available in Review Page Only) This command enables you to load a previously saved page configuration. Select this command from the View menu, locate the name of the page configuration that you want to load in the Load Review page configuration dialog box shown in Figure 4-18, and then click the Load button to delete the configuration.

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Figure 4-18 Load Review Page Configuration Dialog Box

4.6 Test Menu (Test and Review Pages Only)The Test menu, shown in Figure 4-19, is used to run, stop, and pause tests (for quicker access to these functions, be familiar with the Stop button in emergency situations, such as when you are concerned that a sample may strike the tip). Remember that lateral forces applied to the tip can cause serious damage (see the System Controls section for further detail). The Run, Stop, and Pause commands control a test. The Next Test Segment and Run Post Sample commands are explained below.

Figure 4-19 The Test Menu

4.6.1 Next Test Segment A test is divided into segments. You can use this command to skip the current segment and begin the next segment.

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MTS Nano Instruments TestWorks 4 4.6.2 Run Post Sample Selecting this command executes instructions that are defined to run after all testing on a particular sample is complete.

4.7 Configure Menu (Test and Review Pages Only)The commands in the Configure menu, shown in Figure 4-20, are used to set up devices, meters, statistics, the toolbar, review graph, and real-time graph. The Grip Separation command is dimmed and not available for nano indentation.

Figure 4-20 The Configure Menu

4.7.1 Device This command enables you to reset instrument calibrations. This menu item should be used only in consultation with MTS Nano Instruments technical support. 4.7.2 Meters This command enables you to control which channels are displayed on the Test page and how the channels are displayed. After selecting this menu item, the Meter Configuration dialog box appears, as shown in Figure 4-21. You can make adjustments to the displayed meters and channels in this dialog box. Click the OK button when you are satisfied with the configuration. NOTE: To revert back to a previous meter configuration, select Restore Screen to Method Saved Configuration from the View menu.

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Figure 4-21 The Meter Configuration Dialog Box

4.7.2.1

Changing Meters and Their Order

In the Meter Configuration dialog box, the meters available to you are shown in a list under the label Available. Add or remove a meter from the Meters to Display list by clicking on the Add> or >). To remove all meters from the Meters to Display list, click the remove all button (). To remove all channels from the Selected list, click the remove all button (XP ISO 14577 Standard Test Method, as shown in Figure 6-37. Click the OK button.

Figure 6-37 Selecting the Standard Test Method

4. Select Batch Mode from the Mode menu. 5. Right-click anywhere in the right pane in TestWorks and select Load Batch from the resulting popup menu. 6. In the Retrieve Batch File dialog box, open C:\Program Files\MTS Systems\TestWorks\Methods\ISO Standards\Machine Compliance Batch.bch. Click the Open button. 7. Click the green GO arrow to initiate testing. 8. In the Review Sample Names dialog box, replace the six Xs in the default sample name with the current date in a six-digit format (for example, March 15, 2008 would be 031508). Click the OK button. 9. After the head parks and the stages move into position, in the Review the first test location of Sample dialog box, as shown in Figure 6-38, verify that the microscope is in the corr

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