1 stephen schultzfiber optics fall 2005 semiconductor optical detectors
TRANSCRIPT
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Semiconductor Optical Detectors
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Semiconductor Optical Detectors
• Inverse device with semiconductor lasers
– Source: convert electric current to optical power
– Detector: convert optical power to electrical current
• Use pin structures similar to lasers
• Electrical power is proportional to i2
– Electrical power is proportional to optical power squared
– Called square law device
• Important characteristics
– Modulation bandwidth (response speed)
– Optical conversion efficiency
– Noise
– Area
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p-n Diode
• p-n junction has a space charge region at the interface of the two material types
• This region is depleted of most carriers
• A photon generates an electron-hole pair in this region that moves rapidly at the drift velocity by the electric field
• An electron-hole pair generated outside the depletion region they move by diffusion at a much slower rate
• Junction is typically reversed biased to increase the width of the depletion region
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p-n Diode
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Semiconductor pin Detector
• Intrinsic layer is introduced
– Increase the space charge region
– Minimize the diffusion current
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I-V Characteristic of Reversed Biased pin
• Photocurrent increases with incident optical power
• Dark current, Id: current with no incident optical power
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Light Absorption
• Dominant interaction
– Photon absorbed
– Electron is excited to CB
– Hole left in the VB
• Depends on the energy band gap (similar to lasers)
• Absorption ( requires the photon energy to be smaller than the material band gap
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Quantum Efficiency
• Probability that photon generates an electron-hole pair
• Absorption requires
– Photon gets into the depletion region
– Be absorbed
• Reflection off of the surface
• Photon absorbed before it gets to the depletion region
• Photon gets absorbed in the depletion region
• Fraction of incident photons that are absorbed
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Detector Responsivity
• Each absorbed photon generates an electron hole pair
Iph = (Number of absorbed photons) * (charge of electron)
• Rate of incident photons depends on
– Incident optical power Pinc
– Energy of the photon Ephoton= hf
• Generated current
• Detector responsivity
– Current generated per unit optical power
in units of m
fh
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Responsivity
• Depends on quantum efficiency , and photon energy
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Minimum Detectable Power
• Important detector Specifications
– Responsivity
– Noise Equivalent noise power in or noise equivalent power NEP
– Often grouped into minimum detectable power Pmin at a specific data rate
• Pmin scales with data rate
• Common InGaAs pin photodetector
– Pmin=-22 dBm @B=2.5 Gbps, BER=10-10
• Common InGaAs APD
– Pmin=-32 dBm @B=2.5 Gbps, BER=10-10
– Limited to around B=2.5 Gbps