1 agilent at apex 2003 march 30, 2003 anaheim, california

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1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Page 1: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Agilent at APEX 2003

March 30, 2003Anaheim, California

Page 2: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Agenda

• A Look Back

• Ready to Win out of the Turn

• What’s New?

Page 3: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Safe Harbor Language

We caution you that any forward-looking statements we make today – in our presentation or in response to your questions – are just predictions. They are, of course, subject to uncertainties and risks, and actual results may differ materially. Look at the company’s filing with the Securities and Exchange Commission, including our annual report on Form 10-K, our most recent quarter’s 10-Q and our current report on Form 8-K to get a more complete picture of all the factors at work.

Page 4: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Electronics Manufacturing and Board Test – Kamran’s Watch

Intro of SMT and double-sided boards

Increased board functionality and complexity

Move to contract manufacturing

Globalization

Shift from functional to in-circuit to process testShift from functional to in-circuit to process test

3070 scalable architecture, TestJet, boundary-scan3070 scalable architecture, TestJet, boundary-scan

Mainstreaming of automatic inspectionMainstreaming of automatic inspection

Commercialization of electronics/shift to digital

Emergence of distributed test & automated inspectionEmergence of distributed test & automated inspection

Page 5: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Ready to Win Out of the Turn

We remain confident about Agilent’s long-term strengths Continue focus on growing new business and gaining market share in core businesses – especially AOI Continue focus on key technology

Page 6: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Cut costs. Build profits. Compete to win. It’s what we help the world’s electronicsmanufacturers do every day.

SUCCESS – complementary, integrated test solutions and services

Versatility

Innovation

Partnership

Quality

Page 7: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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SP50

5DX

SJ50

3070

S&S

Intelligent Test S/W

FT

Complementary, Integrated Portfolio of Test Solutions and Services

#1

#1

#1

Surface Mount TechnologyProduct of the Year 2003

Page 8: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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What’s NEW

David Kent

General Manager (Interim)

Manufacturing Test Business Unit

Page 9: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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NEW in AOI

Page 10: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Agilent SJ50 Series IINew

• Solid Shape Modeling – remarkable real-life solder joint and component visualization through 3D shape analysis.

• Best AOI call accuracy in the industry

• Significant reduction in time-to-repair process

Page 11: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Segmented Color Lighting

• Lights field of view from up to7 different angles and with 3 different colors (R/G/B)

• Color mapping of joint profiles

• Greater flexibility when working with difficult devices

• Better visual segmentation of component and PCB

IC PinJointColor

mapping of joint profile

SJ50 color

joint image at camera

Page 12: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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How does it work?

South

West East

North1. Images are captured at up to 7 points around the device.

2. The captured images are combined to form a composite color image.

Page 13: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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How does it work?

3. The information in the composite color image is then used to build a 3D solid-shape model.

“Solid Shape Modeling brings AOI

to a whole new level.”-SJ50 OEM customer

Page 14: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Two Algorithm Engines for High AccuracyAND Easy Programming

ChipLength

ChipWidth

Feature ExtractionRobust algorithms with low false fails. Good on joints.

Geometric Pattern Matching (GPM)Simple intuitive programming, scales and rotates with device.

World’

s

First!

Page 15: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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SP50 SJ50

Unified Platform

Unique flexibility

and investmen

t protection

Page 16: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Imaging Solution for Boards

SJ50 Series II XL AOI

5DX Series 5000 XL X-ray Test

NewLARGE

Page 17: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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New in ICT

Page 18: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Agilent Vectorless Test EP• Built on the paradigm-

changing TestJet technique

• Micro-BGAs covered• Significantly improved

pins coverage• Fast test development

with automatic pin debug• Reduced fixture

maintenance costs with robust probe hardware

• Easy to learn and use – same use model as TestJet

Page 19: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Intelligent Test Software

Page 20: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Agilent Quality Tool

•New statistical process control / quality software

•Immediate, actionable feedback•Uses Agilent Intelligent Test Framework

•Intelligent Drill Down tool

•Identify bottlenecks•Increase yields•Decrease overall manufacturing costs

Page 21: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Real-Time Process Monitoring & Control – defect-based

• Increased first pass yield• Decreased repair infrastructure

Pre or Post Repair Data

Page 22: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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Intelligent Drill Downs

Drill-Down selections are customer driven

Speed to actionable information for both technical and non-technical users

Page 23: 1 Agilent at APEX 2003 March 30, 2003 Anaheim, California

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New capabilities across the portfolio

•SJ50 Series II•Large-board imaging

•Vectorless Test EP

•Agilent Quality Tool

Apex Booth #3241